1991 …2020

Research output per year

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Research Output

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A 0.13um CMOS technology for low-voltage analogue applications

Ponomarev, Y. V., Stolk, P. A., van Brandenburg, A., Dachs, C. J. J., Kaiser, M., Montree, A. H., Roes, R., Schmitz, J. & Woerlee, P. H., 1 Jan 1999, ESSDERC 1999: Proceedings of the 29th European solid-state device research conference, Leuven, Belgium, 13-15 september. Mertens, R. P., Grünbacher, H., Maes, H. E. & Declerck, G. (eds.). Piscataway, NJ: IEEE Computer Society, p. 180-183 4 p. 1505469

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Above-CMOS a-Si and CIGS Solar Cells for Powering Autonomous Microsystems

Lu, J., Liu, W., van der Werf, C. H. M., Kovalgin, A. Y., Sun, Y., Schropp, R. E. I. & Schmitz, J., 6 Dec 2010, Proceedings of the 2010 IEEE International Electron Devices Meeting (IEDM). IEEE Electron Devices Society, p. 31.3.1.-31.3.4 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
7 Citations (Scopus)
195 Downloads (Pure)

A high-density inductively-coupled remote plasma system for the deposition of dielectrics and semiconductors

Aarnink, A. A. I., Boogaard, A., Brunets, I., Isai, I. G., Kovalgin, A. Y., Holleman, J., Wolters, R. A. M. & Schmitz, J., 17 Nov 2005, Proceedings of 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Netherlands: STW, p. 67-69 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
5 Downloads (Pure)

A high efficiency lateral light emitting device on SOI

Hoang, T., Le Minh, P., Holleman, J., Zieren, V., Goossens, M. J. & Schmitz, J., 4 Apr 2005, EDMO 2004: 12th IEEE International Symposium on Electron Devices for Microwave and Optoelectronic Applications. Piscataway, NJ: IEEE Computer Society, p. 87-91 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
27 Downloads (Pure)

A miniaturized multiwire proportional chamber using CMOS wafer scale post-processing

Blanco Carballo, V. M., Chefdeville, M. A., van der Graaf, H., Salm, C., Aarnink, A. A. I., Smits, S. M., Altpeter, D. M., Timmermans, J., Timmermans, J., Visschers, J. L. & Schmitz, J., 7 Jul 2006, Proceedings of 32nd European Solid State Device Research Conference. IEEE Computer Society Press, p. 129-132 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

An efficient lateral channel profiling of poly-SiGe-gated PMOSFET's for 0.1 μm CMOS low-voltage applications

Ponomarev, Y. V., Stolk, P. A., van Brandenburg, A. C. M. C., Dachs, C. J. J., Kaiser, M., Montree, A. H., Roes, R., Schmitz, J. & Woerlee, P. H., 14 Jun 1999, 1999 Symposium on VLSI Technology: digest of technical papers : June 14-16, 1999, Kyoto. Piscataway, NJ: IEEE, p. 65-66 2 p. (Digest of Technical Papers - Symposium on VLSI Technology; vol. 1999).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

An electron-multiplying 'Micromegas' grid made in silicon wafer post-processing technology

Chefdeville, M. A., Colas, P., Giomataris, Y., van der Graaf, H., Heijne, E. H. M., van der Putten, S., Salm, C., Schmitz, J., Smits, S. M., Timmermans, J. & Visschers, J. L., Nov 2005, Proceedings 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005. Veldhoven, The Netherlands: STW, p. 139-142 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Open Access
File
51 Downloads (Pure)

An initial modelling and simulation study on the 1D Si-Based LED

Puliyankot Palackavalapil, V., Hueting, R. J. E. & Schmitz, J., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: STW, p. 170-173 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

An Initial study on The Reliability of Power Semiconductor Devices

Boksteen, B. K., Hueting, R. J. E., Salm, C. & Schmitz, J., 18 Nov 2010, Proceedings of STW.ICT Conference 2010. Utrecht: STW, p. 68-72 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

File
133 Downloads (Pure)

