Research output per year
Research output per year
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Dive into the research topics where H. Wormeester is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
Research output
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Alloying, Dealloying, and Reentrant Alloying in (Sub)monolayer Growth of Ag on Pt(111)
Jankowski, M., van Vroonhoven, E., Wormeester, H., Zandvliet, H. J. W. & Poelsema, B., 2017, In: Journal of physical chemistry C. 121, 15, p. 8353-8363Research output: Contribution to journal › Article › Academic › peer-review
1 Citation (Scopus) -
Dealing with inaccuracies in the analysis on solvent-induced swelling of transparent thin films using in situ spectroscopic ellipsometry in the visible wavelength range
Tempelman, K., Kappert, E., Raaijmakers, M. J. T., Wormeester, H. & Benes, N. E., 1 Jun 2017, In: Surface and interface analysis. 49, 6, p. 538-547Research output: Contribution to journal › Article › Academic › peer-review
File3 Citations (Scopus)154 Downloads (Pure) -
Visualization of steps and surface reconstructions in Helium Ion Microscopy with atomic precision
Hlawacek, G., Jankowski, M., Wormeester, H., van Gastel, R., Zandvliet, H. J. W. & Poelsema, B., 2016, In: Ultramicroscopy. 162, p. 17-24Research output: Contribution to journal › Article › Academic › peer-review
9 Citations (Scopus) -
In situ ellipsometry studies on swelling of thin polymer films: A review
Ogieglo, W., Wormeester, H., Eichhorn, K-J., Wessling, M. & Benes, N. E., 2015, In: Progress in polymer science. 42, p. 42-78Research output: Contribution to journal › Article › Academic › peer-review
91 Citations (Scopus) -
The influence of instrumental parameters on the adhesion force in a flat-on-rough contact geometry
Colak, A., Wormeester, H., Zandvliet, H. J. W. & Poelsema, B., 2015, In: Applied surface science. 353, p. 1285-1290Research output: Contribution to journal › Article › Academic › peer-review
18 Citations (Scopus)
Activities
- 115 Oral presentation
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Ellipsometric study of carbon contaminatin and cleaning of EUV mirrors
Herbert Wormeester (Speaker)
11 Apr 2014Activity: Talk or presentation › Oral presentation
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Polarization conversion in a fourfold symmetric subwavelength grating; a Mueller matrix ellipsometric analysis
Herbert Wormeester (Speaker) & T.W.H. Oates (Speaker)
26 May 2013Activity: Talk or presentation › Oral presentation
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Superimposed effects of penetrant and nanoconfinement on the behavior of ultra thin films
Wojciech Ogieglo (Speaker), Herbert Wormeester (Speaker), Matthias Wessling (Speaker) & Nieck E. Benes (Speaker)
7 Mar 2012Activity: Talk or presentation › Oral presentation
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Ellipsometric characterisation of rough and structured surfaces
Herbert Wormeester (Speaker)
5 Mar 2012Activity: Talk or presentation › Oral presentation
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Ellipsometric characterization of a thin titaniumoxide nanosheets layer
Herbert Wormeester (Speaker), G. Maidachi (Speaker), S.K.C. Palanisamy (Speaker), Avijit Kumar (Speaker), Johan E. ten Elshof (Speaker) & Henricus J.W. Zandvliet (Speaker)
28 Oct 2012Activity: Talk or presentation › Oral presentation