1980 …2019

Research output per year

If you made any changes in Pure these will be visible here soon.

Research Output

Filter
Conference contribution
2019

Back-end-of-line CMOS-compatible diode fabrication with pure boron deposition down to 50 °C

Knežević, T., Suligoj, T., Liu, X., Nanver, L. K., Elsayed, A., Dick, J. F. & Schulze, J., 1 Sep 2019, ESSDERC 2019 - 49th European Solid-State Device Research Conference (ESSDERC). IEEE, p. 242-245 4 p. 8901810. (European Solid-State Device Research Conference; vol. 2019-September).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Downloads (Pure)

Impact of ultra-thin-layer material parameters on the suppression of carrier injection in rectifying junctions formed by interfacial charge layers

Kneževic, T., Suligoj, T. & Nanver, L. K., 1 May 2019, 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2019 - Proceedings. Skala, K., Car, Z., Pale, P., Huljenic, D., Janjic, M., Koricic, M., Sruk, V., Ribaric, S., Grbac, T. G., Butkovic, Z., Cicin-Sain, M., Skvorc, D., Mauher, M., Babic, S., Gros, S., Vrdoljak, B. & Tijan, E. (eds.). IEEE, p. 24-29 6 p. 8757156. (International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO); vol. 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Downloads (Pure)

In search of a hole inversion layer in Pd/MoOx/Si diodes through I- v characterization using dedicated ring-shaped test structures

Gupta, G., Tharnmaiah, S. D., Hueting, R. J. E. & Nanver, L. K., 6 Jun 2019, 2019 IEEE 32nd International Conference on Microelectronic Test Structures, ICMTS 2019. IEEE, p. 12-17 6 p. 8730920

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Downloads (Pure)

Minimization of dark counts in PureB SPADs for NUV/VUV/EUV light detection by employing a 2D TCAD-based simulation environment

Knežević, T., Nanver, L. K. & Suligoj, T., 26 Feb 2019, Physics and Simulation of Optoelectronic Devices XXVII. Osinski, M., Witzigmann, B. & Arakawa, Y. (eds.). SPIE, Vol. 10912. 109120Y. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 10912).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
38 Downloads (Pure)

Nanometer-thin pure B layers Grown by MBE as metal diffusion barrier on GaN Diodes

Thammaiah, S. D., Hansen, J. L. & Nanver, L. K., 1 Mar 2019, China Semiconductor Technology International Conference 2019, CSTIC 2019. Claeys, C., Huang, R., Wu, H., Lin, Q., Liang, S., Song, P., Guo, Z., Lai, K., Zhang, Y., Qu, X., Lung, H-L. & Yu, W. (eds.). Piscataway, NJ: IEEE, 8755633

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Downloads (Pure)

Reverse breakdown and light-emission patterns studied in Si PureB SPADs

Krakers, M., Kneževic, T. & Nanver, L. K., 1 May 2019, 2019 42nd International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2019 - Proceedings. Skala, K., Car, Z., Pale, P., Huljenic, D., Janjic, M., Koricic, M., Sruk, V., Ribaric, S., Grbac, T. G., Butkovic, Z., Cicin-Sain, M., Skvorc, D., Mauher, M., Babic, S., Gros, S., Vrdoljak, B. & Tijan, E. (eds.). Piscataway, NJ: IEEE, p. 30-35 6 p. 8757007. (International Convention on Information and Communication Technology, Electronics and Microelectronics (MIPRO); vol. 2019).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2018

2D Dark-Count-Rate Modeling of PureB Single-Photon Avalanche Diodes in a TCAD Environment

Knežević, T., Nanver, L. K. & Suligoj, T., 23 Feb 2018, Physics and Simulation of Optoelectronic Devices XXVI: SPIE OPTO, 27 January - 1 February 2018, San Francisco, California, United States. Witzigmann, B., Osiński, M. & Arakawa, Y. (eds.). Bellingham, WA: SPIE, 10 p. 105261K. (Proceedings of SPIE; vol. 10526).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)
1 Downloads (Pure)