An integrated gaseous detector using microfabrication post-processing technology

Blanco Carballo, V. M., Salm, C., Smits, S. M., Schmitz, J., Chefdeville, M. A., van der Graaf, H., Timmermans, J., Timmermans, J. & Visschers, J. L., 23 Nov 2006, Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006. Utrecht, The Netherlands: STW, p. 369-372 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

An integrated single photon detector array using porous anodic alumina

Melai, J., Salm, C., Schmitz, J., Smits, S. & Visschers, J., 27 Nov 2006, Proceedings 9th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2006. Utrecht, The Netherlands: STW, p. 389-393 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Anomalous Scaling of Parasitic Capacitance in FETs with a High-K Channel Material

Smink, A. E. M., de Jong, M. J., Hilgenkamp, H., Van Der Wiel, W. G. & Schmitz, J., May 2020, 2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, 9107901. (IEEE International Conference on Microelectronic Test Structures; vol. 2020).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Antifuse injectors for SOI LEDs

Piccolo, G., Hoang, T., Holleman, J., Kovalgin, A. Y. & Schmitz, J., 27 Nov 2008, Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008). Utrecht, The Netherlands: STW, p. 573-575 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Downloads (Pure)

A silicon-based electrical source for surface plasmon polaritons

Walters, R. J., van Loon, R. V. A., Brunets, I., Schmitz, J. & Polman, A., 9 Sep 2009, Proceedings of the 6th International Conference on GroupIV Photonics GFP'09. Piscataway: IEEE Computer Society Press, p. 74-76 3 p. 10.1109/GROUP4.2009.5338358

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
2 Citations (Scopus)
100 Downloads (Pure)

A study of measurement system noise for sensitive soft breakdown triggering

Schmitz, J. & Tuinhout, H. P., 2001, ICMTS 2001: proceedings of the 2001 International Conference on Microelectronic Test Structures : March 19-22, 2001, Kobe, Japan. Piscataway, NJ: IEEE, p. 99-102 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
3 Citations (Scopus)

Band Offset Measurements on Ultra-Thin (100) SOI MOSFETs

van der Steen, J-LPJ., Hueting, R. J. E., Smit, G. D. J., Hoang, T., Holleman, J. & Schmitz, J., 29 Nov 2007, 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE). Utrecht, The Netherlands: STW, p. 460-464 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
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Channel formation for 0.15 μm CMOS using through-the-gate implantation

Montree, A. H., Ponomarev, Y. V., Baks, W. M., van Brandenburg, A. C. M. C., Dachs, C., Roes, R. F. M., Schmitz, J., Stolk, P. A. & Tuinhout, H. P., 10 Jun 1999, 1999 International Symposium on VLSI Technology, Systems, and Applications: proceedings of technical papers, June 8-10, 1999, Taipei International Convention Center, Taipei, Taiwan, R.O.C. Piscataway, NJ: IEEE, p. 10-13 4 p. (International Symposium on VLSI Technology, Systems, and Applications: Proceedings; vol. 1999).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
2 Citations (Scopus)
1 Downloads (Pure)

Channel profile engineering of 0.1 μm-Si MOSFETs by through-the-gate implantation

Ponomarev, Y. V., Stolk, P. A., van Brandenburg, A. C. M. C., Roes, R., Montree, A. H., Schmitz, J. & Woerlee, P. H., 1 Dec 1998, International Electron Devices Meeting 1998 : San Francisco, CA, December 6-9, 1998, IEDM technical digest. IEEE, p. 635-638 4 p. (International Electron Devices Meeting, IEDM Technical Digest; vol. 1998).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
20 Citations (Scopus)
10 Downloads (Pure)

Characterization of dielectric charging in RF MEMS

Herfst, R. W., Huizing, H. G. A., Steeneken, P. G. & Schmitz, J., Nov 2005, 8th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors 2005 (SAFE 2005). Utrecht, The Netherlands: STW, p. 11-14 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Characterization of dielectric charging in RF MEMS capacitive switches

