Hendrikus de Vries

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19932009
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Fingerprint Dive into the research topics where Hendrikus de Vries is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

  • 17 Similar Profiles
Transistors Engineering & Materials Science
Amorphous silicon Engineering & Materials Science
Grain boundaries Engineering & Materials Science
Annealing Engineering & Materials Science
Thin films Engineering & Materials Science
Temperature Engineering & Materials Science
Crystals Engineering & Materials Science
Lasers Engineering & Materials Science

Research Output 1993 2009

  • 7 Conference contribution
  • 4 Poster
  • 2 Other contribution
  • 1 Paper

Low temperature TFTs with poly-stripes

Brunets, I., Boogaard, A., Smits, S. M., de Vries, H., Aarnink, A. A. I., Holleman, J., Kovalgin, A. Y. & Schmitz, J., 5 Mar 2009, Proceedings of the 5th International Thin Film Transistor Conference ITC'09. Paris, France: Ecole Polytechnique, p. 62-65 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Transistors
Amorphous silicon
Grain boundaries
Annealing
Thin films
2 Citations (Scopus)
9 Downloads (Pure)

Charge pumping at radio frequencies: [MOSFET device interface state density measurement]

Sasse, G. T., de Vries, H. & Schmitz, J., Apr 2005, ICMTS 2005: proceedings of the 2005 International Conference on Microelectronic Test Structures, April 4-7, 2005, De Valk, Tiensestraat 41, Leuven, Belgium. Piscataway, NJ: IEEE, p. 229-233 5 p. (Proceedings International Conference on Microelectronic Test Structures; vol. 2005).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Electron density measurement
Interface states
MOSFET devices
Pumps
Leakage currents

The RF charge pump technique for measuring the interface state density on leaky dielectrics

Sasse, G. T., de Vries, H., Vries, H. & Schmitz, J., Nov 2005, p. 47-51. 5 p.

Research output: Contribution to conferencePaper

The RF Charge Pump Technique for Measuring the Interface State Density on Leaky Dielectrics

Sasse, G. T., de Vries, H. & Schmitz, J., 17 Nov 2005, 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Netherlands: STW, p. 47-51 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Mixed-Signal testing at the ASIC design course at Twente University

Tangelder, R. J. W. T., de Vries, H., Klumperink, E. A. M., Snijders, H., Kerkhoff, H. G., Smit, J., Gerez, S. H. & Speek, H., 27 Jan 2000, Proceedings of the 3rd European Workshop on Microelectronics Education. Fuveau - France, p. 205-208

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review