1980 …2019
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Research Output 1980 2019

2019
1 Downloads (Pure)

Back-end-of-line CMOS-compatible diode fabrication with pure boron deposition down to 50 °C

Knežević, T., Suligoj, T., Liu, X., Nanver, L. K., Elsayed, A., Dick, J. F. & Schulze, J., 1 Sep 2019, ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC). IEEE, p. 242-245 4 p. 8901810. (European Solid-State Device Research Conference; vol. 2019-September).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Boron
Diodes
Fabrication
Electron injection
Molecular beam epitaxy
1 Downloads (Pure)

Impact of ultra-thin-layer material parameters on the suppression of carrier injection in rectifying junctions formed by interfacial charge layers

Kneževic, T., Suligoj, T. & Nanver, L. K., 1 May 2019, 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2019 - Proceedings. Skala, K., Car, Z., Pale, P., Huljenic, D., Janjic, M., Koricic, M., Sruk, V., Ribaric, S., Grbac, T. G., Butkovic, Z., Cicin-Sain, M., Skvorc, D., Mauher, M., Babic, S., Gros, S., Vrdoljak, B. & Tijan, E. (eds.). IEEE, p. 24-29 6 p. 8757156. (International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO); vol. 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Boron
Electron injection
Diodes
Current density
Electron affinity
1 Downloads (Pure)

In search of a hole inversion layer in Pd/MoOx/Si diodes through I- v characterization using dedicated ring-shaped test structures

Gupta, G., Tharnmaiah, S. D., Hueting, R. J. E. & Nanver, L. K., 6 Jun 2019, 2019 IEEE 32nd International Conference on Microelectronic Test Structures, ICMTS 2019. IEEE, p. 12-17 6 p. 8730920

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Molybdenum oxide
Inversion layers
Palladium
Diodes
Silicon
3 Citations (Scopus)
3 Downloads (Pure)

Limits on Thinning of Boron Layers With/Without Metal Contacting in PureB Si (Photo)Diodes

Knezevic, T., Liu, X., Hardeveld, E., Suligoj, T. & Nanver, L. K., 1 Jun 2019, In : IEEE electron device letters. 40, 6, p. 858-861 4 p., 8686173.

Research output: Contribution to journalArticleAcademicpeer-review

Electron injection
Boron
Diodes
Metals
Monolayers
35 Downloads (Pure)

Minimization of dark counts in PureB SPADs for NUV/VUV/EUV light detection by employing a 2D TCAD-based simulation environment

Knežević, T., Nanver, L. K. & Suligoj, T., 26 Feb 2019, Physics and Simulation of Optoelectronic Devices XXVII. Osinski, M., Witzigmann, B. & Arakawa, Y. (eds.). SPIE, Vol. 10912. 109120Y. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 10912).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
Avalanche diodes
Single Photon Avalanche Diode
environment simulation
avalanche diodes
Simulation Environment
1 Downloads (Pure)

Nanometer-thin pure B layers Grown by MBE as metal diffusion barrier on GaN Diodes

Thammaiah, S. D., Hansen, J. L. & Nanver, L. K., 1 Mar 2019, China Semiconductor Technology International Conference 2019, CSTIC 2019. Claeys, C., Huang, R., Wu, H., Lin, Q., Liang, S., Song, P., Guo, Z., Lai, K., Zhang, Y., Qu, X., Lung, H-L. & Yu, W. (eds.). Piscataway, NJ: IEEE, 8755633

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Diffusion barriers
Molecular beam epitaxy
Diodes
molecular beam epitaxy
Metals

Reverse breakdown and light-emission patterns studied in Si PureB SPADs

Krakers, M., Kneževic, T. & Nanver, L. K., 1 May 2019, 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2019 - Proceedings. Skala, K., Car, Z., Pale, P., Huljenic, D., Janjic, M., Koricic, M., Sruk, V., Ribaric, S., Grbac, T. G., Butkovic, Z., Cicin-Sain, M., Skvorc, D., Mauher, M., Babic, S., Gros, S., Vrdoljak, B. & Tijan, E. (eds.). Piscataway, NJ: IEEE, p. 30-35 6 p. 8757007. (International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO); vol. 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Avalanche diodes
Boron
Light emission
Photons
Diodes
1 Downloads (Pure)

Silicon micromachining with nanometer-thin boron masking and membrane material

Liu, X., Italiano, J., Scott, R. & Nanver, L. K., 18 Oct 2019, In : Materials Research Express. 6, 11, 116438.

