Research Output per year
Research Output per year
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Dive into the research topics where Hans Gerard Kerkhoff is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Research Output
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An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips
Ibrahim, A. M. Y. & Kerkhoff, H. G., 3 Sep 2019, 2019 IEEE International Test Conference in Asia (ITC-Asia). Piscataway, NJ: IEEE, 6 p. 8871531Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open AccessFile -
Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks
Ibrahim, A. M. Y., Kerkhoff, H. G., Ibrahim, A., Safar, M. & El-Kharashi, M. W., 23 Apr 2019, IEEE VLSI Test Symposium (VTS): VTS 2019: proceedings: April 23rd - 25th 2019, Monterey, California (USA). Piscataway, NJ: IEEE, p. 1-6 6 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
2 Citations (Scopus) -
Enhancing Physical Unclonable Function Robustness Employing Embedded Instruments
Pathrose Vareed, J., Ali, G. & Kerkhoff, H. G., 10 Jan 2019, 2018 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS). IEEE, p. 370-373 4 p. 8605571Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
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IJTAG Compatible Delay-line based Voltage Embedded Instrument with One Clock-cycle Conversion Time
Ali, G., Pathrose Vareed, J. & Kerkhoff, H. G., 6 May 2019, 2019 IEEE Latin American Test Symposium (LATS). 6 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
2 Citations (Scopus)1 Downloads (Pure) -
IJTAG Compatible Timing Monitor with Robust Self-Calibration for Environmental and Aging Variation
Ali, G., Pathros, J. & Kerkhoff, H. G., 8 Aug 2019, Proceedings - 2019 IEEE European Test Symposium, ETS 2019. IEEE, p. 1-6 6 p. 8791539. (Proceedings of the European Test Workshop (ETS); vol. 2019).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
1 Citation (Scopus)1 Downloads (Pure)
Activities
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Test signal generation in MS circuits
Hans G. Kerkhoff (Speaker)
1 Jun 2004Activity: Talk or presentation › Oral presentation
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The Gap between Industrial Problems and Academic Solutions
Hans G. Kerkhoff (Invited speaker)
1 Jun 2003Activity: Talk or presentation › Invited talk
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Testing of Systems-on-Chip
Hans G. Kerkhoff (Speaker)
12 Mar 2002Activity: Talk or presentation › Oral presentation
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The Necessity of Self-Testing in High-Speed Electronics
Hans G. Kerkhoff (Invited speaker)
25 Apr 1999Activity: Talk or presentation › Oral presentation
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Testable Design and Testing of Microsystems
Hans G. Kerkhoff (Keynote speaker)
1 Feb 1998Activity: Talk or presentation › Oral presentation