• 1997 Citations
  • 25 h-Index
1988 …2017
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Fingerprint Dive into the research topics where H. Wormeester is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 4 Similar Profiles
Spectroscopic ellipsometry Engineering & Materials Science
swelling Physics & Astronomy
ellipsometry Physics & Astronomy
Ellipsometry Engineering & Materials Science
Swelling Engineering & Materials Science
penetrants Physics & Astronomy
Polymer films Engineering & Materials Science
Polymers Chemical Compounds

Research Output 1988 2017

Alloying, Dealloying, and Reentrant Alloying in (Sub)monolayer Growth of Ag on Pt(111)

Jankowski, M., van Vroonhoven, E., Wormeester, H., Zandvliet, H. J. W. & Poelsema, B., 2017, In : Journal of physical chemistry C. 121, 15, p. 8353-8363

Research output: Contribution to journalArticleAcademicpeer-review

Alloying
alloying
Monolayers
Stress relief
Ultrathin films
2 Citations (Scopus)
88 Downloads (Pure)

Dealing with inaccuracies in the analysis on solvent-induced swelling of transparent thin films using in situ spectroscopic ellipsometry in the visible wavelength range

Tempelman, K., Kappert, E., Raaijmakers, M. J. T., Wormeester, H. & Benes, N. E., 1 Jun 2017, In : Surface and interface analysis. 49, 6, p. 538-547

Research output: Contribution to journalArticleAcademicpeer-review

File
Spectroscopic ellipsometry
Ellipsometry
Polymer films
swelling
Mean square error
6 Citations (Scopus)

Visualization of steps and surface reconstructions in Helium Ion Microscopy with atomic precision

Hlawacek, G., Jankowski, M., Wormeester, H., van Gastel, R., Zandvliet, H. J. W. & Poelsema, B., 2016, In : Ultramicroscopy. 162, p. 17-24

Research output: Contribution to journalArticleAcademicpeer-review

Helium
Surface reconstruction
helium ions
periodic variations
Microscopic examination
51 Citations (Scopus)

In situ ellipsometry studies on swelling of thin polymer films: A review

Ogieglo, W., Wormeester, H., Eichhorn, K-J., Wessling, M. & Benes, N. E., 2015, In : Progress in polymer science. 42, p. 42-78

Research output: Contribution to journalArticleAcademicpeer-review

penetrants
Ellipsometry
Polymer films
swelling
ellipsometry
9 Citations (Scopus)

The influence of instrumental parameters on the adhesion force in a flat-on-rough contact geometry

Colak, A., Wormeester, H., Zandvliet, H. J. W. & Poelsema, B., 2015, In : Applied surface science. 353, p. 1285-1290

Research output: Contribution to journalArticleAcademicpeer-review

Adhesion
Geometry
Atomic force microscopy
Atmospheric humidity
Silicon

Activities 1990 2014

Ellipsometric study of carbon contaminatin and cleaning of EUV mirrors

Herbert Wormeester (Speaker)
11 Apr 2014

Activity: Talk or presentationOral presentation

Polarization conversion in a fourfold symmetric subwavelength grating; a Mueller matrix ellipsometric analysis

Herbert Wormeester (Speaker), T.W.H. Oates (Speaker)
26 May 2013

Activity: Talk or presentationOral presentation

Ellipsometric characterisation of rough and structured surfaces

Herbert Wormeester (Speaker)
5 Mar 2012

Activity: Talk or presentationOral presentation

Ellipsometric characterization of a thin titaniumoxide nanosheets layer

Herbert Wormeester (Speaker), G. Maidachi (Speaker), S.K.C. Palanisamy (Speaker), Avijit Kumar (Speaker), Johan E. ten Elshof (Speaker), Henricus J.W. Zandvliet (Speaker)
28 Oct 2012

Activity: Talk or presentationOral presentation

Glassy state influence on molecular transport in ultra-thin films

Wojciech Ogieglo (Speaker), Herbert Wormeester (Speaker), Matthias Wessling (Speaker), Nieck Edwin Benes (Speaker)
21 Jan 2012

Activity: Talk or presentationOral presentation