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Research Output 1991 2019

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Poster
2017

Low temperature thin films for next-generation microelectronics

Schmitz, J., 22 May 2017. 1 p.

Research output: Contribution to conferencePoster

2006

Substrate-inhibited ALD: interface formation and thin film properties

Sturm, J. M., Zinine, A., Wormeester, H., Poelsema, B., Bankras, R. G., Holleman, J. & Schmitz, J., 31 Mar 2006, p. -.

Research output: Contribution to conferencePoster

2005
1 Citation (Scopus)

Laterally resolved electrical characterisation of high-K oxides with non-contact Atomic Force Microscopy

Sturm, J. M., Zinine, A., Wormeester, H., Bankras, R. G., Holleman, J., Schmitz, J. & Poelsema, B., 1 Jun 2005, p. -.

Research output: Contribution to conferencePosterOther research output

2004

Imaging of oxide charges and contact potential difference fluctuations with non-contact AFM

Sturm, J. M., Zinine, A., Wormeester, H., Poelsema, B., Bankras, R. G., Holleman, J. & Schmitz, J., 14 Dec 2004, p. -.

Research output: Contribution to conferencePoster

Imaging of oxide charges and contact potential difference fluctuations with non-contact AFM

Sturm, J. M., Zinine, A., Wormeester, H., Poelsema, B., Bankras, R. G., Holleman, J. & Schmitz, J., 5 Nov 2004, p. -.

Research output: Contribution to conferencePoster

XPS and SPM characterization of ALD grown thin Al2O3 layers

Zinine, A., Sturm, J. M., Wormeester, H., Poelsema, B., Bankras, R. G., Aarnink, W. A. M., Holleman, J. & Schmitz, J., 16 Aug 2004, p. -.

Research output: Contribution to conferencePoster

2003

Atomic layer deposition - system with in-situ characterization of layer-by-layer growth

Bankras, R. G., Aarnink, A. A. I., Holleman, J. & Schmitz, J., 2 Oct 2003, p. -.

Research output: Contribution to conferencePoster

Characterisation of high-K metal oxides

Zinine, A., Sturm, J. M., Wormeester, H., Poelsema, B., Bankras, R. G., Holleman, J. & Schmitz, J., 16 Dec 2003, p. -.

Research output: Contribution to conferencePoster