1980 …2019

Research output per year

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Research Output

2005

Surface-passivated high-resistivity silicon as a true microwave substrate

Spirito, M., De Paola, F. M., Nanver, L. K., Valletta, E., Rong, B., Rejaei, B., De Vreede, L. C. N. & Burghartz, J. N., 1 Jul 2005, In : IEEE transactions on microwave theory and techniques. 53, 7, p. 2340-2346 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

39 Citations (Scopus)
2004

A back-wafer contacted silicon-on-glass integrated bipolar process - Part I: The conflict electrical versus thermal isolation

Nanver, L. K., Nenadović, N., D'Alessandro, V., Schellevis, H., Van Zeijl, H. W., Dekker, R., De Mooij, D. B., Zieren, V. & Slotboom, J. W., 1 Jan 2004, In : IEEE transactions on electron devices. 51, 1, p. 42-50 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

59 Citations (Scopus)

A back-wafer contacted silicon-on-glass integrated bipolar process - Part II: A novel analysis of thermal breakdown

Nenadović, N., D'Alessandro, V., Nanver, L. K., Tamigi, F., Rinaldi, N. & Slotboom, J. W., 1 Jan 2004, In : IEEE transactions on electron devices. 51, 1, p. 51-62 12 p.

Research output: Contribution to journalArticleAcademicpeer-review

60 Citations (Scopus)

A new extraction technique for the series resistances of semiconductor devices based on the intrinsic properties of bias-dependent y-parameters

Cuoco, V., Neo, W. C. E., De Vreede, L. C. N., De Graaff, H. C., Nanver, L. K., Buisman, K., Wu, H. C., Jos, H. F. F. & Burghartz, J. N., 1 Dec 2004, Proceedings of the 2004 Meeting Bipolar/BiCMOS Circuits and Technology, 2004. p. 148-151 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

A novel SPICE macromodel of BJTs including the temperature dependence of high-injection effects

D'Alessandro, V., Nenadović, N., Tamigi, F., Rinaldi, N., Nanver, L. K. & Slotboom, J. W., 19 Jul 2004, 2004 24th International Conference on Microelectronics (IEEE Cat. No.04TH8716). p. 253-256 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

8 Citations (Scopus)

Design and characterization of a high-resistivity silicon traveling wave amplifier for 10 Gb/s optical communication systems

De Paola, F. M., De Vreede, L. C. N., Nanver, L. K., Rinaldi, N. & Burghartz, J. N., 1 Dec 2004, 2004 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems: Digest of Papers. Cressler, J. D. & Papapolymerou, J. (eds.). p. 69-72 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Electrothermal characterization of silicon-on-glass VDMOSFETs

Nenadović, N., Schellevis, H., Cuoco, V., Griffo, A., Theeuwen, S. J. C. H., Nanver, L. K., Jos, H. F. F. & Slotboom, J. W., 28 Jul 2004, p. 145-148. 4 p.

Research output: Contribution to conferencePaper

Electrothermal limitations on the current density of high-frequency bipolar transistors

Nenadović, N., Nanver, L. K. & Slotboom, J. W., 1 Dec 2004, In : IEEE transactions on electron devices. 51, 12, p. 2175-2180 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

18 Citations (Scopus)

Electrothermal limitations on the current density of high-frequency bipolar transistors

Nenadović, N., Nanver, L. K. & Slotboom, J. W., 1 Dec 2004, p. 3-8. 6 p.

Research output: Contribution to conferencePaper

Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors

Nenadović, N., Mijalković, S., Nanver, L. K., Vandamme, L. K. J., D'Alessandro, V., Schellevis, H. & Slotboom, J. W., 1 Oct 2004, In : IEEE journal of solid-state circuits. 39, 10, p. 1764-1772 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

52 Citations (Scopus)

Modeling of thermal resistance dependence on design parameters in silicon-on-glass bipolar transistors

Tamigi, F., Nenadović, N., D'Alessandro, V., Nanver, L. K., Rinaldi, N. & Slotboom, J. W., 28 Jul 2004, 2004 24th International Conference on Microelectronics. p. 257-260 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Novel low-temperature processing of low noise SDDs with on-detector electronics

Šonský, J., Koornneef, R., Huizenga, J., Hollander, R. W., Nanver, L. K., Scholtes, T., Roozeboom, F. & Van Eijk, C. W. E., 21 Jan 2004, In : Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 517, 1-3, p. 301-312 12 p.

