Computer Architecture Design and Test for Embedded Systems

Research Output 1971 2019

Filter
Conference article
2003
4 Citations (Scopus)
28 Downloads (Pure)

The Detection of Defects in a Niobium Tri-layer Process

Arun, A. J., Heuvelmans, S., Gerritsma, G. J. & Kerkhoff, H. G., 2003, In : IEEE transactions on applied superconductivity. 13, 2, p. 95-98 4 p.

Research output: Contribution to journalConference articleAcademicpeer-review

Open Access
File
Niobium
niobium
chips
Defects
defects