1980 …2019

Research output per year

If you made any changes in Pure these will be visible here soon.

Research Output

2010

Influence of layout design and on-wafer heatspreaders on the thermal behavior of fully-isolated bipolar transistors: Part II - Dynamic analysis

Russo, S., La Spina, L., D'Alessandro, V., Rinaldi, N. & Nanver, L. K., Aug 2010, In : Solid-state electronics. 54, 8, p. 754-762 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Scopus)

Low distortion tunable rf components, a compound semiconductor opportunity

Huang, C., Buisman, K., Zampardi, P. J., Nanver, L. K., Larson, L. E. & De Vreede, L. C. N., 1 Dec 2010, 2010 International Conference on Compound Semiconductor Manufacturing Technology, CS MANTECH 2010.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
2 Citations (Scopus)
21 Downloads (Pure)

Merging standard CVD techniques for GaAs and Si epitaxial growth

Sammak, A., De Boer, W., Van Den Bogaard, A. & Nanver, L. K., 29 Dec 2010, Graphene, Ge/III-V, and Emerging Materials for Post-CMOS Applications 2. 5 ed. p. 237-244 8 p. (ECS Transactions; vol. 28, no. 5).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

8 Citations (Scopus)

MOSFETs on self-assembled SiGe dots with strain-enhanced mobility

Jovanović, V., Biasotto, C., Nanver, L. K., Moers, J., Grützmacher, D., Gerharz, J., Mussler, G., Van Der Cingel, J., Zhang, J., Bauer, G., Schmidt, O. G. & Miglio, L., 1 Dec 2010, ICSICT-2010 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, Proceedings. p. 926-928 3 p. 5667482

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

N-channel MOSFETs fabricated on SiGe dots for strain-enhanced mobility

Jovanovic, V., Biasotto, C., Nanver, L. K., Moers, J., Grutzmacher, D., Gerharz, J., Mussler, G., Van Der Cingel, J., Zhang, J. J., Bauer, G., Schmidt, O. G. & Miglio, L., Oct 2010, In : IEEE electron device letters. 31, 10, p. 1083-1085 3 p., 5557748.

Research output: Contribution to journalArticleAcademicpeer-review

38 Citations (Scopus)

Optical performance of B-layer ultra-shallow-junction silicon photodiodes in the VUV spectral range

Shi, L., Sarubbi, F., Nanver, L. K., Kroth, U., Gottwald, A. & Nihtianov, S., 1 Jan 2010, In : Procedia engineering. 5, p. 633-636 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
24 Citations (Scopus)
4 Downloads (Pure)

Optical stability investigation of high-performance silicon-based VUV photodiodes

Shi, L., Nanver, L. K., Šakić, A., Nihtianov, S., Gottwald, A. & Kroth, U., 1 Dec 2010, IEEE Sensors 2010 Conference, SENSORS 2010. p. 132-135 4 p. 5690669

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

9 Citations (Scopus)

Pure-boron chemical-vapor-deposited layers: A new material for silicon device processing

Nanver, L. K., Scholtes, T. L. M., Sarubbi, F., De Boer, W. B., Lorito, G., Šakić, A., Milosavljević, S., Mok, C., Shi, L., Nihtianov, S. & Buisman, K., 29 Dec 2010, 2010 18th International Conference on Advanced Thermal Processing of Semiconductors (RTP). p. 136-139 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

12 Citations (Scopus)

Silicon photodiodes for high-efficiency low-energy electron detection

Šakić, A., Nanver, L. K., Scholtes, T. L. M., Heerkens, C. T. H., Van Veen, G., Kooijman, K. & Vogelsang, P., 15 Dec 2010, 2010 Proceedings of the European Solid State Device Research Conference, ESSDERC 2010. p. 102-105 4 p. 5617724

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

8 Citations (Scopus)

Thermal budget considerations for excimer laser annealing of implanted dopants

Gonda, V., Venturini, J., Sabatier, C., Van Der Cingel, J. & Nanver, L. K., 1 Mar 2010, In : Journal of optoelectronics and advanced materials. 12, 3, p. 466-469 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
2 Citations (Scopus)
10 Downloads (Pure)

Thermal design of multifinger bipolar transistors

La Spina, L., D'Alessandro, V., Russo, S. & Nanver, L. K., 1 Aug 2010, In : IEEE transactions on electron devices. 57, 8, p. 1789-1800 12 p., 5487380.

