Research Output per year
Fingerprint Dive into the research topics where Hans Gerard Kerkhoff is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 53 Similar Profiles
Aging of materials
Engineering & Materials Science
Monitoring
Engineering & Materials Science
Avionics
Engineering & Materials Science
Data fusion
Engineering & Materials Science
Health
Engineering & Materials Science
Embedded software
Engineering & Materials Science
Enhanced magnetoresistance
Engineering & Materials Science
Railroad cars
Engineering & Materials Science
Network
Recent external collaboration on country level. Dive into details by clicking on the dots.
Research Output 1988 2019
Ageing and embedded instrument monitoring of analogue/mixed-signal IPS
Wan, J., 1 Nov 2019, Enschede: University of Twente. 188 p.Research output: Thesis › PhD Thesis - Research UT, graduation UT › Academic
Open Access
File
Aging of materials
Monitoring
Networks (circuits)
Measurement theory
Degradation
An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips
Ibrahim, A. M. Y. & Kerkhoff, H. G., 3 Sep 2019, 2019 IEEE International Test Conference in Asia (ITC-Asia). Piscataway, NJ: IEEE, 6 p. 8871531Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open Access
File
Controllers
Embedded software
Built-in self test
Temperature sensors
System-on-chip
Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks
Ibrahim, A. M. Y., Kerkhoff, H. G., Ibrahim, A., Safar, M. & El-Kharashi, M. W., 23 Apr 2019, IEEE VLSI Test Symposium (VTS): VTS 2019: proceedings: April 23rd - 25th 2019, Monterey, California (USA). Piscataway, NJ: IEEE, p. 1-6 6 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Monitoring
Enhancing Physical Unclonable Function Robustness Employing Embedded Instruments
Pathrose Vareed, J., Ali, G. & Kerkhoff, H. G., 10 Jan 2019, 2018 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS). IEEE, p. 370-373 4 p. 8605571Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Field programmable gate arrays (FPGA)
Hardware
Hardware security
Internet of things
IJTAG Compatible Delay-line based Voltage Embedded Instrument with One Clock-cycle Conversion Time
Ali, G., Pathrose Vareed, J. & Kerkhoff, H. G., 6 May 2019, 2019 IEEE Latin American Test Symposium (LATS). 6 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Electric delay lines
Clocks
Electric potential
Monitoring
Temperature
Activities 1990 1998
- 3 Oral presentation
Testable Design and Testing of Microsystems
Hans G. Kerkhoff (Keynote speaker)1 Feb 1998
Activity: Talk or presentation › Oral presentation
The ATSEC test-pattern generation tools
Hans G. Kerkhoff (Invited speaker)24 May 1995
Activity: Talk or presentation › Oral presentation
Self-test of a 1 Mbit stand-alone static random access memory
R.H.A. Rijk (Speaker), R.W.C. Dekker (Speaker), H.G. Kerkhoff (Speaker)1 Apr 1990
Activity: Talk or presentation › Oral presentation