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Research Output 1991 2019

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Conference contribution
2019
29 Downloads (Pure)

Electrical characterization of hot-wire assisted atomic layer deposited Tungsten films

van der Zouw, K., Aarnink, A. A. I., Schmitz, J. & Kovalgin, A. Y., 18 Mar 2019, 2019 IEEE 32nd International Conference on Microelectronic Test Structures, ICMTS 2019. IEEE, p. 48-53 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
Atomic layer deposition
Sheet resistance
Contact resistance
Tungsten
Electric lines
2018
2 Citations (Scopus)
55 Downloads (Pure)

Optocoupling in CMOS

Agarwal, V., Dutta, S., Annema, A. J., Hueting, R. J. E., Schmitz, J., Lee, M-J., Charbon, E. & Nauta, B., 2 Dec 2018, 2018 IEEE International Electron Devices Meeting (IEDM). San Francisco, USA: IEEE

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
CMOS
light emitting diodes
avalanches
quantum efficiency
communication
2017

Electrical test structures for verifying continuity of ultra-thin insulating and conducting films

Banerjee, S., van der Velde, F. J., Yang, M., Schmitz, J. & Kovalgin, A. Y., 28 Mar 2017, Electrical test structures for verifying continuity of ultra-thin insulating and conducting films. New York: IEEE, p. 1-6 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

continuity
conduction
aluminum nitrides
closures
ellipsometry
7 Downloads (Pure)

Prospects of efficient band-to-band emission in silicon LEDs

Schmitz, J., 3 Feb 2017, Fourth Conference on Sensors, MEMS, and Electro-Optic Systems: 18–20 September 2016, Skukuza, Kruger National Park, South Africa. du Plessis, M. (ed.). SPIE, p. 2-7 6 p. (Proceedings of SPIE; vol. 10036).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
light emission
quantum efficiency
light emitting diodes
diodes
structural design
2016
53 Downloads (Pure)

Humidity and polarity influence on MIM PZT capacitor degradation and breakdown

Wang, J., Salm, C., Houwman, E., Schmitz, J. & Nguyen, M., 9 Oct 2016, 2016 IEEE International Integrated Reliability Workshop (IIRW). IEEE, p. 65-68 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
MIM (semiconductors)
humidity
polarity
capacitors
breakdown
1 Citation (Scopus)
6 Downloads (Pure)

Interface trap density estimation in FinFETs from the subthreshold current

Schmitz, J., Kaleli, B., Kuipers, P., van den Berg, N., Smits, S. M. & Hueting, R. J. E., 28 Mar 2016, 2016 International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, p. 164-167 4 p. (Proceedings International Conference on Microelectronic Test Structures (ICMTS); vol. 2016).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
traps
transconductance
wafers
electric potential
temperature
5 Downloads (Pure)

Spring-constant measurement methods for RF-MEMS capacitive switches

Wang, J., Bielen, J., Salm, C. & Schmitz, J., 28 Mar 2016, 2016 International Conference on Microelectronic Test Structures (ICMTS). USA: IEEE, p. 10-14 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
MEMS
Switches
Electric potential
Capacitance
Finite element method
2015
1 Citation (Scopus)

Characterization of recessed Ohmic contacts to AlGaN/GaN

Hajlasz, M., Donkers, J. J. T. M., Sque, S. J., Heil, S. B. S., Gravesteijn, D. J., Rietveld, F. J. R. & Schmitz, J., 23 Mar 2015, Proceedings of the International Conference on Microelectronic Test Structures, ICMTS 2015. USA: IEEE Solid-State Circuits Society, p. 158-162 5 p. (Proceedings of the IEEE International Conference on Microelectronic Test Structures).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

The boost transistor: a field plate controlled LDMOST

Ferrara, A., Schmitz, J., Boksteen, B. K., Hueting, R. J. E., Steeneken, P. G., Heringa, A., Claes, J. & van der Wel, A. P., 10 May 2015, 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD). USA: IEEE, p. 165-168 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Transistors
Electrodes
Electric breakdown
Networks (circuits)
Electric potential
2014

