Fingerprint
Dive into the research topics where Kevin M. Batenburg is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 1 Similar Profiles
Collaborations and top research areas from the last five years
Recent external collaboration on country/territory level. Dive into details by clicking on the dots or
-
Realization of Pure Boron/Si Diodes Through a Two-Step Low-Temperature Growth in a Home-Built LP CVD System
Vu, T. T. H., Batenburg, K. M., Aarnink, A. A. I., Wu, W., Kovalgin, A. Y., Gravesteijn, D. J. & Hueting, R. J. E., 2026, In: IEEE Journal of the Electron Devices Society. 14, p. 176-185 10 p.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile1 Downloads (Pure) -
Tuning Nanopores in Tubular Ceramic Nanofiltration Membranes with Atmospheric-Pressure Atomic Layer Deposition: Prospects for Pressure-Based In-Line Monitoring of Pore Narrowing
Nijboer, M., Jan, A., Chen, M., Batenburg, K., Peper, J., Aarnink, T., Roozeboom, F., Kovalgin, A., Nijmeijer, A. & Luiten-Olieman, M., 9 Jan 2024, In: Separations. 11, 1, 24.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile8 Link opens in a new tab Citations (Scopus)278 Downloads (Pure) -
WIRE SUSPENDED ON A V-GROOVE CAVITY TO MEASURE GAS PHYSICAL PROPERTIES
Azadi Kenari, S., Wiegerink, R. J., Batenburg, K. M., Veltkamp, H.-W., Sanders, R. G. P. & Lotterman, H., 2024Research output: Book/Report › Report › Academic
Open Access -
Batch furnace CVD of pure boron layers on Si and GaN substrates for lowleakage- current diode fabrication
Vu, T. T. H., Batenburg, K. M., Aarnink, A. A. I., Knežević, T., Liu, X. & Nanver, L. K., Apr 2023, In: JST: Engineering and Technology for Sustainable Development. 33, 2, p. 29-35Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile117 Downloads (Pure) -
A miniature microclimate thermal flow sensor for horticultural applications
Alveringh, D., Bijsterveld, D. G., Berg, T. E. V. D., Veltkamp, H.-W., Batenburg, K. M., Sanders, R. G. P., Lötters, J. C. & Wiegerink, R. J., 8 Dec 2022, 2022 IEEE Sensors. IEEE, 4 p. 9967348Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open AccessFile4 Link opens in a new tab Citations (Scopus)232 Downloads (Pure)