Jurriaan Schmitz

prof.dr.

1991 …2022

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  • 1996

    Design and characterisation of high-performance 0.13 μm NMOS Devices

    Schmitz, J., Paulzen, G. M., Gravesteijn, D. J., Montree, A. H. & Woerlee, P. H., 1 Jan 1996, ESSDERC 1996: Proceedings of the 26th European Solid State Device Research Conference. Rudan, M. & Baccarani, G. (eds.). Piscataway, NJ: IEEE Computer Society, p. 329-332 4 p. 5437045

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    6 Downloads (Pure)
  • Realisation of a 0.25 um NMOSFET using GexSi1-x (x

    Salm, C., Schmitz, J., Martens, M. C., Gravesteijn, D. J., Holleman, J. & Woerlee, P. H., 9 Sep 1996, Proceedings of the 26th European Solid State Device Research Conference (ESSDERC'96). Bologna, Italy, p. 601-604

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    5 Downloads (Pure)
  • Realisation of a 0.25 μm NMOSFET using GexSi1-x(x≪0.4) as Gate Material

    Salm, C., Schmitz, J., Martens, M. C., Gravesteijn, D. J., Holleman, J. & Woerlee, P. H., 1 Jan 1996, ESSDERC 1996: Proceedings of the 26th European Solid State Device Research Conference. Rudan, M. & Baccarani, G. (eds.). Piscataway, NJ: IEEE Computer Society, p. 601-604 4 p. 5436139

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    1 Citation (Scopus)
    13 Downloads (Pure)
  • 1997

    Effects of gate depletion and boron penetration on matching of deep submicron CMOS transistors

    Tuinhout, H. P., Montree, A. H., Schmitz, J. & Stolk, P. A., 1 Dec 1997, International Electron Devices Meeting, 1997, Washington, DC, December 7-10, 1997: IEDM technical digest. Piscataway, NJ: IEEE, p. 631-634 4 p. (International Electron Devices Meeting, IEDM Technical Digest; vol. 1997).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    72 Citations (Scopus)
    66 Downloads (Pure)
  • Gate-Workfunction Engineering Using Poly-(Si,Ge) for High-Performance 0.18um CMOS Technology

    Ponomarev, Y. V., Salm, C., Schmitz, J., Woerlee, P. H., Stolk, P. A. & Gravesteijn, D. J., 1 Dec 1997, International Electron Devices Meeting, 1997, Washington, DC, December 7-10, 1997: IEDM Technical Digest. Piscataway, NJ: IEEE, p. 829-832 4 p. (International Electron Devices Meeting, IEDM Technical Digest; vol. 1997).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    100 Downloads (Pure)
  • High-Performance Deep Submicron MOSTs With Polycrystalline-(Si,Ge) Gates

    Ponomarev, Y. V., Salm, C., Schmitz, J., Woerlee, P. H. & Gravesteijn, D. J., 6 Jun 1997, VLSI TSA. Taiwan, p. 311-315 5 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    7 Citations (Scopus)
    50 Downloads (Pure)
  • Study of pocket implant parameters for 0,18 um CMOS

    Schmitz, J., Ponomarev, Y. V., Montree, A. H. & Woerlee, P. H., 1 Jan 1997, ESSDERC'97: proceedings of the 27th European Solid-State Device Research Conference : Stuttgart, Germany, 22-24 September 1997. Grunbacher, H. (ed.). Piscataway, NJ: IEEE Computer Society, p. 224-227 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    1 Citation (Scopus)
    64 Downloads (Pure)
  • 1998

    Channel profile engineering of 0.1 μm-Si MOSFETs by through-the-gate implantation

    Ponomarev, Y. V., Stolk, P. A., van Brandenburg, A. C. M. C., Roes, R., Montree, A. H., Schmitz, J. & Woerlee, P. H., 1 Dec 1998, International Electron Devices Meeting 1998 : San Francisco, CA, December 6-9, 1998, IEDM technical digest. IEEE, p. 635-638 4 p. (International Electron Devices Meeting, IEDM Technical Digest; vol. 1998).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    21 Citations (Scopus)
    55 Downloads (Pure)
  • High performance 0.13um CMOS with classical architecture

