1992 …2020

Research output per year

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Research Output

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2020

RFID Tag Failure after Thermal Overstress

Ozturk, E., Dikkers, M. J., Batenburg, K. M., Salm, C. & Schmitz, J., 10 Feb 2020, 2019 IEEE International Integrated Reliability Workshop, IIRW 2019. IEEE, 8989885

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
9 Downloads (Pure)
2016

Humidity and polarity influence on MIM PZT capacitor degradation and breakdown

Wang, J., Salm, C., Houwman, E., Schmitz, J. & Nguyen, M., 9 Oct 2016, 2016 IEEE International Integrated Reliability Workshop (IIRW). IEEE, p. 65-68 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
55 Downloads (Pure)

Spring-constant measurement methods for RF-MEMS capacitive switches

Wang, J., Bielen, J., Salm, C. & Schmitz, J., 28 Mar 2016, 2016 International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, p. 10-14 5 p. (International Conference on Microelectronic Test Structures (ICMTS); vol. 2016).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
9 Downloads (Pure)
2013

Comparison of C-V measurement methods for RF-MEMS capacitive switches

Wang, J., Salm, C. & Schmitz, J., 26 Mar 2013, IEEE International Conference on Microelectronic Test Structures, ICMTS 2013. USA: IEEE Electron Devices Society, p. 53-58 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Mechanical resonators on CMOS for integrated passive band pass filters

Kazmi, S. N. R., Salm, C. & Schmitz, J., 23 Jul 2013, ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day'. p. 193-196 4 p. 6523517. (ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day').

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2012

CMOS-MEMS Post Processing Compatible Capacitively Transduced GeSi Resonators

Kazmi, S. N. R., Aarnink, A. A. I., Salm, C. & Schmitz, J., 25 Jul 2012, Proceedings of 2012 IEEE International Frequency Control Symposium (IFCS). USA: IEEE Electron Devices Society, p. 1-4 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

On the degradation of field-plate assisted RESURF power devices

Boksteen, B. K., Dhar, S., Ferrara, A., Heringa, A., Hueting, R. J. E., Koops, G. E. J., Salm, C. & Schmitz, J., 10 Dec 2012, IEEE International Electron Devices Meeting, IEDM 2012. San Francisco - USA: IEEE International Electron Device Meeting, p. 311-314 4 p. (Technical Digest).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)
2010

Adapting to a changing highschool population

Salm, C., Eijkel, J. C. T., van der Heijden, F. & Odijk, M., 10 May 2010, Proceedings of 8th European Workshop on Microelectronics Education, EWME 2010. Darmstadt, Germany: Technische Universitaet Darmstadt, p. 180-184 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
24 Downloads (Pure)

An Initial study on The Reliability of Power Semiconductor Devices

Boksteen, B. K., Hueting, R. J. E., Salm, C. & Schmitz, J., 18 Nov 2010, Proceedings of STW.ICT Conference 2010. Utrecht: STW, p. 68-72 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

File
133 Downloads (Pure)

Low Stressed In-situ Boron doped Poly SiGe Layers for High-Q Resonators

Kazmi, S. N. R., Rangarajan, B., Aarnink, A. A. I., Salm, C. & Schmitz, J., 18 Nov 2010, Proceedings of the STW.ICT Conference 2010. Utrecht: STW, p. 109-113 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

File
79 Downloads (Pure)

Low temperature silicidation of Pd layers on crystalline silicon monitored via in situ resistance measurements

Faber, E. J., Wolters, R. A. M., Rajasekharan, B., Salm, C. & Schmitz, J., 29 Nov 2010, Advanced Metallization Conference 2009: proceedings of the conference held September 13-15, 2009, Baltimore, Maryland, U.S.A. Edelstein, D. C. & Schulz, S. E. (eds.). Materials Research Society, p. 133-140 8 p. (Materials Research Society conference proceedings; vol. 25).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
5 Citations (Scopus)
9 Downloads (Pure)

On the modelling and optimisation of a novel Schottky based silicon rectifier

van Hemert, T., Hueting, R. J. E., Rajasekharan, B., Salm, C. & Schmitz, J., 13 Sep 2010, Proceedings of the 40th European Solid-State Device Research, Essderc 2010. USA: IEEE Solid-State Circuits Society, p. 460-463 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
7 Citations (Scopus)
94 Downloads (Pure)
2009

Materials selection for low temperature processed high Q resonators using ashby approach

Kazmi, S. N. R., Salm, C. & Schmitz, J., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: STW, p. 81-84 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Metal contacts to lowly doped Si and ultra thin SOI

