1980 …2019

Research output per year

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Research Output

1980

Precipitation of β‐tin in Sn implanted silicon

Nanver, L. K., Weyer, G. & Deutch, B. I., 16 Sep 1980, In : physica status solidi (a). 61, 1, p. K29-K34

Research output: Contribution to journalArticleAcademicpeer-review

15 Citations (Scopus)

Radiation defects in ion-implanted silicon: II. Mössbauer spectroscopy of Sn119 defect structures from implantations of radioactive tellurium

Larsen, A. N., Weyer, G. & Nanver, L., 1 Jun 1980, In : Physical Review B. 21, 11, p. 4951-4966 16 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
25 Citations (Scopus)
3 Downloads (Pure)
1982

Experimental study of the amorphous phases of group-IV semiconductors by the119mSn Mössbauer probe

Nanver, L. K., Weyer, G. & Deutch, B. I., Jun 1982, In : Zeitschrift für Physik B Condensed Matter. 47, 2, p. 103-113 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
17 Citations (Scopus)
6 Downloads (Pure)
1986

Characteristics of Separated-Gate JFETs

Nanver, L. K. & Goudena, E. J. G., 1 Jan 1986, In : Electronics letters. 22, 23, p. 1244-1246 3 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
3 Citations (Scopus)
4 Downloads (Pure)
1988

Design Considerations for Integrated High-Frequency p-Channel JFET's

Nanver, L. K. & Goudena, E. J. G., Nov 1988, In : IEEE transactions on electron devices. 35, 11, p. 1924-1934 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
6 Citations (Scopus)
3 Downloads (Pure)
1989

FM radio receiver front-end circuitry with on-chip SAW filters

van Zeijl, P. T. M., Visser, J. H. & Nanver, L. K., Aug 1989, In : IEEE Transactions on Consumer Electronics. 35, 3, p. 512-519 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
9 Citations (Scopus)
18 Downloads (Pure)

I-V characteristics of integrated n+pn- reachthrough diodes

Nanver, L. K. & Goudena, E. J. G., 1 Jan 1989, In : Solid State Electronics. 32, 8, p. 637-645 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
3 Citations (Scopus)
3 Downloads (Pure)
1992

Characterization of Tungsten Deposited by Geh4 Reduction of Wf6, and its Application as Contact Material to Si

van der Jeugd, C. A., Leusink, G. J., Oosterlaken, T. G. M., Alkemade, P. F. A., Nanver, L. K., Goudena, E. J. G., Janssen, G. C. A. M. & Radelaar, S., 1 Jan 1992, In : Journal of the Electrochemical Society. 139, 12, p. 3615-3623 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
6 Citations (Scopus)
3 Downloads (Pure)

High-speed, high-quality WEB NPN transistors with phosphorus emitters

Nanver, L. K., Goudena, E. J. G. & Van Zeijl, H. W., 1 Jan 1992, European Solid-State Device Research Conference. Maes, H. E., Van Overstraeten, R. J. & Mertens, R. P. (eds.). IEEE Computer Society Press, p. 539-542 4 p. 5435155

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

High-speed, high-quality WEB NPN transistors with phosphorus emitters

Nanver, L. K., Goudena, E. J. G. & van Zeijl, H. W., Sep 1992, In : Microelectronic engineering. 19, 1-4, p. 539-542 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
1 Citation (Scopus)
4 Downloads (Pure)
1993

DIMES-01, a baseline BIFET process for smart sensor experimentation

Nanver, L. K., Goudena, E. J. G. & van Zeijl, H. W., 1 Jan 1993, In : Sensors and Actuators: A. Physical. 36, 2, p. 139-147 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
29 Citations (Scopus)
7 Downloads (Pure)

Optimisation of base-link in fully-implanted NPNs

Nanver, L. K., Goudena, E. J. G. & van Zeijl, H. W., 5 Aug 1993, In : Electronics letters. 29, 16, p. 1451-1452 2 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
3 Citations (Scopus)
2 Downloads (Pure)
1995

Low-stress nitride as oxidation mask for submicrometre LOCOS isolation

Van Zeijl, H. W., Nanver, L. K. & French, P. J., 25 May 1995, In : Electronics letters. 31, 11, p. 927-929 3 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
4 Citations (Scopus)
4 Downloads (Pure)

