Hendrikus de Vries

ing.

19932009

Research output per year

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  • 19 Similar Profiles

Research Output

  • 7 Conference contribution
  • 4 Poster
  • 2 Other contribution
  • 1 Paper

Low temperature TFTs with poly-stripes

Brunets, I., Boogaard, A., Smits, S. M., de Vries, H., Aarnink, A. A. I., Holleman, J., Kovalgin, A. Y. & Schmitz, J., 5 Mar 2009, Proceedings of the 5th International Thin Film Transistor Conference ITC'09. Paris, France: Ecole Polytechnique, p. 62-65 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

  • 2 Downloads (Pure)

    Charge pumping at radio frequencies: [MOSFET device interface state density measurement]

    Sasse, G. T., de Vries, H. & Schmitz, J., Apr 2005, ICMTS 2005: proceedings of the 2005 International Conference on Microelectronic Test Structures, April 4-7, 2005, De Valk, Tiensestraat 41, Leuven, Belgium. Piscataway, NJ: IEEE, p. 229-233 5 p. (Proceedings International Conference on Microelectronic Test Structures; vol. 2005).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

  • 2 Citations (Scopus)
    9 Downloads (Pure)

    The RF charge pump technique for measuring the interface state density on leaky dielectrics

    Sasse, G. T., de Vries, H., Vries, H. & Schmitz, J., Nov 2005, p. 47-51. 5 p.

    Research output: Contribution to conferencePaper

    The RF Charge Pump Technique for Measuring the Interface State Density on Leaky Dielectrics

    Sasse, G. T., de Vries, H. & Schmitz, J., 17 Nov 2005, 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Netherlands: STW, p. 47-51 5 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

    Mixed-Signal testing at the ASIC design course at Twente University

    Tangelder, R. J. W. T., de Vries, H., Klumperink, E. A. M., Snijders, H., Kerkhoff, H. G., Smit, J., Gerez, S. H. & Speek, H., 27 Jan 2000, Proceedings of the 3rd European Workshop on Microelectronics Education. Fuveau - France, p. 205-208

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review