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Cora Salm

dr.ir.

1992 …2019
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Fingerprint Dive into the research topics where Cora Salm is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 7 Similar Profiles
Hot carriers Engineering & Materials Science
recovery Physics & Astronomy
degradation Physics & Astronomy
Recovery Engineering & Materials Science
Metals Chemical Compounds
MEMS Engineering & Materials Science
capacitors Physics & Astronomy
Switches Engineering & Materials Science

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Research Output 1992 2019

2 Downloads (Pure)

Recovery after hot-carrier injection: Slow versus fast traps

de Jong, M. J., Salm, C. & Schmitz, J., 23 Sep 2019, In : Microelectronics reliability. 100-101, 5 p., 113318.

Research output: Contribution to journal › Article › Academic › peer-review

Hot carriers
carrier injection
recovery
traps
Recovery
1 Citation (Scopus)
47 Downloads (Pure)

Towards understanding recovery of hot-carrier induced degradation

de Jong, M. J., Salm, C. & Schmitz, J., 30 Sep 2018, In : Microelectronics reliability. 88-90, p. 147-151 5 p.

Research output: Contribution to journal › Article › Academic › peer-review

Open Access
File
Hot carriers
recovery
degradation
Recovery
Degradation
4 Citations (Scopus)
2 Downloads (Pure)

Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs

de Jong, M. J., Salm, C. & Schmitz, J., Sep 2017, In : Microelectronics reliability. 76-77, p. 136-140 5 p.

Research output: Contribution to journal › Article › Academic › peer-review

Hot carriers
Deuterium
deuterium
Hydrogen
recovery
1 Citation (Scopus)
1 Downloads (Pure)

Process induced poling and plasma induced damage of thin films PZT

Wang, J., Houwman, E. P., Salm, C., Nguyen, D. M., Vergeer, K. & Schmitz, J., 17 Jan 2017, In : Microelectronic engineering. 177, p. 13-18 6 p.

Research output: Contribution to journal › Article › Academic › peer-review

capacitors
Capacitors
damage
Plasmas
Thin films
50 Downloads (Pure)

Humidity and polarity influence on MIM PZT capacitor degradation and breakdown

Wang, J., Salm, C., Houwman, E., Schmitz, J. & Nguyen, M., 9 Oct 2016, 2016 IEEE International Integrated Reliability Workshop (IIRW). IEEE, p. 65-68 4 p.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic

Open Access
File
MIM (semiconductors)
humidity
polarity
capacitors
breakdown

Activities 1992 1995

  • 3 Oral presentation

Initial growth of polycrystalline Si and GeSi alloys in an RTP system

J.B. Rem (Keynote speaker), C. Salm (Keynote speaker), M.H.H. Weusthof (Keynote speaker), J. Holleman (Keynote speaker), J.F. Verweij (Keynote speaker)
17 Apr 1995

Activity: Talk or presentation › Oral presentation

Electrical characterisation of B+ and BF2+ implanted poly-Si and Poly-Ge1Si1-x as gate material for sub-0.25um

Cora Salm (Invited speaker), D.T. van Veen (Invited speaker), J. Holleman (Invited speaker), P.H. Woerlee (Invited speaker)
25 Sep 1995

Activity: Talk or presentation › Oral presentation

Initial oxidation of Si(111)7x7 surface by N2O and O2

Enrico G. Keim (Speaker), Cora Salm (Speaker), Herbert Wormeester (Speaker), D.J. Wentink (Speaker), Arend van Silfhout (Speaker)
12 Oct 1992

Activity: Talk or presentation › Oral presentation