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Scopus)

The state-of-the-art of RF capacitive tunable components (invited)

Huang, C., Buisman, K., Nanver, L. K. & De Vreede, L. C. N., 1 Dec 2010, ICSICT-2010 - 2010 10th IEEE International Conference on Solid-State and Integrated Circuit Technology, Proceedings. p. 619-622 4 p. 5667304

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Ultra-high aspect-ratio FinFET technology

Jovanović, V., Suligoj, T., Poljak, M., Civale, Y. & Nanver, L. K., 1 Sep 2010, In : Solid-state electronics. 54, 9, p. 870-876 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

22 Citations (Scopus)

Versatile silicon photodiode detector technology for scanning electron microscopy with high-efficiency sub-5 keV electron detection

Šakić, A., Nanver, L. K., van Veen, G., Kooijman, K., Vogelsang, P., Scholtes, T. L. M., de Boer, W., Wien, W. H. A., Milosavljević, S., Heerkens, C. T. H., Knežević, T. & Spee, I., 1 Dec 2010, 2010 IEEE International Electron Devices Meeting, IEDM 2010. IEEE, 5703458. (International Electron Devices Meeting; vol. 2010).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

13 Citations (Scopus)
2009

1.9 nm wide ultra-high aspect-ratio bulk-si FinFETs

Jovanović, V., Poljak, M., Suligoj, T., Civale, Y. & Nanver, L. K., 11 Dec 2009, 67th Device Research Conference, DRC 2009. p. 261-262 2 p. 5354923. (Device Research Conference - Conference Digest, DRC).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Analysis of the bipolar current mirror including electrothermal and avalanche effects

Rinaldi, N., d'Alessandro, V. & Nanver, L. K., 20 May 2009, In : IEEE transactions on electron devices. 56, 6, p. 1309-1321 13 p.

Research output: Contribution to journalArticleAcademicpeer-review

11 Citations (Scopus)

Application of laser annealing in the EU FP6 project D-DotFET

Nanver, L. K., Jovanović, V., Biasotto, C., Van Der Cingel, J. & Milosavljević, S., 1 Dec 2009, 17th IEEE Conference on Advanced Thermal Processing of Semiconductors, RTP 2009. 5373443

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Bulk-Si FinFET technology for ultra-high aspect-ratio devices

Jovanovic, V., Nanver, L. K., Suligoj, T. & Poljak, M., 1 Dec 2009, ESSDERC 2009 - Proceedings of the 39th European Solid-State Device Research Conference. p. 241-244 4 p. 5331554

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

Controlled growth of non-uniform arsenic profiles in silicon reduced-pressure chemical vapor deposition epitaxial layers

Popadić, M., Scholtes, T. L. M., De Boer, W., Sarubbi, F. & Nanver, L. K., Nov 2009, In : Journal of electronic materials. 38, 11, p. 2323-2328 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
4 Citations (Scopus)
3 Downloads (Pure)

C-V profiling of ultrashallow junctions using a step-like background doping profile

Popadić, M., Xu, C., Sarubbi, F. & Nanver, L. K., 1 Dec 2009, ESSDERC 2009 - Proceedings of the 39th European Solid-State Device Research Conference. p. 303-306 4 p. 5331556

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Electrothermal behavior of highly-symmetric three-finger bipolar transistors

La Spina, L., d'Alessandro, V., Russo, S., Rinaldi, N. & Nanver, L. K., 28 Dec 2009, 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting, BCTM 2009. IEEE, p. 21-24 4 p. 5314145. (Bipolar - BICMOS Circuits and Technology Meeting. Proceedings ).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