CMOS post-processing for monolithic microsystems

Schmitz, J., 11 Mar 2014, Nano and Giga Challenges in Electronics, Photonics and Renewable Energy, Nano & Giga 2014. Tempe, Arizona, USA: Arizona State University, p. - 1 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

1 Citation (Scopus)

Identifying failure mechanisms in LDMOS transistors by analytical stability analysis

Ferrara, A., Steeneken, P. G., Boksteen, B. K., Heringa, A., Scholten, A. J., Schmitz, J. & Hueting, R. J. E., 22 Sep 2014, Proceedings of the 44th European Solid State Device Research Conference, ESSDERC 2014. USA: IEEE Circuits & Systems Society, p. 321-324 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Materials and integration schemes for above-IC integrated optics

Schmitz, J., Rangarajan, B. & Kovalgin, A. Y., 7 Apr 2014, 15th International Conference on Ultimate Integration on Silicon, ULIS 2014. USA: IEEE Circuits & Systems Society, p. 153-156 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

12 Citations (Scopus)

Silicon LEDs in FinFET technology

Piccolo, G., Kuindersma, P. I., Ragnarsson, L-A., Hueting, R. J. E., Collaert, N. & Schmitz, J., 26 Sep 2014, Proceeding ofthe 44th European Solid State Device Research Conference (ESSDERC). USA: IEEE Circuits & Systems Society, p. 274-277 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2013
4 Citations (Scopus)

Comparison of C-V measurement methods for RF-MEMS capacitive switches

Wang, J., Salm, C. & Schmitz, J., 26 Mar 2013, IEEE International Conference on Microelectronic Test Structures, ICMTS 2013. USA: IEEE Electron Devices Society, p. 53-58 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Comparison of electrical techniques for temperature evaluation in power MOS transistors

Ferrara, A., Steeneken, P. G., Reimann, K., Heringa, A., Yan, L., Boksteen, B. K., Swanenberg, M., Koops, G. E. J., Scholten, A. J., Surdeanu, R., Schmitz, J. & Hueting, R. J. E., 26 Mar 2013, IEEE International Conference on Microelectronic Test Structures (ICMTS 2013). USA: IEEE, p. 115-120 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

MOSFET devices
Temperature
Diodes
Chucks
Gates (transistor)

Mechanical resonators on CMOS for integrated passive band pass filters

Kazmi, S. N. R., Salm, C. & Schmitz, J., 23 Jul 2013, ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day'. p. 193-196 4 p. 6523517. (ULIS 2013: The 14th International Conference on Ultimate Integration on Silicon, Incorporating the 'Technology Briefing Day').

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Passive filters
Bandpass filters
Resonators
Germanium
Boron

Role of junction depth in light emission from silicon p-i-n LEDs

Piccolo, G., Sammak, A., Hueting, R. J. E., Schmitz, J. & Nanver, L. K., 16 Sep 2013, Proceeding of European Solid State Device Research Conference (ESSDERC 2013). USA: IEEE, p. 119-122 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

The safe operating volume as a general measure for the operating limits of LDMOS transistors

Ferrara, A., Steeneken, P. G., Heringa, A., Boksteen, B. K., Swanenberg, M., Scholten, A. J., van Dijk, L., Schmitz, J. & Hueting, R. J. E., 9 Dec 2013, International Electron Devices Meeting (IEDM 2013). USA: IEEE Electron Devices Society, p. 6.7.1-6.7.4 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2012
4 Citations (Scopus)

CMOS-MEMS Post Processing Compatible Capacitively Transduced GeSi Resonators

Kazmi, S. N. R., Aarnink, A. A. I., Salm, C. & Schmitz, J., 25 Jul 2012, Proceedings of 2012 IEEE International Frequency Control Symposium (IFCS). USA: IEEE Electron Devices Society, p. 1-4 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)
2 Downloads (Pure)

