Research Output

Abstract

In-vacuo growth studies and thermal oxidation of ZrO2 thin films

Coloma Ribera, R., Sturm, J. M., van de Kruijs, R. W. E., Yakshin, A. & Bijkerk, F., 17 Jan 2017.

Research output: Contribution to conferenceAbstract

Narrow-band Borrmann multilayer filters for monitoring of EUV sources

Barreaux, J. L. P., Bastiaens, H. M. J., Kozhevnikov, I. V., Bijkerk, F. & Boller, K. J., 14 Oct 2014, p. -.

Research output: Contribution to conferenceAbstract

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Simultaneous analysis of Grazing Incidence X-Ray reflectivity and X-ray standing waves from periodic multilayer systems

Yakunin, S. N., Makhotkin, I. A., Chuyev, M. A., Seregin, A. Y., Pashayev, E. M., Louis, E., van de Kruijs, R. W. E., Bijkerk, F. & Kovalchuk, M. V., 15 Sep 2012, p. 115-115.

Research output: Contribution to conferenceAbstract

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16 Downloads (Pure)

Simultaneous supercontinuum and third harmonic generation in Si3N4 waveguides

Epping, J. P., Hellwig, T., Hoekman, M., Mateman, R., Leinse, A., Heideman, R. G., Van Der Slot, P. J. M., Lee, C. J., Fallnich, C., Boller, K. J. & van Rees, A., 21 Jun 2015, p. CK_5_4.

Research output: Contribution to conferenceAbstract

Article

25 kHz narrow spectral bandwidth of a wavelength tunable diode laser with a short waveguide-based external cavity

Oldenbeuving, R., Klein, E. J., Offerhaus, H. L., Lee, C. J., Song, H. & Boller, K. J., 10 Dec 2013, In : Laser physics letters. 10, 1, p. 015804-1-015804-8 8 p., 015804.

Research output: Contribution to journalArticleAcademicpeer-review

56 Citations (Scopus)

Adsorption and Dissociation of CO2 on Ru (0001)

Pachecka, M., Sturm, J. M., Lee, C. J. & Bijkerk, F., 30 Mar 2017, In : Journal of physical chemistry. p. 6729-6735 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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9 Citations (Scopus)
58 Downloads (Pure)

A gain-coefficient switched Alexandrite laser

Lee, C. J., van der Slot, P. J. M. & Boller, K. J., 11 Sep 2013, In : Journal of physics D: applied physics. 46, 1, p. - 4 p., 015103.

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)

A model for pressurized hydrogen induced thin film blisters

van den Bos, R. A. J. M., Reshetniak, V., Lee, C. J., Benschop, J. P. H. & Bijkerk, F., 2016, In : Journal of Applied Physics. 120, 23, p. 235304- 8 p., 235304.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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9 Citations (Scopus)
73 Downloads (Pure)

Angular and spectral bandwidth of Extreme UV multilayers near spacer material absorption edges

Zameshin, A., Yakshin, A., Chandrasekaran, A. & Bijkerk, F., 1 Jan 2019, In : Journal of nanoscience and nanotechnology. 19, 1, p. 602-608 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

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Anisotropy of heat conduction in Mo/Si multilayers

Medvedev, V., Yang, J., Schmidt, A. J., Yakshin, A., van de Kruijs, R. W. E., Zoethout, E. & Bijkerk, F., 2015, In : Journal of Applied Physics. 118, 8, p. - 085101.

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Scopus)

Aromatic structure degradation of single layer graphene on an amorphous silicon substrate in the presence of water, hydrogen and Extreme Ultraviolet light

Mund, B. K., Sturm, J. M., Lee, C. J. & Bijkerk, F., 1 Jan 2018, In : Applied surface science. 427, Part B, p. 1033-1040 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

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2 Citations (Scopus)
22 Downloads (Pure)

A semi-Analytical approach for the characterization of ordered 3D nanostructures using grazing-incidence X-ray fluorescence

Nikolaev, K. V., Soltwisch, V., Honicke, P., Scholze, F., De La Rie, J., Yakunin, S. N., Makhotkin, I. A., Van De Kruijs, R. W. E. & Bijkerk, F., 1 Mar 2020, In : Journal of synchrotron radiation. 27, p. 386-395 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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1 Citation (Scopus)
8 Downloads (Pure)
Open Access
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10 Downloads (Pure)

Atomic O and H exposure of C-covered and oxidezed d-metal surfaces

Tsarfati, T., Zoethout, E., van de Kruijs, R. W. E. & Bijkerk, F., 2009, In : Surface science. 603, 16, p. 2594-2599 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)

Atomic quantum scattering and molecular diffraction

Kleijn, A., 2011, In : Progress in surface science. 86, 9-10, p. 163-168

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)

Blister formation in Mo/Si multilayered structures induced by hydrogen ions

Van Den Bos, R. A. J. M., Lee, C. J., Benschop, J. P. H. & Bijkerk, F., 9 Jun 2017, In : Journal of physics D: applied physics. 50, 26, 265302.

Research output: Contribution to journalArticleAcademicpeer-review

12 Citations (Scopus)
2 Downloads (Pure)

Broadband transmission grating spectrometer for measuring the emission spectrum of EUV sources

Bayraktar, M., Bastiaens, H. M. J., Bruineman, C., Vratzov, B. & Bijkerk, F., 2016, In : NEVAC blad. 54, 1, p. 14-19 6 p.

Research output: Contribution to journalArticleAcademic

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Carbon film growth and hydrogenic retention of tungsten exposed to carbon-seeded high density deuterium plasmas

Wright, G. M., Al, R. S., Alves, E., Alves, L. C., Barradas, N. P., Kleyn, A. W., Cardozo, N. J. L., van der Meiden, H. J., Philipps, V., Rooij, G. J., Shumack, A. E., Vijvers, W. A. J., Westerhout, J., Zoethout, E. & Rapp, J., 2010, In : Journal of nuclear materials. 396, 2-3, p. 176-180

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)

Carbon induced extreme ultraviolet (EUV) reflectance loss characterized using visible-light ellipsometry

Chen, J., Louis, E., Wormeester, H., Harmsen, R., van de Kruijs, R. W. E., Lee, C. J., van Schaik, W. & Bijkerk, F., 2011, In : Measurement science and technology. 22, 10, p. - 8 p., 105705.

Research output: Contribution to journalArticleAcademicpeer-review

8 Citations (Scopus)

CF3+ etching silicon surface: A molecular dynamics study

Zhao, C., Lu, X., He, P., Zhang, P., Sun, W., Zhang, J., Chen, F. & Gou, F., 2012, In : Vacuum. 86, 7, p. 913-916

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)

Characterization of carbon contamination under ion and hot atom bombardment in a tin-plasma extreme ultraviolet light source

Dolgov, A., Lopaev, D., Lee, C. J., Zoethout, E., Medvedev, V., Yakushev, O. & Bijkerk, F., 23 Jun 2015, In : Applied surface science. 353, p. 708-713 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

12 Citations (Scopus)

Characterization of Mo/Si multilayer growth on stepped topographies

van den Boogaard, A. J. R., Louis, E., Zoethout, E., Goldberg, K. A. & Bijkerk, F., 2011, In : Journal of vacuum science and technology. B: Microelectronics and nanometer structures. 29, 5, p. 1-9 9 p., 051803.

Research output: Contribution to journalArticleAcademicpeer-review

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3 Citations (Scopus)
14 Downloads (Pure)

Characterization of nitrogen doped graphene bilayers synthesized by fast, low temperature microwave plasma-enhanced chemical vapour deposition

Stilhano Vilas Boas, C. R., Focassio, B., Marinho Jr., E., G. Larrude, D., Salvadori, M. C., Rocha Leao, C. & dos Santos, D., 23 Sep 2019, In : Scientific reports. 9, 12 p., 13715.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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5 Citations (Scopus)
15 Downloads (Pure)

Characterization of self-assembled monolayers on a ruthenium surface

Shaheen, A., Sturm, J. M., Ricciardi, R., Huskens, J., Lee, C. J. & Bijkerk, F., 6 Jun 2017, In : Langmuir. 33, 25, p. 6419-6429 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

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4 Citations (Scopus)
49 Downloads (Pure)

Chemical interaction of B4C, B and C with Mo/Si layered structures

de Rooij-Lohmann, V. I. T. A., Veldhuizen, L. W., Zoethout, E., Yakshin, A., van de Kruijs, R. W. E., Thijsse, B. J., Gorgoi, M., Schaefers, F. & Bijkerk, F., 2010, In : Journal of Applied Physics. 108, 094314.

Research output: Contribution to journalArticleAcademicpeer-review

13 Citations (Scopus)

Chemically mediated diffusion of d-metals and B through Si and agglomeration at Si-on-Mo interfaces

Tsarfati, T., Zoethout, E., van de Kruijs, R. W. E. & Bijkerk, F., 2009, In : Journal of Applied Physics. 105, 10, 5 p., 104305.

Research output: Contribution to journalArticleAcademicpeer-review

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Coexistence of ice clusters and liquid-like water clusters on the Ru(0001) surface

Liu, F., Sturm, J. M., Lee, C. J. & Bijkerk, F., 2017, In : Physical chemistry chemical physics. 19, 12, p. 8288-8299 12 p.

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)
1 Downloads (Pure)

Combined EUV reflectance and X-ray reflectivity data analysis of periodic multilayer structures

Yakunin, S. N., Makhotkin, I. A., Nikolaev, K. V., van de Kruijs, R. W. E., Chuev, M. A. & Bijkerk, F., 2014, In : Optics express. 22, 17, p. 20076-20086 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

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19 Citations (Scopus)
206 Downloads (Pure)

Comparison of H2 and He carbon cleaning mechanisms in extreme ultraviolet induced and surface wave discharge plasmas

Dolgov, A., Lopaev, D., Rachimova, T., Kovalev, A., Vasilyeva, A., Lee, C. J., Krivtsun, V. M., Yakushev, O. & Bijkerk, F., 2014, In : Journal of physics D: applied physics. 47, 6, p. - 9 p., 065205.

Research output: Contribution to journalArticleAcademicpeer-review

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16 Citations (Scopus)
62 Downloads (Pure)

Controlled growth of PbZr0.52Ti0.48O3 using nanosheet coated Si (001)

Chopra, A., Bayraktar, M., Bijkerk, F. & Rijnders, A. J. H. M., 2015, In : Thin solid films. 589, p. 13-16 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

6 Citations (Scopus)

Control of YH3 formation and stability via hydrogen surface adsorption and desorption

Soroka, O., Sturm, J. M., van de Kruijs, R. W. E., Lee, C. J. & Bijkerk, F., 15 Oct 2018, In : Applied surface science. 455, p. 70-74 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

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4 Citations (Scopus)
25 Downloads (Pure)

Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold

Makhotkin, I. A., Milov, I., Chalupský, J., Tiedtke, K., Enkisch, H., de Vries, G., Scholze, F., Siewert, F., Sturm, J. M., Nikolaev, K. V., van de Kruijs, R. W. E., Smithers, M. A., Van Wolferen, H. A. G. M., Keim, E. G., Louis, E., Jacyna, I., Jurek, M., Klinger, D., Pelka, J. B., Juha, L. & 15 others, Hájková, V., Vozda, V., Sburian, T., Saksl, K., Faatz, B., Keitel, B., Plönjes, E., Schreiber, S., Toleikis, S., Loch, R., Hermann, M., Strobel, S., Donker, R., Mey, T. & Sobierajski, R., 1 Nov 2018, In : Journal of the Optical Society of America B: Optical Physics. 35, 11, p. 2799-2805 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

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5 Citations (Scopus)
80 Downloads (Pure)

Damage mechanisms of MoN/SiN multilayer optics for next-generation pulsed XUV light sources

Sobierajski, R., Bruijn, S., Khorsand, A. R., Louis, E., van de Kruijs, R. W. E., Burian, T., Chalupsky, J., Cihelka, J., Gleeson, M., Grzonka, J., Gullikson, E. M., Hajkova, V., Hau-Riege, S., Juha, L., Jurek, M., Klinger, D., Krzywinski, J., London, R., Pelka, J. B., Plocinski, T. & 6 others, Rasinski, M., Tiedtke, K., Toleikis, S., Vysin, L., Wabnitz, H. & Bijkerk, F., 2011, In : Optics express. 19, 1, p. 193-205

Research output: Contribution to journalArticleAcademicpeer-review

25 Citations (Scopus)

Damage threshold of amorphous carbon mirror for 177 eV FEL radiation

Dastjani Farahani, S., Chalupsky, J., Burian, T., Chapman, H., Gleeson, A. J., Hajkoya, V., Juha, L., Jurek, M., Klinger, D., Sinn, H., Sobierajski, R., Störmer, M., Tiedtke, K., Toleikis, S., Tschentscher, T., Wabnitz, H. & Gaudin, J., 2011, In : Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment. 635, 1, Suppl. 11, p. S39-S42

Research output: Contribution to journalArticleAcademicpeer-review

10 Citations (Scopus)

Decay of crystalline order and equilibration during solid-to-plasma transition induced by 20-fs microfocused 92 eV Free Electron Laser pulses

Galtier, E., Rosmej, F. B., Dzelzainis, T., Riley, D., Khattak, F. Y., Heimann, P., Lee, R. W., Nelson, A. J., Vinko, S. M., Whitcher, T., Wark, J. S., Tschentscher, T., Toleikis, S., Faustlin, R. R., Sobierajski, R., Jurek, M., Juha, L., Chalupsky, J., Hajkova, V., Kozlova, M. & 2 others, Krzywinski, J. & Nagler, B., 2011, In : Physical review letters. 106, 16, p. 1-4 164801.

Research output: Contribution to journalArticleAcademicpeer-review

26 Citations (Scopus)

Defect formation in single layer graphene under extreme ultraviolet irradiation

Gao, A., Zoethout, E., Sturm, J. M., Lee, C. J. & Bijkerk, F., 2014, In : Applied surface science. 317, p. 745-751 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

8 Citations (Scopus)

Deposition and Etching of SiF2 on Si Surface: MD Study

Chen, X., Lu, X. D., He, P. N., Zhao, C. L., Sun, W., Zhang, P. & Gou, F., 2012, In : Physics procedia. 32, p. 885-890 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)

Detection of defect populations in superconductor boron subphosphide B12P2 through X-ray absorption spectroscopy

Huber, S., Gullikson, E., Meyer-Ilse, J., Frye, C. D., Edgar, J. H., van de Kruijs, R. W. E., Bijkerk, F. & Prendergast, D., 2017, In : Journal of materials chemistry. A. 5, 12, p. 5737-5749 13 p.

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)

Determination of oxygen diffusion kinetics during thin film ruthenium oxidation

Coloma Ribera, R., van de Kruijs, R. W. E., Yakshin, A. & Bijkerk, F., 2015, In : Journal of Applied Physics. 118, p. 055303-

Research output: Contribution to journalArticleAcademicpeer-review

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4 Citations (Scopus)
155 Downloads (Pure)

Determination of the density of ultrathin La films in La/B(4)C layered structures using X-ray standing waves

Makhotin, I. A., Louis, E., van de Kruijs, R. W. E., Yaskini, A. E., Zoethout, E., Seregin, A. Y., Tereschenko, E. Y., Yakunin, S. N. & Bijkerk, F., 2011, In : Physica status solidi A. 208, 11, p. 2597-2600

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)

Determining crystal phase purity in c-BP through X-ray absorption spectroscopy

Huber, S., Medvedev, V., Gullikson, E., Padavala, B., Edgar, J. H., van de Kruijs, R. W. E., Bijkerk, F. & Prendergast, D., 2017, In : Physical chemistry chemical physics. 19, 12, p. 8174-8187 14 p.

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)

Diffusion and interaction studied nondestructively and in real-time with depth-resolved low energy ion spectroscopy

de Rooij-Lohmann, V. I. T. A., Kleyn, A. W., Bijkerk, F., Brongersma, H. H. & Yakshin, A., 2009, In : Applied physics letters. 94, 6, p. 063107-1-063107-3 3 p.

Research output: Contribution to journalArticleAcademicpeer-review

11 Citations (Scopus)

Diffusion-induced structural changes in La/B-based multilayers for 6.7-nm radiation

Nyabero, S. L., van de Kruijs, R. W. E., Yakshin, A., Makhotkin, I. A., Bosgra, J. & Bijkerk, F., 2014, In : Journal of micro/nanolithography, MEMS, and MOEMS. 13, 1, p. 013014-013014-5 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

7 Citations (Scopus)

Double matrix effect in Low Energy Ion Scattering from La surfaces

Zameshin, A. A., Yakshin, A. E., Sturm, J. M., Brongerma, H. H. & Bijkerk, F., 15 May 2018, In : Applied surface science. 440, p. 570-579 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

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5 Citations (Scopus)
30 Downloads (Pure)

Efficient Generation of Extreme Ultraviolet Light From Nd: YAG-Driven Microdroplet-Tin Plasma

Schupp, R., Torretti, F., Meijer, R., Bayraktar, M., Scheers, J., Kurilovich, D., Bayerle, A., Eikema, K. S. E., Witte, S., Ubachs, W., Hoekstra, R. & Versolato, O. O., 8 Jul 2019, In : Physical review applied. 12, 1, 014010.

Research output: Contribution to journalArticleAcademicpeer-review

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6 Citations (Scopus)
45 Downloads (Pure)

Electrical conductivity of nanostructured and C60-modified aluminum

Zameshin, A., Popov, M., Medvedev, V., Perfilov, S., Lomakin, R., Buga, S., Denisov, V., Kirichenko, A., Skryleva, E., Tatyanin, E., Aksenenkov, V. & Blank, V., 2012, In : Applied physics A: Materials science and processing. 107, 4, p. 863-869

Research output: Contribution to journalArticleAcademicpeer-review

10 Citations (Scopus)

Electrofusion of single cells in picoliter droplets

Schoeman, R. M., Van Den Beld, W. T. E., Kemna, E. W. M., Wolbers, F., Eijkel, J. C. T. & Van Den Berg, A., 27 Feb 2018, In : Scientific reports. 8, 3714.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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2 Citations (Scopus)
61 Downloads (Pure)

Electronegativity-dependent tin etching from thin films

Pachecka, M., Sturm, J. M., van de Kruijs, R. W. E., Lee, C. J. & Bijkerk, F., 29 Jul 2016, In : AIP advances. 6, 7, 9 p., 075222.

Research output: Contribution to journalArticleAcademicpeer-review

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7 Citations (Scopus)
51 Downloads (Pure)