    Schmitz, J., van Brandenburg, A. C. M. C., Collart, E. J. H., Huijten, L. H. M., Montree, A. H., Ponomarev, Y. V., Roes, R. F. M., Scholten, A. J. & Woerlee, P. H., 1 Jan 1998, ESSDERC 1998: Proceedings of the 28th European Solid-State Device Research Conference. Touboul, A., Danto, Y. & Grünbacher, H. (eds.). Piscataway, NJ: IEEE Computer Society, p. 156-159 4 p. 1503512

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    3 Downloads (Pure)
  • Ultra-shallow junction formation by outdiffusion from implanted oxide

    Schmitz, J., van Gestel, M., Stolk, P. A., Ponomarev, Y. V., Roozeboom, F., van Berkum, J. G. M., Zalm, P. C. & Woerlee, P. H., 1 Dec 1998, International Electron Devices Meeting, 1998, San Francisco, CA, December 6-9, 1998: IEDM technical digest. Piscataway, NJ: IEEE, p. 1009-1012 4 p. (International Electron Devices Meeting, IEDM Technical Digest; vol. 1998).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    6 Citations (Scopus)
    8 Downloads (Pure)
  • 1999

    A 0.13um CMOS technology for low-voltage analogue applications

    Ponomarev, Y. V., Stolk, P. A., van Brandenburg, A., Dachs, C. J. J., Kaiser, M., Montree, A. H., Roes, R., Schmitz, J. & Woerlee, P. H., 1 Jan 1999, ESSDERC 1999: Proceedings of the 29th European solid-state device research conference, Leuven, Belgium, 13-15 september. Mertens, R. P., Grünbacher, H., Maes, H. E. & Declerck, G. (eds.). Piscataway, NJ: IEEE Computer Society, p. 180-183 4 p. 1505469

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    4 Citations (Scopus)
  • An efficient lateral channel profiling of poly-SiGe-gated PMOSFET's for 0.1 μm CMOS low-voltage applications

    Ponomarev, Y. V., Stolk, P. A., van Brandenburg, A. C. M. C., Dachs, C. J. J., Kaiser, M., Montree, A. H., Roes, R., Schmitz, J. & Woerlee, P. H., 14 Jun 1999, 1999 Symposium on VLSI Technology: digest of technical papers : June 14-16, 1999, Kyoto. Piscataway, NJ: IEEE, p. 65-66 2 p. (Digest of Technical Papers - Symposium on VLSI Technology; vol. 1999).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    4 Citations (Scopus)
  • Channel formation for 0.15 μm CMOS using through-the-gate implantation

    Montree, A. H., Ponomarev, Y. V., Baks, W. M., van Brandenburg, A. C. M. C., Dachs, C., Roes, R. F. M., Schmitz, J., Stolk, P. A. & Tuinhout, H. P., 10 Jun 1999, 1999 International Symposium on VLSI Technology, Systems, and Applications: proceedings of technical papers, June 8-10, 1999, Taipei International Convention Center, Taipei, Taiwan, R.O.C. Piscataway, NJ: IEEE, p. 10-13 4 p. (International Symposium on VLSI Technology, Systems, and Applications: Proceedings; vol. 1999).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    2 Citations (Scopus)
    4 Downloads (Pure)
  • Characterization of low energy boron implants and electrical results of submicron PMOS transistors

    Collart, E. J. H., Murrell, A. J., De Cock, G., Foad, M. A., Schmitz, J., van Zijl, J. P. & van Berkum, J. G. M., 1 Dec 1999, Ion implantation technology-98: 1998 International Conference on Ion Implantation Technology proceedings, Kyoto, Japan, June 22-26, 1998. Matsuo, J., Takaoka, G. & Yamada, I. (eds.). IEEE Canada, Vol. 2. p. 905-908 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    7 Downloads (Pure)
  • Gate polysilicon optimization for deep-submicron MOSFETs

    Schmitz, J., Tuinhout, H. P., Montree, A. H., Ponomarev, Y. V., Stolk, P. A. & Woerlee, P. H., 1 Jan 1999, ESSDERC '99: proceedings of the 29th European Solid-State Device Research Conference : Leuven, Belgium, 13-15 September, 1999. Mertens, R. P., Grünbacher, H., Maes, H. E. & Declerck, G. (eds.). Piscataway, NJ: IEEE Computer Society, p. 156-159 4 p. 1505463

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    5 Citations (Scopus)
    75 Downloads (Pure)
  • Minority carrier tunneling and stress-induced leakage current for p+ gate MOS capacitors with poly-Si and poly-Si0.7Ge0.3 gate material

    Houtsma, V. E., Holleman, J., Salm, C., de Haan, I. R., Schmitz, J., Widdershoven, F. P. & Woerlee, P. H., Dec 1999, International Electron Devices Meeting 1999: Washington, DC, December 5-8, 1999, IEDM technical digest. Piscataway, NJ: IEEE, p. 457-460 4 p. (International Electron Devices Meeting, IEDM Technical Digest; vol. 1999).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    6 Citations (Scopus)
    46 Downloads (Pure)
  • The effect of thin oxide layers on shallow junction formation

    Stolk, P. A., Schmitz, J., Cubaynes, F. N., Van Brandenburg, A. C. M. C., van Berkum, J. G. M., van de Wijgert, W. G. & Roozeboom, F., 1 Jan 1999, ESSDERC '99: Proceedings of the 29th European Solid-State Device Research Conference : Leuven, Belgium 13-15 September 1999. Maes, H. E., Mertens, R. P., Declerck, G. & Grünbacher, H. (eds.). Piscataway, NJ: IEEE Computer Society, p. 428-431 4 p. 1505531

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    5 Downloads (Pure)
  • 2000

    Impact of ion implantation statistics on VT fluctuations in MOSFETs: Comparison between decaborane and boron channel implants

    Tuinhout, H., Widdershoven, F., Stolk, P., Schmitz, J., Dirks, B., van der Tak, K., Bancken, P. & Politiek, J., 2000, 2000 Symposium on VLSI Technology: digest of technical papers : June 13-15, 2000, Honolulu. Piscataway, NJ: IEEE, p. 134-135 2 p. (Symposium on VLSI Technology: Digest of Technical Papers; vol. 2000).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    9 Citations (Scopus)
    5 Downloads (Pure)
  • Ultrashallow junction formation and gate activation in deep-submicron CMOS

    Stolk, P. A., Cubaynes, F. N., Meyssen, V. M. H., Mannino, G., Cowern, N. E. B., Van Zijl, J. P., Roozeboom, F., Verhoeven, J. F. C., Van Berkum, J. G. M., van de Wijgert, W. M., Schmitz, J., Tuinhout, H. P. & Woerlee, P. H., 1 Dec 2000, Symposium B – Si Front End Processing - Physics & Technology..II. Materials Research Society, p. B3.1.1-B3.1.12 12 p. (Materials Research Society Symposium - Proceedings; vol. 610).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    2 Citations (Scopus)
    6 Downloads (Pure)
  • 2001

    A study of measurement system noise for sensitive soft breakdown triggering

    Schmitz, J. & Tuinhout, H. P., 2001, ICMTS 2001: proceedings of the 2001 International Conference on Microelectronic Test Structures : March 19-22, 2001, Kobe, Japan. Piscataway, NJ: IEEE, p. 99-102 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    4 Citations (Scopus)
    2 Downloads (Pure)
  • Soft breakdown triggers for large area capacitors under constant voltage stress

    Schmitz, J., Kretschmann, H. J., Tuinhout, H. P. & Woerlee, P. H., 1 Jan 2001, 39th IEEE International Reliability Physics Symposium 2001: Orlando, Florida, April 30-May 3, 2001. IEEE, p. 393-398 6 p. 922932

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    4 Citations (Scopus)
    6 Downloads (Pure)
  • 2002

    Gate dielectrics for high performance and low power CMOS SoC applications

    Cubaynes, F., Dachs, C. J. J., Detcheverry, C., Zegers, A., Venezia, V. C., Schmitz, J., Stolk, P. A., Jurczak, M., Henson, K., Degraeve, R., Rothschild, A., Conard, T., Petry, J., Da Rold, M., Schaekers, M., Badenes, G., Date, L., Pique, D., Al-Shareef, H. N. & Murto, R. W., 1 Jan 2002, ESSDERC 2002: Proceedings of the 32nd European Solid-State Device Research Conference, Firenze, Italy, 24-26 September 2002. Gnani, E., Baccarani, G. & Rudan, M. (eds.). Piscataway, NJ: IEEE Computer Society, p. 427-430 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    37 Downloads (Pure)
  • Impact of source/drain implants on threshold voltage matching in deep sub-micron CMOS technologies

    Dubois, J., Knol, J., Bolt, M., Tuinhout, H., Schmitz, J. & Stolk, P., 1 Jan 2002, ESSDERC 2002: Proceedings of the 32nd European Solid-State Device Research Conference, Firenze, Italy, 24-26 September 2002. Gnani, E., Baccarani, G. & Rudan, M. (eds.). Piscataway, NJ: IEEE Computer Society, p. 115-118 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    15 Citations (Scopus)
    86 Downloads (Pure)
  • 2003

    High External Quantum Efficiency of the Lateral P-I-N Diodes Realized of Silicon On Insulator (SOI) Material

    Hoang, T., Le Minh, P., Holleman, J., Schmitz, J. & Wallinga, H., 25 Nov 2003, Proceedings of Semiconductor Advances for Future Electronics SAFE 2003. p. 610-613 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

  • In-situ RHEED Analysis of Atomic Layer Deposition and Characterization of AL203 Gate Dielectrics

    Bankras, R. G., Aarnink, A. A. I., Holleman, J. & Schmitz, J., 25 Nov 2003, Proceedings of Semiconductor Advances for Future Electronics SAFE 2003. p. -

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

  • On Oxidation Kinetics and Electrical Quality of Gate Oxide Grown in H2O or D2O Ambient

    Hof, A. J., Kovalgin, A. Y., Woerlee, P. H. & Schmitz, J., 25 Nov 2003, Proceedings of Semiconductor Advances for Future Electronics SAFE 2003. p. 743-747 5 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

  • Plasma nitridation optimization for sub-15 A gate dielectrics

    Cubaynes, F. N., Schmitz, J., van der Marel, C., Snijders, J. H. M., Veloso, A., Rothschild, A., Olsen, C. & Date, L., 2003, Silicon Nitride and Silicon Dioxide Thin Insulating Films VII: Proceedings of the International Symposium. Sah, R. E. (ed.). Pennington, NJ: The Electrochemical Society Inc., Vol. 2. p. 595-604 10 p. (Electrochemical Society Proceedings; vol. 2003-02).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    170 Downloads (Pure)
  • Test structure design considerations for RF-CV measurements on leaky dielectrics

    Schmitz, J., Cubaynes, F. N., Havens, R. J., de Kort, R., Scholten, A. J. & Tiemeijer, L. F., 7 May 2003, ICMTS 2003: Proceedings of the 2003 International Conference on Microelectronic Test Structures : March 17-20, 2003, Double Tree Hotel, Monterey, California. Piscataway, NJ: IEEE Computer Society, p. 181-185 5 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    9 Citations (Scopus)
    60 Downloads (Pure)
  • Trends in CMOS device characterization

