Research Output 2009 2019

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Conference contribution
2019

A simple and robust fabrication method for creating 3D tapered polydimethylsiloxane channels

Rho, H. S., Veltkamp, H-W., Baptista, D., le Gac, S. & Habibović, P., 27 Oct 2019, 23rd International Conference on Miniaturized Systems for Chemistry and Life Sciences. p. 1156-1157 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

funnels
fabrication
lab-on-a-chip devices
veins
replicas
2 Downloads (Pure)

Characterizing the Electrical Properties of Anisotropic, 3D-Printed Conductive Sheets

Dijkshoorn, A., Schouten, M., Wolterink, G., Sanders, R. & Krijnen, G., 8 Aug 2019, IEEE International Conference on Flexible and Printable Sensors and Systems, FLEPS 2019. IEEE, 8792279

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Electric properties
conductors
electrical properties
Transducers
transducers
21 Downloads (Pure)

Electrical characterization of hot-wire assisted atomic layer deposited Tungsten films

van der Zouw, K., Aarnink, A. A. I., Schmitz, J. & Kovalgin, A. Y., 18 Mar 2019, 2019 IEEE 32nd International Conference on Microelectronic Test Structures, ICMTS 2019. IEEE, p. 48-53 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
Atomic layer deposition
Sheet resistance
Contact resistance
Tungsten
Electric lines

High power Si sidewall heaters for fluidic application fabricated by trench-assisted surface channel technology

Veltkamp, H-W., Zhao, Y., de Boer, M. J., Sanders, R. G. P., Wiegerink, R. J. & Lötters, J. C., Jan 2019, 2019 IEEE 32nd Conference on Micro Electro Mechanical Systems (MEMS). IEEE, Vol. 32. p. 648-651 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

fluidics
heaters
heating
silicon
thermal expansion
1 Downloads (Pure)

Impact of ultra-thin-layer material parameters on the suppression of carrier injection in rectifying junctions formed by interfacial charge layers

Kneževic, T., Suligoj, T. & Nanver, L. K., 1 May 2019, 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2019 - Proceedings. Skala, K., Car, Z., Pale, P., Huljenic, D., Janjic, M., Koricic, M., Sruk, V., Ribaric, S., Grbac, T. G., Butkovic, Z., Cicin-Sain, M., Skvorc, D., Mauher, M., Babic, S., Gros, S., Vrdoljak, B. & Tijan, E. (eds.). IEEE, p. 24-29 6 p. 8757156. (International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO); vol. 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Boron
Electron injection
Diodes
Current density
Electron affinity

In search of a hole inversion layer in Pd/MoOx/Si diodes through I- v characterization using dedicated ring-shaped test structures

Gupta, G., Tharnmaiah, S. D., Hueting, R. J. E. & Nanver, L. K., 6 Jun 2019, 2019 IEEE 32nd International Conference on Microelectronic Test Structures, ICMTS 2019. IEEE, p. 12-17 6 p. 8730920

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Molybdenum oxide
Inversion layers
Palladium
Diodes
Silicon
18 Downloads (Pure)

Minimization of dark counts in PureB SPADs for NUV/VUV/EUV light detection by employing a 2D TCAD-based simulation environment

Knežević, T., Nanver, L. K. & Suligoj, T., 26 Feb 2019, Physics and Simulation of Optoelectronic Devices XXVII. Osinski, M., Witzigmann, B. & Arakawa, Y. (eds.). SPIE, Vol. 10912. 109120Y. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 10912).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
Avalanche diodes
Single Photon Avalanche Diode
environment simulation
avalanche diodes
Simulation Environment
1 Downloads (Pure)

Nanometer-thin pure B layers Grown by MBE as metal diffusion barrier on GaN Diodes

Thammaiah, S. D., Hansen, J. L. & Nanver, L. K., 1 Mar 2019, China Semiconductor Technology International Conference 2019, CSTIC 2019. Claeys, C., Huang, R., Wu, H., Lin, Q., Liang, S., Song, P., Guo, Z., Lai, K., Yu, W., Zhang, Y., Qu, X. & Lung, H-L. (eds.). Piscataway, NJ: IEEE, 8755633

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Diffusion barriers
Molecular beam epitaxy
Diodes
molecular beam epitaxy
Metals

Reverse breakdown and light-emission patterns studied in Si PureB SPADs

Krakers, M., Kneževic, T. & Nanver, L. K., 1 May 2019, 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2019 - Proceedings. Skala, K., Car, Z., Pale, P., Huljenic, D., Janjic, M., Koricic, M., Sruk, V., Ribaric, S., Grbac, T. G., Butkovic, Z., Cicin-Sain, M., Skvorc, D., Mauher, M., Babic, S., Gros, S., Vrdoljak, B. & Tijan, E. (eds.). Piscataway, NJ: IEEE, p. 30-35 6 p. 8757007. (International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO); vol. 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Avalanche diodes
Boron
Light emission
Photons
Diodes
2018
2 Citations (Scopus)
1 Downloads (Pure)

