1992 …2020

Research output per year

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Research Output

2020

RFID Tag Failure after Thermal Overstress

Ozturk, E., Dikkers, M. J., Batenburg, K. M., Salm, C. & Schmitz, J., 10 Feb 2020, 2019 IEEE International Integrated Reliability Workshop, IIRW 2019. IEEE, 8989885

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
9 Downloads (Pure)
2019

Analysis of Short-Circuit Transients in the LHC Main Dipole Circuit

Liakopoulou, A., Annema, A. J., Bortot, L., Charifoulline, Z., Maciejewski, M., Prioli, M., Ravaioli, E., Salm, C., Schmitz, J. & Verweij, A. P., 2019. 1 p.

Research output: Contribution to conferenceAbstract

Open Access
File
15 Downloads (Pure)

Recovery after hot-carrier injection: Slow versus fast traps

de Jong, M. J., Salm, C. & Schmitz, J., 23 Sep 2019, In : Microelectronics reliability. 100-101, 5 p., 113318.

Research output: Contribution to journalArticleAcademicpeer-review

2 Downloads (Pure)
2018

Towards understanding recovery of hot-carrier induced degradation

de Jong, M. J., Salm, C. & Schmitz, J., 30 Sep 2018, In : Microelectronics reliability. 88-90, p. 147-151 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
1 Citation (Scopus)
75 Downloads (Pure)
2017

Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs

de Jong, M. J., Salm, C. & Schmitz, J., Sep 2017, In : Microelectronics reliability. 76-77, p. 136-140 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)
2 Downloads (Pure)

Process induced poling and plasma induced damage of thin films PZT

Wang, J., Houwman, E. P., Salm, C., Nguyen, D. M., Vergeer, K. & Schmitz, J., 17 Jan 2017, In : Microelectronic engineering. 177, p. 13-18 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)
2 Downloads (Pure)
2016

Humidity and polarity influence on MIM PZT capacitor degradation and breakdown

Wang, J., Salm, C., Houwman, E., Schmitz, J. & Nguyen, M., 9 Oct 2016, 2016 IEEE International Integrated Reliability Workshop (IIRW). IEEE, p. 65-68 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
55 Downloads (Pure)

On the small-signal capacitance of RF MEMS switches at very low frequencies

Wang, J., Bielen, J., Salm, C., Krijnen, G. & Schmitz, J., 24 Aug 2016, In : Journal of the Electron Devices Society. 4, 6, p. 459-465 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
4 Citations (Scopus)
91 Downloads (Pure)

Spring-constant measurement methods for RF-MEMS capacitive switches

Wang, J., Bielen, J., Salm, C. & Schmitz, J., 28 Mar 2016, 2016 International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, p. 10-14 5 p. (International Conference on Microelectronic Test Structures (ICMTS); vol. 2016).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
9 Downloads (Pure)
2013

Comparison of C-V measurement methods for RF-MEMS capacitive switches

Wang, J., Salm, C. & Schmitz, J., 26 Mar 2013, IEEE International Conference on Microelectronic Test Structures, ICMTS 2013. USA: IEEE Electron Devices Society, p. 53-58 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Deep reactive ion etching of in situ boron doped LPCVD Ge0.7Si0.3 using SF6 and O2 plasma

Kazmi, S. N. R., Salm, C. & Schmitz, J., Oct 2013, In : Microelectronic engineering. 110, p. 311-314 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

Mechanical resonators on CMOS for integrated passive band pass filters

Kazmi, S. N. R., Salm, C. & Schmitz, J., 23 Jul 2013, ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day'. p. 193-196 4 p. 6523517. (ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day').

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

The gridpix detector: History and perspective

van der Graaf, H., Aarnink, A. A. I., Aarts, A., van Bakel, N., Berbee, E., Berkien, A., van Beuzekom, M., Bosma, M., Campbell, M., Chefdeville, M. A., Colas, P., Colijn, A. P., Fomaini, A., Fransen, M., Giganon, A., Giomataris, I., Gotink, W., de Groot, N., Hartjes, F., van der Heijden, B. & 18 others, Hessey, N., Jansweijer, P., Konig, A., Koppert, W., Llopart, X., de Nooij, L., van der Putten, S., Rövekamp, J., Salm, C., San Segundo Bello, D., Schmitz, J., Smits, S. M., Timmermans, J., Verkooijen, H., Visschers, J., Visser, J., Wijnen, T. & Wyrsch, N., 24 Apr 2013, In : Modern physics letters. A. 28, 28-13, p. 13400211-13400217 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)
2012

