1992 …2020

Research output per year

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Research Output

2007

Charge amplitude distribution of the Gossip gaseous pixel detector

Blanco Carballo, V. M., Chefdeville, M. A., Colas, P., Giomataris, Y., van der Graaf, H., Gromov, V., Hartjes, F., Kluit, R., Koffeman, E., Salm, C., Schmitz, J., Smits, S. M., Timmermans, J., Timmermans, J. & Visschers, J. L., 11 Dec 2007, In : Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment. Volume 583, 1/issue 1, p. 42-48 7 p., 10.1016/j.nima.2007.08.199.

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Scopus)

Considerations on using SU-8 as a construction material for high aspect ratio structures

Melai, J., Salm, C., Smits, S. M., Blanco Carballo, V. M., Schmitz, J. & Hageluken, B., 29 Nov 2007, 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE). Utrecht, The Netherlands: STW, p. 529-534 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
75 Downloads (Pure)

Dimensional scaling effects on transport properties of p-i-n diodes

Rajasekharan, B., Salm, C., Hueting, R. J. E., Hoang, T., van der Wiel, W. G. & Schmitz, J., 29 Nov 2007, 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE). Utrecht, The Netherlands: STW, p. 457-459 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Low-frequency noise in hot-carrier degraded nMOSFETs

Salm, C., Hoekstra, E., Kolhatkar, J. S., Hof, A. J., Wallinga, H. & Schmitz, J., Apr 2007, In : Microelectronics reliability. 47, 4-5, p. 577-580 4 p.

Research output: Contribution to journalConference articleAcademicpeer-review

2 Citations (Scopus)

Low-frequency noise phenomena in switched MOSFETs

van der Wel, A. P., Klumperink, E. A. M., Kolhatkar, J. S., Hoekstra, E., Snoeij, M. F., Salm, C., Wallinga, H. & Nauta, B., 2007, In : IEEE journal of solid-state circuits. 42, 3, p. 540-550 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
49 Citations (Scopus)
111 Downloads (Pure)

On the geometrical design of integrated micromegas detectors

Blanco Carballo, V. M., Salm, C., Smits, S. M., Schmitz, J., Chefdeville, M. A., van der Graaf, H., Timmermans, J., Timmermans, J. & Visschers, J. L., 17 Jun 2007, In : Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment. 576, 2/1, p. 1-4 4 p., 10.1016/j.nima.2007.01.108.

Research output: Contribution to journalArticleAcademicpeer-review

11 Citations (Scopus)

Results from MPGDs with a protected TimePix or Medipix-2 pixel sensor as active anode

Bosma, M., Blanco Carballo, V. M., Bylevich, Y., Chefdeville, M., Fransen, M., Van Der Graaf, H., Hartjes, F., Melai, J., Salm, C., Schmitz, J., Timmermans, J., Visschers, J. L. & Wyrsch, N., 1 Dec 2007, 2007 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS-MIC. Vol. 6. 1 p. 4437141

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Technological aspects of gaseous pixel detectors fabrication

Blanco Carballo, V. M., Salm, C., Smits, S. M., Schmitz, J., Melai, J., Chefdeville, M. A. & van der Graaf, H., 29 Nov 2007, 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE). Utrecht, The Netherlands: STW, p. 501-503 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Downloads (Pure)
2006

A miniaturized multiwire proportional chamber using CMOS wafer scale post-processing

Blanco Carballo, V. M., Chefdeville, M. A., van der Graaf, H., Salm, C., Aarnink, A. A. I., Smits, S. M., Altpeter, D. M., Timmermans, J., Timmermans, J., Visschers, J. L. & Schmitz, J., 7 Jul 2006, Proceedings of 32nd European Solid State Device Research Conference. IEEE Computer Society Press, p. 129-132 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

An integrated gaseous detector using microfabrication post-processing technology

Blanco Carballo, V. M., Salm, C., Smits, S. M., Schmitz, J., Chefdeville, M. A., van der Graaf, H., Timmermans, J., Timmermans, J. & Visschers, J. L., 23 Nov 2006, Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006. Utrecht, The Netherlands: STW, p. 369-372 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

An integrated single photon detector array using porous anodic alumina

Melai, J., Salm, C., Schmitz, J., Smits, S. & Visschers, J., 2 Jun 2006. 1 p.

