H. Wormeester

dr.ir.

Advanced Technology
Associate Professor, Mesa+
Associate Professor, Physics of Interfaces and Nanomaterials

Source: Scopus
Calculated based on no. of publications stored in Pure and citations from Scopus

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2191 Citations
25 h-Index
134 Poster
117 Article
13 Other contribution
10 Conference contribution
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Alloying, Dealloying, and Reentrant Alloying in (Sub)monolayer Growth of Ag on Pt(111)
Jankowski, M., van Vroonhoven, E., Wormeester, H., Zandvliet, H. J. W. & Poelsema, B., 2017, In : Journal of physical chemistry C. 121, 15, p. 8353-8363
Research output: Contribution to journal › Article › Academic › peer-review
1 Citation (Scopus)
Dealing with inaccuracies in the analysis on solvent-induced swelling of transparent thin films using in situ spectroscopic ellipsometry in the visible wavelength range
Tempelman, K., Kappert, E., Raaijmakers, M. J. T., Wormeester, H. & Benes, N. E., 1 Jun 2017, In : Surface and interface analysis. 49, 6, p. 538-547
Research output: Contribution to journal › Article › Academic › peer-review

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3 Citations (Scopus)

137 Downloads (Pure)
Visualization of steps and surface reconstructions in Helium Ion Microscopy with atomic precision
Hlawacek, G., Jankowski, M., Wormeester, H., van Gastel, R., Zandvliet, H. J. W. & Poelsema, B., 2016, In : Ultramicroscopy. 162, p. 17-24
Research output: Contribution to journal › Article › Academic › peer-review
9 Citations (Scopus)
In situ ellipsometry studies on swelling of thin polymer films: A review
Ogieglo, W., Wormeester, H., Eichhorn, K-J., Wessling, M. & Benes, N. E., 2015, In : Progress in polymer science. 42, p. 42-78
Research output: Contribution to journal › Article › Academic › peer-review
75 Citations (Scopus)
The influence of instrumental parameters on the adhesion force in a flat-on-rough contact geometry
Colak, A., Wormeester, H., Zandvliet, H. J. W. & Poelsema, B., 2015, In : Applied surface science. 353, p. 1285-1290
Research output: Contribution to journal › Article › Academic › peer-review
12 Citations (Scopus)

115 Oral presentation

Ellipsometric study of carbon contaminatin and cleaning of EUV mirrors
Herbert Wormeester (Speaker)
11 Apr 2014
Activity: Talk or presentation › Oral presentation
Polarization conversion in a fourfold symmetric subwavelength grating; a Mueller matrix ellipsometric analysis
Herbert Wormeester (Speaker) & T.W.H. Oates (Speaker)
26 May 2013
Activity: Talk or presentation › Oral presentation
Superimposed effects of penetrant and nanoconfinement on the behavior of ultra thin films
Wojciech Ogieglo (Speaker), Herbert Wormeester (Speaker), Matthias Wessling (Speaker) & Nieck E. Benes (Speaker)
12 Mar 2012
Activity: Talk or presentation › Oral presentation
Superimposed effects of penetrant and nanoconfinement on the behavior of ultra thin films
Wojciech Ogieglo (Speaker), Herbert Wormeester (Speaker), Matthias Wessling (Speaker) & Nieck E. Benes (Speaker)
7 Mar 2012
Activity: Talk or presentation › Oral presentation
Glassy state influence on molecular transport in ultra-thin films
Wojciech Ogieglo (Speaker), Herbert Wormeester (Speaker), Matthias Wessling (Speaker) & Nieck Edwin Benes (Speaker)
21 Jan 2012
Activity: Talk or presentation › Oral presentation