Rajasekharan, B., Salm, C., Wolters, R. A. M., Aarnink, A. A. I., Boogaard, A. & Schmitz, J., 18 Jan 2009, Proceedings of Fifth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits. Gotheburg, Sweden: Chalmers University of Technology, p. 29-30 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
152 Downloads (Pure)

Metal contacts to lowly doped Si and ultra thin SOI

Rajasekharan, B., Salm, C., Hueting, R. J. E., Wolters, R. A. M. & Schmitz, J., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: STW, p. 103-104 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Monitoring silicide formation via in situ resistance measurements

Faber, E. J., Wolters, R. A. M., Rajasekharan, B., Salm, C. & Schmitz, J., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: STW, p. 67-70 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Photocathodes for a post-processed imaging array

Melai, J., Lyashenko, A., Breskin, A., van der Graaf, H., Timmermans, J., Timmermans, J., Visschers, J., Salm, C. & Schmitz, J., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: STW, p. 32-35 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

File
16 Downloads (Pure)
2008

Charge plasma diode - a novel device concept

Rajasekharan, B., Hueting, R. J. E., Salm, C., Hoang, T. & Schmitz, J., 27 Nov 2008, Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008). Utrecht, The Netherlands: STW, p. 576-579 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Dimensional scaling effects on transport properties of ultrathin body p-i-n diodes

Rajasekharan, B., Salm, C., Hueting, R. J. E., Hoang, T. & Schmitz, J., 13 Mar 2008, Proceedings of the 9th Conference on ULtimate Integration on Silicon. Piscataway: IEEE Computer Society Press, p. 195-198 4 p. 10.1109/ULIS.2008.4527172. (Electron Device Society; no. DTR08-9).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
13 Citations (Scopus)
68 Downloads (Pure)

Further outgassing studies on SU-8

Melai, J., Blanco Carballo, V. M., Salm, C., Wolters, R. A. M. & Schmitz, J., 27 Nov 2008, Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008). Utrecht, The Netherlands: STW, p. 491-494 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Moisture resistance of SU-8 and KMPR as structural material for integrated gaseous detectors

Blanco Carballo, V. M., Melai, J., Salm, C. & Schmitz, J., 27 Nov 2008, Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008). Utrecht, The Netherlands: STW, p. 395-398 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
271 Downloads (Pure)

On the switching speed of SOI LEDs

Schmitz, J., de Vries, R., Salm, C., Hoang, T., Hueting, R. J. E. & Holleman, J., 23 Jan 2008, Proceedings of the Fourth Workshop of the Thematic Network on Silicon on Insulator Technology, Devices and Circuits. Cork, Ireland: Tyndall National Institute, p. 101-102 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
1 Downloads (Pure)
2007

Considerations on using SU-8 as a construction material for high aspect ratio structures

Melai, J., Salm, C., Smits, S. M., Blanco Carballo, V. M., Schmitz, J. & Hageluken, B., 29 Nov 2007, 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE). Utrecht, The Netherlands: STW, p. 529-534 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
75 Downloads (Pure)

Dimensional scaling effects on transport properties of p-i-n diodes

Rajasekharan, B., Salm, C., Hueting, R. J. E., Hoang, T., van der Wiel, W. G. & Schmitz, J., 29 Nov 2007, 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE). Utrecht, The Netherlands: STW, p. 457-459 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Results from MPGDs with a protected TimePix or Medipix-2 pixel sensor as active anode

Bosma, M., Blanco Carballo, V. M., Bylevich, Y., Chefdeville, M., Fransen, M., Van Der Graaf, H., Hartjes, F., Melai, J., Salm, C., Schmitz, J., Timmermans, J., Visschers, J. L. & Wyrsch, N., 1 Dec 2007, 2007 IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS-MIC. Vol. 6. 1 p. 4437141

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Technological aspects of gaseous pixel detectors fabrication

Blanco Carballo, V. M., Salm, C., Smits, S. M., Schmitz, J., Melai, J., Chefdeville, M. A. & van der Graaf, H., 29 Nov 2007, 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE). Utrecht, The Netherlands: STW, p. 501-503 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Downloads (Pure)
2006

A miniaturized multiwire proportional chamber using CMOS wafer scale post-processing

Blanco Carballo, V. M., Chefdeville, M. A., van der Graaf, H., Salm, C., Aarnink, A. A. I., Smits, S. M., Altpeter, D. M., Timmermans, J., Timmermans, J., Visschers, J. L. & Schmitz, J., 7 Jul 2006, Proceedings of 32nd European Solid State Device Research Conference. IEEE Computer Society Press, p. 129-132 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