Research output: Contribution to conferenceAbstract

Open Access
File

An integrated single photon detector array using porous anodic alumina

Melai, J., Salm, C., Schmitz, J., Smits, S. & Visschers, J., 27 Nov 2006, Proceedings 9th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2006. Utrecht, The Netherlands: STW, p. 389-393 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Discharge Protection and Ageing of Micromegas Pixel Detectors

Aarts, A. A., Blanco Carballo, V. M., Chefdeville, M. A., Colas, P., Dunand, S., Fransen, M., van der Graaf, H., Giomataris, Y., Hartjes, F., Koffeman, G., Melai, J., Peek, H., Riegler, W., Salm, C., Schmitz, J., Smits, S. M., Timmermans, J., Timmermans, J., Visschers, J. L. & Wyrsch, N., 29 Oct 2006, 2006 IEEE Nuclear Science Symposium Conference Record. San Diego, CA, USA: IEEE Nuclear & Plasma Sciences Society, p. 3865-3869 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Low-Frequency noise in hot-carrier degraded MOSFETs

Salm, C., Hoekstra, E., Kolhatkar, J. S., Hof, A. J., Wallinga, H. & Schmitz, J., 26 Jun 2006, 14th Workshop on Dielectrics in Microelectronics, WODIM 2006. Koninklijke Nederlandse Academie van Wetenschappen, p. 64-65 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Reduced temperature dependence of hot carrier degradation in deuterated nMOSFETs

Salm, C., Hof, A. J., Kuper, F. G. & Schmitz, J., Nov 2006, In : Microelectronics reliability. 46, 2/9-11, p. 1617-1622 6 p., 10.1016/j.microrel.2006.08.004.

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)
2005

A 3-D circuit model to evaluate CDM performance of Ics

Sowariraj, M. S. B., de Jong, P. C., Salm, C., Mouthaan, A. J. & Kuper, F. G., 1 Nov 2005, In : Microelectronics reliability. 45, 9-11, p. 1425-1429 5 p., 10.1016/j.microrel.2005.07.066.

Research output: Contribution to journalArticleAcademicpeer-review

An electron-multiplying 'Micromegas' grid made in silicon wafer post-processing technology

Chefdeville, M. A., Colas, P., Giomataris, Y., van der Graaf, H., Heijne, E. H. M., van der Putten, S., Salm, C., Schmitz, J., Smits, S. M., Timmermans, J. & Visschers, J. L., Nov 2005, Proceedings 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Netherlands: STW, p. 139-142 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
51 Downloads (Pure)

An electron-multiplying ''Micromegas'' grid made in silicon wafer post-processing technology

Chefdeville, M. A., Colas, P., Giomataris, Y., van der Graaf, H., Heijne, E. H. M., van der Putten, S., Salm, C., Schmitz, J., Smits, S., Timmermans, J., Timmermans, J. & Visschers, J. L., 3 Dec 2005, In : Nuclear instruments & methods in physics research. Section A : Accelerators, spectrometers, detectors and associated equipment. 556, 2, p. 490-494 5 p., 10.1016/j.nima.2005.11.065.

Research output: Contribution to journalArticleAcademicpeer-review

71 Citations (Scopus)

Constant and switched bias low frequency noise in p-MOSFETs with varying gate oxide thickness

Kolhatkar, J. S., Salm, C., Knitel, M. J. & Wallinga, H., 17 Oct 2005, Proceedings of the 32nd European Solid-State Device Research Conference. Kovalguine, A. (ed.). Piscataway: IEEE Computer Society, p. 83-86 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
8 Citations (Scopus)
40 Downloads (Pure)

Impact of hot-carrier degradation on the Low-Frequency Noise in MOSFETs under steady-state and periodic Large-Signal Excitation

Kolhatkar, J., Hoekstra, E., Hof, A., Salm, C., Schmitz, J. & Wallinga, H., 1 Oct 2005, In : IEEE electron device letters. 26, 10, p. 764-766 3 p.

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Scopus)

Reduction of 1/f Noise by Switched Biasing: an Overview

Klumperink, E., van der Wel, A., Kolhatkar, J., Hoekstra, E., Salm, C., Wallinga, H. & Nauta, B., Nov 2005, 16th Workshop on Circuits, Systems and Signal Processing, ProRISC 2005. Utrecht: STW, p. 307-315 9 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
289 Downloads (Pure)

Significance of including substrate capacitance in the full chip circuit model of ICs under CDM stress

Sowariraj, M. S. B., de Jong, P. C., Salm, C., Smedes, T., Mouthaan, A. J. & Kuper, F. G., Apr 2005, 2005 IEEE International Reliability Physics Symposium proceedings: 43rd annual : San Jose, California, April 17-21, 2005. Piscataway, NJ: IEEE Computer Society, p. 608-609 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)
9 Downloads (Pure)

Strategies to cope with plasma charging damage in design and layout phases

Wang, Z., Ackaert, J., Scarpa, A., Salm, C., Kuper, F. G. & Vugts, M., 6 Sep 2005, IEEE International Conference in Integrated Circuit and Technology (ICICDT). Piscataway: IEEE, p. 91-98 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
10 Citations (Scopus)
723 Downloads (Pure)
2004

Effect of thermal gradients on the electromigration lifetime in power electronics

Nguyen, H. V., Salm, C., Krabbenborg, B. H., Weide-Zaage, K., Bisschop, J., Mouthaan, A. J. & Kuper, F. G., 26 Jul 2004, 2004 IEEE International Reliability Physics Symposium proceedings: 42nd Annual : Phoenix, Arizona, April 25-29, 2004 . Piscataway, NJ: IEEE, p. 619-620 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

9 Citations (Scopus)
10 Downloads (Pure)

Fast thermal cycling-enhanced electromigration in power metallization

Nguyen, V. H., Salm, C., Krabbenborg, B. H., Krabbenborg, B. H., Bisschop, J., Mouthaan, A. J. & Kuper, F. G., Jun 2004, In : IEEE transactions on device and materials reliability. 4, 2, p. 246-255 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

File
10 Citations (Scopus)
224 Downloads (Pure)

Full chip model of CMOS Integrated Circuits under Charged Device Model stress

Sowariraj, M. S. B., Salm, C., Smedes, T., Mouthaan, A. J. & Kuper, F. G., 2004, p. 801-807.

Research output: Contribution to conferencePaper

File
377 Downloads (Pure)

Investigating Hot-Carrier Degradation in MOSFETs using Constant and Switched Biased Low-Frequency Noise measurements

Kolhatkar, J. S., Hoekstra, E., Hof, A. J., Salm, C., Wallinga, H. & Schmitz, J., 25 Nov 2004, Proceedings SAFE & ProRISC 2004. Utrecht: STW, p. 700-703 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
19 Downloads (Pure)

Modeling of RTS Noise in MOSFETs under Steady-State and Large-Signal Excitation

Kolhatkar, J. S., Hoekstra, E., Salm, C., van der Wel, A. P., Klumperink, E. A. M., Schmitz, J. & Wallinga, H., Dec 2004, IEEE International Electron Devices Meeting (IEDM 2004). Piscataway, NJ, USA: IEEE, p. 759-762 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
18 Citations (Scopus)
16 Downloads (Pure)

Plasma-charging damage of floating MIM capacitors

Wang, Z., Ackaert, J., Salm, C., Kuper, F. G., Tack, M., de Backer, E., Coppens, P., De Schepper, L. & Vlachakis, B., 1 Jun 2004, In : IEEE transactions on electron devices. 51, 6, p. 1017-1024 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

File
17 Citations (Scopus)
324 Downloads (Pure)

Plasma charging damage reduction in IC processing by a self-balancing interconnect

Wang, Z., Ackaert, J., Salm, C., Kuper, F. G. & De Backer, E., 4 Oct 2004, In : Microelectronics reliability. 44, 9-11, p. 1503-1507 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
360 Downloads (Pure)

Separation of random telegraph sSignals from 1/f noise in MOSFETs under constant and switched bias conditions

Kolhatkar, J. S., Vandamme, L. K. J., Salm, C. & Wallinga, H., 7 Jan 2004, 33rd Conference on European Solid-State Device Research 2003 (ESSDERC). Piscataway: IEEE, p. 549-552 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
14 Citations (Scopus)
185 Downloads (Pure)
2003

A reliability model for interlayer dielectric cracking during fast thermal cycling

Nguyen, V. H., Salm, C., Krabbenborg, B. H., Krabbenborg, B. H., Bisschop, J., Mouthaan, A. J. & Kuper, F. G., 21 Oct 2003, Advanced Metallization Conference (AMC 2003). Ray, G. W., Smy, T., Ohta, T. & Tsujimura, M. (eds.). Warrendale, PA: Materials Research Society, p. 295-299 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
5 Citations (Scopus)
92 Downloads (Pure)

A Reliability Model for interlayer dielectrics cracking during very fast thermal cycling

Nguyen, V. H., Salm, C., Krabbenborg, B. H., Bisschop, J., Mouthaan, A. J. & Kuper, F. G., 21 Oct 2003, Proceedings of Advanced Metallization Conference AMC 2003. p. -

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Electrothermomigration-induced failure in power IC metallization

Nguyen, V. H., Salm, C., Krabbenborg, B. H., Krabbenborg, B. H., Bisschop, J., Mouthaan, A. J. & Kuper, F. G., Nov 2003, Proceedings of the 6th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2003. Utrecht, The Netherlands: STW, p. 622-630 9 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Electro-thermomogration-induced in power IC metallization

Nguyen, V. H., Salm, C., Vroemen, J., Krabbenborg, B. H., Bisschop, J., Mouthaan, A. J. & Kuper, F. G., 16 Dec 2003, p. -.

Research output: Contribution to conferencePoster

Measurement and extraction of RTS parameters under 'Switched Biased' conditions in MOSFETS

Kolhatkar, J. S., van der Wel, A. P., Klumperink, E. A. M., Salm, C., Nauta, B. & Wallinga, H., Aug 2003, 17th International Conference on Noise and Fluctuations. BRNO , Czech Republic: Czech Noise Research Laboratory (CNRL), p. 237-240 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
68 Downloads (Pure)

"Plasma charging damage induced by a power ramp down step in the end of plasma enhanced chemical vapour deposition (PECVD) process

Wang, Z., Ackaert, J., Salm, C., Kuper, F. G., Bessemans, K. & de Backer, E., 25 Nov 2003, p. 766-770. 5 p.

Research output: Contribution to conferencePaper

Plasma Charging Damage Induced by a Power Ramp Down Step in the end of Plasma Enhanced Chemical Vapour Deposition (PECVD) Process

Wang, Z., Ackaert, J. G. G., Salm, C., Kuper, F. G., Bessemans, K. & De Backer, E., 25 Nov 2003, Proceedings of Semiconductor Advances for Future Electronics SAFE 2003. p. 766-770 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Random Telegraph Signals, monitoring single electron jumps

Kolhatkar, J. S. & Salm, C., 2 Oct 2003, p. -.

Research output: Contribution to conferencePoster

Role of package parasitics and substrate resistance on the Charged Device Model (CDM) failure levels - An explantion and die protection strategy

Sowariraj, M. S. B., Smedes, T., Salm, C., Mouthaan, A. J. & Kuper, F. G., 1 Sep 2003, In : Microelectronics reliability. 43, 9-11, p. 1569-1575 7 p., 10.1016/S0026-2714(03)00276-2.

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)

Separation of random telegraph signals from 1/f noise in MOSFETs

Kolhatkar, J. S., Salm, C. & Wallinga, H., 25 Nov 2003, Proceedings of the 6th annual workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2003. Utrecht, The Netherlands: STW, p. 614-617 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Structural and optical characterization of porous anodic aluminium oxide

Galca, A. C., Kooij, E. S., Wormeester, H., Salm, C., Leca, V., Rector, J. H. & Poelsema, B., 1 Oct 2003, In : Journal of Applied Physics. 94, 7, p. 4296-4305 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

54 Citations (Scopus)

Study on the influence of package parasitics and substrate resistance on the Charged Device Model(CDM) failure levels - possible protection methodology

Sowariraj, M. S. B., Smedes, T., Salm, C., Mouthaan, A. J. & Kuper, F. G., 25 Nov 2003, Proceedings of the 6th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2003. Utrecht, The Netherlands: STW, p. 657-662 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

2002

Analysis of 'Switched Biased' Random Telegraph Signals in MOSFETs

Kolhatkar, J., Salm, C. & Wallinga, H., 27 Nov 2002, Proceedings of 5th Annual Workshop on Semiconductors Advances for Future Electronics SAFE 2002. Utrecht, The Netherlands: STW, p. 42-45 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Correlation between hot carrier stress, oxide breakdown and gate leakage current for monitoring plasma processing induced damage on gate oxide

Ackaert, J., Wang, Z., de Backer, E. & Salm, C., 10 Dec 2002, p. 45-48. 4 p.

Research output: Contribution to conferencePaper

File
8 Citations (Scopus)
41 Downloads (Pure)

Correlation between hot carrier stress, oxide breakdown and gate leakage current for monitoring plasma processing induced damage on gate oxide

Wang, Z., Ackaert, J., Salm, C., de Backer, E., van den Bosch, G. & Zawalski, W., 7 Nov 2002, 9th International Symposium on Physics and Failure Analysis 2002. Piscataway, NJ: IEEE, p. 242-245 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

44 Downloads (Pure)

Correlation between Hot Carrier Stress, Oxide Breakdown and Gate Leakage Current for Monitoring Plasma Processing Induced Damage on Gate Oxide

Ackaert, J. G. G., Wang, Z., Backer, E. & Salm, C., 6 Jun 2002, Proceedings of 7th International symposium of Plasma Process-Induced Damage. Santa Clara, California: American Vacuum Society, p. 45-48 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Fast temperature cycling and electromigration induced thin film cracking multilevel interconnection: experiments and modeling

Nguyen, V. H., Nguyen, H., Salm, C., Vroemen, J., Voets, J., Krabbenborg, B. H., Bisschop, J., Mouthaan, A. J. & Kuper, F. G., 9 Nov 2002, In : Microelectronics reliability. 42, 9-11, p. 1415-1420 6 p., 10.1016/S0026-2714(02)00161-0.

Research output: Contribution to journalArticleAcademicpeer-review

21 Citations (Scopus)

Fast temperature cycling and electromigration induced thin film cracking multilevel interconnection: experiments and modelling

Nguyen, V. H., Salm, C., Vroemen, J., Voets, J., Krabbenborg, B. H., Bisschop, J., Mouthaan, A. J. & Kuper, F. G., 2002, In : Microelectronics reliability. 42, p. 1415-1420 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

Fast temperature cycling and electromigration induced thin film cracking multilevel interconnection: experiments and modelling

Nguyen, V. H., Salm, C., Vroemen, J., Voets, J., Krabbenborg, B. H., Bisschop, J., Mouthaan, A. J. & Kuper, F. G., 2002, Proceedings ESREF 2002. p. 1415-1420 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review