Research output: Contribution to journalArticleAcademicpeer-review

6 Citations (Scopus)

RF power silicon-on-glass VDMOSFETs

Nenadović, N., Cuoco, V., Theeuwen, S. J. C. H., Schellevis, H., Spierings, G., Griffo, A., Pelk, M., Nanver, L. K., Jos, R. F. F. & Slotboom, J. W., 1 Jun 2004, In : IEEE electron device letters. 25, 6, p. 424-426 3 p.

Research output: Contribution to journalLetterAcademicpeer-review

18 Citations (Scopus)

Surface morphologies of excimer-laser annealed BF2+ implanted Si diodes

Burtsev, A., Schut, H., Nanver, L. K., Van Veen, A., Slabbekoorn, J. & Scholtes, T. L. M., 30 Dec 2004, In : Materials Science and Engineering B: Solid-State Materials for Advanced Technology. 114-115, SPEC. ISS., p. 109-113 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Scopus)

Surface-passivated high-resistivity silicon substrates for RFICs

Rong, B., Burghartz, J. N., Nanver, L. K., Rejaei, B. & Van Der Zwan, M., 1 Apr 2004, In : IEEE electron device letters. 25, 4, p. 176-178 3 p.

Research output: Contribution to journalLetterAcademicpeer-review

89 Citations (Scopus)
2003

C-V characterization of MOS capacitors on high resistivity silicon substrate

Rong, B., Nanver, L. K., Burghartz, J. N., Jansman, A. B. M., Evans, A. G. R. & Rejaei, B. S., 1 Jan 2003, ESSDERC 2003 - 33rd European Solid-State Device Research . Franca, J. & Freitas, P. (eds.). IEEE Computer Society Press, p. 489-492 4 p. 1256920

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

10 Citations (Scopus)

Design and characterization of integrated passive elements on high ohmic silicon̈

Valletta, E., Van Beek, J., Den Dekker, A., Pulsford, N., Jos, H. F. F., De Vreede, L. C. N., Nanver, L. K. & Burghartz, J. N., 18 Aug 2003, In : IEEE MTT-S International Microwave Symposium Digest. 2, p. 1235-1238 4 p.

Research output: Contribution to journalConference articleAcademicpeer-review

18 Citations (Scopus)

Extraction and modeling of self-heating and mutual thermal coupling impedance of bipolar transistors

Nenadović, N., Mijalković, S., Nanver, L. K., Vandamme, L. J. K., Schellevis, H., d'Alessandro, V. & Slotboom, J. W., 1 Dec 2003, Proceeding of Bipolar/Bicmos Circuits and Technology Meeting 2003. p. 125-128 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Low-loss passives for 2nd-harmonic termination control in power amplifiers for mobile applications

Spirito, M., De Vreede, L. C. N., Nanver, L. K., Mueller, J. E. & Burghartz, J. N., 1 Jan 2003, 2003 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems - Digest of Papers. Ponchak, G. E. (ed.). IEEE, p. 49-52 4 p. 1196666

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

Power amplifier PAE and ruggedness optimization by second-harmonic control

Spirito, M., De Vreede, L. C. N., Nanver, L. K., Weber, S. & Burghartz, J. N., 1 Sep 2003, In : IEEE journal of solid-state circuits. 38, 9, p. 1575-1583 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)

Thermal instability in two-finger bipolar transistors

Nenadovic, N., D'Alessandro, V., Tamigi, F., Rossi, A., Griffo, A., Nanver, L. K. & Slotboom, J. W., 1 Jan 2003, ESSDERC 2003 - Proceedings of the 33rd European Solid-State Device Research Conference. Franca, J. & Freitas, P. (eds.). IEEE Computer Society Press, p. 203-206 4 p. 1256849

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

12 Citations (Scopus)
2002

Analytical formulation and electrical measurements of self-heating in silicon BJT's

Nenadović, N., D'Alessandro, V., Nanver, L. K., Rinaldi, N., Schellevis, H. & Slotboom, J. W., 1 Jan 2002, Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting. p. 24-27 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

12 Citations (Scopus)

A novel vertical DMOS transistor in SOA technology for RF-power applications

Nenadović, N., Cuoco, V., Theeuwen, S. J. C. H., Nanver, L. K., Jos, H. F. F. & Slotboom, J. W., 1 Jan 2002, 2002 23rd International Conference on Microelectronics, MIEL 2002 - Proceedings. IEEE Computer Society Press, Vol. 1. p. 159-162 4 p. 1003164

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

6 Citations (Scopus)

"CV doping profiling of boron out-diffusion using an abrupt and highly doped arsenic buried epilayer"

Ortiz, C. J., Nanver, L. K., Van Noort, W. D., Scholtes, T. L. M. & Slotboom, J. W., 1 Dec 2002, Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. p. 83-88 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

