No photo of Hans Gerard Kerkhoff
Contact Expert

Hans Gerard Kerkhoff

dr.ir.

1988 …2019

Research output per year

If you made any changes in Pure these will be visible here soon.

Fingerprint Dive into the research topics where Hans Gerard Kerkhoff is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 38 Similar Profiles

Network Recent external collaboration on country level. Dive into details by clicking on the dots.

Research Output

An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips

Ibrahim, A. M. Y. & Kerkhoff, H. G., 3 Sep 2019, 2019 IEEE International Test Conference in Asia (ITC-Asia). Piscataway, NJ: IEEE, 6 p. 8871531

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

Open Access
File
    • 27 Downloads (Pure)

    Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks

    Ibrahim, A. M. Y., Kerkhoff, H. G., Ibrahim, A., Safar, M. & El-Kharashi, M. W., 23 Apr 2019, IEEE VLSI Test Symposium (VTS): VTS 2019: proceedings: April 23rd - 25th 2019, Monterey, California (USA). Piscataway, NJ: IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    • 2 Citations (Scopus)

    Enhancing Physical Unclonable Function Robustness Employing Embedded Instruments

    Pathrose Vareed, J., Ali, G. & Kerkhoff, H. G., 10 Jan 2019, 2018 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS). IEEE, p. 370-373 4 p. 8605571

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    • IJTAG Compatible Delay-line based Voltage Embedded Instrument with One Clock-cycle Conversion Time

    Ali, G., Pathrose Vareed, J. & Kerkhoff, H. G., 6 May 2019, 2019 IEEE Latin American Test Symposium (LATS). 6 p.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    • 1 Citation (Scopus)
    1 Downloads (Pure)

    IJTAG Compatible Timing Monitor with Robust Self-Calibration for Environmental and Aging Variation

    Ali, G., Pathros, J. & Kerkhoff, H. G., 8 Aug 2019, Proceedings - 2019 IEEE European Test Symposium, ETS 2019. IEEE, p. 1-6 6 p. 8791539. (Proceedings of the European Test Workshop (ETS); vol. 2019).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    • 1 Downloads (Pure)

    Activities

    • 4 Oral presentation
    • 3 Invited talk

    The Gap between Industrial Problems and Academic Solutions

    Hans G. Kerkhoff (Invited speaker)
    1 Jun 2003

    Activity: Talk or presentation › Invited talk

    The Necessity of Self-Testing in High-Speed Electronics

    Hans G. Kerkhoff (Invited speaker)
    25 Apr 1999

    Activity: Talk or presentation › Oral presentation

    Testable Design and Testing of Microsystems

    Hans G. Kerkhoff (Keynote speaker)
    1 Feb 1998

    Activity: Talk or presentation › Oral presentation

    Taming the analogue fault-simulation beast

    Hans G. Kerkhoff (Invited speaker)
    1 Jun 1997

    Activity: Talk or presentation › Invited talk

    The ATSEC test-pattern generation tools

    Hans G. Kerkhoff (Invited speaker)
    24 May 1995

    Activity: Talk or presentation › Oral presentation