CMOS-MEMS Post Processing Compatible Capacitively Transduced GeSi Resonators

Kazmi, S. N. R., Aarnink, A. A. I., Salm, C. & Schmitz, J., 25 Jul 2012, Proceedings of 2012 IEEE International Frequency Control Symposium (IFCS). USA: IEEE Electron Devices Society, p. 1-4 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Low-Stress Highly-Conductive In-Situ Boron Doped Ge0.7Si0.3 Films by LPCVD

Kazmi, S. N. R., Kovalgin, A. Y., Aarnink, A. A. I., Salm, C. & Schmitz, J., 29 Aug 2012, In : ECS journal of solid state science and technology. 1, 5, p. P222-P226 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)

On the degradation of field-plate assisted RESURF power devices

Boksteen, B. K., Dhar, S., Ferrara, A., Heringa, A., Hueting, R. J. E., Koops, G. E. J., Salm, C. & Schmitz, J., 10 Dec 2012, IEEE International Electron Devices Meeting, IEDM 2012. San Francisco - USA: IEEE International Electron Device Meeting, p. 311-314 4 p. (Technical Digest).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)
2011

Low Stress In Situ Boron Doped Poly SiGe Layers for MEMS Modular Integration with CMOS

Kazmi, S. N. R., Aarnink, A. A. I., Kovalgin, A. Y., Salm, C. & Schmitz, J., 1 May 2011, In : ECS transactions. 35, 30, p. 45-52 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)

Spark protection layers for CMOS pixel anode chips in MPGDs

Bilevych, Y., Bilevych, Y., Blanco Carballo, V. M., Chefdeville, M. A., Colas, P., Delagnes, E., Fransen, M., van der Graaff, H., Koppert, W. J. C., Melai, J., Salm, C., Schmitz, J., Timmermans, J., Timmermans, J. & Wyrsch, N., 11 Feb 2011, In : Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment. 629, 1, p. 66-73 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

20 Citations (Scopus)
2010

Adapting to a changing highschool population

Salm, C., Eijkel, J. C. T., van der Heijden, F. & Odijk, M., 10 May 2010, Proceedings of 8th European Workshop on Microelectronics Education, EWME 2010. Darmstadt, Germany: Technische Universitaet Darmstadt, p. 180-184 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
24 Downloads (Pure)

An Initial study on The Reliability of Power Semiconductor Devices

Boksteen, B. K., Hueting, R. J. E., Salm, C. & Schmitz, J., 18 Nov 2010, Proceedings of STW.ICT Conference 2010. Utrecht: STW, p. 68-72 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

File
133 Downloads (Pure)

An integrated micromegas UV-photon detector

Melai, J., Lyashenko, A., Breskin, A., van der Graaf, H., Timmermans, J., Timmermans, J., Visschers, J., Salm, C. & Schmitz, J., 8 Jul 2010, In : Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment. 633, p. 194-197 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)

A UV sensitive integrated micromegas with timepix readout

Melai, J., Breskin, A., Cortesi, M., Bilevych, Y., Bilevych, Y., Fransen, M., van der Graaf, H., Visschers, J., Blanco Carballo, V. M., Salm, C. & Schmitz, J., 6 Jul 2010, In : Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment. 628, p. 133-137 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Scopus)

Effect of current crowding on electromigration lifetime investigated by simulation and experiment

Nguyen, V. H. & Salm, C., 11 May 2010, In : Computational materials science. 49, 4-Suppl.1, p. S235-S238 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Scopus)

Fabrication and characterization of the charge-plasma diode

Rajasekharan, B., Hueting, R. J. E., Salm, C., van Hemert, T., Wolters, R. A. M. & Schmitz, J., 1 Jun 2010, In : IEEE electron device letters. 31, 6, p. 528-530 3 p., 10.1109/LED.2010.2045731.

Research output: Contribution to journalArticleAcademicpeer-review

File
129 Citations (Scopus)
189 Downloads (Pure)

Low Stressed In-situ Boron doped Poly SiGe Layers for High-Q Resonators

Kazmi, S. N. R., Rangarajan, B., Aarnink, A. A. I., Salm, C. & Schmitz, J., 18 Nov 2010, Proceedings of the STW.ICT Conference 2010. Utrecht: STW, p. 109-113 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

File
79 Downloads (Pure)

Low temperature silicidation of Pd layers on crystalline silicon monitored via in situ resistance measurements

