1988 …2019
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Fingerprint Dive into the research topics where Hans Gerard Kerkhoff is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 53 Similar Profiles
Aging of materials Engineering & Materials Science
Monitoring Engineering & Materials Science
Avionics Engineering & Materials Science
Data fusion Engineering & Materials Science
Health Engineering & Materials Science
Embedded software Engineering & Materials Science
Enhanced magnetoresistance Engineering & Materials Science
Railroad cars Engineering & Materials Science

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Research Output 1988 2019

17 Downloads (Pure)

Ageing and embedded instrument monitoring of analogue/mixed-signal IPS

Wan, J., 1 Nov 2019, Enschede: University of Twente. 188 p.

Research output: ThesisPhD Thesis - Research UT, graduation UTAcademic

Open Access
File
Aging of materials
Monitoring
Networks (circuits)
Measurement theory
Degradation
4 Downloads (Pure)

An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips

Ibrahim, A. M. Y. & Kerkhoff, H. G., 3 Sep 2019, 2019 IEEE International Test Conference in Asia (ITC-Asia). Piscataway, NJ: IEEE, 6 p. 8871531

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
Controllers
Embedded software
Built-in self test
Temperature sensors
System-on-chip

Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks

Ibrahim, A. M. Y., Kerkhoff, H. G., Ibrahim, A., Safar, M. & El-Kharashi, M. W., 23 Apr 2019, IEEE VLSI Test Symposium (VTS): VTS 2019: proceedings: April 23rd - 25th 2019, Monterey, California (USA). Piscataway, NJ: IEEE, p. 1-6 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Monitoring

Enhancing Physical Unclonable Function Robustness Employing Embedded Instruments

Pathrose Vareed, J., Ali, G. & Kerkhoff, H. G., 10 Jan 2019, 2018 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS). IEEE, p. 370-373 4 p. 8605571

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Field programmable gate arrays (FPGA)
Hardware
Hardware security
Internet of things
1 Downloads (Pure)

IJTAG Compatible Delay-line based Voltage Embedded Instrument with One Clock-cycle Conversion Time

Ali, G., Pathrose Vareed, J. & Kerkhoff, H. G., 6 May 2019, 2019 IEEE Latin American Test Symposium (LATS). 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Electric delay lines
Clocks
Electric potential
Monitoring
Temperature

Activities 1990 1998

  • 3 Oral presentation

Testable Design and Testing of Microsystems

Hans G. Kerkhoff (Keynote speaker)
1 Feb 1998

Activity: Talk or presentationOral presentation

The ATSEC test-pattern generation tools

Hans G. Kerkhoff (Invited speaker)
24 May 1995

Activity: Talk or presentationOral presentation

Self-test of a 1 Mbit stand-alone static random access memory

R.H.A. Rijk (Speaker), R.W.C. Dekker (Speaker), H.G. Kerkhoff (Speaker)
1 Apr 1990

Activity: Talk or presentationOral presentation