1980 …2020

Research output per year

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Fingerprint Dive into the research topics where Lis Karen Nanver is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

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Research Output

Broadband PureGaB Ge-on-Si photodiodes responsive in the ultraviolet to near-infrared range

Knezević, T., Krakers, M. & Nanver, L. K., 3 Mar 2020, Optical Components and Materials XVII. Jiang, S. & Digonnet, M. J. F. (eds.). SPIE Press, 112760I. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 11276).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

  • Back-end-of-line CMOS-compatible diode fabrication with pure boron deposition down to 50 °C

    Knežević, T., Suligoj, T., Liu, X., Nanver, L. K., Elsayed, A., Dick, J. F. & Schulze, J., 1 Sep 2019, ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC). IEEE, p. 242-245 4 p. 8901810. (European Solid-State Device Research Conference; vol. 2019-September).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

  • 1 Downloads (Pure)

    Impact of ultra-thin-layer material parameters on the suppression of carrier injection in rectifying junctions formed by interfacial charge layers

    Kneževic, T., Suligoj, T. & Nanver, L. K., 1 May 2019, 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2019 - Proceedings. Skala, K., Car, Z., Pale, P., Huljenic, D., Janjic, M., Koricic, M., Sruk, V., Ribaric, S., Grbac, T. G., Butkovic, Z., Cicin-Sain, M., Skvorc, D., Mauher, M., Babic, S., Gros, S., Vrdoljak, B. & Tijan, E. (eds.). IEEE, p. 24-29 6 p. 8757156. (International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO); vol. 2019).

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

  • 1 Downloads (Pure)

    In search of a hole inversion layer in Pd/MoOx/Si diodes through I- v characterization using dedicated ring-shaped test structures

    Gupta, G., Tharnmaiah, S. D., Hueting, R. J. E. & Nanver, L. K., 6 Jun 2019, 2019 IEEE 32nd International Conference on Microelectronic Test Structures, ICMTS 2019. IEEE, p. 12-17 6 p. 8730920

    Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

  • 1 Downloads (Pure)

    Limits on Thinning of Boron Layers With/Without Metal Contacting in PureB Si (Photo)Diodes

    Knezevic, T., Liu, X., Hardeveld, E., Suligoj, T. & Nanver, L. K., 1 Jun 2019, In : IEEE electron device letters. 40, 6, p. 858-861 4 p., 8686173.

    Research output: Contribution to journalArticleAcademicpeer-review

  • 4 Citations (Scopus)
    4 Downloads (Pure)

    Activities

    • 1 Oral presentation

    Test structures without metal contacts for DC measurement of 2D-materials deposited on silicon

    Lis Karen Nanver (Speaker), Xingyu Liu (Contributor), Tihomir Knežević (Contributor)
    20 Mar 2018

    Activity: Talk or presentationOral presentation