5 Citations (Scopus)

Design of 200 GHz SiGe HBT's

Van den Oever, L. C. M., Nanver, L. K. & Slotboom, J. W., 1 Jan 2002, Proceedings of the 2001 BIPOLAR/BiCMOS Circuits and Technology Meeting. p. 78-81 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

6 Citations (Scopus)

Power amplifier PAE and ruggedness optimization by second harmonic control

Spirito, M., De Vreede, L. C. N., Nanver, L. K., Weber, S. & Burghartz, J. N., 1 Jan 2002, Proceedings of the Bipolar/BiCMOS Circuits and Technology Meeting. p. 173-176 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

Sensitive measurement method for evaluation of high thermal resistance in bipolar transistors

Nenadović, N., Nanver, L. K., Schellevis, H., De Mooij, D., Zieren, V. & Slotboom, J. W., 1 Dec 2002, Proceedings of the 2002 International Conference on Microelectronic Test Structures, 2002. ICMTS 2002. p. 77-82 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2001

Al/Si contacting of ultra-shallow epitaxially grown Si and SiGe junctions

Ren, Q. W., Nanver, L. K., Visser, C. C. G. & Slotboom, J. W., 1 Apr 2001, In : Journal of Materials Science: Materials in Electronics. 12, 4-6, p. 313-316 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)

A low-cost BiCMOS process with metal gates

Van Zeijl, H. W. & Nanver, L. K., 1 Jan 2001, In : Materials Research Society Symposium - Proceedings. 611

Research output: Contribution to journalConference articleAcademicpeer-review

Arsenic-spike epilayer technology applied to bipolar transistors

Van Noort, W. D., Nanver, L. K. & Slotboom, J. W., 1 Nov 2001, In : IEEE transactions on electron devices. 48, 11, p. 2500-2505 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Scopus)

Electrical detection and simulation of stress in silicon nitride spacer technology

Van Zeijl, H. W., Mijalcovic, S. & Nanver, L. K., 1 Apr 2001, In : Journal of Materials Science: Materials in Electronics. 12, 4-6, p. 339-341 3 p.

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Scopus)

Epitaxy and device behaviour of collector-up SiGe HBTs with a partial p-type collector

van den Oever, L. C. M., Nanver, L. K., Scholtes, T. L. M., Van Zeijl, H. W., Van Noort, W. D., Ren, Q. W. & Slotboom, J. W., Nov 2001, In : Solid-state electronics. 45, 11, p. 1899-1904 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

Reduction of UHF power transistor distortion with a nonuniform collector doping profile

Van Noort, W. D., De Vreede, L. C. N., Jos, H. F. F., Nanver, L. K. & Slotboom, J. W., Sep 2001, In : IEEE journal of solid-state circuits. 36, 9, p. 1399-1406 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

14 Citations (Scopus)

Single-crystal thin film transistor by grain-filter location-controlled excimer-laser crystallization

Van Dijk, B. D., Van Der Wilt, P. C., Bertens, G. J., Nanver, L. K. & Ishihara, R., 1 Dec 2001, In : Materials Research Society symposia proceedings. 685, p. 299-304 6 p.

Research output: Contribution to journalConference articleAcademicpeer-review

Thermal issues in a backwafer contacted silicon-on-glass integrated bipolar process

Nenadovic, N., Nanver, L. K., Schellevis, H., Van Zeijl, H. W. & Slotboom, J. W., 1 Jan 2001, 2001 Topical Meeting on Silicon Monolithic Integrated Circuits in RF Systems, SiRF 2001. Ponchak, G. E. (ed.). IEEE, p. 114-121 8 p. 942351

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)
2000

Analysis of the emitter charge storage in sige heterojunction bipolar transistors with a lightly doped emitter

Van Den Oever, L. C. M., Nanver, L. K. & Slotboom, J. W., 1 Jan 2000, 30th European Solid-State Device Research Conference. Grunbacher, H., Crean, G. M., Lane, W. A. & McCabe, F. A. (eds.). IEEE Computer Society Press, p. 568-571 4 p. 1503771

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Annealing experiments on supercritical Si1-x Gex layers grown by RPCVD

Grimm, K., Vescan, L., Visser, C. C. G., Nanver, L. K. & Lüth, H., 19 Jan 2000, In : Materials Science and Engineering B: Solid-State Materials for Advanced Technology. 69-70, p. 261-265 5 p.