An experimental view on PureB silicon photodiode device physics

Nanver, L. K., 28 Jun 2018, 2018 41st International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2018 - Proceedings. IEEE, 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)
2 Downloads (Pure)

Investigation of light-emission and avalanche-current mechanisms in PureB SPAD devices

Nanver, L. K., Krakers, M., Knezevic, T., Karavidas, A., Boturchuk, I., Agarwal, V., Hueting, R. J. E., Dutta, S. & Annema, A. J., 8 Oct 2018, Fifth Conference on Sensors, MEMS and Electro-Optical Systems 2018. SPIE International, Vol. 11043.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Downloads (Pure)

Non-linear behavior of Al-contacted pure amorphous boron (PureB) devices at low temperatures

Knezevic, T., Nanver, L. K., Capan, I. & Suligoj, T., 28 Jun 2018, 2018 41st International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2018 - Proceedings. IEEE, p. 12-17 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Test structures without metal contacts for DC measurement of 2D-materials deposited on silicon

Nanver, L. K., Liu, X. & Knežević, T., 2018, 2018 IEEE International Conference on Microelectronic Test Structures (ICMTS). Piscataway, NJ: IEEE, p. 69-74 6 p. (IEEE International Conference on Microelectronic Test Structures (ICMTS)).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

6 Citations (Scopus)
1 Downloads (Pure)
2017

Indirect optical crosstalk reduction by highly-doped backside layer in PureB single-photon avalanche diode arrays

Osrečki, Ž., Knežević, T., Nanver, L. K. & Suligoj, T., 11 Aug 2017, 17th International Conference on Numerical Simulation of Optoelectronic Devices, NUSOD 2017: 24-28 July 2017, Copenhagen, Denmark. IEEE Computer Society, p. 69-70 2 p. 8009995

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Perimeter effects from interfaces in ultra-thin layers deposited on nanometer-deep p+n silicon junctions

Knežević, T., Nanver, L. K. & Suligoj, T., 13 Jul 2017, 2017 40th International Convention on Information and Communication Technology, Electronics and Microelectronics, MIPRO 2017 - Proceedings. IEEE, p. 72-76 5 p. 7973393

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

Thin-Film layers with Interfaces that reduce RF Losses on High-Resistivity Silicon Substrates

Evseev, S. B., Milosavljevic, S. & Nanver, L. K., 15 Nov 2017, 2017 IEEE Bipolar/BiCMOS Circuits and Technology Meeting, BCTM 2017. IEEE, Vol. 2017-October. p. 21-24 4 p. 8112903

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Downloads (Pure)
2016

Comparing current flows in ultrashallow pn-/Schottky-like diodes with 2-diode test method

Liu, X. & Nanver, L. K., 28 Mar 2016, Microelectronic Test Structures (ICMTS), 2016 International Conference on. New York: IEEE, p. 190-195 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)
1 Downloads (Pure)

Random telegraph signal phenomena in avalanche mode diodes: application to SPADs

Agarwal, V. V., Annema, A. J., Dutta, S., Hueting, R. J. E., Nanver, L. K. & Nauta, B., 14 Sep 2016, 2016 46th European Solid-State Device Research Conference (ESSDERC). USA: IEEE, p. 264-267 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
2 Citations (Scopus)
104 Downloads (Pure)
2015

Sheet resistance measurement for process monitoring of 400 °c PureB deposition on Si

Qi, L. & Nanver, L. K., 12 May 2015, 2015 International Conference on Microelectronic Test Structures (ICMTS). IEEE, p. 169-174 6 p. 7106135

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)
2014

A 270×1 Ge-on-Si photodetector array for sensitive infrared imaging

Sammak, A., Aminian, M., Qi, L., Charbon, E. & Nanver, L. K., 1 Jan 2014, Optical Sensing and Detection III. SPIE, 914104. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 9141).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
2 Citations (Scopus)
5 Downloads (Pure)

Fabrication of low dark-count PureB single-photon avalanche diodes

Qi, L., Mok, K. R. C., Aminian, M., Charbon, E. & Nanver, L. K., 29 Oct 2014, 2014 29th Symposium on Microelectronics Technology and Devices: Chip in Aracaju, SBMicro 2014. IEEE, 6940113

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

Fabrication of PureB-only light-entrance windows for VUV sensitive single-photon avalanche diodes

Qi, L. & Nanver, L. K., 23 Jan 2014, Proceedings - 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014. Zhou, J. & Tang, T-A. (eds.). IEEE, 7021330

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Thickness evaluation of deposited pureb layers in micro-/millimeter-sized windows to Si

Mohammadi, V., Ramesh, S. & Nanver, L. K., 1 Jan 2014, 2014 IEEE International Conference on Microelectronic Test Structures, ICMTS 2014 - Conference Proceedings. IEEE, p. 194-199 6 p. 6841492

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

13 Citations (Scopus)

Towards CMOS-compatible photon-counting imagers in the whole 10 nm - 1600 nm spectral range with PureB Si and PureGaB Ge-on-Si technology

Nanver, L. K., Qi, L., Sammak, A., Mok, K. R. C., Aminian, M. & Charbon, E., 26 Jan 2014, Proceedings - 2014 IEEE 12th International Conference on Solid-State and Integrated Circuit Technology, ICSICT 2014. Zhou, J. & Tang, T-A. (eds.). IEEE, 7021268

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2013

AlN thin-film deposition for suppressing surface current losses in RF circuits on high-resistivity silicon

Evseev, S. B., Nanver, L. K. & Milosavljević, S., 1 Jan 2013, 2013 IEEE Bipolar/BiCMOS Circuits and Technology Meeting, BCTM 2013. IEEE, 6798148

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

A simple model describing the kinetic of CVD deposition of pure-boron layers from diborane

Mohammadi, V., De Boer, W. B., Scholtes, T. L. M. & Nanver, L. K., 1 Jan 2013, Thermal and Plasma CVD of Nanostructures and Their Applications. 31 ed. The Electrochemical Society Inc., p. 57-65 9 p. (ECS Transactions; vol. 45, no. 31).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

Chemical vapor deposition of PureB layers for solar cell application

Mok, K. R. C., Vlooswijk, A. H. G., Derakhshandeh, J. & Nanver, L. K., 1 Jan 2013, 39th IEEE Photovoltaic Specialists Conference, PVSC 2013. IEEE, p. 2234-2238 5 p. 6744921

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

High-ohmic resistors using nanometer-thin pure-boron chemical-vapour- deposited layers

Golshani, N., Mohammadi, V., Ramesh, S. & Nanver, L. K., 1 Jan 2013, ESSDERC 2013 - Proceedings of the 43rd European Solid-State Device Research Conference. IEEE Computer Society, p. 210-213 4 p. 6818856

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

8 Citations (Scopus)

Reverse biasing and breakdown behavior of PureB diodes

Qi, L., Mok, K. R. C., Aminian, M., Scholtes, T. L. M., Charbon, E. & Nanver, L. K., 1 Jan 2013, 2013 13th International Workshop on Junction Technology (IWJT). p. 70-73 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Role of junction depth in light emission from silicon p-i-n LEDs

Piccolo, G., Sammak, A., Hueting, R. J. E., Schmitz, J. & Nanver, L. K., 16 Sep 2013, Proceeding of European Solid State Device Research Conference (ESSDERC 2013). USA: IEEE, p. 119-122 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Ultra-wide band CPW to substrate integrated waveguide (SIW) transition based on a U-shaped slot antenna

Gentile, G., Rejaei, B., Jovanovic, V., Nanver, L. K., De Vreede, L. C. N. & Spirito, M., 1 Dec 2013, European Microwave Week 2013, EuMW 2013 - Conference Proceedings; EuMIC 2013: 8th European Microwave Integrated Circuits Conference. p. 25-28 4 p. 6687776

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

UV-sensitive low dark-count PureB single-photon avalanche diode

Qi, L., Mok, K. R. C., Charbon, E., Nanver, L. K. & Aminian, M., 1 Jan 2013, IEEE SENSORS 2013 - Proceedings. IEEE Computer Society, 6688603

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

10 Citations (Scopus)
2012

A Ge-on-Si single photon avalanche diode operating in Geiger mode at Infrared wavelengths

Aminian, M., Sammak, A., Qi, L., Nanver, L. K. & Charbon, E., 1 Dec 2012, Advanced Photon Counting Techniques VI. 83750Q. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 8375).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
4 Citations (Scopus)
20 Downloads (Pure)

Applications of PureB and PureGaB ultrashallow junction technologies

Nanver, L. K., Sammak, A., Sakic, A., Mohammadi, V., Derakhshandeh, J., Mok, K. R. C., Qi, L., Golshani, N., Scholtes, T. M. L. & De Boer, W. B., 1 Dec 2012, ICSICT 2012 - 2012 IEEE 11th International Conference on Solid-State and Integrated Circuit Technology, Proceedings. 6467697

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

Electrical performance stability characterization of high-sensitivity Si-based EUV photodiodes in a harsh industrial application

Shi, L., Nihtianov, S. N., Scholze, F. & Nanver, L. K., 1 Dec 2012, Proceedings, IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society. p. 3952-3957 6 p. 6389260

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Epitaxial growth of large-area p+n diodes at 400 °c by Aluminum-Induced Crystallization

Sakic, A., Qi, L., Scholtes, T. L. M., Van Der Cingel, J. & Nanver, L. K., 11 Dec 2012, 2012 Proceedings of the European Solid-State Device Research Conference, ESSDERC 2012. p. 145-148 4 p. 6343354

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Ge-on-Si: Single-crystal selective epitaxial growth in a CVD reactor

Sammak, A., De Boer, W. B. & Nanver, L. K., 1 Dec 2012, SiGe, Ge, and Related Compounds 5: Materials, Processing, and Devices. 9 ed. p. 507-512 6 p. (ECS Transactions; vol. 50, no. 9).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

6 Citations (Scopus)

Insights to emitter saturation current densities of boron implanted samples based on defects simulations

Mok, K. R. C., Naber, R. C. G. & Nanver, L. K., 1 Dec 2012, Ion Implantation Technology 2012 - Proceedings of the 19th International Conference on Ion Implantation Technology. p. 245-248 4 p. (AIP Conference Proceedings; vol. 1496).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
6 Citations (Scopus)
5 Downloads (Pure)

Local-loading effects for pure-boron-layer chemical-vapor deposition

Mohammadi, V., De Boer, W. B., Scholtes, T. L. M. & Nanver, L. K., 1 Dec 2012, Dielectric Materials and Metals for Nanoelectronics and Photonics 10. 4 ed. p. 333-341 9 p. (ECS Transactions; vol. 50, no. 4).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

6 Citations (Scopus)

Low-pressure chemical vapor deposition of pureb layers on silicon for p + n junction formation

Mok, K. R. C., Mohammadi, V., Nanver, L. K., De Boer, W. D. & Vlooswijk, A. H. G., 1 Jan 2012, IWJT 2012 - 2012 12th International Workshop on Junction Technology. Jiang, Y-L., Qu, X-P., Li, B-Z. & Ru, G-P. (eds.). IEEE, p. 1-4 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

Modelling of electrical characteristics of ultrashallow pure amorphous boron p +n junctions

Knežević, T., Suligoj, T., Šakić, A. & Nanver, L. K., 22 Aug 2012, MIPRO 2012 - 35th International Convention on Information and Communication Technology, Electronics and Microelectronics - Proceedings. p. 36-41 6 p. 6240610

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

Pattern dependency of pure-boron-layer chemical-vapor depositions

Mohammadi, V., De Boer, W. B., Scholtes, T. L. M. & Nanver, L. K., 19 Nov 2012, Silicon Compatible Materials, Processes, and Technologies for Advanced Integrated Circuits and Emerging Applications 2. 6 ed. p. 39-48 10 p. (ECS Transactions; vol. 45, no. 6).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

PureB low-energy electron detectors with closely-packed photodiodes integrated on locally-thinned high-resistivity silicon

Sakic, A., Milosavljevic, S., Wien, W. H. A., Laros, J. M. W. & Nanver, L. K., 1 Dec 2012, IEEE SENSORS 2012: Proceedings. IEEE, 6411452

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)
2011

A CMOS compatible Ge-on-Si APD operating in proportional and Geiger modes at infrared wavelengths

Sammak, A., Aminian, M., Qi, L., De Boer, W. B., Charbon, E. & Nanver, L. K., 1 Dec 2011, 2011 International Electron Devices Meeting, IEDM 2011. 6131515

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

12 Citations (Scopus)

Electrical performance optimization of a silicon-based EUV photodiode with near-theoretical quantum efficiency

Shi, L., Nanver, L. K., Laubis, C., Scholze, F. & Nihtianov, S., 1 Sep 2011, 2011 16th International Solid-State Sensors, Actuators and Microsystems Conference, TRANSDUCERS'11. p. 48-51 4 p. 5969130. (2011 16th International Solid-State Sensors, Actuators and Microsystems Conference, TRANSDUCERS'11).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

5 Citations (Scopus)

High-quality p + n Ge diodes selectively grown on Si with a sub-300nm transition region

Sammak, A., De Boer, W. D., Qi, L. & Nanver, L. K., 12 Dec 2011, ESSDERC 2011 - Proceedings of the 41st European Solid-State Device Research Conference. p. 359-362 4 p. 6044160

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

1 Citation (Scopus)

High-sensitivity high-stability silicon photodiodes for DUV, VUV and EUV spectral ranges

Shi, L., Nihtianov, S., Scholze, F., Gottwald, A. & Nanver, L. K., 2 Nov 2011, UV, X-Ray, and Gamma-Ray Space Instrumentation for Astronomy XVII. 81450N. (Proceedings of SPIE - The International Society for Optical Engineering; vol. 8145).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
16 Citations (Scopus)
14 Downloads (Pure)

Lateral bipolar structures for evaluating the effectiveness of surface doping techniques

Lorito, G., Qi, L. & Nanver, L. K., 9 Sep 2011, 2011 IEEE International Conference on Microelectronic Test Structures - 24th ICMTS Conference Proceedings. p. 108-113 6 p. 5976870. (IEEE International Conference on Microelectronic Test Structures).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Optimization of the perimeter doping of ultrashallow p+-n --n- photodiodes

Knežević, T., Suligoj, T., Šakić, A. & Nanver, L. K., 6 Sep 2011, MIPRO 2011 - 34th International Convention on Information and Communication Technology, Electronics and Microelectronics - Proceedings. p. 44-48 5 p. 5967021

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Series resistance optimization of high-sensitivity Si-based VUV photodiodes

Shi, L., Nanver, L. K., Šakić, A., Nihtianov, S., Knežević, T., Gottwald, A. & Kroth, U., 25 Aug 2011, 2011 IEEE International Instrumentation and Measurement Technology Conference, I2MTC 2011 - Proceedings. p. 818-821 4 p. 5944073

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

4 Citations (Scopus)

Stability characterization of high-sensitivity silicon-based EUV photodiodes in a detrimental industrial environment

Shi, L., Nanver, L. K. & Nihtianov, S. N., 1 Dec 2011, IECON 2011 - 37th Annual Conference of the IEEE Industrial Electronics Society. p. 2651-2656 6 p. 6119729

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

5 Citations (Scopus)
2010

Al-mediated solid-phase epitaxy of silicon-on-insulator

Šakić, A., Civale, Y., Nanver, L. K., Biasotto, C. & Jovanović, V., 24 Dec 2010, Amorphous and Polycrystalline Thin-Film Silicon Science and Technology - 2010. p. 427-432 6 p. (Materials Research Society Symposium Proceedings; vol. 1245).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)