Research Output per year
Fingerprint Dive into the research topics where Fred Bijkerk is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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mirrors
Physics & Astronomy
reflectance
Physics & Astronomy
wavelengths
Physics & Astronomy
Multilayers
Engineering & Materials Science
optics
Physics & Astronomy
lithography
Physics & Astronomy
thin films
Physics & Astronomy
x rays
Physics & Astronomy
Network
Recent external collaboration on country level. Dive into details by clicking on the dots.
Research Output 1994 2020
1
Citation
(Scopus)
Similarity in ruthenium damage induced by photons with different energies: From visible light to hard X-rays
Milov, I., Lipp, V., Ilnitsky, D., Medvedev, N., Migdal, K., Zhakhovsky, V., Khokhlov, V., Petrov, Y., Inogamov, N., Semin, S., Kimel, A., Ziaja, B., Makhotkin, I. A., Louis, E. & Bijkerk, F., 31 Jan 2020, In : Applied surface science. 501, 143973.Research output: Contribution to journal › Article › Academic › peer-review
Open Access
Ruthenium
ruthenium
Photons
damage
X rays
Angular and spectral bandwidth of Extreme UV multilayers near spacer material absorption edges
Zameshin, A., Yakshin, A., Chandrasekaran, A. & Bijkerk, F., 1 Jan 2019, In : Journal of nanoscience and nanotechnology. 19, 1, p. 602-608 7 p.Research output: Contribution to journal › Article › Academic › peer-review
Open Access
File
material absorption
Electric Power Supplies
Optical Devices
Synchrotrons
spacers
Atomic H diffusion and C etching in multilayer graphene monitored using a y based optical sensor
Mund, B. K., Soroka, O., Sturm, J. M., Van Den Beld, W. T. E., Lee, C. J. & Bijkerk, F., 1 Sep 2019, In : Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics. 37, 5, 6 p., 051801.Research output: Contribution to journal › Article › Academic › peer-review
Open Access
Graphite
Optical sensors
optical measuring instruments
Graphene
Etching
Calibrated broadband spectroscopy using transmission gratings in the EUV to DUV wavelengths
Bayraktar, M., Bastiaens, H. M. J. & Bijkerk, F., 4 Nov 2019.Research output: Contribution to conference › Poster
Etching processes of transferred and non-transferred multi-layer graphene in the presence of extreme UV, H2O and H2
Mund, B. K., Sturm, J. M., van den Beld, W. T. E., Lee, C. J. & Bijkerk, F., 29 Oct 2019, In : Applied surface science. 504, 144485.Research output: Contribution to journal › Article › Academic › peer-review
Graphite
Graphene
Etching
graphene
etching
Activities 2003 2018
Advancing thin film X-ray reflectivity data analysis
Igor A. Makhotkin (Speaker), Sergey N. Yakunin (Contributor), J.F. Woitok (Contributor), Robbert Wilhelmus Elisabeth van de Kruijs (Contributor), F. Bijkerk (Contributor)12 Dec 2018
Activity: Talk or presentation › Oral presentation
Nanometer scale oxidation and oxygen diffusion at low temperature: Static and Isotope Exchange Depth Profile
Cristiane Regina Stilhano Vilas Boas (Speaker), J.M. Sturm (Contributor), F. Bijkerk (Contributor)31 May 2018
Activity: Talk or presentation › Oral presentation
Atomic oxygen diffusion in ultrathin transition metal oxide films at room temperature
Cristiane Regina Stilhano Vilas Boas (Speaker), J.M. Sturm (Contributor), F. Bijkerk (Contributor)7 Nov 2018 → 9 Nov 2018
Activity: Talk or presentation › Oral presentation
Piezoelectric actuators for adaptive multilayer mirrors in XUV lithography systems
Mohammadreza Nematollahi (Speaker), Philip Lucke (Contributor), Muharrem Bayraktar (Contributor), Kerstin Hild (Contributor), Toralf Gruner (Contributor), Andrey Yakshin (Contributor), A.J.H.M. Rijnders (Contributor), Eric Louis (Contributor), F. Bijkerk (Contributor)7 Nov 2018
Activity: Talk or presentation › Oral presentation
Stress development of thin films monitored in-situ by cantilever laser deflection and low energy ion scattering
Robbert Wilhelmus Elisabeth van de Kruijs (Speaker), Johan Reinink (Contributor), F. Bijkerk (Contributor)11 Dec 2018
Activity: Talk or presentation › Oral presentation