Research output: Contribution to journalArticleAcademicpeer-review

Boron
Micromachining
Silicon
Membranes
Chemical vapor deposition
2018
2 Citations (Scopus)
1 Downloads (Pure)

2D Dark-Count-Rate Modeling of PureB Single-Photon Avalanche Diodes in a TCAD Environment

Knežević, T., Nanver, L. K. & Suligoj, T., 23 Feb 2018, Physics and Simulation of Optoelectronic Devices XXVI: SPIE OPTO, 27 January - 1 February 2018, San Francisco, California, United States. Witzigmann, B., Osiński, M. & Arakawa, Y. (eds.). Bellingham, WA: SPIE, 10 p. 105261K. (Proceedings of SPIE; vol. 10526).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

avalanche diodes
photons
ionization
electric fields
rings
2 Citations (Scopus)
2 Downloads (Pure)

An experimental view on PureB silicon photodiode device physics

Nanver, L. K., 28 Jun 2018, 2018 41st International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2018 - Proceedings. IEEE, 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Photodiodes
Boron
Physics
Silicon
Diodes
3 Citations (Scopus)
48 Downloads (Pure)

Data Transmission Capabilities of Silicon Avalanche Mode Light-Emitting Diodes

Agarwal, V., Annema, A-J., Hueting, R. J. E., Dutta, S., Nanver, L. K. & Nauta, B., 1 Nov 2018, In : IEEE transactions on electron devices. 65, 11, p. 4883-4890 8 p., 8472882.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Silicon
Data communication systems
Light emitting diodes
Jitter
Leakage currents
1 Citation (Scopus)

Indirect optical crosstalk reduction by highly-doped backside layer in single-photon avalanche diode arrays

Osrečki, Ž., Knežević, T., Nanver, L. K. & Suligoj, T., 1 Mar 2018, In : Optical and quantum electronics. 50, 3, 152.

Research output: Contribution to journalArticleAcademicpeer-review

Avalanche diodes
avalanche diodes
Crosstalk
crosstalk
Photons
2 Downloads (Pure)

Investigation of light-emission and avalanche-current mechanisms in PureB SPAD devices

Nanver, L. K., Krakers, M., Knezevic, T., Karavidas, A., Boturchuk, I., Agarwal, V., Hueting, R. J. E., Dutta, S. & Annema, A. J., 8 Oct 2018, Fifth Conference on Sensors, MEMS and Electro-Optical Systems 2018. SPIE International, Vol. 11043.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

avalanche diodes
avalanches
light emission
defects
photons
4 Citations (Scopus)
6 Downloads (Pure)

Material Reliability of Low-Temperature Boron Deposition for PureB Silicon Photodiode Fabrication

Nanver, L. K., Lyon, K., Liu, X., Italiano, J. & Huffman, J., 26 Jun 2018, In : MRS Advances. 3, 57-58, p. 3397-3402 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

photodiodes
boron
fabrication
silicon
diodes

Non-linear behavior of Al-contacted pure amorphous boron (PureB) devices at low temperatures

Knezevic, T., Nanver, L. K., Capan, I. & Suligoj, T., 28 Jun 2018, 2018 41st International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2018 - Proceedings. IEEE, p. 12-17 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Boron
Temperature
Electric potential
Cryogenics
Processing
2 Citations (Scopus)
54 Downloads (Pure)

Random telegraph signal phenomena in ultra shallow p+n silicon avalanche diodes

Agarwal, V., Annema, A. J., Dutta, S., Hueting, R. J. E., Nanver, L. K. & Nauta, B., 10 May 2018, In : Journal of the Electron Devices Society. 6, 1, p. 642-652 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Avalanches
Avalanche diodes
Telegraph
Silicon
Defects
6 Citations (Scopus)
1 Downloads (Pure)

Test structures without metal contacts for DC measurement of 2D-materials deposited on silicon

Nanver, L. K., Liu, X. & Knežević, T., 2018, 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, p. 69-74 6 p. (IEEE International Conference on Microelectronic Test Structures (ICMTS)).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Turnaround time
Diodes
Silicon
Electrons
Substrates
2017
1 Citation (Scopus)

Indirect optical crosstalk reduction by highly-doped backside layer in PureB single-photon avalanche diode arrays