Low stress nitride as surface isolation in bipolar transistors

Nanver, L. K., French, P. J., Goudena, E. J. G. & van Zeijl, H. W., 1 Jan 1995, In : Materials Science and Technology (United Kingdom). 11, 1, p. 36-40 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

8 Citations (Scopus)
1996

Bipolar integrated Kelvin test structure for contact resistance measurement of self-aligned implantations

Nanver, L. K., Goudena, E. J. G. & Slabbekoorn, J., Aug 1996, In : IEEE Transactions on Semiconductor Manufacturing. 9, 3, p. 455-460 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
4 Citations (Scopus)
6 Downloads (Pure)

High-frequency SiGe HBT's with implanted emitters

Nanver, L. K., Goudena, E. J. G., Visser, C., Van Zeijl, H. W. & Slotboom, J. W., 1 Jan 1996, ESSDERC 1996 - Proceedings of the 26th European Solid State Device Research Conference. Rudan, M. & Baccarani, G. (eds.). IEEE Computer Society Press, p. 469-472 4 p. 5436189

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
1 Citation (Scopus)
3 Downloads (Pure)

Kelvin test structure for measuring contact resistance of shallow junctions

Nanver, L. K., Goudena, E. J. G. & Slabbekoorn, J., 1 Jan 1996, Proceedings of International Conference on Microelectronic Test Structures. IEEE, p. 241-245 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

9 Citations (Scopus)

Optimization of fully-implanted NPN's for high-frequency operation

Nanver, L. K., Goudena, E. J. G. & Van Zeijl, H. W., 1 Dec 1996, In : IEEE transactions on electron devices. 43, 6, p. 1038-1040 3 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
21 Citations (Scopus)
3 Downloads (Pure)

Time scales of transient enhanced diffusion: Free and clustered interstitials

Cowern, N. E. B., Huizing, H. G. A., Stolk, P. A., Visser, C. C. G., de Kruif, R. C. M., Kyllesbech Larsen, K., Privitera, V., Nanver, L. K. & Crans, W., Dec 1996, In : Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 120, 1-4, p. 14-18 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
15 Citations (Scopus)
23 Downloads (Pure)
1997

Development of a 128 channel silicon drift detector for spectroscopic purposes

Valk, H., Huizenga, J., Van Eijk, C. W. E., Hollander, R. W., Nanver, L. K., Sarro, P. M. & Van Den Boogaard, A., 21 Jun 1997, In : Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 392, 1-3, p. 169-172 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
1 Citation (Scopus)
3 Downloads (Pure)

Inverse SiGe heterojunction bipolar transistor

Van Den Oever, L. C. M., Nanver, L. K., Visser, C. C. G., Scholtes, T. L. M., Hueting, R. J. E. & Slotboom, J., 1 Jan 1997, European Solid-State Device Research Conference. Grunbacher, H. (ed.). IEEE Computer Society Press, p. 540-543 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Self-aligned metallization of high-frequency BJT with low-stress silicon-nitride spacers

Van Zeijl, H. W. & Nanver, L. K., 1 Jan 1997, 27th European Solid-State Device Research Conference 1997. Grunbacher, H. (ed.). IEEE Computer Society Press, p. 248-251 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Silicon nitride as dielectric in the low temperature SiGe HBT processing

Ren, Q. W., Nanver, L. K., de Boer, C. R. & Van Zeijl, H. W., Jun 1997, In : Microelectronic engineering. 36, 1-4, p. 179-182 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
6 Downloads (Pure)
1998

Characterisation of low-stress LPCVD silicon nitride in high frequency BJT's with self-aligned metallization

van Zeijl, H. W. & Nanver, L. K., 1 Dec 1998, 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings. p. 98-101 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

Controlling transient enhanced diffusion effects in high-frequency Si0.7Ge0.3, heterojunction bipolar transistors with implanted emitters

Nanver, L. K., Visser, C. C. G. & van den Bogaard, A., 9 Jun 1998, In : Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 16, 3, p. 1533-1537 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
3 Citations (Scopus)
3 Downloads (Pure)

Critical thickness of Si0.7Ge0.3 layers in the fabrication of hf SiGe HBT's

Shi, J. L., Nanver, L. K., Grimm, K. & Visser, C. C. G., 1 Dec 1998, 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings. p. 788-791 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Epitaxially grown n+ phosphorus collector peaks in high-frequency HBT's with implanted emitters

Visser, C. C. G., Nanver, L. K. & van den Bogaard, A., 1998, In : Materials Research Society Symposium - Proceedings. 533, p. 105-110 6 p.

