Igor A. Makhotkin

  • 139 Citations
  • 7 h-Index
20102019
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Research Output 2010 2019

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Article
2019
1 Citation (Scopus)
20 Downloads (Pure)

Grazing-incidence small-angle X-ray scattering study of correlated lateral density fluctuations in W/Si multilayers

Nikolaev, K. V., Yakunin, S. N., Makhotkin, I. A., de la Rie, J., Medvedev, R. V., Rogachev, A. V., Trunckin, I. N., Vasiliev, A. L., Hendrikx, C. P., Gateshki, M., van de Kruijs, R. W. E. & Bijkerk, F., Mar 2019, In : Acta Crystallographica Section A: Foundations and Advances. 75, p. 342-351 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
X ray scattering
grazing incidence
Scanning Transmission Electron Microscopy
Multilayers
X-Rays

Hydrogenation dynamics of Ru capped y thin films

Soroka, O., Sturm, J. M., Van De Kruijs, R. W. E., Makhotkin, I. A., Nikolaev, K., Yakunin, S. N., Lee, C. J. & Bijkerk, F., 8 Oct 2019, In : Journal of applied physics. 126, 14, 145301.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
hydrogenation
thin films
ellipsometry
hydrogen
surface plasmon resonance
2 Downloads (Pure)

In-depth structural analysis of swift heavy ion irradiation in KY(WO4)2 for the fabrication of planar optical waveguides

Frentrop, R., Subbotin, I., Segerink, F., Keim, R., Tormo-marquez, V., Olivares, J., Shcherbachev, K., Yakunin, S., Makhotkin, I. & Garcia-blanco, S. M., 1 Dec 2019, In : Optical materials express. 9, 12, p. 4796-4810

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Heavy Ions
Planar waveguides
Optical waveguides
Ion bombardment
Heavy ions

Low-energy ion polishing of Si in W/Si soft X-ray multilayer structures

Medvedev, R. V., Nikolaev, K. V., Zameshin, A. A., Ijpes, D., Makhotkin, I. A., Yakunin, S. N., Yakshin, A. E. & Bijkerk, F., 25 Jul 2019, In : Journal of applied physics. 126, 4, 045302.

Research output: Contribution to journalArticleAcademicpeer-review

polishing
laminates
reflectance
roughness
ions

Optical and structural characterization of orthorhombic LaLuO3 using extreme ultraviolet reflectometry

Tryus, M., Nikolaev, K. V., Makhotkin, I. A., Schubert, J., Kibkalo, L., Danylyuk, S., Giglia, A., Nicolosi, P. & Juschkin, L., 30 Jun 2019, In : Thin solid films. 680, p. 94-101 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

Optical constants
error analysis
Pulsed laser deposition
Stoichiometry
Error analysis
1 Citation (Scopus)
19 Downloads (Pure)

Surface structure determination by x-ray standing waves at a free-electron laser

Mercurio, G., Makhotkin, I. A., Milov, I., Kim, Y., Zaluzhnyy, I., Dziarzhytski, S., Wenthaus, L., Vartanyants, I. & Wurth, W., 28 Mar 2019, In : New journal of physics. 21, 3, 13 p., 033031.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
standing waves
free electron lasers
x rays
dynamic structural analysis
temporal resolution
2018
2 Citations (Scopus)
50 Downloads (Pure)

Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold

Makhotkin, I. A., Milov, I., Chalupský, J., Tiedtke, K., Enkisch, H., de Vries, G., Scholze, F., Siewert, F., Sturm, J. M., Nikolaev, K. V., van de Kruijs, R. W. E., Smithers, M. A., Van Wolferen, H. A. G. M., Keim, E. G., Louis, E., Jacyna, I., Jurek, M., Klinger, D., Pelka, J. B., Juha, L. & 15 othersHájková, V., Vozda, V., Sburian, T., Saksl, K., Faatz, B., Keitel, B., Plönjes, E., Schreiber, S., Toleikis, S., Loch, R., Hermann, M., Strobel, S., Donker, R., Mey, T. & Sobierajski, R., 1 Nov 2018, In : Journal of the Optical Society of America B: Optical Physics. 35, 11, p. 2799-2805 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
free electron lasers
ruthenium
ablation
shot
damage
10 Citations (Scopus)
33 Downloads (Pure)

Experimental study of EUV mirror radiation damage resistance under long-term free-electron laser exposures below the single-shot damage threshold

