Research Output

2016

Exploiting the P L2,3 absorption edge for optics: spectroscopic and structural characterization of cubic boron phosphide thin films

Huber, S., Medvedev, V., Meyer-Ilse, J., Gullikson, E., Padavala, B., Edgar, J. H., Sturm, J. M., van de Kruijs, R. W. E., Prendergast, D. & Bijkerk, F., 2016, In : Optical materials express. 6, 12, p. 3946-3959 12.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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7 Citations (Scopus)
81 Downloads (Pure)

Exploring the electron density in plasma induced by EUV radiation: I. Experimental study in hydrogen

Horst, R. M., Beckers, J., Osorio, E. A., Astakhov, D., Goedheer, W. J., Lee, C. J., Ivanov, V. V., Krivtsum, V. M., Koshelev, K. N. & Lopaev, D. V., 2016, In : Journal of physics D: applied physics. 49, 14, p. - 8 p., 145203.

Research output: Contribution to journalArticleAcademicpeer-review

17 Citations (Scopus)

Exploring the electron density in plasma induced by EUV radiation: II. Numerical studies in argon and hydrogen

Astakhov, D., Goedheer, W. J., Lee, C. J., Ivanov, V. V., Krivtsun, V. M., Koshelev, K. N., Lopaev, D. V., Horst, R. M., Beckers, J., Osorio, E. A. & Bijkerk, F., 2016, In : Journal of physics D: applied physics. 49, 29, p. - 9 p., 295204.

Research output: Contribution to journalArticleAcademicpeer-review

16 Citations (Scopus)

Extreme UV induced dissociation of amorphous solid water and crystalline water bilayers on Ru(0001)

Liu, F., Sturm, J. M., Lee, C. J. & Bijkerk, F., 2016, In : Surface science. 646, p. 101-107 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)

Flying Circus Spectrometer for characterization of EUV light sources from UV to soft x-ray wavelengths

Bayraktar, M., Bruineman, C., Vratzov, B., Bastiaens, H. M. J. & Bijkerk, F., 21 Jun 2016.

Research output: Contribution to conferencePoster

Highly efficient blazed grating with multilayer coating for tender X-ray energies

Senf, F., Bijkerk, F., Eggenstein, F., Gwalt, G., Huang, Q., van de Kruijs, R. W. E., Kutz, O., Lemke, S., Louis, E., Mertin, M., Packe, I., Rudolph, I., Schafers, F., Siewert, F., Sokolov, A., Sturm, J. M., Waberski, C., Wang, Z., Wolf, J., Zeschke, T. & 1 others, Erko, A., 2016, In : Optics express. 24, 12, p. 13220-13230 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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22 Citations (Scopus)
288 Downloads (Pure)

Hydrogen induced blister formation in multilayer mirror structures

van den Bos, R. A. J. M., Lee, C. J. & Bijkerk, F., 19 Jan 2016, p. -.

Research output: Contribution to conferencePoster

Illuminating the structure of borides through X-ray absorption spectroscopy

Huber, S., 20 Oct 2016, Enschede: Universiteit Twente. 166 p.

Research output: ThesisPhD Thesis - Research UT, graduation UT

File
72 Downloads (Pure)

In depth study of molybdenum silicon compound formation at buried interfaces

Zoethout, E., Louis, E. & Bijkerk, F., 2016, In : Journal of Applied Physics. 120, 11, p. - 9 p., 115303.

Research output: Contribution to journalArticleAcademicpeer-review

File
10 Citations (Scopus)
59 Downloads (Pure)

Influence of the surface oxide content of a boron capping layer on UV photodetector performance

Mohammadi, V., Van De Kruijs, R. W. E., Rao, P. R., Sturm, J. M. & Nihtianov, S., 21 Mar 2016, 2015 9th International Conference on Sensing Technology, ICST 2015. IEEE Computer Society, Vol. 2016-March. p. 656-660 5 p. 7438479

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

In-house X-ray Standing Wave study of LaN/B multilayer mirrors

Hendrikx, C. P., Makhotkin, I. A., Yakunin, S. N., van de Kruijs, R. W. E. & Bijkerk, F., 10 Nov 2016, p. -.

Research output: Contribution to conferencePoster

Insitu stress measurement of thin film and multilayer growth

Reinink, J., van de Kruijs, R. W. E. & Bijkerk, F., 19 Jan 2016, p. -.

Research output: Contribution to conferencePoster

In-situ study of the YH2-YH3+x transition during hydrogenation by GI-DAFS and HAXPEX

Makhotkin, I. A., Soroka, O., Yakunin, S. N., Nikolaev, K., Hendrikx, S. P. & Lee, C. J., 2016, Grenoble: Universiteit Twente, XUV Optics. 3 p.

