1992 …2020

Research output per year

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Conference article
2007

Low-frequency noise in hot-carrier degraded nMOSFETs

Salm, C., Hoekstra, E., Kolhatkar, J. S., Hof, A. J., Wallinga, H. & Schmitz, J., Apr 2007, In : Microelectronics reliability. 47, 4-5, p. 577-580 4 p.

Research output: Contribution to journalConference articleAcademicpeer-review

2 Citations (Scopus)