Faber, E. J., Wolters, R. A. M., Rajasekharan, B., Salm, C. & Schmitz, J., 29 Nov 2010, Advanced Metallization Conference 2009: proceedings of the conference held September 13-15, 2009, Baltimore, Maryland, U.S.A. Edelstein, D. C. & Schulz, S. E. (eds.). Materials Research Society, p. 133-140 8 p. (Materials Research Society conference proceedings; vol. 25).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
5 Citations (Scopus)
9 Downloads (Pure)

On the modelling and optimisation of a novel Schottky based silicon rectifier

van Hemert, T., Hueting, R. J. E., Rajasekharan, B., Salm, C. & Schmitz, J., 13 Sep 2010, Proceedings of the 40th European Solid-State Device Research, Essderc 2010. USA: IEEE Solid-State Circuits Society, p. 460-463 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
7 Citations (Scopus)
94 Downloads (Pure)

Suspended membranes, cantilevers and beams using SU-8 foils

Melai, J., Blanco Carballo, V. M., Salm, C. & Schmitz, J., 26 Feb 2010, In : Microelectronic engineering. 87, 5-8, p. 1274-1277 4 p., 10.1016/j.mee.2009.10.035.

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)
2009

GEMGrid: a wafer post-processed GEM-like radiation detector

Blanco Carballo, V. M., Bilevych, Y., Bilevych, Y., Chefdeville, M. A., Fransen, M., van der Graaf, H., Salm, C., Schmitz, J., Timmermans, J. & Timmermans, J., 18 Jun 2009, In : Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment. 608, 1, p. 86-91 6 p., 10.1016/j.nima.2009.06.023.

Research output: Contribution to journalArticleAcademicpeer-review

6 Citations (Scopus)

Materials selection for low temperature processed high Q resonators using ashby approach

Kazmi, S. N. R., Salm, C. & Schmitz, J., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: STW, p. 81-84 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Metal contacts to lowly doped Si and ultra thin SOI

Rajasekharan, B., Salm, C., Wolters, R. A. M., Aarnink, A. A. I., Boogaard, A. & Schmitz, J., 18 Jan 2009, Proceedings of Fifth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits. Gotheburg, Sweden: Chalmers University of Technology, p. 29-30 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
152 Downloads (Pure)

Metal contacts to lowly doped Si and ultra thin SOI

Rajasekharan, B., Salm, C., Hueting, R. J. E., Wolters, R. A. M. & Schmitz, J., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: STW, p. 103-104 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Moisture resistance of SU-8 and KMPR as structural material

Blanco Carballo, V. M., Melai, J., Salm, C. & Schmitz, J., 2009, In : Microelectronic engineering. 86, 4-6, p. 765-768 4 p., 10.1016/j.mee.2008.12.076.

Research output: Contribution to journalArticleAcademicpeer-review

20 Citations (Scopus)

Monitoring silicide formation via in situ resistance measurements

Faber, E. J., Wolters, R. A. M., Rajasekharan, B., Salm, C. & Schmitz, J., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: STW, p. 67-70 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Photocathodes for a post-processed imaging array

Melai, J., Lyashenko, A., Breskin, A., van der Graaf, H., Timmermans, J., Timmermans, J., Visschers, J., Salm, C. & Schmitz, J., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: STW, p. 32-35 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

File
16 Downloads (Pure)

Qualitative and quantitative characterization of outgassing from SU-8

Melai, J., Salm, C., Wolters, R. A. M. & Schmitz, J., 1 Mar 2009, In : Microelectronic engineering. 86, 4-6, p. 761-764 4 p., 10.1016/j.mee.2008.11.008.

Research output: Contribution to journalArticleAcademicpeer-review

10 Citations (Scopus)

The electrical conduction and dielectric strength of SU-8

Melai, J., Salm, C., Smits, S. M., Visschers, J. & Schmitz, J., 25 May 2009, In : Journal of micromechanics and microengineering. 19, 6, p. 065012-065018 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

30 Citations (Scopus)

Twingrid: a wafer post-processed multistage micro patterned gaseous detector

Bilevych, Y., Bilevych, Y., Blanco Carballo, V. M., Chefdeville, M. A., Fransen, M., van der Graaf, H., Salm, C., Schmitz, J., Timmermans, J. & Timmermans, J., 11 Nov 2009, In : Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment. 610, 3, p. 644-648 5 p., 10.1016/j.nima.2009.09.054.

Research output: Contribution to journalArticleAcademicpeer-review

10 Citations (Scopus)
2008

A Radiation Imaging Detector Made by Postprocessing a Standard CMOS Chip

Blanco Carballo, V. M., Chefdeville, M. A., Fransen, M., van der Graaf, H., Melai, J., Salm, C., Schmitz, J., Timmermans, J. & Timmermans, J., 20 May 2008, In : IEEE electron device letters. 29, DTR08-9/6, p. 585-588 4 p., 10.1109/LED.2008.925649.