Research output: Book/ReportReportProfessional

In-vacuo growth studies and thermal oxidation of ZrO2 thin films

Coloma Ribera, R., Sturm, J. M., van de Kruijs, R. W. E., Yakshin, A. & Bijkerk, F., 10 Nov 2016, p. -.

Research output: Contribution to conferencePoster

In vacuo growth studies of Ru thin films on Si, SiN, and SiO2 by high-sensitivity low energy ion scattering

Coloma Ribera, R., van de Kruijs, R. W. E., Sturm, J. M., Yakshin, A. & Bijkerk, F., 2016, In : Journal of Applied Physics. 120, 6, p. 065303- 13 p., 065303.

Research output: Contribution to journalArticleAcademicpeer-review

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5 Citations (Scopus)
186 Downloads (Pure)

In-vacuo growth studies of ZrO2 thin films

Coloma Ribera, R., Sturm, J. M., van de Kruijs, R. W. E., Yakshin, A. & Bijkerk, F., 1 Dec 2016, p. -.

Research output: Contribution to conferencePoster

Ion acceleration in the transparent regime and the critical influence of the plasma density scale length

Loch, R. A., Ceccotti, T., Quere, F., George, H., Bonnaud, G., Réau, F., D'Oliviera, P., Luttikhof, M. J. H., Bijkerk, F., Boller, K. J., Blaclard, G. & Combis, P., 21 Sep 2016, In : Physics of plasmas. 23, 9, p. - 9 p., 093117.

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)

Kombinierter Reflektor und Filter für Licht underschiedlicher Wellenlängen

Medvedev, V., Yakshin, A., Krivtsun, V. M. & Bijkerk, F., 18 Feb 2016, (Submitted) Patent No. P20448DE1, Priority date 11 May 2015, Priority No. 10 2014 216 109.6

Research output: Patent

Low Energy Ion Scattering from La surfaces

Zameshin, A., Yakshin, A., Sturm, J. M., Brongersma, H. H. & Bijkerk, F., 19 Jan 2016, p. -.

Research output: Contribution to conferencePoster

Nonequilibrium electron-phonon dynamics in ruthenium thin films exposed to ultra-short laser pulses

Milov, I., Makhotkin, I. A., Enkisch, H., Sobierajski, R., Chalupsky, J., Tiedtke, K., de Vries, G., Scholze, F., Siewert, F., Störmer, M., van de Kruijs, R. W. E., Keim, R., van Wolferen, H. A. G. M., Yatsyna, I., Jurek, M., Juha, L., Hajkova, V., Vozda, V., Burian, T., Saksl, K. & 11 others, Faatz, B., Keitel, B., Ploenjes, E., Schreiber, S., Toleikis, S., Loch, R., Hermann, M., Strobel, S., Nienhuys, H., Louis, E. & Bijkerk, F., 10 Nov 2016, p. -.

Research output: Contribution to conferencePoster

Numerical and experimental studies of the carbon etching in EUV-induced plasma

Astakhov, D., Goedheer, W. J., Lee, C. J., Ivanov, V. V., Krivtsun, V. M., Yakushev, O., Koshelev, K. N., Lopaev, D. V. & Bijkerk, F., 2016, p. -, 11 p.

Research output: Working paper

Open Access
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14 Downloads (Pure)

Numerical study of extreme-ultra-violet generated plasmas in hydrogen

Astakhov, D., 28 Apr 2016, Enschede: Universiteit Twente. 122 p.

Research output: ThesisPhD Thesis - Research UT, graduation UT

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262 Downloads (Pure)

On-chip broadband supercontinuum generation at telecom wavelengths using silicon nitride waveguides

Garcia Porcel, M. A., Schepers, F., Epping, J. P., Hellwig, T., Hoekman, M., Leinse, A., Heideman, R., van Rees, A., van der Slot, P. J. M., Lee, C. J., Schmidt, R., Bratschitsch, R., Fallnich, C. & Boller, K. J., 13 Dec 2016.

Research output: Contribution to conferencePoster

Oxygen-stabilized triangular defects in hexagonal boron nitride

Huber, S., Gullikson, E., van de Kruijs, R. W. E., Bijkerk, F. & Prendergast, D., 2016, In : Physical review B: Condensed matter and materials physics. 92, 245310, p. 1-7 7 p., 245310.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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15 Citations (Scopus)
89 Downloads (Pure)

Polarizaton recovery in lead zirconate titanate thin films deposited on nanosheets-beffered Si (oo1)

Chopra, A., Bayraktar, M., Nijland, M., ten Elshof, J. E., Bijkerk, F. & Rijnders, A. J. H. M., 2016, In : AIP advances. 6, 125209, 6 p., 125209.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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27 Downloads (Pure)

Recommended reading list of early publications on atomic layer deposition-outcome of the "virtual project on the history of ALD"

