View Scopus Profile

Lis Karen Nanver

Visiting Scholar, Integrated Devices and Systems

Research output per year

If you made any changes in Pure these will be visible here soon.

Activities

1 Oral presentation

1 results

Filter

Test structures without metal contacts for DC measurement of 2D-materials deposited on silicon

Lis Karen Nanver (Speaker), Xingyu Liu (Contributor), Tihomir Knežević (Contributor)

20 Mar 2018

Activity: Talk or presentation › Oral presentation

Your message has successfully been sent.

Your message was not sent due to an error.