Herfst, R. W., Huizing, H. G. A., Steeneken, P. G. & Schmitz, J., 6 Mar 2006, Proceedings of the 2006 International Conference on Microelectronic Test Structures (ICMTS). Austin, USA: IEEE, p. 133-136 4 p. 10.1109/ICMTS.2006.1614290

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
63 Citations (Scopus)
326 Downloads (Pure)

Characterization of Green Laser Crystallized GeSi Thin Films

Rangarajan, B., Brunets, I., Oesterlin, P., Kovalgin, A. Y. & Schmitz, J., 2011, Amorphous and Polycrystalline Thin-Film Silicon Science and Technology 2011. p. a06-04 6 p. (MRS online proceedings; vol. 1321).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

37 Downloads (Pure)

Characterization of low energy boron implants and electrical results of submicron PMOS transistors

Collart, E. J. H., Murrell, A. J., De Cock, G., Foad, M. A., Schmitz, J., van Zijl, J. P. & van Berkum, J. G. M., 1 Dec 1999, Ion implantation technology-98: 1998 International Conference on Ion Implantation Technology proceedings, Kyoto, Japan, June 22-26, 1998. Matsuo, J., Takaoka, G. & Yamada, I. (eds.). IEEE Canada, Vol. 2. p. 905-908 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
3 Downloads (Pure)

Characterization of recessed Ohmic contacts to AlGaN/GaN

Hajlasz, M., Donkers, J. J. T. M., Sque, S. J., Heil, S. B. S., Gravesteijn, D. J., Rietveld, F. J. R. & Schmitz, J., 23 Mar 2015, Proceedings of the International Conference on Microelectronic Test Structures, ICMTS 2015. USA: IEEE Solid-State Circuits Society, p. 158-162 5 p. (Proceedings of the IEEE International Conference on Microelectronic Test Structures).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Charge plasma diode - a novel device concept

Rajasekharan, B., Hueting, R. J. E., Salm, C., Hoang, T. & Schmitz, J., 27 Nov 2008, Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008). Utrecht, The Netherlands: STW, p. 576-579 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Charge protection characterisation and drift time resolution improvement for GridPix

Koppert, W. J. C., Fransen, M., van Bakel, N., van der Graaf, H., Hartjes, F., Timmermans, J., Visser, J., Kluit, R., Gromov, V., Zappon, F., Blanco Carballo, V. M., Schmitz, J., Bilevych, Y. & Bilevych, Y., 23 Oct 2011, IEEE Nuclear Science Symposium and Medical Imaging Conference, NSS/MIC 2011. USA: IEEE, p. 1799-1802 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Charge pumping at radio frequencies: [MOSFET device interface state density measurement]

Sasse, G. T., de Vries, H. & Schmitz, J., Apr 2005, ICMTS 2005: proceedings of the 2005 International Conference on Microelectronic Test Structures, April 4-7, 2005, De Valk, Tiensestraat 41, Leuven, Belgium. Piscataway, NJ: IEEE, p. 229-233 5 p. (Proceedings International Conference on Microelectronic Test Structures; vol. 2005).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)
9 Downloads (Pure)

Charge Pumping at radio Frequencies: Methodology, Trap Response and Application

Sasse, G. T. & Schmitz, J., 30 Mar 2006, 2006 IEEE International Reliability Physics Symposium proceedings: 44th annual : San Jose, California, March, 26-30, 2006. Piscataway, NJ: IEEE, p. 627-628 2 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

8 Citations (Scopus)

CMOS-MEMS Post Processing Compatible Capacitively Transduced GeSi Resonators

Kazmi, S. N. R., Aarnink, A. A. I., Salm, C. & Schmitz, J., 25 Jul 2012, Proceedings of 2012 IEEE International Frequency Control Symposium (IFCS). USA: IEEE Electron Devices Society, p. 1-4 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

CMOS post-processing for monolithic microsystems

Schmitz, J., 11 Mar 2014, Nano and Giga Challenges in Electronics, Photonics and Renewable Energy, Nano & Giga 2014. Tempe, Arizona, USA: Arizona State University, p. - 1 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Comparison of C-V measurement methods for RF-MEMS capacitive switches

Wang, J., Salm, C. & Schmitz, J., 26 Mar 2013, IEEE International Conference on Microelectronic Test Structures, ICMTS 2013. USA: IEEE Electron Devices Society, p. 53-58 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Comparison of electrical techniques for temperature evaluation in power MOS transistors

Ferrara, A., Steeneken, P. G., Reimann, K., Heringa, A., Yan, L., Boksteen, B. K., Swanenberg, M., Koops, G. E. J., Scholten, A. J., Surdeanu, R., Schmitz, J. & Hueting, R. J. E., 26 Mar 2013, IEEE International Conference on Microelectronic Test Structures (ICMTS 2013). USA: IEEE, p. 115-120 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

5 Citations (Scopus)

Comparison of gate capacitance extraction methodologies

Kazmi, S. N. R. & Schmitz, J., 27 Nov 2008, Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008). Utrecht, The Netherlands: STW, p. 562-564 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Considerations on using SU-8 as a construction material for high aspect ratio structures

Melai, J., Salm, C., Smits, S. M., Blanco Carballo, V. M., Schmitz, J. & Hageluken, B., 29 Nov 2007, 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE). Utrecht, The Netherlands: STW, p. 529-534 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
75 Downloads (Pure)

Contact chain measurements for ultrathin conducting films

Groenland, A. W., Wolters, R. A. M., Kovalgin, A. Y. & Schmitz, J., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: STW, p. 150-152 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Cross-Bridge Kelvin Resistor (CBKR) structures for silicide-semiconductor junctions characterization

Stavitski, N., van Dal, M. J. H., Klootwijk, J. H., Wolters, R. A. M., Kovalgin, A. Y. & Schmitz, J., 23 Nov 2006, Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006. Utrecht, The Netherlands: STW, p. 436-438 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

2 Downloads (Pure)

C-V Test Structures for Metal Gate CMOS

Bankras, R. G., Tiggelman, M. P. J., Negara, M. A., Sasse, G. T. & Schmitz, J., 6 Mar 2006, Proceedings of the International Conference on Microelectronic Test Structures (ICMTS). Piscataway: IEEE EDS, p. 226-229 4 p. (Electron Devices Society).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
1 Citation (Scopus)
146 Downloads (Pure)

Degradation and reliability of silicon power transistors

Schmitz, J., Oct 2013, 2013 IEEE International Integrated Reliability Workshop Final Report.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Deposition of High-Quality SiO2 Insulating Films at Low Temperatures by means of Remote PECVD

Boogaard, A., Roesthuis, R., Brunets, I., Aarnink, A. A. I., Kovalgin, A. Y., Holleman, J., Wolters, R. A. M. & Schmitz, J., 27 Nov 2008, Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008). Utrecht, The Netherlands: STW, p. 452-456 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Design and characterisation of high-performance 0.13 μm NMOS Devices

Schmitz, J., Paulzen, G. M., Gravesteijn, D. J., Montree, A. H. & Woerlee, P. H., 1 Jan 1996, ESSDERC 1996: Proceedings of the 26th European Solid State Device Research Conference. Rudan, M. & Baccarani, G. (eds.). Piscataway, NJ: IEEE Computer Society, p. 329-332 4 p. 5437045

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
4 Downloads (Pure)

Dimensional scaling effects on transport properties of p-i-n diodes

Rajasekharan, B., Salm, C., Hueting, R. J. E., Hoang, T., van der Wiel, W. G. & Schmitz, J., 29 Nov 2007, 10th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors (SAFE). Utrecht, The Netherlands: STW, p. 457-459 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Dimensional scaling effects on transport properties of ultrathin body p-i-n diodes

Rajasekharan, B., Salm, C., Hueting, R. J. E., Hoang, T. & Schmitz, J., 13 Mar 2008, Proceedings of the 9th Conference on ULtimate Integration on Silicon. Piscataway: IEEE Computer Society Press, p. 195-198 4 p. 10.1109/ULIS.2008.4527172. (Electron Device Society; no. DTR08-9).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
13 Citations (Scopus)
70 Downloads (Pure)

Discharge Protection and Ageing of Micromegas Pixel Detectors

Aarts, A. A., Blanco Carballo, V. M., Chefdeville, M. A., Colas, P., Dunand, S., Fransen, M., van der Graaf, H., Giomataris, Y., Hartjes, F., Koffeman, G., Melai, J., Peek, H., Riegler, W., Salm, C., Schmitz, J., Smits, S. M., Timmermans, J., Timmermans, J., Visschers, J. L. & Wyrsch, N., 29 Oct 2006, 2006 IEEE Nuclear Science Symposium Conference Record. San Diego, CA, USA: IEEE Nuclear & Plasma Sciences Society, p. 3865-3869 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Effect of Ambient on the Recovery of Hot-Carrier Degraded Devices

De Jong, M. J., Salm, C. & Schmitz, J., 30 Jun 2020, 2020 IEEE International Reliability Physics Symposium, IRPS 2020 - Proceedings. IEEE, 9129540. (IEEE International Reliability Physics Symposium Proceedings; vol. 2020-April).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Effect of carrier injector size on silicon LED performance

Piccolo, G., Kovalgin, A. Y. & Schmitz, J., 26 Nov 2009, Proceedings of the 12th Annual Workshop on Semiconductor Advances for Future Electronics and Sensors. Utrecht, The Netherlands: STW, p. 167-169 3 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

Effects of gate depletion and boron penetration on matching of deep submicron CMOS transistors

Tuinhout, H. P., Montree, A. H., Schmitz, J. & Stolk, P. A., 1 Dec 1997, International Electron Devices Meeting, 1997, Washington, DC, December 7-10, 1997: IEDM technical digest. Piscataway, NJ: IEEE, p. 631-634 4 p. (International Electron Devices Meeting, IEDM Technical Digest; vol. 1997).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
66 Citations (Scopus)
7 Downloads (Pure)

Electrical characterization of hot-wire assisted atomic layer deposited Tungsten films

van der Zouw, K., Aarnink, A. A. I., Schmitz, J. & Kovalgin, A. Y., 18 Mar 2019, 2019 IEEE 32nd International Conference on Microelectronic Test Structures, ICMTS 2019. IEEE, p. 48-53 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
1 Citation (Scopus)
48 Downloads (Pure)

Electrical characterization of thin film ferroelectric capacitors

Tiggelman, M. P. J., Reimann, K., Klee, M., Beelen, D., Keur, W., Schmitz, J. & Hueting, R. J. E., 23 Nov 2006, Proceedings of the 9th annual workshop on Semiconductor Advances for Future Electronics and Sensors 2006. Utrecht, The Netherlands: STW, p. 439-443 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

File
239 Downloads (Pure)

Electrical test structures for verifying continuity of ultra-thin insulating and conducting films

Banerjee, S., van der Velde, F. J., Yang, M., Schmitz, J. & Kovalgin, A. Y., 28 Mar 2017, Electrical test structures for verifying continuity of ultra-thin insulating and conducting films. New York: IEEE, p. 1-6 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Electron Beam Lithography of HSQ and PMMA Resists and Importance of their Properties to Link the Nano World to the Micro World

Kaleli, B., Aarnink, A. A. I., Smits, S. M., Hueting, R. J. E., Wolters, R. A. M. & Schmitz, J., 18 Nov 2010, Proceeding of STW.ICT Conference 2010. Utrecht: STW, p. 105-108 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademic

File
183 Downloads (Pure)

Energy band offset extraction - a comparative study

van der Steen, J. P. J., Hueting, R. J. E. & Schmitz, J., 27 Nov 2008, Proceedings of the 11th annual workshop on semiconductor advances for future electronics and sensors (SAFE 2008). Utrecht, The Netherlands: STW, p. 592-595 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review