Ahvenniemi, E., Akbashev, A. R., Ali, S., Bechelany, M., Berdova, M., Boyadjiev, S., Cameron, D. C., Chen, R., Chubarov, M., Cremers, V., Devi, A., Drozd, V., Elnikova, L., Gottardi, G., Grigoras, K., Hausmann, D. M., Hwang, C. S., Jen, S. H., Kallio, T., Kanervo, J. & 42 others, Khmelnitskiy, I., Kim, D. H., Klibanov, L., Koshtyal, Y., Krause, A. O. I., Kuhs, J., Karkkanen, I., Kaariainen, M. L., Kaariainen, T., Lamagna, L., Lapicki, A. A., Leskela, M., Lipsanen, H., Lyytinen, J., Malkov, A., Malygin, A., Mennad, A., Militzer, C., Molarius, J., Norek, M., Ozgit-Akgun, C., Panov, M., Pedersen, H., Piallat, F., Popov, G., Puurunen, R. L., Rampelberg, G., Ras, R. H. A., Rauwel, E., Roozeboom, F., Sajavaara, T., Salami, H., Savin, H., Schneider, N., Seidel, T. E., Sundqvist, J., Suyatin, D. B., Torndahl, T., van Ommen, J. R., Wiemer, C., Ylivaara, O. M. E. & Yurkevich, O., 2016, In : Journal of vacuum science and technology A: vacuum, surfaces, and films. 35, 1, 010801.

Research output: Contribution to journalReview articleAcademicpeer-review

Open Access
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32 Citations (Scopus)
35 Downloads (Pure)
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11 Citations (Scopus)
62 Downloads (Pure)

Reflectivity tuning through controlled hydrogenation

Lee, C. J. & Bijkerk, F., 27 Oct 2016, (Submitted) Patent No. P21855/de, Priority date 18 Aug 2016, Priority No. G02B 1/10 (2015/01)

Research output: Patent

Research in the Industrial Focus Group XUV Optics

Sturm, J. M. & Bijkerk, F., 26 May 2016, Delft

Research output: Other contributionOther research output

Role of heat accumulation in the multi-shot damage of silicon irradiated with femtosecond XUV pulses at a 1 Mhz repetition rate

Sobierajski, R., Jacyna, I., Dluzewski, P., Klepka, M., Klinger, D., Pelka, J. B., Burian, T., Hajkova, V., Juha, L., Saksl, K., Vozda, V., Makhotkin, I. A., Louis, E., Faatz, B., Tiedtke, K., Toleikis, S., Enkisch, H., Hermann, M., Strobel, S., Loch, R. A. & 1 others, Chalupsky, J., 29 Jun 2016, In : Optics express. 24, 14, p. 15468-15477 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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5 Citations (Scopus)
62 Downloads (Pure)

Self-healing in B12P2 through Mediated Defect Recombination

Huber, S., Gullikson, E., Frye, C. D., Edgar, J. H., van de Kruijs, R. W. E., Bijkerk, F. & Prendergast, D., 2016, In : Chemistry of materials. 28, 22, p. 8415-8428

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)

Single-shot damage of Ru thin film induced by FEL fs pulses

Milov, I., Makhotkin, I. A., Enkisch, H., Sobierajski, R., Chalupsky, J., Tiedtke, K., de Vries, G., Scholze, F., Siewert, F., Störmer, M., van de Kruijs, R. W. E., Keim, E. G., van Wolferen, H. A. G. M., Yatsyna, I., Jurek, M., Juha, L., Hajkova, V., Vozda, V., Burian, T., Saksl, K. & 11 others, Faatz, B., Keitel, B., Ploenjes, E., Schreiber, S., Toleikis, S., Loch, R. A., Hermann, M., Strobel, S., Nienhuys, H., Louis, E. & Bijkerk, F., 10 Nov 2016, p. -.

Research output: Contribution to conferencePoster

Spectral control of high-harmonic generation via drive laser pulse shaping in a wide-diameter capillary

Goh, S. J., Reinink, J., Tao, Y., van der Slot, P. J. M., Bastiaens, H. M. J., Herek, J. L., Biedron, S. G., Milton, S. V. & Boller, K. J., 20 Jan 2016, In : Optics express. 24, 2, p. 1604-1605

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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2 Citations (Scopus)
63 Downloads (Pure)

Spectroscopic ellipsometry for H diffusion

Soroka, O., Jose, A. A., van de Kruijs, R. W. E., Bijkerk, F. & Lee, C. J., 3 Apr 2016, p. -.

