A.E.M. Smink - Research output - University of Twente Research Information

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2020
Anomalous Scaling of Parasitic Capacitance in FETs with a High-K Channel Material
Smink, A. E. M., de Jong, M. J., Hilgenkamp, H., Van Der Wiel, W. G. & Schmitz, J., May 2020, 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, 9107901. (IEEE International Conference on Microelectronic Test Structures; vol. 2020).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

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