Micro- and nano-link ultra-low power heaters for sensors

Groenland, A. W., Vereshchagina, E., Kovalgin, A. Y., Wolters, R. A. M., Gardeniers, J. G. E. & Schmitz, J., 17 Sep 2012, European Solid-State Device Research Conference, ESSDERC 2012. USA: IEEE Solid-State Circuits Society, p. 169-172 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

On the degradation of field-plate assisted RESURF power devices

Boksteen, B. K., Dhar, S., Ferrara, A., Heringa, A., Hueting, R. J. E., Koops, G. E. J., Salm, C. & Schmitz, J., 10 Dec 2012, IEEE International Electron Devices Meeting, IEDM 2012. San Francisco - USA: IEEE International Electron Device Meeting, p. 311-314 4 p. (Technical Digest).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2011
1 Citation (Scopus)

Charge protection characterisation and drift time resolution improvement for GridPix

Koppert, W. J. C., Fransen, M., van Bakel, N., van der Graaf, H., Hartjes, F., Timmermans, J., Visser, J., Kluit, R., Gromov, V., Zappon, F., Blanco Carballo, V. M., Schmitz, J., Bilevych, Y. & Bilevych, Y., 23 Oct 2011, IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2011. USA: IEEE, p. 1799-1802 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

8 Citations (Scopus)

Exploring Capacitance-Voltage measurements to find the Piezoelectric Coefficient of Aluminum Nitride

van Hemert, T., Sakriotis, D., Hueting, R. J. E. & Schmitz, J., 4 Apr 2011, 24th International Conference on Microelectronic Test Structures, ICMTS 2011. USA: IEEE Electron Devices Society, p. 69-73 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Extracting the Conduction Band Offset in Strained FinFETs from Subthreshold-Current Measurements

van Hemert, T., Kaleli, B., Hueting, R. J. E., Esseni, D., van Dal, M. J. H. & Schmitz, J., 12 Sep 2011, Proceedings of the 41st European Solid-State Device Research Conference (Essderc 2011). USA: IEEE Solid-State Circuits Society, p. 275-278 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Gap-closing test structures for temperature budget determination

Faber, E. J., Wolters, R. A. M. & Schmitz, J., 4 Apr 2011, 24th International Conference on Microelectronic Test Structures, ICMTS 2011. USA: IEEE Electron Devices Society, p. 165-169 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Green Laser Crystallization of GeSi thin Films and Dopant Activation

Rangarajan, B., Brunets, I., Oesterlin, P., Kovalgin, A. Y. & Schmitz, J., 1 May 2011, 219th ECS Meeting Transactions. The Electrochemical Society Inc., p. 17-25 9 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

activation
crystallization
thin films
lasers
annealing
3 Citations (Scopus)
1 Downloads (Pure)

Increased light emission by geometrical changes in Si LEDs

Puliyankot Palackavalapil, V., Piccolo, G., Hueting, R. J. E., Heringa, A., Kovalgin, A. Y. & Schmitz, J., 14 Sep 2011, Proceedings of the 8th International Conference on Group IV Photonics (GFP). USA: IEEE Photonics Society, p. 287-289 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Light emission enhancement by geometrical scaling of carrier injectors in Si-based LEDs

Piccolo, G., Puliyankot Palackavalapil, V., Kovalgin, A. Y., Hueting, R. J. E., Heringa, A. & Schmitz, J., 12 Sep 2011, 2011 Proceedings of the 41st European Solid-State Device Research Conference (Essderc). USA: IEEE Solid-State Circuits Society, p. 175-178 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

53 Downloads (Pure)

Materials Characterization of CIGS solar cells on Top of CMOS chips

Lu, J., Liu, W., Kovalgin, A. Y., Sun, Y. & Schmitz, J., 1 Jun 2011, Proceedings of 2011 MRS Spring Meeting. Venkatasubramanian, R., Radousky, H. & Liang, H. (eds.). Cambridge, UK: Cambridge University Press, p. e06-23 8 p. (MRS proceedings; vol. 1325).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
CMOS
solar cells
chips
glass
ion microscopes

Microsecond pulsed DC matching measurements on MOSFETs in strong and weak inversion