Research output: Contribution to journalConference articleAcademicpeer-review

3 Citations (Scopus)

Backwafer optical lithography and wafer distortion in substrate transfer technologies

van Zeijl, H. W., Slabbekoorn, J., Nanver, L. K., van Dijk, P. W. L., Berthold, A. & Machielsen, T., 18 Aug 2000, In : Proceedings of SPIE - the international society for optical engineering. 4181, 1, p. 200-207 8 p.

Research output: Contribution to journalConference articleAcademicpeer-review

Open Access
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8 Citations (Scopus)
7 Downloads (Pure)

Control of arsenic doping during low temperature CVD epitaxy of silicon (100)

van Noort, W. D., Nanver, L. K. & Slotboom, J. W., 1 Nov 2000, In : Journal of the Electrochemical Society. 147, 11, p. 4301-4304 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

17 Citations (Scopus)

Defect related photoluminescence of SiGe/Si heterostructures grown by APCVD

Shi, J. L., Nanver, L. K., Grimm, K. & Visser, C. C. G., 27 Mar 2000, In : Thin solid films. 364, 1, p. 254-258 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

5 Citations (Scopus)

Integrated transmission lines on high-resistivity silicon: Coplanar waveguides or microstrips?

Rejaei, B., Ng, K. T., Floerkemeier, C., Pham, N. P., Nanver, L. & Burghartz, J. N., 1 Jan 2000, ESSDERC 2000 - Proceedings of the 30th European Solid-State Device Research Conference. Grunbacher, H., Crean, G. M., Lane, W. A. & McCabe, F. A. (eds.). IEEE Computer Society Press, p. 460-463 4 p. 1503744

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Ionizing-radiation induced degradation of SiGe HBTs

Topkar, A., Lodha, S., Mahfooz, A. T., Vasi, J., LaL, R. & Nanver, L., 1 Jan 2000, In : Proceedings of SPIE - the international society for optical engineering. 3975

Research output: Contribution to journalConference articleAcademicpeer-review

Low noise p-channel JFETs for X-ray spectroscopy with silicon drift detectors

Šonský, J., Koornneef, R. N., Nanver, L. K., Lubking, G. W., Huizenga, J., Hollander, R. W. & Van Eijk, C. W. E., 1 Dec 2000, 2000 IEEE Nuclear Science Symposium.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

On the reliability of SiGe microwave power heterojunction bipolar transistor

Zhang, J., Tsien, P. H., Chen, P., Nanver, L. K. & Slotboom, J. W., 1 Dec 2000, Proceedings 2000 IEEE Hong Kong Electron Devices Meeting. p. 90-93 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Si1-xGex island formation by post-growth anneal on supercritical layers grown by RPCVD

Grimm, K., Vescan, L., Nanver, L. K., Visser, C. C. G. & Lüth, H., 2000, In : Materials Research Society Symposium - Proceedings. 618, p. 129-134 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

Temperature dependence of avalanche multiplication in spiked electric fields

Van den Berg, M. R., Nanver, L. K. & Slotboom, J. W., 1 Dec 2000, International Electron Devices Meeting 2000. Technical Digest. p. 79-81 3 p. (Technical Digest - International Electron Devices Meeting).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Transport mechanisms of a polysilicon emitter bipolar transistor with 8 nm gate oxide between emitter and base

Van Den Berg, M. R., Nanver, L. K., De Boer, C. R., Visser, C. C. G. & Slotboom, J. W., 1 Jan 2000, ESSDERC 2000 - Proceedings of the 30th European Solid-State Device Research Conference. Grunbacher, H., Crean, G. M., Lane, W. A. & McCabe, F. A. (eds.). IEEE Computer Society Press, p. 612-615 4 p. 1503782

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)
1999

Ultra-low-temperature low-ohmic contacts for SOA applications

Nanver, L. K., van Zeijl, H. W., Schellevis, H., Mallee, R. J. M., Slabbekoorn, J., Dekker, R. & Slotboom, J. W., 1 Dec 1999, Proceedings of the 1999 Bipolar/BiCMOS Circuits and Technology Meeting. p. 137-140 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

14 Citations (Scopus)
1998

Characterisation of low-stress LPCVD silicon nitride in high frequency BJT's with self-aligned metallization

van Zeijl, H. W. & Nanver, L. K., 1 Dec 1998, 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings. p. 98-101 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

Controlling transient enhanced diffusion effects in high-frequency Si0.7Ge0.3, heterojunction bipolar transistors with implanted emitters

Nanver, L. K., Visser, C. C. G. & van den Bogaard, A., 9 Jun 1998, In : Journal of Vacuum Science and Technology B: Microelectronics and Nanometer Structures. 16, 3, p. 1533-1537 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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3 Citations (Scopus)
3 Downloads (Pure)