Research output per year
Research output per year
Fingerprint
Dive into the research topics where H. Wormeester is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
Network
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
-
Corrigendum to “In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers” [Appl. Surf. Sci. 258(1) (2011) 7–12, (S0169433211011883), (10.1016/j.apsusc.2011.07.121)]
Chen, J., Louis, E., Harmsen, R., Tsarfati, T., Wormeester, H., van Kampen, M., van Schaik, W., van de Kruijs, R. & Bijkerk, F., 30 Nov 2022, (E-pub ahead of print/First online) In: Applied surface science. 155765.Research output: Contribution to journal › Comment/Letter to the editor › Academic › peer-review
-
Alloying, Dealloying, and Reentrant Alloying in (Sub)monolayer Growth of Ag on Pt(111)
Jankowski, M., van Vroonhoven, E., Wormeester, H., Zandvliet, H. J. W. & Poelsema, B., 2017, In: Journal of physical chemistry C. 121, 15, p. 8353-8363Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile2 Citations (Scopus) -
Dealing with inaccuracies in the analysis on solvent-induced swelling of transparent thin films using in situ spectroscopic ellipsometry in the visible wavelength range
Tempelman, K., Kappert, E., Raaijmakers, M. J. T., Wormeester, H. & Benes, N. E., 1 Jun 2017, In: Surface and interface analysis. 49, 6, p. 538-547Research output: Contribution to journal › Article › Academic › peer-review
File4 Citations (Scopus)223 Downloads (Pure) -
Visualization of steps and surface reconstructions in Helium Ion Microscopy with atomic precision
Hlawacek, G., Jankowski, M., Wormeester, H., van Gastel, R., Zandvliet, H. J. W. & Poelsema, B., 2016, In: Ultramicroscopy. 162, p. 17-24Research output: Contribution to journal › Article › Academic › peer-review
9 Citations (Scopus) -
In situ ellipsometry studies on swelling of thin polymer films: A review
Ogieglo, W., Wormeester, H., Eichhorn, K-J., Wessling, M. & Benes, N. E., 2015, In: Progress in polymer science. 42, p. 42-78Research output: Contribution to journal › Article › Academic › peer-review
111 Citations (Scopus)1 Downloads (Pure)
Activities
- 115 Oral presentation
-
Ellipsometric study of carbon contaminatin and cleaning of EUV mirrors
Herbert Wormeester (Speaker)
11 Apr 2014Activity: Talk or presentation › Oral presentation
-
Polarization conversion in a fourfold symmetric subwavelength grating; a Mueller matrix ellipsometric analysis
Herbert Wormeester (Speaker) & T.W.H. Oates (Speaker)
26 May 2013Activity: Talk or presentation › Oral presentation
-
Glassy state influence on molecular transport in ultra-thin films
Wojciech Ogieglo (Speaker), Herbert Wormeester (Speaker), Matthias Wessling (Speaker) & Nieck Edwin Benes (Speaker)
21 Jan 2012Activity: Talk or presentation › Oral presentation
-
Ellipsometric characterisation of rough and structured surfaces
Herbert Wormeester (Speaker)
5 Mar 2012Activity: Talk or presentation › Oral presentation
-
Ellipsometric characterization of a thin titaniumoxide nanosheets layer
Herbert Wormeester (Speaker), G. Maidachi (Speaker), S.K.C. Palanisamy (Speaker), Avijit Kumar (Speaker), Johan E. ten Elshof (Speaker) & Henricus J.W. Zandvliet (Speaker)
28 Oct 2012Activity: Talk or presentation › Oral presentation