    Schmitz, J. & Tiemeijer, L. F., 17 Jun 2003, Proceedings of the INFOS Conference 2003. Barcelona, Spain, p. -

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    7 Downloads (Pure)
  • 2004

    Gate-capacitance extraction from RF C-V measurements

    Sasse, G. T., de Kort, R. & Schmitz, J., 15 Nov 2004, The 34th European Solid-State Device Research conference, 2004. Piscataway: IEEE, p. 113-116 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    3 Citations (Scopus)
    180 Downloads (Pure)
  • Gate-Capacitance Extraction from RF C-V Measurements

    Sasse, G. T., de Kort, R. & Schmitz, J., 25 Nov 2004, Proceedings of Semiconductor Advances for Future Electronics (SAFE). Veldhoven, The Netherlands: STW

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

  • Gate oxide reliability and deuterated CMOS processing

    Hof, A. J., Kovalgin, A., van Schaijk, R., Baks, W. M. & Schmitz, J., 25 Apr 2004, IEEE Integrated Reliability Workshop 2004. Piscataway, NJ: IEEE Computer Society, p. 7-10 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    1 Citation (Scopus)
    105 Downloads (Pure)
  • GOSSIP: a vertex detector combining a thin gas layer as signal generator with a CMOS readout pixel array

    van der Graaf, H., Campbell, M., Chefdeville, M. A., Colas, P., Colijn, A. P., Fornaini, A., Giomataris, Y., Heijne, E. H. M., Kluit, P., Llopart, X., Schmitz, J., Timmermans, J. & Visschers, J. L., 2004, Proceedings of Vertex 2004 conference. IEEE

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    48 Downloads (Pure)
  • Investigating Hot-Carrier Degradation in MOSFETs using Constant and Switched Biased Low-Frequency Noise measurements

    Kolhatkar, J. S., Hoekstra, E., Hof, A. J., Salm, C., Wallinga, H. & Schmitz, J., 25 Nov 2004, Proceedings SAFE & ProRISC 2004. Utrecht: STW, p. 700-703 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

    Open Access
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    29 Downloads (Pure)
  • Leakage current correction in quasi-static C-V measurements

    Schmitz, J., Weusthof, M. H. H. & Hof, A. J., 25 Feb 2004, International Conference of Microelectronic Test Structures ICMTS 2004. Piscataway: IEEE Electron Devices Society, p. 179-181 3 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    14 Citations (Scopus)
    317 Downloads (Pure)
  • Modeling of RTS Noise in MOSFETs under Steady-State and Large-Signal Excitation

    Kolhatkar, J. S., Hoekstra, E., Salm, C., van der Wel, A. P., Klumperink, E. A. M., Schmitz, J. & Wallinga, H., Dec 2004, IEEE International Electron Devices Meeting (IEDM 2004). Piscataway, NJ, USA: IEEE, p. 759-762 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    20 Citations (Scopus)
    61 Downloads (Pure)
  • On Oxidation of Silicon in Ultra-Diluted H2O and D2O Ambient

    Hof, A. J., Kovalgin, A. Y. & Schmitz, J., 27 Jun 2004, proceedings Wodim 2004. Cork, Ireland, p. -

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    8 Downloads (Pure)
  • The readout of gaseous detectors by means of a Micromegas-covered pixel-segmented CMOS anode

    Fornaini, A., Campbell, M., Colas, P., Giomataris, Y., van der Graaf, H., Heijne, E. H. M., Kluit, P., Llopart, X., Schmitz, J., Timmermans, J. & Visschers, J. L., 2004, Proceedings of IWORID workshop 2004. Glasgow: IEEE, p. -

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

  • The Readout of Gaseous Detectors by Means of a Micromegas-Covered Pixel-Segmented CMOS Anode

