1991 …2020

Research output per year

If you made any changes in Pure these will be visible here soon.

Research Output

Filter
Conference contribution
1996

Design and characterisation of high-performance 0.13 μm NMOS Devices

Schmitz, J., Paulzen, G. M., Gravesteijn, D. J., Montree, A. H. & Woerlee, P. H., 1 Jan 1996, ESSDERC 1996: Proceedings of the 26th European Solid State Device Research Conference. Rudan, M. & Baccarani, G. (eds.). Piscataway, NJ: IEEE Computer Society, p. 329-332 4 p. 5437045

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
4 Downloads (Pure)

Realisation of a 0.25 um NMOSFET using GexSi1-x (x

Salm, C., Schmitz, J., Martens, M. C., Gravesteijn, D. J., Holleman, J. & Woerlee, P. H., 9 Sep 1996, Proceedings of the 26th European Solid State Device Research Conference (ESSDERC'96). Bologna, Italy, p. 601-604

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
4 Downloads (Pure)

Realisation of a 0.25 μm NMOSFET using GexSi1-x(x≪0.4) as Gate Material

Salm, C., Schmitz, J., Martens, M. C., Gravesteijn, D. J., Holleman, J. & Woerlee, P. H., 1 Jan 1996, ESSDERC 1996: Proceedings of the 26th European Solid State Device Research Conference. Rudan, M. & Baccarani, G. (eds.). Piscataway, NJ: IEEE Computer Society, p. 601-604 4 p. 5436139

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
1 Citation (Scopus)
9 Downloads (Pure)
1997

Effects of gate depletion and boron penetration on matching of deep submicron CMOS transistors

Tuinhout, H. P., Montree, A. H., Schmitz, J. & Stolk, P. A., 1 Dec 1997, International Electron Devices Meeting, 1997, Washington, DC, December 7-10, 1997: IEDM technical digest. Piscataway, NJ: IEEE, p. 631-634 4 p. (International Electron Devices Meeting, IEDM Technical Digest; vol. 1997).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
66 Citations (Scopus)
7 Downloads (Pure)

Gate-Workfunction Engineering Using Poly-(Si,Ge) for High-Performance 0.18um CMOS Technology

Ponomarev, Y. V., Salm, C., Schmitz, J., Woerlee, P. H., Stolk, P. A. & Gravesteijn, D. J., 1 Dec 1997, International Electron Devices Meeting, 1997, Washington, DC, December 7-10, 1997: IEDM Technical Digest. Piscataway, NJ: IEEE, p. 829-832 4 p. (International Electron Devices Meeting, IEDM Technical Digest; vol. 1997).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
22 Downloads (Pure)

High-Performance Deep Submicron MOSTs With Polycrystalline-(Si,Ge) Gates

Ponomarev, Y. V., Salm, C., Schmitz, J., Woerlee, P. H. & Gravesteijn, D. J., 6 Jun 1997, VLSI TSA. Taiwan, p. 311-315 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
7 Citations (Scopus)
8 Downloads (Pure)

Study of pocket implant parameters for 0,18 um CMOS

Schmitz, J., Ponomarev, Y. V., Montree, A. H. & Woerlee, P. H., 1 Jan 1997, ESSDERC'97: proceedings of the 27th European Solid-State Device Research Conference : Stuttgart, Germany, 22-24 September 1997. Grunbacher, H. (ed.). Piscataway, NJ: IEEE Computer Society, p. 224-227 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
1 Citation (Scopus)
11 Downloads (Pure)
1998

Channel profile engineering of 0.1 μm-Si MOSFETs by through-the-gate implantation

Ponomarev, Y. V., Stolk, P. A., van Brandenburg, A. C. M. C., Roes, R., Montree, A. H., Schmitz, J. & Woerlee, P. H., 1 Dec 1998, International Electron Devices Meeting 1998 : San Francisco, CA, December 6-9, 1998, IEDM technical digest. IEEE, p. 635-638 4 p. (International Electron Devices Meeting, IEDM Technical Digest; vol. 1998).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
20 Citations (Scopus)
10 Downloads (Pure)

High performance 0.13um CMOS with classical architecture

Schmitz, J., van Brandenburg, A. C. M. C., Collart, E. J. H., Huijten, L. H. M., Montree, A. H., Ponomarev, Y. V., Roes, R. F. M., Scholten, A. J. & Woerlee, P. H., 1 Jan 1998, ESSDERC 1998: Proceedings of the 28th European Solid-State Device Research Conference. Touboul, A., Danto, Y. & Grünbacher, H. (eds.). Piscataway, NJ: IEEE Computer Society, p. 156-159 4 p. 1503512

