Research Output per year
Fingerprint Dive into the research topics where H. Wormeester is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 4 Similar Profiles
Spectroscopic ellipsometry
Engineering & Materials Science
swelling
Physics & Astronomy
ellipsometry
Physics & Astronomy
Ellipsometry
Engineering & Materials Science
Swelling
Engineering & Materials Science
penetrants
Physics & Astronomy
Polymer films
Engineering & Materials Science
Polymers
Chemical Compounds
Research Output 1988 2017
Alloying, Dealloying, and Reentrant Alloying in (Sub)monolayer Growth of Ag on Pt(111)
Jankowski, M., van Vroonhoven, E., Wormeester, H., Zandvliet, H. J. W. & Poelsema, B., 2017, In : Journal of physical chemistry C. 121, 15, p. 8353-8363Research output: Contribution to journal › Article › Academic › peer-review
Alloying
alloying
Monolayers
Stress relief
Ultrathin films
Dealing with inaccuracies in the analysis on solvent-induced swelling of transparent thin films using in situ spectroscopic ellipsometry in the visible wavelength range
Tempelman, K., Kappert, E., Raaijmakers, M. J. T., Wormeester, H. & Benes, N. E., 1 Jun 2017, In : Surface and interface analysis. 49, 6, p. 538-547Research output: Contribution to journal › Article › Academic › peer-review
File
Spectroscopic ellipsometry
Ellipsometry
Polymer films
swelling
Mean square error
Visualization of steps and surface reconstructions in Helium Ion Microscopy with atomic precision
Hlawacek, G., Jankowski, M., Wormeester, H., van Gastel, R., Zandvliet, H. J. W. & Poelsema, B., 2016, In : Ultramicroscopy. 162, p. 17-24Research output: Contribution to journal › Article › Academic › peer-review
Helium
Surface reconstruction
helium ions
periodic variations
Microscopic examination
In situ ellipsometry studies on swelling of thin polymer films: A review
Ogieglo, W., Wormeester, H., Eichhorn, K-J., Wessling, M. & Benes, N. E., 2015, In : Progress in polymer science. 42, p. 42-78Research output: Contribution to journal › Article › Academic › peer-review
penetrants
Ellipsometry
Polymer films
swelling
ellipsometry
The influence of instrumental parameters on the adhesion force in a flat-on-rough contact geometry
Colak, A., Wormeester, H., Zandvliet, H. J. W. & Poelsema, B., 2015, In : Applied surface science. 353, p. 1285-1290Research output: Contribution to journal › Article › Academic › peer-review
Adhesion
Geometry
Atomic force microscopy
Atmospheric humidity
Silicon
Activities 1990 2014
- 115 Oral presentation
Ellipsometric study of carbon contaminatin and cleaning of EUV mirrors
Herbert Wormeester (Speaker)11 Apr 2014
Activity: Talk or presentation › Oral presentation
Polarization conversion in a fourfold symmetric subwavelength grating; a Mueller matrix ellipsometric analysis
Herbert Wormeester (Speaker), T.W.H. Oates (Speaker)26 May 2013
Activity: Talk or presentation › Oral presentation
Ellipsometric characterisation of rough and structured surfaces
Herbert Wormeester (Speaker)5 Mar 2012
Activity: Talk or presentation › Oral presentation
Ellipsometric characterization of a thin titaniumoxide nanosheets layer
Herbert Wormeester (Speaker), G. Maidachi (Speaker), S.K.C. Palanisamy (Speaker), Avijit Kumar (Speaker), Johan E. ten Elshof (Speaker), Henricus J.W. Zandvliet (Speaker)28 Oct 2012
Activity: Talk or presentation › Oral presentation
Glassy state influence on molecular transport in ultra-thin films
Wojciech Ogieglo (Speaker), Herbert Wormeester (Speaker), Matthias Wessling (Speaker), Nieck Edwin Benes (Speaker)21 Jan 2012
Activity: Talk or presentation › Oral presentation