Research Output per year
Research Output per year
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Dive into the research topics where Jurriaan Schmitz is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Research Output
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Analysis of short-circuit transients in the LHC main dipole circuit
Liakopoulou, A., Annema, A. J., Bortot, L., Charifoulline, Z., MacIejewski, M., Prioli, M., Ravaioli, E., Salm, C., Schmitz, J. & Verweij, A. P., 19 Jun 2020, In : Journal of physics: Conference series. 1559, 1, 012077.Research output: Contribution to journal › Conference article › Academic › peer-review
Open AccessFile -
Anomalous Scaling of Parasitic Capacitance in FETs with a High-K Channel Material
Smink, A. E. M., de Jong, M. J., Hilgenkamp, H., Van Der Wiel, W. G. & Schmitz, J., May 2020, 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, 9107901. (IEEE International Conference on Microelectronic Test Structures; vol. 2020).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
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Conduction and electric field effect in ultra-thin tungsten films
van der Zouw, K., Aarnink, A. A. I., Schmitz, J. & Kovalgin, A. Y., May 2020, In : IEEE Transactions on Semiconductor Manufacturing. 33, 2, p. 202-209 8 p., 9016070.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile -
Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices
De Jong, M. J., Salm, C. & Schmitz, J., 30 Jun 2020, 2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings. IEEE, 9129540. (IEEE International Reliability Physics Symposium Proceedings; vol. 2020-April).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
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Interface States Characterization of UTB SOI MOSFETs From the Subthreshold Current
Vermeer, M. L., Hueting, R. J. E., Pirro, L., Hoentschel, J. & Schmitz, J., 23 Dec 2020, In : IEEE transactions on electron devices. 6 p.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile
Activities
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Electrical characterization of hot-wire assisted atomic layer deposited Tungsten films
Kees van der Zouw (Speaker), Antonius A.I. Aarnink (Contributor), Jurriaan Schmitz (Contributor) & Alexey Y. Kovalgin (Contributor)
19 Mar 2019Activity: Talk or presentation › Oral presentation
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Purely Thermal Deposition of Polycrystalline Gallium Nitride Films at 400 °C
Sourish Banerjee (Speaker), Satadal Dutta (Contributor), Antonius A.I. Aarnink (Contributor), Jurriaan Schmitz (Contributor), Dirk J Gravesteijn (Contributor) & Alexey Y. Kovalgin (Contributor)
29 Jul 2018 → 1 Aug 2018Activity: Talk or presentation › Oral presentation
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How hot is the wire: optical, electrical and combined methods of filament temperature determination
Arnoud Jonathan Onnink (Speaker), Alexey Y. Kovalgin (Contributor) & Jurriaan Schmitz (Contributor)
3 Sep 2018 → 6 Sep 2018Activity: Talk or presentation › Oral presentation
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Hot wire technique as a radical source for atomic layer deposition of metal and metal nitride films
Sourish Banerjee (Speaker), Ramazan Oguzhan Apaydin (Contributor), Antonius A.I. Aarnink (Contributor), Jurriaan Schmitz (Contributor), Dirk J Gravesteijn (Contributor), Machiel Pieter de Jong (Contributor) & Alexey Y. Kovalgin (Contributor)
11 Jun 2017 → 17 Jun 2017Activity: Talk or presentation › Oral presentation
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Optocouplers in CMOS for smart power
Satadal Dutta (Speaker), Vishal Vishal Agarwal (Contributor), Anne J. Annema (Contributor), Raymond Josephus Engelbart Hueting (Invited speaker) & Jurriaan Schmitz (Contributor)
29 May 2017Activity: Talk or presentation › Invited talk