Andricciola, P., Andricciola, P., Tuinhout, H., Wils, N. & Schmitz, J., 4 Apr 2011, 24th International Conference on Microelectronic Test Structures, ICMTS 2011. USA: IEEE Electron Devices Society, p. 90-94 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Realization of Silicon-Nanodots-Based CMOS Backend-Compatible Electrical SPP Source

Brunets, I., Walters, R. J., Kovalgin, A. Y., Polman, A. & Schmitz, J., 1 May 2011, 219th ECS Meeting. Pennington, NJ, USA: Electro Chemical Society, p. MA2011-01 4 p. (Meeting Abstracts; vol. MA2011-01).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

3 Citations (Scopus)

Simultaneous extraction of threshold voltage and mobility degradation from on-the-fly NBTI measurements

Herfst, R. W., Schmitz, J. & Scholten, A. J., 10 Apr 2011, 2011 IEEE International Reliability Physics Symposium, IRPS 2011: Monterey, California, USA, 10-14 April 2011. IEEE Reliability Society, p. XT.6.1-6.4 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Threshold voltage
Drain current
Degradation
Electric network analyzers
Negative bias temperature instability
2010
7 Citations (Scopus)
166 Downloads (Pure)

Above-CMOS a-Si and CIGS Solar Cells for Powering Autonomous Microsystems

Lu, J., Liu, W., van der Werf, C. H. M., Kovalgin, A. Y., Sun, Y., Schropp, R. E. I. & Schmitz, J., 6 Dec 2010, Proceedings of the 2010 IEEE International Electron Devices Meeting (IEDM). IEEE Electron Devices Society, p. 31.3.1.-31.3.4 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
gallium selenides
amorphous silicon
CMOS
solar cells
metal ions
127 Downloads (Pure)

An Initial study on The Reliability of Power Semiconductor Devices

Boksteen, B. K., Hueting, R. J. E., Salm, C. & Schmitz, J., 18 Nov 2010, Proceedings of STW.ICT Conference 2010. Utrecht: STW, p. 68-72 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

File
148 Downloads (Pure)

Electron Beam Lithography of HSQ and PMMA Resists and Importance of their Properties to Link the Nano World to the Micro World

Kaleli, B., Aarnink, A. A. I., Smits, S. M., Hueting, R. J. E., Wolters, R. A. M. & Schmitz, J., 18 Nov 2010, Proceeding of STW.ICT Conference 2010. Utrecht: STW, p. 105-108 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

File
1 Citation (Scopus)
55 Downloads (Pure)

Fast RF-CV characterization through high-speed 1-port S-parameter measurements

Herfst, R. W., Steeneken, P. G., Tiggelman, M. P. J., Stulemeijer, J. & Schmitz, J., 22 Mar 2010, Proceedings of IEEE International Conference on Microelectronic Test Structures (ICMTS), 2010. Piscataway: IEEE Computer Society Press, p. 170-173 4 p. 10.1109/ICMTS.2010.5466829

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
46 Downloads (Pure)

Low Stressed In-situ Boron doped Poly SiGe Layers for High-Q Resonators

Kazmi, S. N. R., Rangarajan, B., Aarnink, A. A. I., Salm, C. & Schmitz, J., 18 Nov 2010, Proceedings of the STW.ICT Conference 2010. Utrecht: STW, p. 109-113 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

File
5 Citations (Scopus)
7 Downloads (Pure)

Low temperature silicidation of Pd layers on crystalline silicon monitored via in situ resistance measurements

Faber, E. J., Wolters, R. A. M., Rajasekharan, B., Salm, C. & Schmitz, J., 29 Nov 2010, Advanced Metallization Conference 2009: proceedings of the conference held September 13-15, 2009, Baltimore, Maryland, U.S.A. Edelstein, D. C. & Schulz, S. E. (eds.). Materials Research Society, p. 133-140 8 p. (Materials Research Society conference proceedings; vol. 25).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
Silicon
Crystalline materials
Metals
Sputtering
Temperature
3 Citations (Scopus)
43 Downloads (Pure)

Novel test structures for temperature budget determination during wafer processing