Research output: Contribution to journalConference articleAcademicpeer-review

3 Citations (Scopus)

Low-ohmic contacts by excimer laser annealing of implanted polysilicon

Ren, Q. W., van den Berg, M. R., Nanver, L. K., Slabbekoorn, J. & Visser, C. C. G., 1 Dec 1998, 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings. p. 102-105 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Optimisation of the base-collector doping profile for high-frequency distortion

Van Noort, W., De Vreede, L. C. N., Nanver, L. K., De Graaff, H. C. & Slotboom, J. W., 1 Jan 1998, ESSDERC 1998 - Proceedings of the 28th European Solid-State Device Research Conference. Touboul, A., Danto, Y. & Grunbacher, H. (eds.). IEEE Computer Society Press, p. 496-499 4 p. 1503597

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Radiation-induced degradation of bipolar transistors

Topkar, A., Mathew, T., Lal, R., Vasi, J. & Nanver, L., 1 Dec 1998, In : Proceedings of SPIE - the international society for optical engineering. 3316, 1, p. 686-689 4 p.

Research output: Contribution to journalConference articleAcademicpeer-review

1999

Ultra-low-temperature low-ohmic contacts for SOA applications

Nanver, L. K., van Zeijl, H. W., Schellevis, H., Mallee, R. J. M., Slabbekoorn, J., Dekker, R. & Slotboom, J. W., 1 Dec 1999, Proceedings of the 1999 Bipolar/BiCMOS Circuits and Technology Meeting. p. 137-140 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

14 Citations (Scopus)
2000

Analysis of the emitter charge storage in sige heterojunction bipolar transistors with a lightly doped emitter

Van Den Oever, L. C. M., Nanver, L. K. & Slotboom, J. W., 1 Jan 2000, 30th European Solid-State Device Research Conference. Grunbacher, H., Crean, G. M., Lane, W. A. & McCabe, F. A. (eds.). IEEE Computer Society Press, p. 568-571 4 p. 1503771

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Annealing experiments on supercritical Si1-x Gex layers grown by RPCVD

Grimm, K., Vescan, L., Visser, C. C. G., Nanver, L. K. & Lüth, H., 19 Jan 2000, In : Materials Science and Engineering B: Solid-State Materials for Advanced Technology. 69-70, p. 261-265 5 p.

Research output: Contribution to journalConference articleAcademicpeer-review

3 Citations (Scopus)

Backwafer optical lithography and wafer distortion in substrate transfer technologies

van Zeijl, H. W., Slabbekoorn, J., Nanver, L. K., van Dijk, P. W. L., Berthold, A. & Machielsen, T., 18 Aug 2000, In : Proceedings of SPIE - the international society for optical engineering. 4181, 1, p. 200-207 8 p.

Research output: Contribution to journalConference articleAcademicpeer-review

Open Access
File
8 Citations (Scopus)
7 Downloads (Pure)

Control of arsenic doping during low temperature CVD epitaxy of silicon (100)

van Noort, W. D., Nanver, L. K. & Slotboom, J. W., 1 Nov 2000, In : Journal of the Electrochemical Society. 147, 11, p. 4301-4304 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

17 Citations (Scopus)

Defect related photoluminescence of SiGe/Si heterostructures grown by APCVD

Shi, J. L., Nanver, L. K., Grimm, K. & Visser, C. C. G., 27 Mar 2000, In : Thin solid films. 364, 1, p. 254-258 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Scopus)

Integrated transmission lines on high-resistivity silicon: Coplanar waveguides or microstrips?

