Igor A. Makhotkin

Assistant Professor, Mesa+
Assistant Professor, XUV Optics

Source: Scopus
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196 Citations
8 h-Index
31 Poster
29 Article
4 Other contribution
3 Conference contribution
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A semi-Analytical approach for the characterization of ordered 3D nanostructures using grazing-incidence X-ray fluorescence
Nikolaev, K. V., Soltwisch, V., Honicke, P., Scholze, F., De La Rie, J., Yakunin, S. N., Makhotkin, I. A., Van De Kruijs, R. W. E. & Bijkerk, F., 1 Mar 2020, In : Journal of synchrotron radiation. 27, p. 386-395 10 p.
Research output: Contribution to journal › Article › Academic › peer-review

Open Access
File
3 Citations (Scopus)

18 Downloads (Pure)
Similarity in ruthenium damage induced by photons with different energies: From visible light to hard X-rays
Milov, I., Lipp, V., Ilnitsky, D., Medvedev, N., Migdal, K., Zhakhovsky, V., Khokhlov, V., Petrov, Y., Inogamov, N., Semin, S., Kimel, A., Ziaja, B., Makhotkin, I. A., Louis, E. & Bijkerk, F., 31 Jan 2020, In : Applied surface science. 501, 143973.
Research output: Contribution to journal › Article › Academic › peer-review

Open Access
File
4 Citations (Scopus)

29 Downloads (Pure)
Two-level ablation and damage morphology of Ru films under femtosecond extreme UV irradiation
Milov, I., Zhakhovsky, V., Ilnitsky, D., Migdal, K., Khokhlov, V., Petrov, Y., Inogamov, N., Lipp, V., Medvedev, N., Ziaja, B., Medvedev, V., Makhotkin, I. A., Louis, E. & Bijkerk, F., 30 Oct 2020, In : Applied surface science. 528, 146952.
Research output: Contribution to journal › Article › Academic › peer-review

Open Access
File
15 Downloads (Pure)
Determining the transmission of thin foil filters for soft X-ray free-electron laser radiation: an ablation imprint approach
Burian, T., Hájková, V., Saksl, K., Vozda, V., Makhotkin, I. A., Louis, E., Schreiber, S., Tiedtke, K., Toleikis, S., Keitel, B., Plönjes, E., Ruiz-Lopez, M. I., Kuhlmann, M., Wodzinski, A., Enkisch, H., Hermann, M., Strobel, S., Loch, R. A., Sobierajski, R., Jacyna, I. & 9 others, Klinger, D., Jurek, M., Pełka, J. B., de Vries, G., Störmer, M., Scholze, F., Siewert, F., Mey, T. & Chalupský, J., 14 May 2019, Optics Damage and Materials Processing by EUV/X-ray Radiation VII. (SPIE conference proceedings; vol. 11035).
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Grazing-incidence small-angle X-ray scattering study of correlated lateral density fluctuations in W/Si multilayers
Nikolaev, K. V., Yakunin, S. N., Makhotkin, I. A., de la Rie, J., Medvedev, R. V., Rogachev, A. V., Trunckin, I. N., Vasiliev, A. L., Hendrikx, C. P., Gateshki, M., van de Kruijs, R. W. E. & Bijkerk, F., Mar 2019, In : Acta Crystallographica Section A: Foundations and Advances. 75, p. 342-351 10 p.
Research output: Contribution to journal › Article › Academic › peer-review

Open Access
File
2 Citations (Scopus)

43 Downloads (Pure)

27 Oral presentation
6 Invited talk

Optical properties of multilayers for operational wavelengths between 6.6 and 13.5 nm’
Andrey Yakshin (Speaker), Andrey Zameshin (Contributor), Dmitry Kuznetsov (Contributor), Igor Milov (Contributor), Igor A. Makhotkin (Contributor), Eric Louis (Contributor) & Fred Bijkerk (Contributor)
4 Nov 2019 → 6 Nov 2019
Activity: Talk or presentation › Invited talk
Damage processes in ruthenium thin films induced by femtosecond laser pulses for a wide range of incident photon energy
Igor Milov (Contributor), Igor A. Makhotkin (Speaker), Nikita Medvedev (Contributor), vladimir lipp (Contributor), B. Ziaja (Contributor), V. Khokhlov (Contributor), V. Zhakhovsky (Contributor), Yu. Petrov (Contributor), V. Shepelev (Contributor), D. Ilnitsky (Contributor), K. Migdal (Contributor), N. Inogamov (Contributor), Eric Louis (Contributor) & F. Bijkerk (Contributor)
21 Oct 2019
Activity: Talk or presentation › Oral presentation
Damage processes in ruthenium thin films induced by femtosecond laser pulses with varying incident photon energy
Igor Milov (Contributor), Igor A. Makhotkin (Speaker), Nikita Medvedev (Contributor), vladimir lipp (Contributor), B. Ziaja (Contributor), V. Khokhlov (Contributor), V. Zhakhovsky (Contributor), Yu. Petrov (Contributor), V. Shepelev (Contributor), D. Ilnitsky (Contributor), K. Migdal (Contributor), N. Inogamov (Contributor), Eric Louis (Contributor) & F. Bijkerk (Contributor)
27 May 2019
Activity: Talk or presentation › Oral presentation
Structural analysis of ion polished W/Si soft X-ray multilayer reflectors
Roman Medvedev (Contributor), Konstantin Nikolaev (Contributor), Andrey Zameshin (Contributor), Dennis IJpes (Contributor), Igor A. Makhotkin (Contributor), Sergey N. Yakunin (Contributor), Andrey Yakshin (Speaker) & Fred Bijkerk (Contributor)
21 Oct 2019 → 23 Oct 2019
Activity: Talk or presentation › Oral presentation
Single-shot ablation of Ru thin films induced by fs EUV Free-Electron Laser
Igor Milov (Speaker), Igor A. Makhotkin (Contributor), Ryszard Sobierajski (Contributor), Nikita Medvedev (Contributor), Vladimir Lipp (Speaker), N. Inogamov (Contributor), V. Zhakhovsky (Contributor), V. Khokhlov (Contributor), Viacheslav Medvedev (Contributor), Eric Louis (Contributor) & Fred Bijkerk (Contributor)
19 Jun 2018
Activity: Talk or presentation › Oral presentation