Osrečki, Ž., Knežević, T., Nanver, L. K. & Suligoj, T., 11 Aug 2017, 17th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2017: 24-28 July 2017, Copenhagen, Denmark. IEEE Computer Society, p. 69-70 2 p. 8009995

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Avalanche diodes
Single Photon Avalanche Diode
Crosstalk
Photons
Optical Constants
9 Citations (Scopus)
1 Downloads (Pure)

Nanometer-Thin Pure Boron Layers as Mask for Silicon Micromachining

Liu, X., Nanver, L. K. & Scholtes, T. L. M., Dec 2017, In : Journal of microelectromechanical systems. 26, 6, p. 1428-1434

Research output: Contribution to journalArticleAcademicpeer-review

Ammonium hydroxide
Micromachining
Boron
Masks
Etching
3 Citations (Scopus)

Perimeter effects from interfaces in ultra-thin layers deposited on nanometer-deep p+n silicon junctions

Knežević, T., Nanver, L. K. & Suligoj, T., 13 Jul 2017, 2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2017 - Proceedings. IEEE, p. 72-76 5 p. 7973393

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Semiconductor junctions
silicon junctions
p-n junctions
Semiconductor materials
Silicon
1 Downloads (Pure)

Thin-Film layers with Interfaces that reduce RF Losses on High-Resistivity Silicon Substrates

Evseev, S. B., Milosavljevic, S. & Nanver, L. K., 15 Nov 2017, 2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting, BCTM 2017. IEEE, Vol. 2017-October. p. 21-24 4 p. 8112903

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Thin films
Silicon
Substrates
Nitridation
Coplanar waveguides
2016
5 Citations (Scopus)
52 Downloads (Pure)

CMOS-compatible PureGaB Ge-on-Si APD pixel arrays

Sammak, A., Aminian, M., Nanver, L. K. & Charbon, E., 1 Jan 2016, In : IEEE transactions on electron devices. 63, 1, p. 92-99 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
1 Citation (Scopus)
1 Downloads (Pure)

Comparing current flows in ultrashallow pn-/Schottky-like diodes with 2-diode test method

Liu, X. & Nanver, L. K., 28 Mar 2016, Microelectronic Test Structures (ICMTS), 2016 International Conference on. New York: IEEE, p. 190-195 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)
103 Downloads (Pure)

Random telegraph signal phenomena in avalanche mode diodes: application to SPADs

Agarwal, V. V., Annema, A. J., Dutta, S., Hueting, R. J. E., Nanver, L. K. & Nauta, B., 14 Sep 2016, 2016 46th European Solid-State Device Research Conference (ESSDERC). USA: IEEE, p. 264-267 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
avalanche diodes
avalanches
diodes
photons
sustaining
4 Citations (Scopus)
30 Downloads (Pure)

Silicon drift detectors with the drift field induced by pureB-coated trenches

Nanver, L. K., Kneževi´c, T. & Suligoj, T., 29 Oct 2016, In : Photonics. 3, 54, p. 1-18 18 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
2015
4 Citations (Scopus)
1 Downloads (Pure)

Boron-doped silicon surfaces from B2H6 passivated by ALD Al2O3 for solar cells

Mok, K. R. C. C., van de Loo, B. W. H., Vlooswijk, A. H. G., Kessels, W. M. M. E. & Nanver, L. K., 1 Sep 2015, In : IEEE journal of photovoltaics. 5, 5, p. 1310-1318 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

19 Citations (Scopus)

Conductance along the interface formed by 400 �C pure boron deposition on silicon

Qi, L. & Nanver, L. K., 1 Feb 2015, In : IEEE electron device letters. 36, 2, p. 102-104 3 p., 6998818.

Research output: Contribution to journalArticleAcademicpeer-review

Negative temperature coefficient
Inversion layers
Boron
Carrier transport
Sheet resistance
21 Citations (Scopus)

Opto-electronic modeling of light emission from avalanche-mode silicon p+n junctions

Dutta, S., Hueting, R. J. E., Annema, A. J., Qi, L., Nanver, L. K. & Schmitz, J., 18 Sep 2015, In : Journal of applied physics. 118, p. 1-10 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)

PureB single-photon avalanche diodes for low-energy electron detection down to 200 eV

Qi, L., Sluyterman, S., Kooijman-van Dijk, A. L., Mok, K. R. C. & Nanver, L. K., 1 Feb 2015, In : Optics letters. 40, 3, p. 300-303 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

avalanche diodes
entrances
boron
electron energy
sensitivity
52 Downloads (Pure)