Evaluating the self-heating thermal resistance of bipolar transistors by DC measurements: A critical review and update

Russo, S., d'Alessandro, V., La Spina, L., Rinaldi, N. & Nanver, L. K., 1 Jan 2009, 2009 IEEE Bipolar/BiCMOS Circuits and Technology Meeting, BCTM 2009. IEEE, p. 95-98 4 p. 5314135

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

12 Citations (Scopus)

Extremely ultra-shallow p+-n boron-deposited silicon diodes applied to DUV photodiodes

Sarubbi, F., Nanver, L. K., Scholtes, T. L. M. & Nihtianov, S. N., 16 Mar 2009, 66th DRC Device Research Conference Digest, DRC 2008. p. 143-144 2 p. 4800775

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

13 Citations (Scopus)

High performance silicon-based extreme ultraviolet (EUV) radiation detector for industrial application

Shi, L., Sarubbi, F., Nihtianov, S. N., Nanver, L. K., Scholtes, T. L. M. & Scholze, F., 1 Dec 2009, 2009 35th Annual Conference of IEEE Industrial Electronics. p. 1877-1882 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

20 Citations (Scopus)

Improved RF devices for future adaptive wireless systems using two-sided contacting and AlN cooling

Nanver, L. K., Schellevis, H., Scholtes, T. L. M., La Spina, L., Lorito, G., Sarubbi, F., Gonda, V., Popadić, M., Buisman, K., De Vreede, L. C. N., Huang, C., Milosavljević, S. & Goudena, E. J. G., 26 Aug 2009, In : IEEE journal of solid-state circuits. 44, 9, p. 2322-2338 17 p., 5226772.

Research output: Contribution to journalArticleAcademicpeer-review

12 Citations (Scopus)

Influence of concurrent electrothermal and avalanche effects on the safe operating area of multifinger bipolar transistors

La Spina, L., d'Alessandro, V., Russo, S., Rinaldi, N. & Nanver, L. K., 1 Jan 2009, In : IEEE transactions on electron devices. 56, 3, p. 483-491 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

21 Citations (Scopus)

Integration of laser-annealed junctions in a low-temperature high-k metal-gate MISFET

Biasotto, C., Jovanović, V., Gonda, V., Van Der Cingel, J., Milosavljević, S. & Nanver, L. K., 23 Jul 2009, Proceedings of the 10th International Conference on ULtimate Integration of Silicon, ULIS 2009. p. 181-184 4 p. 4897566

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

5 Citations (Scopus)

Laser annealing of self-aligned As+ implants in contact windows for ultrashallow junction formation

Biasotto, C., Gonda, V., Nanver, L. K., Van Der Cingel, J. & Jovanović., V., 1 Dec 2009, ECS Transactions - Microelectronics Technology and Devices - SBMicro 2009. 1 ed. p. 19-27 9 p. (ECS Transactions; vol. 23, no. 1).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Numerical analysis of the dynamic thermal behavior of RF bipolar transistors

Russo, S., D’Alessandro, V., Rinaldi, N., De Magistris, M., La Spina, L. & Nanver, L. K., 2009, First International conference on Computational Methods for Thermal Problems, ThermaComp2009. 223599 ed. p. 345-348 4 p. (International Conference on Computational Methods for Thermal Problems).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

On the mechanisms governing aluminum-mediated solid-phase epitaxy of silicon

Civale, Y., Vastola, G., Nanver, L. K., Mary-Joy, R. & Kim, J. R., Oct 2009, In : Journal of electronic materials. 38, 10, p. 2052-2062 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
8 Citations (Scopus)
3 Downloads (Pure)

Pure dopant deposition of B and Ga for ultrashallow junctions in Si-based devices

Nanver, L. K., Sammak, A., Mohammadi, V., Mok, K. R. C., Qi, L., Šakic, A., Golshani, N., Derakhshandeh, J., Scholtes, T. M. L. & De Boer, W. B., 1 Dec 2009, Microelectronics Technology and Devices, SBMicro 2012. 1 ed. p. 25-33 9 p. (ECS Transactions; vol. 49, no. 1).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

