Research output per year
Research output per year
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Dive into the research topics where Lis Karen Nanver is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
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Identifying nano-Schottky diode currents in silicon diodes with 2D interfacial layers
Knezevic, T. & Nanver, L. K., 10 Apr 2023, 2023 35th International Conference on Microelectronic Test Structure (ICMTS). IEEE, 6 p. (IEEE International Conference on Microelectronic Test Structures; vol. 2023-March).Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
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Checks on temperature during on-wafer I-V characterization of Si diodes made with 2-D interfacial layers
Van Zoeren, J. & Nanver, L. K., 26 Sep 2022, 2022 IEEE 34th International Conference on Microelectronic Test Structures, ICMTS 2022 - Proceedings. IEEE, p. 149-154 6 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open AccessFile1 Citation (Scopus)5 Downloads (Pure) -
Optical detectors
Nanver, L. & Kneževic, T., 30 Sep 2022, Advances in Semiconductor Technologies: Selected Topics Beyond Conventional CMOS. Chen, A. (ed.). Wiley-Blackwell, p. 211-229 19 p.Research output: Chapter in Book/Report/Conference proceeding › Chapter › Academic › peer-review
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Low-Temperature Electrical Performance of PureB Photodiodes Revealing Al-Metallization-Related Degradation of Dark Currents
Knezevic, T., Suligoj, T., Capan, I. & Nanver, L. K., Jun 2021, In: IEEE Transactions on Electron Devices. 68, 6, p. 2810 - 2817 8 p.Research output: Contribution to journal › Article › Academic › peer-review
Open AccessFile2 Citations (Scopus)15 Downloads (Pure) -
Modeling and Simulation Study of Electrical Properties of Ge-on-Si Diodes with Nanometer-thin PureGaB Layer
Markovic, L., Knezevic, T., Nanver, L. K. & Suligoj, T., 15 Nov 2021, 2021 44th International Convention on Information, Communication and Electronic Technology, MIPRO 2021 - Proceedings. Koricic, M., Skala, K., Car, Z., Cicin-Sain, M., Babic, S., Sruk, V., Skvorc, D., Ribaric, S., Jerbic, B., Gros, S., Vrdoljak, B., Mauher, M., Tijan, E., Katulic, T., Petrovic, J., Grbac, T. G., Fijan, N. F. & Gradisnik, V. (eds.). IEEE, p. 64-69 6 p.Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
Open AccessFile1 Citation (Scopus)36 Downloads (Pure)
Activities
- 1 Oral presentation
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Test structures without metal contacts for DC measurement of 2D-materials deposited on silicon
Lis Karen Nanver (Speaker), Xingyu Liu (Contributor) & Tihomir Knezevic (Contributor)
20 Mar 2018Activity: Talk or presentation › Oral presentation