2D Dark-Count-Rate Modeling of PureB Single-Photon Avalanche Diodes in a TCAD Environment

Knežević, T., Nanver, L. K. & Suligoj, T., 23 Feb 2018, Physics and Simulation of Optoelectronic Devices XXVI: SPIE OPTO, 27 January - 1 February 2018, San Francisco, California, United States. Witzigmann, B., Osiński, M. & Arakawa, Y. (eds.). Bellingham, WA: SPIE, 10 p. 105261K. (Proceedings of SPIE; vol. 10526).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

avalanche diodes
photons
ionization
electric fields
rings
1 Citation (Scopus)
2 Downloads (Pure)

An experimental view on PureB silicon photodiode device physics

Nanver, L. K., 28 Jun 2018, 2018 41st International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2018 - Proceedings. IEEE, 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Photodiodes
Boron
Physics
Silicon
Diodes
1 Downloads (Pure)

Figures of merit of avalanche-mode silicon LEDS

Hueting, R. J. E., Dutta, S., Agarwal, V. & Annema, A. J., 8 Oct 2018, Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, 2018, Skuluza, South Africa. SPIE International, Vol. 11043.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

figure of merit
avalanches
light emitting diodes
CMOS
silicon
2 Downloads (Pure)

Investigation of light-emission and avalanche-current mechanisms in PureB SPAD devices

Nanver, L. K., Krakers, M., Knezevic, T., Karavidas, A., Boturchuk, I., Agarwal, V., Hueting, R. J. E., Dutta, S. & Annema, A. J., 8 Oct 2018, Fifth Conference on Sensors, MEMS and Electro-Optical Systems 2018. SPIE International, Vol. 11043.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

avalanche diodes
avalanches
light emission
defects
photons

Non-linear behavior of Al-contacted pure amorphous boron (PureB) devices at low temperatures

Knezevic, T., Nanver, L. K., Capan, I. & Suligoj, T., 28 Jun 2018, 2018 41st International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2018 - Proceedings. IEEE, p. 12-17 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Boron
Temperature
Electric potential
Cryogenics
Processing
1 Citation (Scopus)
40 Downloads (Pure)

Optocoupling in CMOS

Agarwal, V., Dutta, S., Annema, A. J., Hueting, R. J. E., Schmitz, J., Lee, M-J., Charbon, E. & Nauta, B., 2 Dec 2018, 2018 IEEE International Electron Devices Meeting (IEDM). San Francisco, USA: IEEE

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
CMOS
light emitting diodes
avalanches
quantum efficiency
communication
5 Citations (Scopus)

Test structures without metal contacts for DC measurement of 2D-materials deposited on silicon

Nanver, L. K., Liu, X. & Knežević, T., 2018, 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, p. 69-74 6 p. (IEEE International Conference on Microelectronic Test Structures (ICMTS)).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Turnaround time
Diodes
Silicon
Electrons
Substrates
2017
3 Citations (Scopus)
70 Downloads (Pure)

3D-printing soft sEMG sensing structures

Wolterink, G., Sanders, R., Muijzer, F., van Beijnum, B-J. & Krijnen, G., 29 Oct 2017, 2017 IEEE Sensors. IEEE, 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
Printing
Electrodes
Orthotics
Frequency division multiplexing
Prosthetics
11 Citations (Scopus)
204 Downloads (Pure)

Nano-G accelerometer using geometric anti-springs

Boom, B. A., Bertolini, A., Hennes, E., Brookhuis, R. A., Wiegerink, R. J., Brand, van den, J. F. J., Beker, M. G., Oner, A. & Wees, van, D., 22 Jan 2017, 2017 IEEE 30th International Conference on Micro Electro Mechanical Systems (MEMS). IEEE, p. 33-36 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
Accelerometers
Stiffness
Leaf springs
Mechanics
Bandwidth
2013

Mechanical resonators on CMOS for integrated passive band pass filters

Kazmi, S. N. R., Salm, C. & Schmitz, J., 23 Jul 2013, ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day'. p. 193-196 4 p. 6523517. (ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day').

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Passive filters
Bandpass filters
Resonators
Germanium
Boron
2012
6 Citations (Scopus)

Ge-on-Si: Single-crystal selective epitaxial growth in a CVD reactor

Sammak, A., De Boer, W. B. & Nanver, L. K., 1 Dec 2012, SiGe, Ge, and Related Compounds 5: Materials, Processing, and Devices. 9 ed. p. 507-512 6 p. (ECS Transactions; vol. 50, no. 9).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Epitaxial growth
Chemical vapor deposition
Single crystals
Defect density
Dislocations (crystals)
4 Citations (Scopus)

Pattern dependency of pure-boron-layer chemical-vapor depositions

Mohammadi, V., De Boer, W. B., Scholtes, T. L. M. & Nanver, L. K., 19 Nov 2012, Silicon Compatible Materials, Processes, and Technologies for Advanced Integrated Circuits and Emerging Applications 2. 6 ed. p. 39-48 10 p. (ECS Transactions; vol. 45, no. 6).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Deposition rates
Boron
Chemical vapor deposition
Boundary layers
Gases