    Colas, P., Giomataris, Y., Colijn, A. P., Fornaini, A., van der Graaf, H., Kluit, P., Timmermans, J., Visschers, J. L., Schmitz, J., Campbell, M., Heijne, E. H. M. & Llopart, X., 2004, Proceedings of Nuclear Science Symposium. Rome: IEEE

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

  • 2005

    A high-density inductively-coupled remote plasma system for the deposition of dielectrics and semiconductors

    Aarnink, A. A. I., Boogaard, A., Brunets, I., Isai, I. G., Kovalgin, A. Y., Holleman, J., Wolters, R. A. M. & Schmitz, J., 17 Nov 2005, Proceedings of 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Netherlands: STW, p. 67-69 3 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

    Open Access
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    31 Downloads (Pure)
  • A high efficiency lateral light emitting device on SOI

    Hoang, T., Le Minh, P., Holleman, J., Zieren, V., Goossens, M. J. & Schmitz, J., 4 Apr 2005, EDMO 2004: 12th IEEE International Symposium on Electron Devices for Microwave and Optoelectronic Applications. Piscataway, NJ: IEEE Computer Society, p. 87-91 5 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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    68 Downloads (Pure)
  • An electron-multiplying 'Micromegas' grid made in silicon wafer post-processing technology

    Chefdeville, M. A., Colas, P., Giomataris, Y., van der Graaf, H., Heijne, E. H. M., van der Putten, S., Salm, C., Schmitz, J., Smits, S. M., Timmermans, J. & Visschers, J. L., Nov 2005, Proceedings 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Netherlands: STW, p. 139-142 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

    Open Access
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    53 Downloads (Pure)
  • Characterization of dielectric charging in RF MEMS

    Herfst, R. W., Huizing, H. G. A., Steeneken, P. G. & Schmitz, J., Nov 2005, 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005 (SAFE 2005). Utrecht, The Netherlands: STW, p. 11-14 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

  • Charge pumping at radio frequencies: [MOSFET device interface state density measurement]

    Sasse, G. T., de Vries, H. & Schmitz, J., Apr 2005, ICMTS 2005: proceedings of the 2005 International Conference on Microelectronic Test Structures, April 4-7, 2005, De Valk, Tiensestraat 41, Leuven, Belgium. Piscataway, NJ: IEEE, p. 229-233 5 p. (Proceedings International Conference on Microelectronic Test Structures; vol. 2005).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    3 Citations (Scopus)
    11 Downloads (Pure)
  • In-situ RHEED Analysis of Atomic Layer Deposition

    Bankras, R. G., Holleman, J. & Schmitz, J., 17 Nov 2005, Proceedings of 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Netherlands: STW, p. 70-75 6 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

  • In-situ RHEED of atomic layer deposition

    Bankras, R. G., Holleman, J. & Schmitz, J., 5 Sep 2005, EuroCVD-15 conference proceedings. Bochum, Germany, p. -

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    1 Citation (Scopus)
  • Specific Contact Resistance Measurements of Metal-Semiconductor Junctions

    Stavitski, N., van Dal, M. J. H., Wolters, R. A. M., Kovalgin, A. Y. & Schmitz, J., 17 Nov 2005, Proceedings of 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Netherlands: STW, p. 52-55 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

  • The Effect of an Electric Field on a Lateral Silicon Light-Emitting Diode

    Le Minh, P., Hoang, T., Holleman, J. & Schmitz, J., 17 Nov 2005, Proceedings of 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Ntherlands: STW, p. 117-120 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

  • The effect of dislocation loops on the light emission of silicon LEDs

    Hoang, T., Le Minh, P., Holleman, J. & Schmitz, J., 11 Sep 2005, Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Grenoble, France: IEEE, p. 359-362 4 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

    6 Citations (Scopus)
    40 Downloads (Pure)
  • The RF Charge Pump Technique for Measuring the Interface State Density on Leaky Dielectrics

    Sasse, G. T., de Vries, H. & Schmitz, J., 17 Nov 2005, 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Netherlands: STW, p. 47-51 5 p.

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic