1980 …2019

Research output per year

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Research Output

1998

Critical thickness of Si0.7Ge0.3 layers in the fabrication of hf SiGe HBT's

Shi, J. L., Nanver, L. K., Grimm, K. & Visser, C. C. G., 1 Dec 1998, 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings. p. 788-791 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Epitaxially grown n+ phosphorus collector peaks in high-frequency HBT's with implanted emitters

Visser, C. C. G., Nanver, L. K. & van den Bogaard, A., 1998, In : Materials Research Society Symposium - Proceedings. 533, p. 105-110 6 p.

Research output: Contribution to journalConference articleAcademicpeer-review

3 Citations (Scopus)

Low-ohmic contacts by excimer laser annealing of implanted polysilicon

Ren, Q. W., van den Berg, M. R., Nanver, L. K., Slabbekoorn, J. & Visser, C. C. G., 1 Dec 1998, 1998 5th International Conference on Solid-State and Integrated Circuit Technology. Proceedings. p. 102-105 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Optimisation of the base-collector doping profile for high-frequency distortion

Van Noort, W., De Vreede, L. C. N., Nanver, L. K., De Graaff, H. C. & Slotboom, J. W., 1 Jan 1998, ESSDERC 1998 - Proceedings of the 28th European Solid-State Device Research Conference. Touboul, A., Danto, Y. & Grunbacher, H. (eds.). IEEE Computer Society Press, p. 496-499 4 p. 1503597

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Radiation-induced degradation of bipolar transistors

Topkar, A., Mathew, T., Lal, R., Vasi, J. & Nanver, L., 1 Dec 1998, In : Proceedings of SPIE - the international society for optical engineering. 3316, 1, p. 686-689 4 p.

Research output: Contribution to journalConference articleAcademicpeer-review

1997

Development of a 128 channel silicon drift detector for spectroscopic purposes

Valk, H., Huizenga, J., Van Eijk, C. W. E., Hollander, R. W., Nanver, L. K., Sarro, P. M. & Van Den Boogaard, A., 21 Jun 1997, In : Nuclear Instruments and Methods in Physics Research, Section A: Accelerators, Spectrometers, Detectors and Associated Equipment. 392, 1-3, p. 169-172 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
1 Citation (Scopus)
3 Downloads (Pure)

Inverse SiGe heterojunction bipolar transistor

Van Den Oever, L. C. M., Nanver, L. K., Visser, C. C. G., Scholtes, T. L. M., Hueting, R. J. E. & Slotboom, J., 1 Jan 1997, European Solid-State Device Research Conference. Grunbacher, H. (ed.). IEEE Computer Society Press, p. 540-543 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Self-aligned metallization of high-frequency BJT with low-stress silicon-nitride spacers

Van Zeijl, H. W. & Nanver, L. K., 1 Jan 1997, 27th European Solid-State Device Research Conference 1997. Grunbacher, H. (ed.). IEEE Computer Society Press, p. 248-251 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Silicon nitride as dielectric in the low temperature SiGe HBT processing

Ren, Q. W., Nanver, L. K., de Boer, C. R. & Van Zeijl, H. W., Jun 1997, In : Microelectronic engineering. 36, 1-4, p. 179-182 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
6 Downloads (Pure)
1996

Bipolar integrated Kelvin test structure for contact resistance measurement of self-aligned implantations

Nanver, L. K., Goudena, E. J. G. & Slabbekoorn, J., Aug 1996, In : IEEE Transactions on Semiconductor Manufacturing. 9, 3, p. 455-460 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
4 Citations (Scopus)
6 Downloads (Pure)

High-frequency SiGe HBT's with implanted emitters

Nanver, L. K., Goudena, E. J. G., Visser, C., Van Zeijl, H. W. & Slotboom, J. W., 1 Jan 1996, ESSDERC 1996 - Proceedings of the 26th European Solid State Device Research Conference. Rudan, M. & Baccarani, G. (eds.). IEEE Computer Society Press, p. 469-472 4 p. 5436189

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
1 Citation (Scopus)
3 Downloads (Pure)

Kelvin test structure for measuring contact resistance of shallow junctions

Nanver, L. K., Goudena, E. J. G. & Slabbekoorn, J., 1 Jan 1996, Proceedings of International Conference on Microelectronic Test Structures. IEEE, p. 241-245 5 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

9 Citations (Scopus)

Optimization of fully-implanted NPN's for high-frequency operation

Nanver, L. K., Goudena, E. J. G. & Van Zeijl, H. W., 1 Dec 1996, In : IEEE transactions on electron devices. 43, 6, p. 1038-1040 3 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
21 Citations (Scopus)
3 Downloads (Pure)

Time scales of transient enhanced diffusion: Free and clustered interstitials

Cowern, N. E. B., Huizing, H. G. A., Stolk, P. A., Visser, C. C. G., de Kruif, R. C. M., Kyllesbech Larsen, K., Privitera, V., Nanver, L. K. & Crans, W., Dec 1996, In : Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms. 120, 1-4, p. 14-18 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
15 Citations (Scopus)
23 Downloads (Pure)
1995

Low-stress nitride as oxidation mask for submicrometre LOCOS isolation

Van Zeijl, H. W., Nanver, L. K. & French, P. J., 25 May 1995, In : Electronics letters. 31, 11, p. 927-929 3 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
4 Citations (Scopus)
4 Downloads (Pure)

Low stress nitride as surface isolation in bipolar transistors

Nanver, L. K., French, P. J., Goudena, E. J. G. & van Zeijl, H. W., 1 Jan 1995, In : Materials Science and Technology (United Kingdom). 11, 1, p. 36-40 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

8 Citations (Scopus)
1993

DIMES-01, a baseline BIFET process for smart sensor experimentation

Nanver, L. K., Goudena, E. J. G. & van Zeijl, H. W., 1 Jan 1993, In : Sensors and Actuators: A. Physical. 36, 2, p. 139-147 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
29 Citations (Scopus)
7 Downloads (Pure)

Optimisation of base-link in fully-implanted NPNs

Nanver, L. K., Goudena, E. J. G. & van Zeijl, H. W., 5 Aug 1993, In : Electronics letters. 29, 16, p. 1451-1452 2 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
3 Citations (Scopus)
2 Downloads (Pure)
1992

Characterization of Tungsten Deposited by Geh4 Reduction of Wf6, and its Application as Contact Material to Si

van der Jeugd, C. A., Leusink, G. J., Oosterlaken, T. G. M., Alkemade, P. F. A., Nanver, L. K., Goudena, E. J. G., Janssen, G. C. A. M. & Radelaar, S., 1 Jan 1992, In : Journal of the Electrochemical Society. 139, 12, p. 3615-3623 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
6 Citations (Scopus)
3 Downloads (Pure)

High-speed, high-quality WEB NPN transistors with phosphorus emitters

Nanver, L. K., Goudena, E. J. G. & Van Zeijl, H. W., 1 Jan 1992, European Solid-State Device Research Conference. Maes, H. E., Van Overstraeten, R. J. & Mertens, R. P. (eds.). IEEE Computer Society Press, p. 539-542 4 p. 5435155

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

High-speed, high-quality WEB NPN transistors with phosphorus emitters

Nanver, L. K., Goudena, E. J. G. & van Zeijl, H. W., Sep 1992, In : Microelectronic engineering. 19, 1-4, p. 539-542 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
1 Citation (Scopus)
4 Downloads (Pure)
1989

FM radio receiver front-end circuitry with on-chip SAW filters

van Zeijl, P. T. M., Visser, J. H. & Nanver, L. K., Aug 1989, In : IEEE Transactions on Consumer Electronics. 35, 3, p. 512-519 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
9 Citations (Scopus)
18 Downloads (Pure)

I-V characteristics of integrated n+pn- reachthrough diodes

Nanver, L. K. & Goudena, E. J. G., 1 Jan 1989, In : Solid State Electronics. 32, 8, p. 637-645 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
3 Citations (Scopus)
3 Downloads (Pure)
1988

Design Considerations for Integrated High-Frequency p-Channel JFET's

Nanver, L. K. & Goudena, E. J. G., Nov 1988, In : IEEE transactions on electron devices. 35, 11, p. 1924-1934 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
6 Citations (Scopus)
3 Downloads (Pure)
1986

Characteristics of Separated-Gate JFETs

Nanver, L. K. & Goudena, E. J. G., 1 Jan 1986, In : Electronics letters. 22, 23, p. 1244-1246 3 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
3 Citations (Scopus)
4 Downloads (Pure)
1982

Experimental study of the amorphous phases of group-IV semiconductors by the119mSn Mössbauer probe

Nanver, L. K., Weyer, G. & Deutch, B. I., Jun 1982, In : Zeitschrift für Physik B Condensed Matter. 47, 2, p. 103-113 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
17 Citations (Scopus)
6 Downloads (Pure)
1980

Precipitation of β‐tin in Sn implanted silicon

Nanver, L. K., Weyer, G. & Deutch, B. I., 16 Sep 1980, In : physica status solidi (a). 61, 1, p. K29-K34

Research output: Contribution to journalArticleAcademicpeer-review

15 Citations (Scopus)

Radiation defects in ion-implanted silicon: II. Mössbauer spectroscopy of Sn119 defect structures from implantations of radioactive tellurium

Larsen, A. N., Weyer, G. & Nanver, L., 1 Jun 1980, In : Physical Review B. 21, 11, p. 4951-4966 16 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
25 Citations (Scopus)
3 Downloads (Pure)