Restricted-access al-mediated material transport in al contacting of pureGaB Ge-on-Si p+n diodes

Sammak, A., Qi, L. & Nanver, L. K., Dec 2015, In : Journal of electronic materials. 44, 12, p. 4676-4683 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

File
4 Citations (Scopus)

Self-aligned two-layer metallization with low series resistance for litho-less contacting of large-area photodiodes

Mok, K. R. C., Qi, L., Vlooswijk, A. H. G. & Nanver, L. K., 11 Jun 2015, In : Solid-state electronics. 111, p. 210-217 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Scopus)

Sheet resistance measurement for process monitoring of 400 °c PureB deposition on Si

Qi, L. & Nanver, L. K., 12 May 2015, 2015 International Conference on Microelectronic Test Structures (ICMTS). IEEE, p. 169-174 6 p. 7106135

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Sheet resistance
Process monitoring
Boron
Diodes
Silicon
5 Citations (Scopus)

Silicon-based technology for integrated waveguides and mm-Wave systems

Jovanovic, V., Gentile, G., Dekker, R., de Graaf, P., de Vreede, L. C. N., Nanver, L. K. & Spirito, M., 1 Oct 2015, In : IEEE transactions on electron devices. 62, 10, p. 3153-3159 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

2014
2 Citations (Scopus)
4 Downloads (Pure)

A 270×1 Ge-on-Si photodetector array for sensitive infrared imaging

Sammak, A., Aminian, M., Qi, L., Charbon, E. & Nanver, L. K., 1 Jan 2014, Optical Sensing and Detection III. SPIE, 914104. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 9141).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
Infrared Imaging
Photodetector
Infrared imaging
Photodetectors
photometers
3 Citations (Scopus)

Amorphous silicon carbide nitride layer as an alternative to a disordered silicon surface to suppress RF/microwave losses

Evseev, S. B., Nanver, L. K., Rejaei, B. & Milosavljević, S., 1 Aug 2014, In : Microelectronic engineering. 125, p. 2-7 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

Microwave frequencies
Silicon
Amorphous silicon
Silicon carbide
Nitrides
3 Citations (Scopus)

Fabrication of low dark-count PureB single-photon avalanche diodes

Qi, L., Mok, K. R. C., Aminian, M., Charbon, E. & Nanver, L. K., 29 Oct 2014, 2014 29th Symposium on Microelectronics Technology and Devices: Chip in Aracaju, SBMicro 2014. IEEE, 6940113

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Avalanche diodes
Electric breakdown
Ultraviolet radiation
Boron
Chemical vapor deposition

Fabrication of PureB-only light-entrance windows for VUV sensitive single-photon avalanche diodes

Qi, L. & Nanver, L. K., 23 Jan 2014, Proceedings - 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014. Zhou, J. & Tang, T-A. (eds.). IEEE, 7021330

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Avalanche diodes
Boron
Photons
Vacuum
Fabrication
2 Citations (Scopus)

Fabrication of PureGaB Ge-on-Si photodiodes for well-controlled 100-pA-level dark currents

Sammak, A., Aminian, M., Qi, L., De Boer, W. B., Charbon, E. & Nanver, L. K., 1 Jan 2014, In : ECS transactions. 64, 6, p. 737-745 9 p.

Research output: Contribution to journalConference articleAcademicpeer-review

Dark currents
Photodiodes
Fabrication
Diodes
Current density
32 Citations (Scopus)

Robust UV/VUV/EUV PureB photodiode detector technology with high CMOS Compatibility

Nanver, L. K., Qi, L., Mohammadi, V., Mok, K. R. M., De Boer, W. B., Golshani, N., Sammak, A., Scholtes, T. L. M., Gottwald, A., Kroth, U. & Scholze, F., 1 Jan 2014, In : IEEE Journal on Selected Topics in Quantum Electronics. 20, 6, 6805604.

