Research Output per year
Fingerprint Dive into the research topics where Cora Salm is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 5 Similar Profiles
Hot carriers
Engineering & Materials Science
degradation
Physics & Astronomy
Metals
Chemical Compounds
capacitors
Physics & Astronomy
recovery
Physics & Astronomy
Silicon
Chemical Compounds
MIM (semiconductors)
Physics & Astronomy
Passive filters
Engineering & Materials Science
Network
Recent external collaboration on country level. Dive into details by clicking on the dots.
Research Output 1992 2018
Towards understanding recovery of hot-carrier induced degradation
de Jong, M. J., Salm, C. & Schmitz, J., 30 Sep 2018, In : Microelectronics reliability. 88-90, p. 147-151 5 p.Research output: Contribution to journal › Article › Academic › peer-review
Open Access
File
Hot carriers
recovery
degradation
Recovery
Degradation
Characterization and reliability studies towards piezoelectrically actuated RF-MEMS switches
Wang, J., 29 Jun 2017, Enschede: University of Twente. 150 p.Research output: Thesis › PhD Thesis - Research UT, graduation UT › Academic
Open Access
File
microelectromechanical systems
switches
breakdown
degradation
capacitors
Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs
de Jong, M. J., Salm, C. & Schmitz, J., Sep 2017, In : Microelectronics reliability. 76-77, p. 136-140 5 p.Research output: Contribution to journal › Article › Academic › peer-review
Hot carriers
Deuterium
deuterium
Hydrogen
recovery
Process induced poling and plasma induced damage of thin films PZT
Wang, J., Houwman, E. P., Salm, C., Nguyen, D. M., Vergeer, K. & Schmitz, J., 17 Jan 2017, In : Microelectronic engineering. 177, p. 13-18 6 p.Research output: Contribution to journal › Article › Academic › peer-review
capacitors
Capacitors
damage
Plasmas
Thin films
Humidity and polarity influence on MIM PZT capacitor degradation and breakdown
Wang, J., Salm, C., Houwman, E., Schmitz, J. & Nguyen, M., 9 Oct 2016, 2016 IEEE International Integrated Reliability Workshop (IIRW). IEEE, p. 65-68 4 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic
Open Access
File
MIM (semiconductors)
humidity
polarity
capacitors
breakdown
Activities 1992 1995
- 3 Oral presentation
Electrical characterisation of B+ and BF2+ implanted poly-Si and Poly-Ge1Si1-x as gate material for sub-0.25um
Cora Salm (Invited speaker), D.T. van Veen (Invited speaker), J. Holleman (Invited speaker), P.H. Woerlee (Invited speaker)25 Sep 1995
Activity: Talk or presentation › Oral presentation
Initial growth of polycrystalline Si and GeSi alloys in an RTP system
J.B. Rem (Keynote speaker), C. Salm (Keynote speaker), M.H.H. Weusthof (Keynote speaker), J. Holleman (Keynote speaker), J.F. Verweij (Keynote speaker)17 Apr 1995
Activity: Talk or presentation › Oral presentation
Initial oxidation of Si(111)7x7 surface by N2O and O2
Enrico G. Keim (Speaker), Cora Salm (Speaker), Herbert Wormeester (Speaker), D.J. Wentink (Speaker), Arend van Silfhout (Speaker)12 Oct 1992
Activity: Talk or presentation › Oral presentation