Anirudhan Chandrasekaran

Visiting Scholar, XUV Optics

Source: Scopus
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4 Citations
1 h-Index
2 Article
1 Poster

Angular and spectral bandwidth of Extreme UV multilayers near spacer material absorption edges
Zameshin, A., Yakshin, A., Chandrasekaran, A. & Bijkerk, F., 1 Jan 2019, In : Journal of nanoscience and nanotechnology. 19, 1, p. 602-608 7 p.
Research output: Contribution to journal › Article › Academic › peer-review

Open Access
File
187 Downloads (Pure)
Nanoscale Transition Metal Thin Films: Growth Characteristics and Scaling Law for Interlayer Formation
Chandrasekaran, A., van de Kruijs, R. W. E., Sturm, J. M., Zameshin, A. & Bijkerk, F., 11 Dec 2019, In : ACS applied materials & interfaces. 11, 49, p. 46311−46326 16 p.
Research output: Contribution to journal › Article › Academic › peer-review

Open Access
File
4 Citations (Scopus)

34 Downloads (Pure)
Advancing X-ray standing wave data analysis
Makhotkin, I. A., Yakunin, S. N., Hendrikx, C. P., Chandrasekaran, A., van de Kruijs, R. W. E. & Bijkerk, F., 7 Nov 2018.
Research output: Contribution to conference › Poster › Academic

File
27 Downloads (Pure)

1 Invited talk
1 Oral presentation

Metal-on-metal interface formation laws of nanoscale thin films
Anirudhan Chandrasekaran (Speaker), Robbert Wilhelmus Elisabeth van de Kruijs (Contributor), J.M. Sturm (Contributor) & F. Bijkerk (Contributor)
7 Nov 2018
Activity: Talk or presentation › Invited talk
Capabilities of model free X-ray standing wave analysis of periodic multilayer structures
I.A. Makhotkin (Speaker), S.N. Yakunin (Contributor), C.P. Hendrikx (Contributor), A. Chandrasekaran (Contributor), Andrey Zameshin (Contributor), A. Zarkadas (Contributor), M. Gateshki (Contributor), R.W.E. van de Kruijs (Contributor), E. Reuvekamp (Contributor) & F. Bijkerk (Contributor)
22 May 2017
Activity: Talk or presentation › Oral presentation

Angular and spectral bandwidth of Extreme UV multilayers near spacer material absorption edges

Nanoscale Transition Metal Thin Films: Growth Characteristics and Scaling Law for Interlayer Formation

Advancing X-ray standing wave data analysis

Metal-on-metal interface formation laws of nanoscale thin films

Capabilities of model free X-ray standing wave analysis of periodic multilayer structures