Research output per year
Research output per year
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Dive into the research topics where Jurriaan Schmitz is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Interface States Characterization of UTB SOI MOSFETs From the Subthreshold Current
Vermeer, M. L., Hueting, R. J. E., Pirro, L., Hoentschel, J. & Schmitz, J., 1 Feb 2021, In: IEEE Transactions on Electron Devices. 68, 2, p. 497-502 6 p., 9305941.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile57 Downloads (Pure) -
Analysis of short-circuit transients in the LHC main dipole circuit
Liakopoulou, A., Annema, A. J., Bortot, L., Charifoulline, Z., MacIejewski, M., Prioli, M., Ravaioli, E., Salm, C., Schmitz, J. & Verweij, A. P., 19 Jun 2020, In: Journal of physics: Conference series. 1559, 1, 012077.Research output: Contribution to journal › Conference article › Academic › peer-review
Open AccessFile17 Downloads (Pure) -
Anomalous Scaling of Parasitic Capacitance in FETs with a High-K Channel Material
Smink, A. E. M., de Jong, M. J., Hilgenkamp, H., Van Der Wiel, W. G. & Schmitz, J., May 2020, 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, 9107901. (IEEE International Conference on Microelectronic Test Structures; vol. 2020).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open AccessFile8 Downloads (Pure) -
Conduction and electric field effect in ultra-thin tungsten films
van der Zouw, K., Aarnink, A. A. I., Schmitz, J. & Kovalgin, A. Y., May 2020, In: IEEE Transactions on Semiconductor Manufacturing. 33, 2, p. 202-209 8 p., 9016070.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile28 Downloads (Pure) -
Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices
De Jong, M. J., Salm, C. & Schmitz, J., 30 Jun 2020, 2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings. IEEE, 9129540. (IEEE International Reliability Physics Symposium Proceedings; vol. 2020-April).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
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Electrical characterization of hot-wire assisted atomic layer deposited Tungsten films
Kees van der Zouw (Speaker), Antonius A.I. Aarnink (Contributor), Jurriaan Schmitz (Contributor) & Alexey Y. Kovalgin (Contributor)
19 Mar 2019Activity: Talk or presentation › Oral presentation
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Purely Thermal Deposition of Polycrystalline Gallium Nitride Films at 400 °C
Sourish Banerjee (Speaker), Satadal Dutta (Contributor), Antonius A.I. Aarnink (Contributor), Jurriaan Schmitz (Contributor), Dirk J Gravesteijn (Contributor) & Alexey Y. Kovalgin (Contributor)
29 Jul 2018 → 1 Aug 2018Activity: Talk or presentation › Oral presentation
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How hot is the wire: optical, electrical and combined methods of filament temperature determination
Arnoud Jonathan Onnink (Speaker), Alexey Y. Kovalgin (Contributor) & Jurriaan Schmitz (Contributor)
3 Sep 2018 → 6 Sep 2018Activity: Talk or presentation › Oral presentation
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Material properties of LPCVD processed n-type poly-Si passivating contacts and application in PERPoly industrial bifacial solar cells
M.K. Stodolny (Speaker), L.J. Geerligs (Speaker), G.J.M. Janssen (Speaker), I. Romijn (Speaker), B.W.H. van de Loo (Speaker), J. Melskens (Speaker), W.M.M. Kessels (Speaker), R. Santbergen (Speaker), O. Isabella (Speaker), J. Schmitz (Contributor), M. Lenes (Speaker) & J.R.M. Luchies (Speaker)
28 Sep 2017Activity: Talk or presentation › Oral presentation
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Effects of oxygen, nitrogen and fluorine sources on the formation of α- and β-phase Tungsten films by hot-wire assisted ALD
Mengdi Yang (Contributor), Antonius A.I. Aarnink (Contributor), Jurriaan Schmitz (Contributor) & Alexey Y. Kovalgin (Speaker)
11 Jun 2017 → 14 Jun 2017Activity: Talk or presentation › Oral presentation