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
2 Downloads (Pure)

Ultra-shallow junction formation by outdiffusion from implanted oxide

Schmitz, J., van Gestel, M., Stolk, P. A., Ponomarev, Y. V., Roozeboom, F., van Berkum, J. G. M., Zalm, P. C. & Woerlee, P. H., 1 Dec 1998, International Electron Devices Meeting, 1998, San Francisco, CA, December 6-9, 1998: IEDM technical digest. Piscataway, NJ: IEEE, p. 1009-1012 4 p. (International Electron Devices Meeting, IEDM Technical Digest; vol. 1998).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
6 Citations (Scopus)
1 Downloads (Pure)
1999

A 0.13um CMOS technology for low-voltage analogue applications

Ponomarev, Y. V., Stolk, P. A., van Brandenburg, A., Dachs, C. J. J., Kaiser, M., Montree, A. H., Roes, R., Schmitz, J. & Woerlee, P. H., 1 Jan 1999, ESSDERC 1999: Proceedings of the 29th European solid-state device research conference, Leuven, Belgium, 13-15 september. Mertens, R. P., Grünbacher, H., Maes, H. E. & Declerck, G. (eds.). Piscataway, NJ: IEEE Computer Society, p. 180-183 4 p. 1505469

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

An efficient lateral channel profiling of poly-SiGe-gated PMOSFET's for 0.1 μm CMOS low-voltage applications

Ponomarev, Y. V., Stolk, P. A., van Brandenburg, A. C. M. C., Dachs, C. J. J., Kaiser, M., Montree, A. H., Roes, R., Schmitz, J. & Woerlee, P. H., 14 Jun 1999, 1999 Symposium on VLSI Technology: digest of technical papers : June 14-16, 1999, Kyoto. Piscataway, NJ: IEEE, p. 65-66 2 p. (Digest of Technical Papers - Symposium on VLSI Technology; vol. 1999).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Channel formation for 0.15 μm CMOS using through-the-gate implantation

Montree, A. H., Ponomarev, Y. V., Baks, W. M., van Brandenburg, A. C. M. C., Dachs, C., Roes, R. F. M., Schmitz, J., Stolk, P. A. & Tuinhout, H. P., 10 Jun 1999, 1999 International Symposium on VLSI Technology, Systems, and Applications: proceedings of technical papers, June 8-10, 1999, Taipei International Convention Center, Taipei, Taiwan, R.O.C. Piscataway, NJ: IEEE, p. 10-13 4 p. (International Symposium on VLSI Technology, Systems, and Applications: Proceedings; vol. 1999).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
2 Citations (Scopus)
1 Downloads (Pure)

Characterization of low energy boron implants and electrical results of submicron PMOS transistors

Collart, E. J. H., Murrell, A. J., De Cock, G., Foad, M. A., Schmitz, J., van Zijl, J. P. & van Berkum, J. G. M., 1 Dec 1999, Ion implantation technology-98: 1998 International Conference on Ion Implantation Technology proceedings, Kyoto, Japan, June 22-26, 1998. Matsuo, J., Takaoka, G. & Yamada, I. (eds.). IEEE Canada, Vol. 2. p. 905-908 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
3 Downloads (Pure)

Gate polysilicon optimization for deep-submicron MOSFETs

Schmitz, J., Tuinhout, H. P., Montree, A. H., Ponomarev, Y. V., Stolk, P. A. & Woerlee, P. H., 1 Jan 1999, ESSDERC '99: proceedings of the 29th European Solid-State Device Research Conference : Leuven, Belgium, 13-15 September, 1999. Mertens, R. P., Grünbacher, H., Maes, H. E. & Declerck, G. (eds.). Piscataway, NJ: IEEE Computer Society, p. 156-159 4 p. 1505463

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
5 Citations (Scopus)
9 Downloads (Pure)

Minority carrier tunneling and stress-induced leakage current for p+ gate MOS capacitors with poly-Si and poly-Si0.7Ge0.3 gate material

Houtsma, V. E., Holleman, J., Salm, C., de Haan, I. R., Schmitz, J., Widdershoven, F. P. & Woerlee, P. H., Dec 1999, International Electron Devices Meeting 1999: Washington, DC, December 5-8, 1999, IEDM technical digest. Piscataway, NJ: IEEE, p. 457-460 4 p. (International Electron Devices Meeting, IEDM Technical Digest; vol. 1999).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
6 Citations (Scopus)
12 Downloads (Pure)

