Research output per year
Research output per year
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Dive into the research topics where Fred Bijkerk is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
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Active Wafer Table Based on Piezoelectric Thin Films
Şimşek, E., Vries, S. E., Jansen, B., Steur, M., Bijkerk, F., Bayraktar, M. & Ackermann, M., 2023.Research output: Contribution to conference › Poster › Academic
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Corrigendum to “In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers” [Appl. Surf. Sci. 258(1) (2011) 7–12]
Chen, J., Louis, E., Harmsen, R., Tsarfati, T., Wormeester, H., van Kampen, M., van Schaik, W., van de Kruijs, R. & Bijkerk, F., 1 May 2023, In: Applied surface science. 618, 1 p., 155765.Research output: Contribution to journal › Comment/Letter to the editor › Academic › peer-review
Open AccessFile53 Downloads (Pure) -
EUV Source Metrology
Bayraktar, M., Liu, F., Versolato, O. & Bijkerk, F., 22 Sept 2023, Photon Sources for Lithography and Metrology. Bakshi, V. (ed.). p. 509-535Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review
Open AccessFile489 Downloads (Pure) -
Fracture Toughness of Free-Standing ZrSiₓ Thin Films Measured Using Crack-on-a-Chip Method
Shafikov, A., van de Kruijs, R. W. E., Benschop, J. P. H., van den Beld, W., Houweling, S. & Bijkerk, F., 1 Feb 2022, In: Journal of microelectromechanical systems. 31, 1, p. 63-73 11 p.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile1 Citation (Scopus)150 Downloads (Pure) -
Influence of the Template Layer on the Structure and Ferroelectric Properties of PbZr<sub>0.52</sub>Ti<sub>0.48</sub>O<sub>3</sub> Films
Lucke, P., Nematollahi, M., Bayraktar, M., Yakshin, A. E., Elshof, J. E. T. & Bijkerk, F., 5 Jul 2022, In: ACS Omega. 7, 26, p. 22210-22220 11 p.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile2 Citations (Scopus)157 Downloads (Pure)
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Probing thin film interfaces at the nanoscale by Low Energy Ion Scattering
Sturm, M. (Speaker), Chandrasekaran, A. (Contributor), Valpreda, A. (Contributor), Zameshin, A. (Contributor), van de Kruijs, R. W. E. (Contributor), Yakshin, A. (Contributor), Bijkerk, F. (Contributor) & Ackermann, M. D. (Contributor)
10 Nov 2023Activity: Talk or presentation › Invited talk
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Low Energy Ion Interactions with Transition Metal Films: ballistic and Diffusive Transport Processes
Phadke, P. (Speaker), Sturm, M. (Contributor), van de Kruijs, R. W. E. (Contributor), Bijkerk, F. (Contributor) & Ackermann, M. D. (Contributor)
11 Jul 2022Activity: Talk or presentation › Oral presentation
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Similarity in Ru damage induced by photons with different energy: From visible light to hard X-rays
Milov, I. (Speaker), Lipp, V. (Contributor), Ilnitsky, D. (Contributor), Medvedev, N. (Contributor), Migdal, K. (Contributor), Zhakhovsky, V. (Contributor), Khokhlov, V. (Contributor), Petrov, Y. (Contributor), Inogamov, N. (Contributor), Semin, S. (Contributor), Kimel, A. (Contributor), Ziaja, B. (Contributor), Medvedev, V. (Contributor), Makhotkin, I. A. (Contributor), Louis, E. (Contributor) & Bijkerk, F. (Contributor)
21 Jan 2020 → 22 Jan 2020Activity: Talk or presentation › Oral presentation
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Ultrafast ablation of ruthenium: from visible to hard X¬ray irradiation
Milov, I. (Invited speaker), Lipp, V. (Contributor), Ilnitsky, D. (Contributor), Medvedev, N. (Contributor), Migdal, K. (Contributor), Zhakhovsky, V. (Contributor), Khokhlov, V. (Contributor), Petrov, Y. (Contributor), Inogamov, N. (Contributor), Semin, S. (Contributor), Kimel, A. (Contributor), Ziaja, B. (Contributor), Medvedev , V. V. (Contributor), Makhotkin, I. A. (Contributor), Louis, E. (Contributor) & Bijkerk, F. (Contributor)
28 Sept 2020 → 2 Oct 2020Activity: Talk or presentation › Invited talk
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Adaptive piezoelectric actuators for XUV wavelengths and scaling of hysteresis
Lucke, P. (Speaker), Bayraktar, M. (Contributor), Nematollahi, M. (Contributor), Houwman, E. (Contributor), Birkhölzer, Y. A. (Contributor), Yakshin, A. (Contributor), Rijnders, G. (Contributor) & Bijkerk, F. (Contributor)
22 Jan 2020Activity: Talk or presentation › Oral presentation