15 Citations (Scopus)

Thermal transient behavior of silicon-on-glass BJTs

Russo, S., Spina, L. L., D'Alessandro, V., Rinaldii, N., Magistris, M. D. & Nanver, L. K., 21 Jul 2009, 2009 10th International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Microsystems, EuroSimE 2009. 4938484

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

7 Citations (Scopus)

Ultra linear low-loss varactor diode configurations for adaptive RF systems

Huang, C., Buisman, K., Marchetti, M., Nanver, L. K., Sarubbi, F., Popadić, M., Scholtes, T. L. M., Schellevis, H., Larson, L. E. & De Vreede, L. C. N., 8 Jan 2009, In : IEEE transactions on microwave theory and techniques. 57, 1, p. 205-215 11 p., 4711066.

Research output: Contribution to journalArticleAcademicpeer-review

21 Citations (Scopus)

X-ray diffraction study of the composition and strain fields in buried SiGe islands

Hrauda, N., Zhang, J. J., Stoffel, M., Stangl, J., Bauer, G., Rehman-Khan, A., Holý, V., Schmidt, O. G., Jovanovic, V. & Nanver, L. K., 9 Apr 2009, In : European Physical Journal: Special Topics. 167, 1, p. 41-46 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Scopus)

X-ray investigation of buried SiGe islands for devices with strain-enhanced mobility

Hrauda, N., Zhang, J. J., Stangl, J., Rehman-Khan, A., Bauer, G., Stoffel, M., Schmidt, O. G., Jovanovich, V. & Nanver, L. K., 30 Mar 2009, In : Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 27, 2, p. 912-918 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
13 Citations (Scopus)
4 Downloads (Pure)
2008

50 GHz integrated distributed phase shifter based on novel silicon-on-glass varactor diodes

Gentile, G., Buisman, K., Akhoukh, A., De Vreede, L. C. N., Rejaei, B. & Nanver, L. K., 24 Sep 2008, 2008 IEEE Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems : Digest of Papers. p. 199-202 4 p. 4446290

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

A 67 dBm OIP3 multistacked junction varactor

Huang, C., Buisman, K., Nanver, L. K., Sarubbi, F., Popadić, M., Scholtes, T. L. M., Schellevis, H., Larson, L. E. & De Vreede, L. C. N., 1 Nov 2008, In : IEEE microwave and wireless components letters. 18, 11, p. 749-751 3 p., 4666741.

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)

Accurate SIMS doping profiling of aluminum-doped solid-phase epitaxy silicon islands

Civale, Y., Nanver, L. K., Alberici, S. G., Gammon, A. & Kelly, I., 22 Feb 2008, In : Electrochemical and solid-state letters. 11, 4, p. H74-H76

Research output: Contribution to journalArticleAcademicpeer-review

6 Citations (Scopus)

Aluminum nitride for heatspreading in RF IC's

La Spina, L., Iborra, E., Schellevis, H., Clement, M., Olivares, J. & Nanver, L. K., 9 May 2008, In : Solid-state electronics. 52, 9, p. 1359-1363 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

28 Citations (Scopus)

Aluminum-nitride thin-film heatspreaders integrated in bipolar transistors

La Spina, L., Marano, I., d'Alessandro, V., Schellevis, H. & Nanver, L. K., 20 May 2008, EuroSimE 2008: International Conference on Thermal, Mechanical and Multi-Physics Simulation and Experiments in Microelectronics and Micro-Systems. IEEE Computer Society, 4525061

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

8 Citations (Scopus)

Analytical carrier transport model for arbitrarily shallow p-n junctions

Popadić, M., Lorito, G. & Nanver, L. K., 19 Sep 2008, 2008 26th International Conference on Microelectronics, Proceedings, MIEL 2008. IEEE, p. 155-158 4 p. 4559246

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Analytical model of I-V characteristics of arbitrarily shallow p-n junctions