Research output: Contribution to journalArticleAcademicpeer-review

File
24 Citations (Scopus)
183 Downloads (Pure)

Charge plasma diode - a novel device concept

Rajasekharan, B., Hueting, R. J. E., Salm, C., Hoang, T. & Schmitz, J., 27 Nov 2008, Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008). Utrecht, The Netherlands: STW, p. 576-579 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Dimensional scaling effects on transport properties of ultrathin body p-i-n diodes

Rajasekharan, B., Salm, C., Hueting, R. J. E., Hoang, T. & Schmitz, J., 13 Mar 2008, Proceedings of the 9th Conference on ULtimate Integration on Silicon. Piscataway: IEEE Computer Society Press, p. 195-198 4 p. 10.1109/ULIS.2008.4527172. (Electron Device Society; no. DTR08-9).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
13 Citations (Scopus)
68 Downloads (Pure)

Further outgassing studies on SU-8

Melai, J., Blanco Carballo, V. M., Salm, C., Wolters, R. A. M. & Schmitz, J., 27 Nov 2008, Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008). Utrecht, The Netherlands: STW, p. 491-494 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Moisture resistance of SU-8 and KMPR as structural material for integrated gaseous detectors

Blanco Carballo, V. M., Melai, J., Salm, C. & Schmitz, J., 27 Nov 2008, Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008). Utrecht, The Netherlands: STW, p. 395-398 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
271 Downloads (Pure)

On the switching speed of SOI LEDs

Schmitz, J., de Vries, R., Salm, C., Hoang, T., Hueting, R. J. E. & Holleman, J., 23 Jan 2008, Proceedings of the Fourth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits. Cork, Ireland: Tyndall National Institute, p. 101-102 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
1 Downloads (Pure)

Preparation of metal-SAM-dendrimer-SAM-metal junctions by supramolecular metal transfer printing

Nijhuis, C. A., ter Maat, J., Bisri, S. Z., Weusthof, M. H. H., Salm, C., Schmitz, J., Ravoo, B. J., Huskens, J. & Reinhoudt, D., 8 Jan 2008, In : New journal of chemistry. 32, p. 652-661 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

10 Citations (Scopus)

Pulse height fluctuations of integrated micromegas detectors

Chefdeville, M. A., van der Graaf, H., Hartjes, F., Timmermans, J., Timmermans, J., Visschers, J., Blanco Carballo, V. M., Salm, C., Schmitz, J., Smits, S. M., Colas, P. & Giomataris, I., 21 Mar 2008, In : Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment. 591, 4952/1, p. 147-150 4 p., 10.1016/j.nima.2008.03.045.

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)

Reliability aspects of a radiation detector fabricated by post-processing a standard CMOS chip

Salm, C., Blanco Carballo, V. M., Melai, J. & Schmitz, J., 10 Aug 2008, In : Microelectronics reliability. 48, WoTUG-31/8-9, p. 1139-1143 4 p., 10.1016/j.microrel.2008.06.038.

Research output: Contribution to journalArticleAcademicpeer-review

8 Citations (Scopus)

The charge plasma P-N diode

Hueting, R. J. E., Rajasekharan, B., Salm, C. & Schmitz, J., 1 Dec 2008, In : IEEE electron device letters. 29, 412/12, p. 1367-1369 3 p., 10.1109/LED.2008.2006864.

Research output: Contribution to journalArticleAcademicpeer-review

File
154 Citations (Scopus)
271 Downloads (Pure)
2007

Charge amplitude distribution of the Gossip gaseous pixel detector

Blanco Carballo, V. M., Chefdeville, M. A., Colas, P., Giomataris, Y., van der Graaf, H., Gromov, V., Hartjes, F., Kluit, R., Koffeman, E., Salm, C., Schmitz, J., Smits, S. M., Timmermans, J., Timmermans, J. & Visschers, J. L., 11 Dec 2007, In : Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment. Volume 583, 1/issue 1, p. 42-48 7 p., 10.1016/j.nima.2007.08.199.

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Scopus)

Considerations on using SU-8 as a construction material for high aspect ratio structures

Melai, J., Salm, C., Smits, S. M., Blanco Carballo, V. M., Schmitz, J. & Hageluken, B., 29 Nov 2007, 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE). Utrecht, The Netherlands: STW, p. 529-534 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
75 Downloads (Pure)