Fred Bijkerk

prof.dr.

  • 1956 Citations
  • 23 h-Index
1992 …2020

Research output per year

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Research Output

A semi-Analytical approach for the characterization of ordered 3D nanostructures using grazing-incidence X-ray fluorescence

Nikolaev, K. V., Soltwisch, V., Honicke, P., Scholze, F., De La Rie, J., Yakunin, S. N., Makhotkin, I. A., Van De Kruijs, R. W. E. & Bijkerk, F., 1 Mar 2020, In : Journal of synchrotron radiation. 27, p. 386-395 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
  • 1 Citation (Scopus)
    7 Downloads (Pure)

    Etching processes of transferred and non-transferred multi-layer graphene in the presence of extreme UV, H2O and H2

    Mund, B. K., Sturm, J. M., van den Beld, W. T. E., Lee, C. J. & Bijkerk, F., 28 Feb 2020, In : Applied surface science. 504, 144485.

    Research output: Contribution to journalArticleAcademicpeer-review

    Open Access
    File
  • 8 Downloads (Pure)

    Hydrogen diffusion through Ru thin films

    Soroka, O., Sturm, J. M., Lee, C. J., Schreuders, H., Dam, B. & Bijkerk, F., 26 May 2020, In : International journal of hydrogen energy. 45, 29, p. 15003-15010 8 p.

    Research output: Contribution to journalArticleAcademicpeer-review

  • Activities

    • 76 Oral presentation
    • 5 Invited talk

    Damage processes in ruthenium thin films induced by femtosecond laser pulses for a wide range of incident photon energy

    Igor Milov (Contributor), Igor A. Makhotkin (Speaker), Nikita Medvedev (Contributor), vladimir lipp (Contributor), B. Ziaja (Contributor), V. Khokhlov (Contributor), V. Zhakhovsky (Contributor), Yu. Petrov (Contributor), V. Shepelev (Contributor), D. Ilnitsky (Contributor), K. Migdal (Contributor), N. Inogamov (Contributor), Eric Louis (Contributor), F. Bijkerk (Contributor)
    21 Oct 2019

    Activity: Talk or presentationOral presentation

    Structural analysis of ion polished W/Si soft X-ray multilayer reflectors

    Roman Medvedev (Contributor), Konstantin Nikolaev (Contributor), Andrey Zameshin (Contributor), Dennis IJpes (Contributor), Igor A. Makhotkin (Contributor), Sergey N. Yakunin (Contributor), Andrey Yakshin (Speaker), Fred Bijkerk (Contributor)
    21 Oct 201923 Oct 2019

    Activity: Talk or presentationOral presentation

    Damage processes in ruthenium thin films induced by femtosecond laser pulses with varying incident photon energy

    Igor Milov (Contributor), Igor A. Makhotkin (Speaker), Nikita Medvedev (Contributor), vladimir lipp (Contributor), B. Ziaja (Contributor), V. Khokhlov (Contributor), V. Zhakhovsky (Contributor), Yu. Petrov (Contributor), V. Shepelev (Contributor), D. Ilnitsky (Contributor), K. Migdal (Contributor), N. Inogamov (Contributor), Eric Louis (Contributor), F. Bijkerk (Contributor)
    27 May 2019

    Activity: Talk or presentationOral presentation

    Lithography machine in-line broadband spectrum metrology and feedback control system

    Fei Liu (Speaker), Dries Smeets (Contributor), Sjoerd Huang (Contributor), Andrei Yakunin (Contributor), Peter Havermans (Contributor), Rene Oesterholt (Contributor), Muharrem Bayraktar (Contributor), Fred Bijkerk (Contributor)
    10 Jun 201913 Jun 2019

    Activity: Talk or presentationOral presentation

    Optical properties of multilayers for operational wavelengths between 6.6 and 13.5 nm’

    Andrey Yakshin (Speaker), Andrey Zameshin (Contributor), Dmitry Kuznetsov (Contributor), Igor Milov (Contributor), Igor A. Makhotkin (Contributor), Eric Louis (Contributor), Fred Bijkerk (Contributor)
    4 Nov 20196 Nov 2019

    Activity: Talk or presentationInvited talk