Research output per year
Research output per year
Personal profile
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Dive into the research topics where H. Wormeester is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Collaborations and top research areas from the last five years
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Integrating Essential Skills and Systems Thinking into Chemistry Education: The CLEAR Initiative for Sustainability
Pei, L., Onnink, A. J., Susarrey Arce, A., van Lente, J., Wong, A., ten Elshof, A., Wormeester, H. & Krab - Hüsken, L., 2025.Research output: Contribution to conference › Paper › peer-review
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Corrigendum to “In situ ellipsometry study of atomic hydrogen etching of extreme ultraviolet induced carbon layers” [Appl. Surf. Sci. 258(1) (2011) 7–12]
Chen, J., Louis, E., Harmsen, R., Tsarfati, T., Wormeester, H., van Kampen, M., van Schaik, W., van de Kruijs, R. & Bijkerk, F., 1 May 2023, In: Applied surface science. 618, 1 p., 155765.Research output: Contribution to journal › Comment/Letter to the editor › Academic › peer-review
Open AccessFile64 Downloads (Pure) -
Alloying, Dealloying, and Reentrant Alloying in (Sub)monolayer Growth of Ag on Pt(111)
Jankowski, M., van Vroonhoven, E., Wormeester, H., Zandvliet, H. J. W. & Poelsema, B., 2017, In: The Journal of physical chemistry C. 121, 15, p. 8353-8363Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile5 Citations (Scopus)56 Downloads (Pure) -
Dealing with inaccuracies in the analysis on solvent-induced swelling of transparent thin films using in situ spectroscopic ellipsometry in the visible wavelength range
Tempelman, K., Kappert, E. J., Raaijmakers, M. J. T., Wormeester, H. & Benes, N. E. (Corresponding Author), 1 Jun 2017, In: Surface and interface analysis. 49, 6, p. 538-547Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile4 Citations (Scopus)396 Downloads (Pure) -
Visualization of steps and surface reconstructions in Helium Ion Microscopy with atomic precision
Hlawacek, G., Jankowski, M., Wormeester, H., van Gastel, R., Zandvliet, H. J. W. & Poelsema, B., 2016, In: Ultramicroscopy. 162, p. 17-24Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile10 Citations (Scopus)135 Downloads (Pure)
Activities
- 115 Oral presentation
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Ellipsometric study of carbon contaminatin and cleaning of EUV mirrors
Wormeester, H. (Speaker)
11 Apr 2014Activity: Talk or presentation › Oral presentation
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Polarization conversion in a fourfold symmetric subwavelength grating; a Mueller matrix ellipsometric analysis
Wormeester, H. (Speaker) & Oates, T. W. H. (Speaker)
26 May 2013Activity: Talk or presentation › Oral presentation
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Superimposed effects of penetrant and nanoconfinement on the behavior of ultra thin films
Ogieglo, W. (Speaker), Wormeester, H. (Speaker), Wessling, M. (Speaker) & Benes, N. E. (Speaker)
7 Mar 2012Activity: Talk or presentation › Oral presentation
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Ellipsometric characterisation of rough and structured surfaces
Wormeester, H. (Speaker)
5 Mar 2012Activity: Talk or presentation › Oral presentation
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Glassy state influence on molecular transport in ultra-thin films
Ogieglo, W. (Speaker), Wormeester, H. (Speaker), Wessling, M. (Speaker) & Benes, N. E. (Speaker)
21 Jan 2012Activity: Talk or presentation › Oral presentation