Makhotkin, I. A., Sobierajski, R., Chalupsky, J., Tiedtke, K., de Vries, G., Störmer, M., Scholze, F., Siewert, F., van de Kruijs, R. W. E., Milov, I., Louis, E., Jacyna, I., Jurek, M., Klinger, D., Nittler, L., Syryanyy, Y., Juha, L., Hájková, V., Vozda, V., Burian, T. & 13 othersSaksl, K., Faatz, B., Keitel, B., Plonjes, E., Schreiber, S., Toleikis, S., Loch, R., Hermann, M., Strobel, S., Nienhuys, H. K., Gwalt, G., Mey, T. & Enkisch, H., Jan 2018, In : Journal of synchrotron radiation. 25, 1, p. 77-84 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Free electron lasers
Radiation damage
yield point
radiation damage
free electron lasers
5 Citations (Scopus)
27 Downloads (Pure)

Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser

Milov, I., Makhotkin, I. A., Sobierajski, R., Medvedev, N., lipp, V., Chalupsky, J., Sturm, J. M., Tiedtke, K., de Vries, G., Störmer, M., Siewert, F., van de Kruijs, R., Louis, E., Jacyna, I., Jurek, M., Juha, L., Hájková, V., Vozda, V., Burian, T., Saksl, K. & 13 othersFaatz, B., Keitel, B., Plönjes, E., Schreiber, S., Toleikis, S., Loch, R., Hermann, M., Strobel, S., Nienhuys, H. K., Gwalt, G., Mey, T., Enkisch, H. & Bijkerk, F., 23 Jul 2018, In : Optics express. 26, 15, p. 19665-19685 21 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
ultraviolet lasers
free electron lasers
shot
damage
thin films
1 Citation (Scopus)
42 Downloads (Pure)

Modeling of XUV-induced damage in Ru films: The role of model parameters

Milov, I., Lipp, V., Medvedev, N., Makhotkin, I. A., Louis, E. & Bijkerk, F., 28 Sep 2018, In : Journal of the Optical Society of America B: Optical Physics. 35, 10, p. B43-B53 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
damage
photoabsorption
hot electrons
ruthenium
electrons
34 Downloads (Pure)

Specular reflection intensity modulated by grazing-incidence diffraction in a wide angular range

Nikolaev, K. V., Makhotkin, I. A., Yakunin, S. N., Van De Kruijs, R. W. E., Chuev, M. A. & Bijkerk, F., 1 Sep 2018, In : Acta Crystallographica Section A: Foundations and Advances. 74, 5, p. 545-552 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
specular reflection
grazing incidence
X-Ray Diffraction
Theoretical Models
Diffraction
1 Citation (Scopus)

Study of ultrathin Pt/Co/Pt trilayers modified by nanosecond XUV pulses from laser-driven plasma source

Jacyna, I., Klinger, D., Pełka, J. B., Minikayev, R., Dłużewski, P., Dynowska, E., Jakubowski, M., Klepka, M. T., Zymierska, D., Bartnik, A., Kurant, Z., Wolska, A., Wawro, A., Sveklo, I., Plaisier, J. R., Eichert, D., Brigidi, F., Makhotkin, I., Maziewski, A. & Sobierajski, R., 30 Sep 2018, In : Journal of alloys and compounds. 763, p. 899-908 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

Plasma sources
Laser pulses
X rays
Magnetization
Lasers
2016
8 Citations (Scopus)
49 Downloads (Pure)
File
Multilayers
Optical constants
X-Rays
X rays
Incidence
4 Citations (Scopus)
46 Downloads (Pure)

Role of heat accumulation in the multi-shot damage of silicon irradiated with femtosecond XUV pulses at a 1 Mhz repetition rate

Sobierajski, R., Jacyna, I., Dluzewski, P., Klepka, M., Klinger, D., Pelka, J. B., Burian, T., Hajkova, V., Juha, L., Saksl, K., Vozda, V., Makhotkin, I. A., Louis, E., Faatz, B., Tiedtke, K., Toleikis, S., Enkisch, H., Hermann, M., Strobel, S., Loch, R. A. & 1 othersChalupsky, J., 29 Jun 2016, In : Optics express. 24, 14, p. 15468-15477 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
shot
repetition
damage
heat
thresholds
2015
Reflectivity
grazing incidence
Annealing
laminates
Multilayer
2014
18 Citations (Scopus)
177 Downloads (Pure)

Combined EUV reflectance and X-ray reflectivity data analysis of periodic multilayer structures

Yakunin, S. N., Makhotkin, I. A., Nikolaev, K. V., van de Kruijs, R. W. E., Chuev, M. A. & Bijkerk, F., 2014, In : Optics express. 22, 17, p. 20076-20086 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
laminates
reflectance
grazing incidence
x rays
sensitivity
7 Citations (Scopus)

