Hans Gerard Kerkhoff

dr.ir.

1988 …2019

Research output per year

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Research Output

An On-Chip IEEE 1687 Network Controller for Reliability and Functional Safety Management of System-on-Chips

Ibrahim, A. M. Y. & Kerkhoff, H. G., 3 Sep 2019, 2019 IEEE International Test Conference in Asia (ITC-Asia). Piscataway, NJ: IEEE, 6 p. 8871531

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
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  • 21 Downloads (Pure)

    Efficient Structured Scan Patterns Retargeting for Hierarchical IEEE 1687 Networks

    Ibrahim, A. M. Y., Kerkhoff, H. G., Ibrahim, A., Safar, M. & El-Kharashi, M. W., 23 Apr 2019, IEEE VLSI Test Symposium (VTS): VTS 2019: proceedings: April 23rd - 25th 2019, Monterey, California (USA). Piscataway, NJ: IEEE, p. 1-6 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

  • 2 Citations (Scopus)

    Enhancing Physical Unclonable Function Robustness Employing Embedded Instruments

    Pathrose Vareed, J., Ali, G. & Kerkhoff, H. G., 10 Jan 2019, 2018 IEEE Asia Pacific Conference on Circuits and Systems (APCCAS). IEEE, p. 370-373 4 p. 8605571

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

  • IJTAG Compatible Delay-line based Voltage Embedded Instrument with One Clock-cycle Conversion Time

    Ali, G., Pathrose Vareed, J. & Kerkhoff, H. G., 6 May 2019, 2019 IEEE Latin American Test Symposium (LATS). 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

  • 1 Citation (Scopus)
    1 Downloads (Pure)

    IJTAG Compatible Timing Monitor with Robust Self-Calibration for Environmental and Aging Variation

    Ali, G., Pathros, J. & Kerkhoff, H. G., 8 Aug 2019, Proceedings - 2019 IEEE European Test Symposium, ETS 2019. IEEE, p. 1-6 6 p. 8791539. (Proceedings of the European Test Workshop (ETS); vol. 2019).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

  • 1 Downloads (Pure)

    Activities

    • 3 Oral presentation

    Testable Design and Testing of Microsystems

    Hans G. Kerkhoff (Keynote speaker)
    1 Feb 1998

    Activity: Talk or presentationOral presentation

    The ATSEC test-pattern generation tools

    Hans G. Kerkhoff (Invited speaker)
    24 May 1995

    Activity: Talk or presentationOral presentation

    Self-test of a 1 Mbit stand-alone static random access memory

    R.H.A. Rijk (Speaker), R.W.C. Dekker (Speaker), H.G. Kerkhoff (Speaker)
    1 Apr 1990

    Activity: Talk or presentationOral presentation