Fred Bijkerk

prof.dr.

XUV Optics

Fingerprint Fingerprint is based on mining the text of the person's scientific documents to create an index of weighted terms, which defines the key subjects of each individual researcher.

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Multilayers Engineering & Materials Science

mirrors Physics & Astronomy

wavelengths Physics & Astronomy

optics Physics & Astronomy

gratings Physics & Astronomy

Optics Engineering & Materials Science

X rays Engineering & Materials Science

Ions Engineering & Materials Science

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Research Output 2002 2018

Aromatic structure degradation of single layer graphene on an amorphous silicon substrate in the presence of water, hydrogen and Extreme Ultraviolet light

Mund, B. K., Sturm, J. M., Lee, C. J. & Bijkerk, F. 1 Jan 2018 In : Applied surface science. 427, Part B, p. 1033-1040 8 p.

Research output: Scientific - peer-review › Article

Graphene

Ketones

Water

Hydrogen

Substrates

Control of YH₃ formation and stability via hydrogen surface adsorption and desorption

Soroka, O., Sturm, J. M., van de Kruijs, R. W. E., Lee, C. J. & Bijkerk, F. 15 Oct 2018 In : Applied surface science. 455, p. 70-74 5 p.

Research output: Scientific - peer-review › Article

Hydrogen

Thin films

Yttrium

Desorption

Hydrides

Double matrix effect in Low Energy Ion Scattering from La surfaces

Zameshin, A. A., Yakshin, A. E., Sturm, J. M., Brongerma, H. H. & Bijkerk, F. 15 May 2018 In : Applied surface science. 440, p. 570-579 10 p.

Research output: Scientific - peer-review › Article

Ions

Scattering

Charge transfer

Lanthanum

Conduction bands

Hydrogen induced blister formation in Mo/Si multilayer structures

van den Bos, R. A. J. M. 2 May 2018 Enschede. 113 p.

Research output: Scientific › PhD Thesis - Research UT, graduation UT

blisters

hydrogen

laminates

electromagnetic spectra

theses

Influence of internal stress and layer thickness on the formation of hydrogen induced thin film blisters in Mo/Si multilayers

Van Den Bos, R. A. J. M., Reinink, J., Lopaev, D. V., Lee, C. J., Benschop, J. P. H. & Bijkerk, F. 22 Feb 2018 In : Journal of physics D: applied physics. 51, 11, 115302

Research output: Scientific - peer-review › Article

Hydrogen

Multilayer films

Multilayers

Thin films

Stress relaxation

Activities 2010 2017

21 Oral presentation
2 Invited talk

Tailoring the spectral properties of extreme UV multilayer optics

V.V. Medvedev (Speaker), Yakshin, A. (Contributor), Bijkerk, F. (Contributor)

17 Jan 2017

Activity: Oral presentation

EUVL optics for Free Electron Laser sources: damage threshold studies and the use of adjusted wavelengths

Louis, E. (Speaker), Zameshin, A. (Contributor), Yakshin, A. (Contributor), Makhotkin, I. A. (Contributor), Bijkerk, F. (Contributor)

7 Nov 2017

Activity: Oral presentation

Ruthenium growth on B, C and B4C studied by LEIS

Zameshin, A. (Speaker), Yakshin, A. (Contributor), Sturm, J. (Contributor), Bijkerk, F. (Contributor)

8 Aug 2017

Activity: Oral presentation

Status of multilayer reflective optics

Louis, E. (Speaker), H. Enkisch (Contributor), van de Kruijs, R. W. E. (Contributor), Yakshin, A. (Contributor), Sturm, J. (Contributor), Makhotkin, I. A. (Contributor), Lee, C. J. (Contributor), Stephan Müllender (Contributor), Bijkerk, F. (Contributor)

28 Feb 2017

Activity: Oral presentation

Multilayer reflective optics for EUV Lithography

Louis, E. (Invited speaker), H. Enkisch (Contributor), van de Kruijs, R. W. E. (Contributor), Yakshin, A. (Contributor), Sturm, J. (Contributor), Makhotkin, I. A. (Contributor), Stephan Müllender (Contributor), Bijkerk, F. (Contributor)

12 Dec 2017

Activity: Invited talk