Ton, B. T. & Veldhuis, R. N. J., 4 Jun 2013, Proceedings of the 2013 International Conference on Biometrics (ICB). Piscataway, NJ, USA: IEEE, p. 1-55 p. (Proceedings International Conference on Biometrics (ICB); vol. 2013).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review