• 30 Citations
  • 3 h-Index
20142019
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Fingerprint Dive into the research topics where Ahmed Mohammed Youssef Ibrahim is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 14 Similar Profiles
Monitoring Engineering & Materials Science
Aging of materials Engineering & Materials Science
Controllers Engineering & Materials Science
Embedded software Engineering & Materials Science
Costs Engineering & Materials Science
Large scale systems Engineering & Materials Science
Railroad cars Engineering & Materials Science
System-on-chip Engineering & Materials Science

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Research Output 2014 2019

  • 30 Citations
  • 3 h-Index
  • 10 Conference contribution
  • 1 Paper
  • 1 PhD Thesis - Research UT, graduation UT
4 Downloads (Pure)

An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips

Ibrahim, A. M. Y. & Kerkhoff, H. G., 3 Sep 2019, 2019 IEEE International Test Conference in Asia (ITC-Asia). Piscataway, NJ: IEEE, 6 p. 8871531

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
Controllers
Embedded software
Built-in self test
Temperature sensors
System-on-chip

Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks

Ibrahim, A. M. Y., Kerkhoff, H. G., Ibrahim, A., Safar, M. & El-Kharashi, M. W., 23 Apr 2019, IEEE VLSI Test Symposium (VTS): VTS 2019: proceedings: April 23rd - 25th 2019, Monterey, California (USA). Piscataway, NJ: IEEE, p. 1-6 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Monitoring
115 Downloads (Pure)

Test Standards Reuse for Structured and Cost-Efficient Dependability Management of System-on-Chips

Ibrahim, A. M. Y., 18 Apr 2018, Enschede : University of Twente. 293 p.

Research output: ThesisPhD Thesis - Research UT, graduation UTAcademic

Open Access
File
Costs
Large scale systems
Automation
Built-in self test
Testing
2 Citations (Scopus)
2 Downloads (Pure)

A cost-efficient dependability management framework for self-aware system-on-chips based on IEEE 1687

Ibrahim, A. M. Y. & Kerkhoff, H. G., 3 Jul 2017, 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design (IOLTS). IEEE, p. 1-2 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Costs
Actuators
Communication
Sensors
System-on-chip
3 Citations (Scopus)
1 Downloads (Pure)

An automotive MP-SoC featuring an advanced embedded instrument infrastructure for high dependability

Kerkhoff, H. G., Ali, G., Ebrahimi, H. & Ibrahim, A. M. Y., 13 Sep 2017, 2017 International Test Conference in Asia (ITC-Asia). p. 65-70 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Railroad cars
Aging of materials
Health
Monitoring
System-on-chip