Faber, E. J., Wolters, R. A. M. & Schmitz, J., 22 Mar 2010, IEEE International Conference on Microelectronic Test Structures (ICMTS), 2010. Piscataway: IEEE Computer Society, p. 30-33 4 p. 10.1109/ICMTS.2010.5466867

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
14 Downloads (Pure)

On the effect of nano-injectors on conduction in silicon p-i-n diodes

Piccolo, G., Kovalgin, A. Y. & Schmitz, J., 18 Nov 2010, Proceedings of STW.ICT Conference 2010. Utrecht: STW, p. 140-142 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

File
200 Downloads (Pure)

On the leakage problem of MIM capacitors due to improper etching of titanium nitride

Groenland, A. W., Wolters, R. A. M., Kovalgin, A. Y. & Schmitz, J., 18 Nov 2010, Proceedings of STW.ICT Conference 2010. Utrecht: STW, p. 89-92 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

File
7 Citations (Scopus)
82 Downloads (Pure)

On the modelling and optimisation of a novel Schottky based silicon rectifier

van Hemert, T., Hueting, R. J. E., Rajasekharan, B., Salm, C. & Schmitz, J., 13 Sep 2010, Proceedings of the 40th European Solid-State Device Research, Essderc 2010. USA: IEEE Solid-State Circuits Society, p. 460-463 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File

The performance of GridPix detectors

Bilevych, Y., Carballo, V. M. B., Fransen, M., van der Graaf, H., De Groot, N., Hartjes, F., Hessey, N., Konig, A., Koppert, W. J. C., Rogers, M., Schmitz, J., Schon, R., Visschers, J. & Timmermans, J., 1 Dec 2010, 2010 IEEE Nuclear Science Symposium Conference Record (NSS/MIC 2010). IEEE, p. 944-948 5 p. 5873901. (IEEE Nuclear Science Symposium Conference Record).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Silicon
Electrodes
detectors
Gases
Post and Core Technique
2009

An initial modelling and simulation study on the 1D Si-Based LED

Puliyankot Palackavalapil, V., Hueting, R. J. E. & Schmitz, J., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: STW, p. 170-173 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

2 Citations (Scopus)
84 Downloads (Pure)

A silicon-based electrical source for surface plasmon polaritons

Walters, R. J., van Loon, R. V. A., Brunets, I., Schmitz, J. & Polman, A., 9 Sep 2009, Proceedings of the 6th International Conference on GroupIV Photonics GFP'09. Piscataway: IEEE Computer Society Press, p. 74-76 3 p. 10.1109/GROUP4.2009.5338358

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File

Contact chain measurements for ultrathin conducting films

Groenland, A. W., Wolters, R. A. M., Kovalgin, A. Y. & Schmitz, J., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: STW, p. 150-152 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Effect of carrier injector size on silicon LED performance

Piccolo, G., Kovalgin, A. Y. & Schmitz, J., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: STW, p. 167-169 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

2 Citations (Scopus)
49 Downloads (Pure)

Four point probe structures with buried electrodes for the electrical characterization of ultrathin conducting films

Groenland, A. W., Wolters, R. A. M., Kovalgin, A. Y. & Schmitz, J., 14 Apr 2009, Proceedings of the 2009 IEEE International Conference on Microelectronic Test Structures. Piscataway: IEEE Computer Society Press, p. 191-195 5 p. 10.1109/ICMTS.2009.4814639

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File

Influence of passivation process on chip performance

Lu, J., Kovalgin, A. Y. & Schmitz, J., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: STW, p. 542-544 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

2 Downloads (Pure)

Low temperature TFTs with poly-stripes

Brunets, I., Boogaard, A., Smits, S. M., de Vries, H., Aarnink, A. A. I., Holleman, J., Kovalgin, A. Y. & Schmitz, J., 5 Mar 2009, Proceedings of the 5th International Thin Film Transistor Conference ITC'09. Paris, France: Ecole Polytechnique, p. 62-65 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Transistors
Amorphous silicon
Grain boundaries
Annealing
Thin films