Research output per year
Research output per year
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Dive into the research topics where Hans Gerard Kerkhoff is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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A New Monitor Insertion Algorithm for Intermittent Fault Detection
Ebrahimi, H. & Kerkhoff, H. G., May 2020, 2020 IEEE European Test Symposium, ETS 2020. IEEE, 9131563. (Proceedings of the European Test Workshop; vol. 2020-May).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
2 Citations (Scopus) -
Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning
Bagheriye, L., Ali, G. & Kerkhoff, H. G., 13 Jul 2020, IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2020. Piscataway, NJ: IEEE, p. 1-4 4 p. (IEEE International Symposium on On-Line Testing and Robust System Design (IOLTS); vol. 2020, no. 26).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
2 Citations (Scopus)1 Downloads (Pure) -
On-Chip Embedded Instruments Data Fusion and Life-Time Prognostics of Dependable VLSI-SoCs using Machine-learning
Ali, G., Bagheriye, L. & Kerkhoff, H. G., 28 Sep 2020, IEEE International Symposium on Circuits and Systems, ISCAS 2020. Piscataway, NJ: IEEE, p. 1-5 5 p. (IEEE International Symposium on Circuits and Systems (ISCAS); vol. 2020).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
1 Downloads (Pure) -
On-chip EOL Prognostics Using Data-Fusion of Embedded Instruments for Dependable MP-SoCs
Ali, G., Bagheriye, L., Manhaeve, H. & Kerkhoff, H. G., 23 Nov 2020, IEEE Asian Test Symposium, ATS 2020. Piscataway, NJ: IEEE, p. 1-6 6 p. (IEEE Asian Test Symposium (ATS); vol. 2020, no. 29).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
1 Downloads (Pure) -
A Digital On-Line Monitor for Detecting Intermittent Resistance Faults at Board Level
Ebrahimi, H. & Kerkhoff, H. G., 1 Dec 2019, In: Journal of circuits, systems and computers. 28, 1940003.Research output: Contribution to journal › Article › Academic › peer-review
1 Citation (Scopus)
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Testable Design for MEMS Sensors
Hans G. Kerkhoff (Speaker)
1 Nov 2005Activity: Talk or presentation › Oral presentation
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VHDL-AMS Fault Simulation for testing DNA Bio-Sensing Arrays
Hans G. Kerkhoff (Speaker)
1 Nov 2005Activity: Talk or presentation › Oral presentation
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Fault Modeling & System Simulation of FlowFET-Based MEF Arrays
Hans G. Kerkhoff (Speaker)
1 Nov 2005Activity: Talk or presentation › Oral presentation
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10 years - Past Success Stories & Future Challenges
Hans G. Kerkhoff (Speaker)
1 Jun 2004Activity: Talk or presentation › Oral presentation
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Test signal generation in MS circuits
Hans G. Kerkhoff (Speaker)
1 Jun 2004Activity: Talk or presentation › Oral presentation