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Research Output 1991 2019

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Conference article
2009
12 Downloads (Pure)

The InGrid chip post-processing technology for radiation imaging

Schmitz, J., 1 Jan 2009, In : Proceedings of Science. 95

Research output: Contribution to journalConference articleAcademicpeer-review

Open Access
File
Detectors
Imaging techniques
Radiation
Processing
Electronic equipment
2007
2 Citations (Scopus)

Low-frequency noise in hot-carrier degraded nMOSFETs

Salm, C., Hoekstra, E., Kolhatkar, J. S., Hof, A. J., Wallinga, H. & Schmitz, J., Apr 2007, In : Microelectronics reliability. 47, 4-5, p. 577-580 4 p.

Research output: Contribution to journalConference articleAcademicpeer-review

Hot carriers
Deuterium
low frequencies
Degradation
degradation
2004
2 Citations (Scopus)
8 Downloads (Pure)

The RF-CV method for characterization of leaky gate dielectrics

Schmitz, J., Cubaynes, F. N., de Kort, R., Havens, R. J., Scholten, A. J. & Tiemeijer, L. F., 3 Feb 2004, In : Microelectronic engineering. 72, 10.1016/j.mee.2004.01.028, p. 149-153 5 p.

Research output: Contribution to journalConference articleAcademicpeer-review

File
Gate dielectrics
frequency measurement
leakage