The effect of thin oxide layers on shallow junction formation

Stolk, P. A., Schmitz, J., Cubaynes, F. N., Van Brandenburg, A. C. M. C., van Berkum, J. G. M., van de Wijgert, W. G. & Roozeboom, F., 1 Jan 1999, ESSDERC '99: Proceedings of the 29th European Solid-State Device Research Conference : Leuven, Belgium 13-15 September 1999. Maes, H. E., Mertens, R. P., Declerck, G. & Grünbacher, H. (eds.). Piscataway, NJ: IEEE Computer Society, p. 428-431 4 p. 1505531

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
2 Downloads (Pure)
2000

Impact of ion implantation statistics on VT fluctuations in MOSFETs: Comparison between decaborane and boron channel implants

Tuinhout, H., Widdershoven, F., Stolk, P., Schmitz, J., Dirks, B., van der Tak, K., Bancken, P. & Politiek, J., 2000, 2000 Symposium on VLSI Technology: digest of technical papers : June 13-15, 2000, Honolulu. Piscataway, NJ: IEEE, p. 134-135 2 p. (Symposium on VLSI Technology: Digest of Technical Papers; vol. 2000).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
9 Citations (Scopus)

Ultrashallow junction formation and gate activation in deep-submicron CMOS

Stolk, P. A., Cubaynes, F. N., Meyssen, V. M. H., Mannino, G., Cowern, N. E. B., Van Zijl, J. P., Roozeboom, F., Verhoeven, J. F. C., Van Berkum, J. G. M., van de Wijgert, W. M., Schmitz, J., Tuinhout, H. P. & Woerlee, P. H., 1 Dec 2000, Symposium B – Si Front End Processing - Physics & Technology..II. Materials Research Society, p. B3.1.1-B3.1.12 12 p. (Materials Research Society Symposium - Proceedings; vol. 610).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
1 Citation (Scopus)
1 Downloads (Pure)
2001

A study of measurement system noise for sensitive soft breakdown triggering

Schmitz, J. & Tuinhout, H. P., 2001, ICMTS 2001: proceedings of the 2001 International Conference on Microelectronic Test Structures : March 19-22, 2001, Kobe, Japan. Piscataway, NJ: IEEE, p. 99-102 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
3 Citations (Scopus)

Soft breakdown triggers for large area capacitors under constant voltage stress

Schmitz, J., Kretschmann, H. J., Tuinhout, H. P. & Woerlee, P. H., 1 Jan 2001, 39th IEEE International Reliability Physics Symposium 2001: Orlando, Florida, April 30-May 3, 2001. IEEE, p. 393-398 6 p. 922932

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
4 Citations (Scopus)
4 Downloads (Pure)
2002

Gate dielectrics for high performance and low power CMOS SoC applications

Cubaynes, F., Dachs, C. J. J., Detcheverry, C., Zegers, A., Venezia, V. C., Schmitz, J., Stolk, P. A., Jurczak, M., Henson, K., Degraeve, R., Rothschild, A., Conard, T., Petry, J., Da Rold, M., Schaekers, M., Badenes, G., Date, L., Pique, D., Al-Shareef, H. N. & Murto, R. W., 1 Jan 2002, ESSDERC 2002: Proceedings of the 32nd European Solid-State Device Research Conference, Firenze, Italy, 24-26 September 2002. Gnani, E., Baccarani, G. & Rudan, M. (eds.). Piscataway, NJ: IEEE Computer Society, p. 427-430 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
1 Downloads (Pure)

Impact of source/drain implants on threshold voltage matching in deep sub-micron CMOS technologies

Dubois, J., Knol, J., Bolt, M., Tuinhout, H., Schmitz, J. & Stolk, P., 1 Jan 2002, ESSDERC 2002: Proceedings of the 32nd European Solid-State Device Research Conference, Firenze, Italy, 24-26 September 2002. Gnani, E., Baccarani, G. & Rudan, M. (eds.). Piscataway, NJ: IEEE Computer Society, p. 115-118 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
13 Citations (Scopus)
3 Downloads (Pure)
2003

High External Quantum Efficiency of the Lateral P-I-N Diodes Realized of Silicon On Insulator (SOI) Material

Hoang, T., Le Minh, P., Holleman, J., Schmitz, J. & Wallinga, H., 25 Nov 2003, Proceedings of Semiconductor Advances for Future Electronics SAFE 2003. p. 610-613 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

In-situ RHEED Analysis of Atomic Layer Deposition and Characterization of AL203 Gate Dielectrics