An integrated gaseous detector using microfabrication post-processing technology

Blanco Carballo, V. M., Salm, C., Smits, S. M., Schmitz, J., Chefdeville, M. A., van der Graaf, H., Timmermans, J., Timmermans, J. & Visschers, J. L., 23 Nov 2006, Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006. Utrecht, The Netherlands: STW, p. 369-372 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

An integrated single photon detector array using porous anodic alumina

Melai, J., Salm, C., Schmitz, J., Smits, S. & Visschers, J., 27 Nov 2006, Proceedings 9th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2006. Utrecht, The Netherlands: STW, p. 389-393 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Discharge Protection and Ageing of Micromegas Pixel Detectors

Aarts, A. A., Blanco Carballo, V. M., Chefdeville, M. A., Colas, P., Dunand, S., Fransen, M., van der Graaf, H., Giomataris, Y., Hartjes, F., Koffeman, G., Melai, J., Peek, H., Riegler, W., Salm, C., Schmitz, J., Smits, S. M., Timmermans, J., Timmermans, J., Visschers, J. L. & Wyrsch, N., 29 Oct 2006, 2006 IEEE Nuclear Science Symposium Conference Record. San Diego, CA, USA: IEEE Nuclear & Plasma Sciences Society, p. 3865-3869 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Low-Frequency noise in hot-carrier degraded MOSFETs

Salm, C., Hoekstra, E., Kolhatkar, J. S., Hof, A. J., Wallinga, H. & Schmitz, J., 26 Jun 2006, 14th Workshop on Dielectrics in Microelectronics, WODIM 2006. Koninklijke Nederlandse Academie van Wetenschappen, p. 64-65 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2005

An electron-multiplying 'Micromegas' grid made in silicon wafer post-processing technology

Chefdeville, M. A., Colas, P., Giomataris, Y., van der Graaf, H., Heijne, E. H. M., van der Putten, S., Salm, C., Schmitz, J., Smits, S. M., Timmermans, J. & Visschers, J. L., Nov 2005, Proceedings 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Netherlands: STW, p. 139-142 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
59 Downloads (Pure)

Constant and switched bias low frequency noise in p-MOSFETs with varying gate oxide thickness

Kolhatkar, J. S., Salm, C., Knitel, M. J. & Wallinga, H., 17 Oct 2005, Proceedings of the 32nd European Solid-State Device Research Conference. Kovalguine, A. (ed.). Piscataway: IEEE Computer Society, p. 83-86 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
8 Citations (Scopus)
40 Downloads (Pure)

Reduction of 1/f Noise by Switched Biasing: an Overview

Klumperink, E., van der Wel, A., Kolhatkar, J., Hoekstra, E., Salm, C., Wallinga, H. & Nauta, B., Nov 2005, 16th Workshop on Circuits, Systems and Signal Processing, ProRISC 2005. Utrecht: STW, p. 307-315 9 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
268 Downloads (Pure)

Significance of including substrate capacitance in the full chip circuit model of ICs under CDM stress

Sowariraj, M. S. B., de Jong, P. C., Salm, C., Smedes, T., Mouthaan, A. J. & Kuper, F. G., Apr 2005, 2005 IEEE International Reliability Physics Symposium proceedings: 43rd annual : San Jose, California, April 17-21, 2005. Piscataway, NJ: IEEE Computer Society, p. 608-609 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)
9 Downloads (Pure)

Strategies to cope with plasma charging damage in design and layout phases

Wang, Z., Ackaert, J., Scarpa, A., Salm, C., Kuper, F. G. & Vugts, M., 6 Sep 2005, IEEE International Conference in Integrated Circuit and Technology (ICICDT). Piscataway: IEEE, p. 91-98 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
10 Citations (Scopus)
705 Downloads (Pure)
2004

Effect of thermal gradients on the electromigration lifetime in power electronics

Nguyen, H. V., Salm, C., Krabbenborg, B. H., Weide-Zaage, K., Bisschop, J., Mouthaan, A. J. & Kuper, F. G., 26 Jul 2004, 2004 IEEE International Reliability Physics Symposium proceedings: 42nd Annual : Phoenix, Arizona, April 25-29, 2004 . Piscataway, NJ: IEEE, p. 619-620 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

8 Citations (Scopus)
10 Downloads (Pure)

Investigating Hot-Carrier Degradation in MOSFETs using Constant and Switched Biased Low-Frequency Noise measurements

Kolhatkar, J. S., Hoekstra, E., Hof, A. J., Salm, C., Wallinga, H. & Schmitz, J., 25 Nov 2004, Proceedings SAFE & ProRISC 2004. Utrecht: STW, p. 700-703 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
19 Downloads (Pure)

Modeling of RTS Noise in MOSFETs under Steady-State and Large-Signal Excitation

Kolhatkar, J. S., Hoekstra, E., Salm, C., van der Wel, A. P., Klumperink, E. A. M., Schmitz, J. & Wallinga, H., Dec 2004, IEEE International Electron Devices Meeting (IEDM 2004). Piscataway, NJ, USA: IEEE, p. 759-762 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
18 Citations (Scopus)
14 Downloads (Pure)

Separation of random telegraph sSignals from 1/f noise in MOSFETs under constant and switched bias conditions

Kolhatkar, J. S., Vandamme, L. K. J., Salm, C. & Wallinga, H., 7 Jan 2004, 33rd Conference on European Solid-State Device Research 2003 (ESSDERC). Piscataway: IEEE, p. 549-552 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
14 Citations (Scopus)
182 Downloads (Pure)
2003

A reliability model for interlayer dielectric cracking during fast thermal cycling

Nguyen, V. H., Salm, C., Krabbenborg, B. H., Krabbenborg, B. H., Bisschop, J., Mouthaan, A. J. & Kuper, F. G., 21 Oct 2003, Advanced Metallization Conference (AMC 2003). Ray, G. W., Smy, T., Ohta, T. & Tsujimura, M. (eds.). Warrendale, PA: Materials Research Society, p. 295-299 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
5 Citations (Scopus)
90 Downloads (Pure)

A Reliability Model for interlayer dielectrics cracking during very fast thermal cycling

Nguyen, V. H., Salm, C., Krabbenborg, B. H., Bisschop, J., Mouthaan, A. J. & Kuper, F. G., 21 Oct 2003, Proceedings of Advanced Metallization Conference AMC 2003. p. -

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Electrothermomigration-induced failure in power IC metallization

Nguyen, V. H., Salm, C., Krabbenborg, B. H., Krabbenborg, B. H., Bisschop, J., Mouthaan, A. J. & Kuper, F. G., Nov 2003, Proceedings of the 6th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors, SAFE 2003. Utrecht, The Netherlands: STW, p. 622-630 9 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Measurement and extraction of RTS parameters under 'Switched Biased' conditions in MOSFETS

Kolhatkar, J. S., van der Wel, A. P., Klumperink, E. A. M., Salm, C., Nauta, B. & Wallinga, H., Aug 2003, 17th International Conference on Noise and Fluctuations. BRNO , Czech Republic: Czech Noise Research Laboratory (CNRL), p. 237-240 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
67 Downloads (Pure)

Plasma Charging Damage Induced by a Power Ramp Down Step in the end of Plasma Enhanced Chemical Vapour Deposition (PECVD) Process

Wang, Z., Ackaert, J. G. G., Salm, C., Kuper, F. G., Bessemans, K. & De Backer, E., 25 Nov 2003, Proceedings of Semiconductor Advances for Future Electronics SAFE 2003. p. 766-770 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Separation of random telegraph signals from 1/f noise in MOSFETs

Kolhatkar, J. S., Salm, C. & Wallinga, H., 25 Nov 2003, Proceedings of the 6th annual workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2003. Utrecht, The Netherlands: STW, p. 614-617 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Study on the influence of package parasitics and substrate resistance on the Charged Device Model(CDM) failure levels - possible protection methodology

Sowariraj, M. S. B., Smedes, T., Salm, C., Mouthaan, A. J. & Kuper, F. G., 25 Nov 2003, Proceedings of the 6th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors SAFE 2003. Utrecht, The Netherlands: STW, p. 657-662 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

2002

Analysis of 'Switched Biased' Random Telegraph Signals in MOSFETs

Kolhatkar, J., Salm, C. & Wallinga, H., 27 Nov 2002, Proceedings of 5th Annual Workshop on Semiconductors Advances for Future Electronics SAFE 2002. Utrecht, The Netherlands: STW, p. 42-45 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Correlation between hot carrier stress, oxide breakdown and gate leakage current for monitoring plasma processing induced damage on gate oxide

Wang, Z., Ackaert, J., Salm, C., de Backer, E., van den Bosch, G. & Zawalski, W., 7 Nov 2002, 9th International Symposium on Physics and Failure Analysis 2002. Piscataway, NJ: IEEE, p. 242-245 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

43 Downloads (Pure)

Correlation between Hot Carrier Stress, Oxide Breakdown and Gate Leakage Current for Monitoring Plasma Processing Induced Damage on Gate Oxide

Ackaert, J. G. G., Wang, Z., Backer, E. & Salm, C., 6 Jun 2002, Proceedings of 7th International symposium of Plasma Process-Induced Damage. Santa Clara, California: American Vacuum Society, p. 45-48 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review