Research output per year
Research output per year
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Dive into the research topics where Cora Salm is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Analysis of short-circuit transients in the LHC main dipole circuit
Liakopoulou, A., Annema, A. J., Bortot, L., Charifoulline, Z., MacIejewski, M., Prioli, M., Ravaioli, E., Salm, C., Schmitz, J. & Verweij, A. P., 19 Jun 2020, In: Journal of physics: Conference series. 1559, 1, 012077.Research output: Contribution to journal › Conference article › Academic › peer-review
Open AccessFile36 Downloads (Pure) -
Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices
De Jong, M. J., Salm, C. & Schmitz, J., 30 Jun 2020, 2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings. IEEE, 9129540. (IEEE International Reliability Physics Symposium Proceedings; vol. 2020-April).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open AccessFile3 Downloads (Pure) -
RFID Tag Failure after Thermal Overstress
Ozturk, E., Dikkers, M. J., Batenburg, K. M., Salm, C. & Schmitz, J., 10 Feb 2020, 2019 IEEE International Integrated Reliability Workshop, IIRW 2019. IEEE, 8989885Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open AccessFile259 Downloads (Pure) -
Analysis of Short-Circuit Transients in the LHC Main Dipole Circuit
Liakopoulou, A., Annema, A. J., Bortot, L., Charifoulline, Z., Maciejewski, M., Prioli, M., Ravaioli, E., Salm, C., Schmitz, J. & Verweij, A. P., 2019. 1 p.Research output: Contribution to conference › Abstract › Academic
Open AccessFile39 Downloads (Pure) -
Recovery after hot-carrier injection: Slow versus fast traps
de Jong, M. J., Salm, C. & Schmitz, J., 23 Sep 2019, In: Microelectronics reliability. 100-101, 5 p., 113318.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile4 Citations (Scopus)43 Downloads (Pure)
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Initial growth of polycrystalline Si and GeSi alloys in an RTP system
J.B. Rem (Keynote speaker), C. Salm (Keynote speaker), M.H.H. Weusthof (Keynote speaker), J. Holleman (Keynote speaker) & J.F. Verweij (Keynote speaker)
17 Apr 1995Activity: Talk or presentation › Oral presentation
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Electrical characterisation of B+ and BF2+ implanted poly-Si and Poly-Ge1Si1-x as gate material for sub-0.25um
Cora Salm (Invited speaker), D.T. van Veen (Invited speaker), J. Holleman (Invited speaker) & P.H. Woerlee (Invited speaker)
25 Sep 1995Activity: Talk or presentation › Oral presentation
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Polycrystalline Germanium Silicon
Cora Salm (Invited speaker)
21 Dec 1995Activity: Talk or presentation › Invited talk
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Polycrystalline Germanium-Silicon, characterization and application
Cora Salm (Invited speaker), J.B. Rem (Invited speaker) & J.H. Klootwijk (Invited speaker)
22 Feb 1995Activity: Talk or presentation › Oral presentation
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Initial oxidation of Si(111)7x7 surface by N2O and O2
Enrico G. Keim (Speaker), Cora Salm (Speaker), Herbert Wormeester (Speaker), D.J. Wentink (Speaker) & Arend van Silfhout (Speaker)
12 Oct 1992Activity: Talk or presentation › Oral presentation