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- 1 Conference contribution
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RFID Tag Failure after Thermal Overstress
Ozturk, E., Dikkers, M. J., Batenburg, K. M., Salm, C. & Schmitz, J., 10 Feb 2020, 2019 IEEE International Integrated Reliability Workshop, IIRW 2019. IEEE, 8989885Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open AccessFile3 Link opens in a new tab Citations (Scopus)750 Downloads (Pure)