Bankras, R. G., Aarnink, A. A. I., Holleman, J. & Schmitz, J., 25 Nov 2003, Proceedings of Semiconductor Advances for Future Electronics SAFE 2003. p. -

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

On Oxidation Kinetics and Electrical Quality of Gate Oxide Grown in H2O or D2O Ambient

Hof, A. J., Kovalgin, A. Y., Woerlee, P. H. & Schmitz, J., 25 Nov 2003, Proceedings of Semiconductor Advances for Future Electronics SAFE 2003. p. 743-747 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Plasma nitridation optimization for sub-15 A gate dielectrics

Cubaynes, F. N., Schmitz, J., van der Marel, C., Snijders, J. H. M., Veloso, A., Rothschild, A., Olsen, C. & Date, L., 2003, Silicon Nitride and Silicon Dioxide Thin Insulating Films VII: Proceedings of the International Symposium. Sah, R. E. (ed.). Pennington, NJ: The Electrochemical Society Inc., Vol. 2. p. 595-604 10 p. (Electrochemical Society Proceedings; vol. 2003-02).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
46 Downloads (Pure)

Test structure design considerations for RF-CV measurements on leaky dielectrics

Schmitz, J., Cubaynes, F. N., Havens, R. J., de Kort, R., Scholten, A. J. & Tiemeijer, L. F., 7 May 2003, ICMTS 2003: Proceedings of the 2003 International Conference on Microelectronic Test Structures : March 17-20, 2003, Double Tree Hotel, Monterey, California. Piscataway, NJ: IEEE Computer Society, p. 181-185 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
8 Citations (Scopus)
15 Downloads (Pure)

Trends in CMOS device characterization

Schmitz, J. & Tiemeijer, L. F., 17 Jun 2003, Proceedings of the INFOS Conference 2003. Barcelona, Spain, p. -

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
4 Downloads (Pure)
2004

Gate-capacitance extraction from RF C-V measurements

Sasse, G. T., de Kort, R. & Schmitz, J., 15 Nov 2004, The 34th European Solid-State Device Research conference, 2004. Piscataway: IEEE, p. 113-116 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
3 Citations (Scopus)
73 Downloads (Pure)

Gate-Capacitance Extraction from RF C-V Measurements

Sasse, G. T., de Kort, R. & Schmitz, J., 25 Nov 2004, Proceedings of Semiconductor Advances for Future Electronics (SAFE). Veldhoven, The Netherlands: STW

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Gate oxide reliability and deuterated CMOS processing

Hof, A. J., Kovalgin, A., van Schaijk, R., Baks, W. M. & Schmitz, J., 25 Apr 2004, IEEE Integrated Reliability Workshop 2004. Piscataway, NJ: IEEE Computer Society, p. 7-10 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
1 Citation (Scopus)
58 Downloads (Pure)

GOSSIP: a vertex detector combining a thin gas layer as signal generator with a CMOS readout pixel array

van der Graaf, H., Campbell, M., Chefdeville, M. A., Colas, P., Colijn, A. P., Fornaini, A., Giomataris, Y., Heijne, E. H. M., Kluit, P., Llopart, X., Schmitz, J., Timmermans, J. & Visschers, J. L., 2004, Proceedings of Vertex 2004 conference. IEEE, p. -

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
9 Downloads (Pure)

Investigating Hot-Carrier Degradation in MOSFETs using Constant and Switched Biased Low-Frequency Noise measurements

Kolhatkar, J. S., Hoekstra, E., Hof, A. J., Salm, C., Wallinga, H. & Schmitz, J., 25 Nov 2004, Proceedings SAFE & ProRISC 2004. Utrecht: STW, p. 700-703 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
19 Downloads (Pure)

Leakage current correction in quasi-static C-V measurements

Schmitz, J., Weusthof, M. H. H. & Hof, A. J., 25 Feb 2004, International Conference of Microelectronic Test Structures ICMTS 2004. Piscataway: IEEE Electron Devices Society, p. 179-181 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
13 Citations (Scopus)
165 Downloads (Pure)

Modeling of RTS Noise in MOSFETs under Steady-State and Large-Signal Excitation

Kolhatkar, J. S., Hoekstra, E., Salm, C., van der Wel, A. P., Klumperink, E. A. M., Schmitz, J. & Wallinga, H., Dec 2004, IEEE International Electron Devices Meeting (IEDM 2004). Piscataway, NJ, USA: IEEE, p. 759-762 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
18 Citations (Scopus)
16 Downloads (Pure)

On Oxidation of Silicon in Ultra-Diluted H2O and D2O Ambient

Hof, A. J., Kovalgin, A. Y. & Schmitz, J., 27 Jun 2004, proceedings Wodim 2004. Cork, Ireland, p. -