Research output: Contribution to conferencePoster

Spiegel, insbesondere für eine mikrolithographische Projektionsbelichtungsanlage

Medvedev, V., Yakshin, A. & Bijkerk, F., 10 Mar 2016, (Submitted) Patent No. P21487DE, Priority date 13 Mar 2015

Research output: Patent

Structure of high-reflectance La/B-based multilayer mirrors with partial La nitridation

Kuznetsov, D., Yakshin, A., Sturm, J. M., van de Kruijs, R. W. E. & Bijkerk, F., 2016, In : AIP advances. 6, 9 p., 115117.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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6 Citations (Scopus)
52 Downloads (Pure)

Study of crystal surface with asymmetrical X-Ray diffraction

Nikolaev, K., Makhotkin, I. A., Yakunin, S. N., van de Kruijs, R. W. E. & Bijkerk, F., 10 Jul 2016, p. -.

Research output: Contribution to conferencePoster

Transmission grating spectrometer for broadband characterization of EUV sources

Bayraktar, M., Bastiaens, H. M. J., Bruineman, C., Vratzov, B. & Bijkerk, F., 7 Nov 2016, p. -.

Research output: Contribution to conferencePoster

Two-octave spanning on-chip supercontinuum generation at telecom wavelengths using silicon nitride waveguides

Garcia Porcel, M. A., Schepers, F., Epping, J. P., Hellwig, T., Hoekman, M., Leinse, A., Heideman, R., van Rees, A., van der Slot, P. J. M., Lee, C. J., Schmidt, R., Bratschitsch, R., Fallnich, C. & Boller, K. J., 10 Oct 2016, p. -.

Research output: Contribution to conferencePoster

Ultra-broadband Supercontinuum Generation at Telecommunication Wavelengths in Dispersion Engineered Stoichiometric Si3N4 Waveguides

Schepers, F., Garcia Porcel, M. A., Epping, J. P., Hellwig, T., Hoekman, M., Mateman, R., Leinse, A., Heideman, R. G., van der Slot, P. J. M., Lee, C. J., Schmidt, R., Bratschitsch, R., Boller, K. J., Fallnich, C. & van Rees, A., 5 Jun 2016, Conference on Lasers and Electro-Optics. San Jose, California, USA: OSA Technical Digest, p. AM3J.5-

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Ultra-wideband supercontinuum generation in Si3N4-based waveguides

van der Slot, P. J. M., Epping, J. P., Hellwig, T., Hoekman, M., Leinse, A., Heideman, R., Mateman, R., van Rees, A., Lee, C. J., Fallnich, C. & Boller, K. J., 19 Jan 2016, p. -.

Research output: Contribution to conferencePoster

Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS

Belsey, N. A., Cant, D. J. H., Minelli, C., Araujo, J. R., Bock, B., Brüner, P., Castner, D. G., Ceccone, C., Counsell, J. D. P., Dietrich, P. M., Engelhard, M. H., Fearn, S., Galhardo, C. E., Kalbe, H., Kim, J. W., Lartundo-Rojas, L., Luftman, H. S., Nunney, T. S., Pseiner, J., Smith, E. F. & 12 others, Spampinato, V., Sturm, J. M., Thomas, A. G., Treacy, J. P. W., Veith, L., Wagstaffe, M., Wang, H., Wang, M., Wang, Y. C., Werner, W., Yang, L. & Shard, A. G., 2016, In : Journal of physical chemistry C. 120, 42, p. 24070-24079

Research output: Contribution to journalArticleAcademicpeer-review

21 Citations (Scopus)

Wavefront correction at Angstom length scales

Wylie- Van Eerd, B., Bayraktar, M., Chopra, A. R., Krijnen, B., Rijnders, A. J. H. M. & Bijkerk, F., 20 Jan 2016, p. -.

Research output: Contribution to conferencePoster

2015

Ab-initio simulated X-ray Absorption Spectroscopy of hexagonal Boron Nitride

Huber, S., van de Kruijs, R. W. E., Bijkerk, F., Gullikson, E. M. & Prendergast, D., 20 Jan 2015, p. -.

Research output: Contribution to conferencePoster

Accurate determination of oxygen diffusion kinetics for thin film ruthenium oxidation

Coloma Ribera, R., 1 Oct 2015, p. -.

Research output: Contribution to conferencePoster

Adaptive multilayer optics for extreme ultraviolet wavelengths

Bayraktar, M., 26 Feb 2015, Enschede: Universiteit Twente. 124 p.

Research output: ThesisPhD Thesis - Research UT, graduation UT

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153 Downloads (Pure)

Analysis of extreme ultraviolet induced surface defect processes

Gao, A., 22 Oct 2015, Enschede: Universiteit Twente. 134 p.

Research output: ThesisPhD Thesis - Research UT, graduation UT

File
907 Downloads (Pure)

Anisotropy of heat conduction in Mo/Si multilayers

Medvedev, V., Yang, J., Schmidt, A. J., Yakshin, A., van de Kruijs, R. W. E., Zoethout, E. & Bijkerk, F., 2015, In : Journal of Applied Physics. 118, 8, p. - 085101.

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Scopus)