20202020

Research output per year

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Fingerprint Dive into the research topics where Kevin Michael Batenburg is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

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Research Output

  • 2 Conference contribution

Diode design for studying material defect distributions with avalanche-mode light emission

Krakers, M., Knezevic, T., Batenburg, K. M., Liu, X. & Nanver, L. K., May 2020, 2020 IEEE 33rd International Conference on Microelectronic Test Structures, ICMTS 2020 - Proceedings. Piscataway, NJ: IEEE, 9107933. (IEEE International Conference on Microelectronic Test Structures; vol. 2020).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

  • RFID Tag Failure after Thermal Overstress

    Ozturk, E., Dikkers, M. J., Batenburg, K. M., Salm, C. & Schmitz, J., 10 Feb 2020, 2019 IEEE International Integrated Reliability Workshop, IIRW 2019. IEEE, 8989885

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

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