Research output: Contribution to journalArticleAcademicpeer-review

Photodiodes
compatibility
photodiodes
CMOS
Diodes
14 Citations (Scopus)

Temperature dependency of the kinetics of PureB CVD deposition over patterned Si/SiO2 surfaces

Mohammadi, V., Golshani, N., Mok, K. R. C., De Boer, W. B., Derakhshandeh, J. & Nanver, L. K., 1 Aug 2014, In : Microelectronic engineering. 125, p. 45-50 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

Oxides
Chemical vapor deposition
vapor deposition
Kinetics
Boron
13 Citations (Scopus)

Thickness evaluation of deposited pureb layers in micro-/millimeter-sized windows to Si

Mohammadi, V., Ramesh, S. & Nanver, L. K., 1 Jan 2014, 2014 IEEE International Conference on Microelectronic Test Structures, ICMTS 2014 - Conference Proceedings. IEEE, p. 194-199 6 p. 6841492

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Boron
Diodes
Monitoring
Metals

Towards CMOS-compatible photon-counting imagers in the whole 10 nm - 1600 nm spectral range with PureB Si and PureGaB Ge-on-Si technology

Nanver, L. K., Qi, L., Sammak, A., Mok, K. R. C., Aminian, M. & Charbon, E., 26 Jan 2014, Proceedings - 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014. Zhou, J. & Tang, T-A. (eds.). IEEE, 7021268

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Photodiodes
Image sensors
Photons
Avalanche diodes
Infrared radiation
18 Citations (Scopus)

UV-sensitive low dark-count pureb single-photon avalanche diode

Qi, L., Mok, K. R. C., Aminian, M., Charbon, E. & Nanver, L. K., 1 Nov 2014, In : IEEE transactions on electron devices. 61, 11, p. 3768-3774 7 p., 6894558.

Research output: Contribution to journalArticleAcademicpeer-review

Avalanche diodes
Photons
Wavelength
Boron
Chemical vapor deposition
2013
1 Citation (Scopus)

AlN thin-film deposition for suppressing surface current losses in RF circuits on high-resistivity silicon

Evseev, S. B., Nanver, L. K. & Milosavljević, S., 1 Jan 2013, 2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting, BCTM 2013. IEEE, 6798148

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Aluminum nitride
Thin films
Silicon
Networks (circuits)
Passivation
1 Citation (Scopus)

Aluminum-induced iso-epitaxy of silicon for low-temperature fabrication of centimeter-large p+n junctions

Sakic, A., Qi, L., Scholtes, T. L. M., Van Der Cingel, J. & Nanver, L. K., 1 Jun 2013, In : Solid-state electronics. 84, p. 65-73 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

Silicon
Aluminum
p-n junctions
Epitaxial growth
epitaxy
3 Citations (Scopus)

A simple model describing the kinetic of CVD deposition of pure-boron layers from diborane

Mohammadi, V., De Boer, W. B., Scholtes, T. L. M. & Nanver, L. K., 1 Jan 2013, Thermal and Plasma CVD of Nanostructures and Their Applications. 31 ed. The Electrochemical Society Inc., p. 57-65 9 p. (ECS Transactions; vol. 45, no. 31).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Boron
Kinetics
Surface reactions
Deposition rates
Silicon wafers
2 Citations (Scopus)

Chemical vapor deposition of PureB layers for solar cell application

Mok, K. R. C., Vlooswijk, A. H. G., Derakhshandeh, J. & Nanver, L. K., 1 Jan 2013, 39th IEEE Photovoltaic Specialists Conference, PVSC 2013. IEEE, p. 2234-2238 5 p. 6744921

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Boron
Chemical vapor deposition
Solar cells
Sheet resistance
Doping (additives)
8 Citations (Scopus)

Effects of annealing on chemical-vapor deposited PureB layers

Mok, K. R. C., Vlooswijk, A. H. G., Mohammadi, V. & Nanver, L. K., 15 Nov 2013, In : ECS journal of solid state science and technology. 2, 9

Research output: Contribution to journalArticleAcademicpeer-review

Boron
Vapors
Annealing
Oxides
Oxygen
8 Citations (Scopus)

High-ohmic resistors using nanometer-thin pure-boron chemical-vapour- deposited layers

Golshani, N., Mohammadi, V., Ramesh, S. & Nanver, L. K., 1 Jan 2013, ESSDERC 2013 - Proceedings of the 43rd European Solid-State Device Research Conference. IEEE Computer Society, p. 210-213 4 p. 6818856

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Resistors
Boron
Vapors
Sheet resistance
Silicon

Reverse biasing and breakdown behavior of PureB diodes

Qi, L., Mok, K. R. C., Aminian, M., Scholtes, T. L. M., Charbon, E. & Nanver, L. K., 1 Jan 2013, 2013 13th International Workshop on Junction Technology (IWJT). p. 70-73 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Diodes
Avalanche photodiodes
Photosensitivity
Anodes
Imaging techniques