Christopher Gerard Zeinstra

drs.

19992019

Research output per year

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Research Output

Mind the Gap: A practical framework for classifiers in a forensic context

Zeinstra, C., Meuwly, D., Veldhuis, R. & Spreeuwers, L., 25 Apr 2019, 2018 IEEE 9th International Conference on Biometrics Theory, Applications and Systems, BTAS 2018. Piscataway, NJ: IEEE, 8698583. (IEEE nternational Conference on Biometrics Theory, Applications and Systems (BTAS); vol. 2018).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
  • 1 Citation (Scopus)
    22 Downloads (Pure)

    FEERCI: A Package for Fast Non-Parametric Confidence Intervals for Equal Error Rates in Amortized O(m log n)

    Haasnoot, E., Khodabakhsh, A., Zeinstra, C., Spreeuwers, L. & Veldhuis, R., 10 Oct 2018, 2018 International Conference of the Biometrics Special Interest Group, BIOSIG 2018. Bromme, A., Uhl, A., Busch, C., Rathgeb, C. & Dantcheva, A. (eds.). Piscataway, NJ: IEEE, 5 p. 8553607. (International Conference of the Biometrics Special Interest Group (BIOSIG); vol. 2018).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    Open Access
    File
  • 34 Downloads (Pure)

    Forensic face recognition as a means to determine strength of evidence: A survey

    Zeinstra, C. G., Meuwly, D., Ruifrok, A. C., Veldhuis, R. N. & Spreeuwers, L. J., 1 Jan 2018, In : Forensic Science Review. 30, 1, p. 21-32 12 p.

    Research output: Contribution to journalReview articleAcademicpeer-review

  • 7 Citations (Scopus)
    43 Downloads (Pure)

    Grid-Based Likelihood Ratio Classifiers for the Comparison of Facial Marks

    Zeinstra, C., Veldhuis, R. & Spreeuwers, L., 1 Jan 2018, In : IEEE transactions on information forensics and security. 13, 1, p. 253-264 12 p., 8017453.

    Research output: Contribution to journalArticleAcademicpeer-review

  • 2 Citations (Scopus)
    1 Downloads (Pure)

    Shallow CNNs for the Reliable Detection of Facial Marks

    Zeinstra, C. & Haasnoot, E., 10 Oct 2018, 2018 International Conference of the Biometrics Special Interest Group, BIOSIG 2018. Bromme, A., Uhl, A., Busch, C., Rathgeb, C. & Dantcheva, A. (eds.). Piscataway, NJ: IEEE, 8553157. (International Conference of the Biometrics Special Interest Group (BIOSIG); vol. 2018).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review