Rejaei, B., Ng, K. T., Floerkemeier, C., Pham, N. P., Nanver, L. & Burghartz, J. N., 1 Jan 2000, ESSDERC 2000 - Proceedings of the 30th European Solid-State Device Research Conference. Grunbacher, H., Crean, G. M., Lane, W. A. & McCabe, F. A. (eds.). IEEE Computer Society Press, p. 460-463 4 p. 1503744

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Ionizing-radiation induced degradation of SiGe HBTs

Topkar, A., Lodha, S., Mahfooz, A. T., Vasi, J., LaL, R. & Nanver, L., 1 Jan 2000, In : Proceedings of SPIE - the international society for optical engineering. 3975

Research output: Contribution to journalConference articleAcademicpeer-review

Low noise p-channel JFETs for X-ray spectroscopy with silicon drift detectors

Šonský, J., Koornneef, R. N., Nanver, L. K., Lubking, G. W., Huizenga, J., Hollander, R. W. & Van Eijk, C. W. E., 1 Dec 2000, 2000 IEEE Nuclear Science Symposium.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

On the reliability of SiGe microwave power heterojunction bipolar transistor

Zhang, J., Tsien, P. H., Chen, P., Nanver, L. K. & Slotboom, J. W., 1 Dec 2000, Proceedings 2000 IEEE Hong Kong Electron Devices Meeting. p. 90-93 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Si1-xGex island formation by post-growth anneal on supercritical layers grown by RPCVD

Grimm, K., Vescan, L., Nanver, L. K., Visser, C. C. G. & Lüth, H., 2000, In : Materials Research Society Symposium - Proceedings. 618, p. 129-134 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

Temperature dependence of avalanche multiplication in spiked electric fields

Van den Berg, M. R., Nanver, L. K. & Slotboom, J. W., 1 Dec 2000, International Electron Devices Meeting 2000. Technical Digest. p. 79-81 3 p. (Technical Digest - International Electron Devices Meeting).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Transport mechanisms of a polysilicon emitter bipolar transistor with 8 nm gate oxide between emitter and base

Van Den Berg, M. R., Nanver, L. K., De Boer, C. R., Visser, C. C. G. & Slotboom, J. W., 1 Jan 2000, ESSDERC 2000 - Proceedings of the 30th European Solid-State Device Research Conference. Grunbacher, H., Crean, G. M., Lane, W. A. & McCabe, F. A. (eds.). IEEE Computer Society Press, p. 612-615 4 p. 1503782

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)
2001

Al/Si contacting of ultra-shallow epitaxially grown Si and SiGe junctions

Ren, Q. W., Nanver, L. K., Visser, C. C. G. & Slotboom, J. W., 1 Apr 2001, In : Journal of Materials Science: Materials in Electronics. 12, 4-6, p. 313-316 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)

A low-cost BiCMOS process with metal gates

Van Zeijl, H. W. & Nanver, L. K., 1 Jan 2001, In : Materials Research Society Symposium - Proceedings. 611

Research output: Contribution to journalConference articleAcademicpeer-review

Arsenic-spike epilayer technology applied to bipolar transistors

Van Noort, W. D., Nanver, L. K. & Slotboom, J. W., 1 Nov 2001, In : IEEE transactions on electron devices. 48, 11, p. 2500-2505 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Scopus)

Electrical detection and simulation of stress in silicon nitride spacer technology

Van Zeijl, H. W., Mijalcovic, S. & Nanver, L. K., 1 Apr 2001, In : Journal of Materials Science: Materials in Electronics. 12, 4-6, p. 339-341 3 p.

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Scopus)

Epitaxy and device behaviour of collector-up SiGe HBTs with a partial p-type collector

van den Oever, L. C. M., Nanver, L. K., Scholtes, T. L. M., Van Zeijl, H. W., Van Noort, W. D., Ren, Q. W. & Slotboom, J. W., Nov 2001, In : Solid-state electronics. 45, 11, p. 1899-1904 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

Reduction of UHF power transistor distortion with a nonuniform collector doping profile

Van Noort, W. D., De Vreede, L. C. N., Jos, H. F. F., Nanver, L. K. & Slotboom, J. W., Sep 2001, In : IEEE journal of solid-state circuits. 36, 9, p. 1399-1406 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

14 Citations (Scopus)

Single-crystal thin film transistor by grain-filter location-controlled excimer-laser crystallization

Van Dijk, B. D., Van Der Wilt, P. C., Bertens, G. J., Nanver, L. K. & Ishihara, R., 1 Dec 2001, In : Materials Research Society symposia proceedings. 685, p. 299-304 6 p.

Research output: Contribution to journalConference articleAcademicpeer-review