Diffusion-induced structural changes in La/B-based multilayers for 6.7-nm radiation

Nyabero, S. L., van de Kruijs, R. W. E., Yakshin, A., Makhotkin, I. A., Bosgra, J. & Bijkerk, F., 2014, In : Journal of micro/nanolithography, MEMS, and MOEMS. 13, 1, p. 013014-013014-5 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

Multilayers
thermal stability
reflectance
Radiation
annealing
3 Citations (Scopus)

Model independent X-ray standing wave analysis of periodic multilayer structures

Yakunin, S. N., Makhotkin, I. A., van de Kruijs, R. W. E., Chuev, M. A., Pashaev, E. M., Zoethout, E., Louis, E., Seregin, S. Y., Subbotin, I. A., Novikov, D., Bijkerk, F. & Kovalchuk, M. V., 2014, In : Journal of applied physics. 115, 13, p. - 134303.

Research output: Contribution to journalArticleAcademicpeer-review

standing waves
laminates
fluorescence
x rays
profiles
2013
5 Citations (Scopus)

Determination of preferential molecular orientation in porphyrin-fullerene dyad zndhd6ee monolayers by the x-ray standing-wave method and x-ray reflectometry

Seregin, A. Y., D'yakova, Y. A., Yakunin, S. N., Makhotkin, I. A., Alekseev, A. S., Klechkovskaya, V. V., Tereschenko, E. Y., Tkachenko, N. V., Lemmetyinen, H., Feigin, L. A. & Kovalchuk, M. V., 1 Jan 2013, In : Crystallography reports. 58, 6, p. 934-938 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

Fullerenes
Molecular orientation
Porphyrins
standing waves
porphyrins
28 Citations (Scopus)
38 Downloads (Pure)

Short period La/B and LaN/B multilayer mirrors for ~6.8 nm wavelength

Makhotkin, I. A., Zoethout, E., van de Kruijs, R., Yakunin, S. N., Louis, E., Yakunin, A. M., Banine, V., Müllender, S. & Bijkerk, F., 2 Dec 2013, In : Optics express. 21, 24, p. 29894-29904 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
mirrors
reflectance
wavelengths
grazing incidence
laminates
2012
4 Citations (Scopus)
1 Downloads (Pure)

Influence of noble gas ion polishing species on extreme ultraviolet mirrors

van den Boogaard, T., Zoethout, E., Makhotkin, I. A., Louis, E. & Bijkerk, F., 2012, In : Journal of applied physics. 112, 12, p. - 4 p., 123502.

Research output: Contribution to journalArticleAcademicpeer-review

polishing
rare gases
mirrors
roughness
ions
23 Citations (Scopus)
10 Downloads (Pure)

Spectral properties of La/B - Based multilayer mirrors near the boron K absorption edge

Makhotkin, I. A., Zoethout, E., Louis, E., Yakunin, A. M., Müllender, S. & Bijkerk, F., 21 May 2012, In : Optics express. 20, 11, p. 11778-11786 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
boron
mirrors
reflectance
wavelengths
lanthanum compounds
12 Citations (Scopus)
39 Downloads (Pure)

Wavelength selection for multilayer coatings for the lithography generation beyond extreme ultraviolet

Makhotkin, I. A., Zoethout, E., Louis, E., Yakunin, A. M., Muellender, S. & Bijkerk, F., 19 Oct 2012, In : Journal of micro/nanolithography, MEMS, and MOEMS. 11, 4, p. 040501-1-040501-3 3 p., 040501.

Research output: Contribution to journalArticleAcademicpeer-review

File
Boron
Lithography
Multilayers
boron
lithography
2011

Investigation of the Formation of QuasicrystallineAl70-Pd20-Re10 Phase in situ during Annealing

Makhotkin, I. A., Yakunin, S. N., Seregin, A. Y., Shaitura, D. S., Tsetlin, M. B. & Tereshchenko, E. Y., 2011, In : Crystallography reports. 56, 5, p. 871-874

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)

Investigation of the Thermal Diffusion during the Formation of a Quasicrystalline Phase in Thin Al–Pd–Re Films

Seregin, A. Y., Makhotkin, I. A., Yakunin, S. N., Erko, A. I., Chikina, E. A., Mikheeva, M. N. & Ol’shanskii, E. D., 2011, In : Crystallography reports. 56, 3, p. 497-501

Research output: Contribution to journalArticleAcademicpeer-review