1992 …2018
If you made any changes in Pure these will be visible here soon.

Fingerprint Dive into the research topics where Cora Salm is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 6 Similar Profiles
Hot carriers Engineering & Materials Science
degradation Physics & Astronomy
Metals Chemical Compounds
capacitors Physics & Astronomy
recovery Physics & Astronomy
Silicon Chemical Compounds
MIM (semiconductors) Physics & Astronomy
Passive filters Engineering & Materials Science

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output 1992 2018

22 Downloads (Pure)

Towards understanding recovery of hot-carrier induced degradation

de Jong, M. J., Salm, C. & Schmitz, J., 30 Sep 2018, In : Microelectronics reliability. 88-90, p. 147-151 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Hot carriers
recovery
degradation
Recovery
Degradation
160 Downloads (Pure)

Characterization and reliability studies towards piezoelectrically actuated RF-MEMS switches

Wang, J., 29 Jun 2017, Enschede: University of Twente. 150 p.

Research output: ThesisPhD Thesis - Research UT, graduation UTAcademic

Open Access
File
microelectromechanical systems
switches
breakdown
degradation
capacitors
2 Citations (Scopus)
2 Downloads (Pure)

Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs

de Jong, M. J., Salm, C. & Schmitz, J., Sep 2017, In : Microelectronics reliability. 76-77, p. 136-140 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

Hot carriers
Deuterium
deuterium
Hydrogen
recovery
1 Citation (Scopus)

Process induced poling and plasma induced damage of thin films PZT

Wang, J., Houwman, E. P., Salm, C., Nguyen, D. M., Vergeer, K. & Schmitz, J., 17 Jan 2017, In : Microelectronic engineering. 177, p. 13-18 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

capacitors
Capacitors
damage
Plasmas
Thin films
38 Downloads (Pure)

Humidity and polarity influence on MIM PZT capacitor degradation and breakdown

Wang, J., Salm, C., Houwman, E., Schmitz, J. & Nguyen, M., 9 Oct 2016, 2016 IEEE International Integrated Reliability Workshop (IIRW). IEEE, p. 65-68 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
MIM (semiconductors)
humidity
polarity
capacitors
breakdown

Activities 1992 1995

  • 3 Oral presentation

Initial growth of polycrystalline Si and GeSi alloys in an RTP system

J.B. Rem (Keynote speaker), C. Salm (Keynote speaker), M.H.H. Weusthof (Keynote speaker), J. Holleman (Keynote speaker), J.F. Verweij (Keynote speaker)
17 Apr 1995

Activity: Talk or presentationOral presentation

Electrical characterisation of B+ and BF2+ implanted poly-Si and Poly-Ge1Si1-x as gate material for sub-0.25um

Cora Salm (Invited speaker), D.T. van Veen (Invited speaker), J. Holleman (Invited speaker), P.H. Woerlee (Invited speaker)
25 Sep 1995

Activity: Talk or presentationOral presentation

Initial oxidation of Si(111)7x7 surface by N2O and O2

Enrico G. Keim (Speaker), Cora Salm (Speaker), Herbert Wormeester (Speaker), D.J. Wentink (Speaker), Arend van Silfhout (Speaker)
12 Oct 1992

Activity: Talk or presentationOral presentation