Popadiç, M., Lorito, G. & Nanver, L. K., 19 Dec 2008, In : IEEE transactions on electron devices. 56, 1, p. 116-125 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

13 Citations (Scopus)

Characterization of PVD aluminum nitride for heat spreading in RF IC's

La Spina, L., Nanver, L. K., Schellevis, H., Iborra, E., Clement, M. & Olivares, J., 1 Jan 2008, ESSDERC 2007: Proceedings of the 37th European Solid State Device Research Conference. Schmitt-Landsiedel, D. & Thewes, R. (eds.). IEEE Computer Society, p. 354-357 4 p. 4430951. (European Solid State Device Research Conference. Proceedings).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

5 Citations (Scopus)

Crystallographic Silicon-etching for ultra-high aspect-ratio FinFET

Jovanović, V., Suligoj, T. & Nanver, L. K., 13 Nov 2008, ECS Transactions - Advanced Gate Stack, Source/Drain, and Channel Engineering for Si-Based CMOS 4: New Materials, Processes, and Equipment. 1 ed. Vol. 13. p. 313-320 8 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

5 Citations (Scopus)

Enabling low-distortion varactors for adaptive transmitters

Huang, C., De Vreede, L. C. N., Sarubbi, F., Popadič, M., Buisman, K., Qureshi, J., Marchetti, M., Akhnoukh, A., Scholtes, T. L. M., Larson, L. E. & Nanver, L. K., 12 May 2008, In : IEEE transactions on microwave theory and techniques. 56, 5, p. 1149-1163 15 p., 4490422.

Research output: Contribution to journalArticleAcademicpeer-review

24 Citations (Scopus)

Evaluation of Al-doped SPE ultrashallow P+N junctions for use as PNP SiGe HBT emitters

Civale, Y., Lorito, G., Xu, C., Nanver, L. K. & Van Der Toorn, R., 8 Sep 2008, Extended Abstracts 2008 International Workshop on Junction Technology: IWJT-2008. Jiang, Y-L., Qu, X-P., Ru, G-P. & Li, B-Z. (eds.). IEEE, p. 97-100 4 p. 4540026

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Extremely ultrashallow junctions for a high-linearity silicon-on-glass RF varactor-diode technology

Nanver, L. K., Sarubbi, F., Gonda, V., Popadić, M., Scholtes, T. L. M., De Boer, W. & Buisman, K., 8 Sep 2008, Extended Abstracts 2008 International Workshop on Junction Technology: IWJT-2008. Jiang, Y-L., Qu, X-P., Ru, G-P. & Li, B-Z. (eds.). IEEE, p. 101-106 6 p. 4540027

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

FinFET technology for wide-channel devices with ultra-thin silicon body

Jovanović, V., Suligoj, T., Biljanović, P. & Nanver, L. K., 1 Dec 2008, MIPRO 2008 31st International Convention on Information and Communication Technology, Electronics and Microelectronics: Proceedings. [vol. 1], Microelectronics, electronics and electronic technologies, MEET. Grid and visualizayion systems, GVS. Biljanovic, P. & Skala, K. (eds.). Vol. 1. p. 79-83 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
1 Citation (Scopus)
3 Downloads (Pure)

Pure boron-doped photodiodes: A solution for radiation detection in EUV lithography

Sarubbi, F., Nanver, L. K., Scholtes, T. L. M., Nihtianov, S. N. & Scholze, F., 1 Jan 2008, ESSDERC 2008: Proceedings of the 38th European Solid-State Device Research Conference. Hall, S. & Walton, A. (eds.). IEEE Computer Society, p. 278-281 4 p. 4681752. (Proceedings of the European Solid State Device Research Conference).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

34 Citations (Scopus)

Reduction of surface roughness of a silicon chip for advanced nanocalorimetry

La Spina, L., Ovchinnikov, D., Wien, W. H. A., van Herwaarden, A. W., Goudena, E. J. G., Loos, J. & Nanver, L. K., 15 Jun 2008, In : Sensors and Actuators, A: Physical. 144, 2, p. 403-409 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)