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
6 Downloads (Pure)

The readout of gaseous detectors by means of a Micromegas-covered pixel-segmented CMOS anode

Fornaini, A., Campbell, M., Colas, P., Giomataris, Y., van der Graaf, H., Heijne, E. H. M., Kluit, P., Llopart, X., Schmitz, J., Timmermans, J. & Visschers, J. L., 2004, Proceedings of IWORID workshop 2004. Glasgow: IEEE, p. -

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

The Readout of Gaseous Detectors by Means of a Micromegas-Covered Pixel-Segmented CMOS Anode

Colas, P., Giomataris, Y., Colijn, A. P., Fornaini, A., van der Graaf, H., Kluit, P., Timmermans, J., Visschers, J. L., Schmitz, J., Campbell, M., Heijne, E. H. M. & Llopart, X., 2004, Proceedings of Nuclear Science Symposium. Rome: IEEE, p. -

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2005

A high-density inductively-coupled remote plasma system for the deposition of dielectrics and semiconductors

Aarnink, A. A. I., Boogaard, A., Brunets, I., Isai, I. G., Kovalgin, A. Y., Holleman, J., Wolters, R. A. M. & Schmitz, J., 17 Nov 2005, Proceedings of 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Netherlands: STW, p. 67-69 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
5 Downloads (Pure)

A high efficiency lateral light emitting device on SOI

Hoang, T., Le Minh, P., Holleman, J., Zieren, V., Goossens, M. J. & Schmitz, J., 4 Apr 2005, EDMO 2004: 12th IEEE International Symposium on Electron Devices for Microwave and Optoelectronic Applications. Piscataway, NJ: IEEE Computer Society, p. 87-91 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
27 Downloads (Pure)

An electron-multiplying 'Micromegas' grid made in silicon wafer post-processing technology

Chefdeville, M. A., Colas, P., Giomataris, Y., van der Graaf, H., Heijne, E. H. M., van der Putten, S., Salm, C., Schmitz, J., Smits, S. M., Timmermans, J. & Visschers, J. L., Nov 2005, Proceedings 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Netherlands: STW, p. 139-142 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
51 Downloads (Pure)

Characterization of dielectric charging in RF MEMS

Herfst, R. W., Huizing, H. G. A., Steeneken, P. G. & Schmitz, J., Nov 2005, 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005 (SAFE 2005). Utrecht, The Netherlands: STW, p. 11-14 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Charge pumping at radio frequencies: [MOSFET device interface state density measurement]

Sasse, G. T., de Vries, H. & Schmitz, J., Apr 2005, ICMTS 2005: proceedings of the 2005 International Conference on Microelectronic Test Structures, April 4-7, 2005, De Valk, Tiensestraat 41, Leuven, Belgium. Piscataway, NJ: IEEE, p. 229-233 5 p. (Proceedings International Conference on Microelectronic Test Structures; vol. 2005).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)
9 Downloads (Pure)

In-situ RHEED Analysis of Atomic Layer Deposition

Bankras, R. G., Holleman, J. & Schmitz, J., 17 Nov 2005, Proceedings of 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Netherlands: STW, p. 70-75 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

In-situ RHEED of atomic layer deposition

Bankras, R. G., Holleman, J. & Schmitz, J., 5 Sep 2005, EuroCVD-15 conference proceedings. Bochum, Germany, p. -

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Specific Contact Resistance Measurements of Metal-Semiconductor Junctions

Stavitski, N., van Dal, M. J. H., Wolters, R. A. M., Kovalgin, A. Y. & Schmitz, J., 17 Nov 2005, Proceedings of 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Netherlands: STW, p. 52-55 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

The Effect of an Electric Field on a Lateral Silicon Light-Emitting Diode

Le Minh, P., Hoang, T., Holleman, J. & Schmitz, J., 17 Nov 2005, Proceedings of 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Ntherlands: STW, p. 117-120 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

The effect of dislocation loops on the light emission of silicon LEDs

Hoang, T., Le Minh, P., Holleman, J. & Schmitz, J., 11 Sep 2005, Proceedings of 35th European Solid-State Device Research Conference, 2005. ESSDERC 2005. Grenoble, France: IEEE, p. 359-362 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

6 Citations (Scopus)
33 Downloads (Pure)

The RF Charge Pump Technique for Measuring the Interface State Density on Leaky Dielectrics

Sasse, G. T., de Vries, H. & Schmitz, J., 17 Nov 2005, 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Netherlands: STW, p. 47-51 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic