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VHDL-AMS Fault Simulation for testing DNA Bio-Sensing Arrays

  • Hans G. Kerkhoff (Speaker)

Activity: Talk or presentation › Oral presentation

Period1 Nov 2005
Event titleNOE PATENT (FP6) Assembly Meeting
Event typeConference
LocationBudapest, HungaryShow on map
Degree of RecognitionInternational

Keywords

  • METIS-226950