Marco Ottavi

Research output

Research output per year 2000 2004 2005 2006 2007 2012 2013 2014 2015 2017 2018 2019 2020 2021 2022 2023 2024 2024

• 93 Conference contribution
• 55 Article
• 5 Chapter
• 5 Editorial
• 11 More
  • 3 Foreword/postscript
  • 3 Patent
  • 3 Preprint
  • 1 Book editing
  • 1 Report

Research output per year

Research output per year

Search results

• 2019

  MEMRISTOR BASED SENSOR

  Jabir, A. (Inventor), Ottavi, M. (Inventor), Mathew, J. (Inventor), Martinelli, E. (Inventor), Di Natale, C. (Inventor) & Adeyemo, A. (Inventor), 25 Jul 2019, IPC No. G01N 33/ 00 A I, Patent No. US2019227017, Priority date 4 Oct 2017, Priority No. WO2017IB56113

  Research output: Patent

  • Sensor 100%
  • Elements 75%
  • Resistance Characteristic 12%

• Perovskite based low power synaptic memristor device for neuromorphic application

  Gupta, V., Lucarelli, G., Castro, S., Brown, T. & Ottavi, M., 2019, Proceedings - 2019 14th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2019.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Perovskite 100%
  • Utilization 100%
  • Memristor 100%
  • Application 100%
  • High Speed 50%
  14 Citations (Scopus)

• The case for RISC-V in space

  Di Mascio, S., Menicucci, A., Furano, G., Monteleone, C. & Ottavi, M., 2019, Applications in Electronics Pervading Industry, Environment and Society: APPLEPIES 2018.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
  22 Citations (Scopus)

• The Missing Applications Found: Robust Design Techniques and Novel Uses of Memristors

  Ottavi, M., Gupta, V., Khandelwal, S., Kvatinsky, S., Mathew, J., Martinelli, E. & Jabir, A., Jul 2019, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019. Gizopoulos, D., Alexandrescu, D., Papavramidou, P. & Maniatakos, M. (eds.). IEEE, p. 159-164 6 p. 8854427

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Memristor 100%
  • Application 100%
  • Design Technique 100%
  • Computing 60%
  • Diagnosis 20%
  9 Citations (Scopus)
• 2018

  A Double Error Correction Code for 32-Bit Data Words With Efficent Decoding

  Liu, S., Li, J., Reviriego, P., Ottavi, M. & Xiao, L., 2018, In: IEEE transactions on device and materials reliability. 18, 1, p. 125-127

  Research output: Contribution to journal › Article › Academic › peer-review

  • Error Correction Code 100%
  • Parity Check Bit 66%
  13 Citations (Scopus)

• Efficient sensing approaches for high-density memristor sensor array

  Adeyemo, A., Mathew, J., Jabir, A., Natale, C. D., Martinelli, E. & Ottavi, M., 25 Sept 2018, In: Journal of Computational Electronics. 17, p. 1285-1296

  Research output: Contribution to journal › Article › Academic › peer-review

  • Memristor 100%
  • Design Automation 16%
  • Automation Tool 16%
  • Verilog 16%
  26 Citations (Scopus)

• Guest Editorial: IEEE Transactions on Emerging Topics in Computing  Special Issue on Design & Technology of Integrated Systems in Deep Submicron Era

  Natale, G. D. & Ottavi, M., 1 Apr 2018, In: IEEE Transactions on Emerging Topics in Computing. 6, 2, p. 170-171

  Research output: Contribution to journal › Article › Academic

  • Computing 100%
  • Technology Design 100%
  • Integrated System 100%
  • Reliability 100%
  • Design 100%
  1 Citation (Scopus)

• Memristor based adaptive impedance and frequency tuning network

  Palson, C. L., Das Krishna, D., Mathew, J., Jose, B. R., Ottavi, M. & Gupta, V., 2018, Proceedings - 2018 13th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2018.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Antenna Impedance 100%
  7 Citations (Scopus)

• Neutron irradiation of an ARM Cortex-M0 Core

  Malatesta, F., Ottavi, M., Cardarilli, G., Furano, G., Menicucci, A., Cazzaniga, C., Andreani, C., Senesi, R. & Scatigno, C., Sept 2018, 2018 18th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2018. Piscataway, NJ: IEEE, 5 p. 9328652

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Fault Tolerant 100%
  • Soft Error 100%
  • Internal Resource 100%
  • Memory Resource 100%
  • Cores 100%
  2 Citations (Scopus)

• Opcode vector: An efficient scheme to detect soft errors in instructions

  Martinez, J., Atamaner, M., Reviriego, P., Ergin, O. & Ottavi, M., 2018, In: Microelectronics reliability. 86, p. 92-97

  Research output: Contribution to journal › Article › Academic › peer-review
  1 Citation (Scopus)

• Sensor

  Abusaleh, J. (Inventor), Marco, O. (Inventor), Jimson, M. (Inventor), Eugenio, M. (Inventor), Corrado, D. N. (Inventor) & Adedotun, A. (Inventor), 18 Apr 2018, IPC No. G01N 27/ 04 A I, Patent No. GB2554861, Priority date 4 Oct 2016, Priority No. GB20160016837

  Research output: Patent

  • Array 100%
  • Sensor 100%
  • Species 100%
  • One-Dimensional Array 100%
  • Wire 75%

• Setup and experimental results analysis of COTS Camera and SRAMs at the ISIS neutron facility

  Ottavi, M., Asciolla, D., Fiorucci, T., Grosso, E., Marzullo, C., Scaramella, A., Stramaccioni, S., Zibecchi, A., Andreani, C., Cardarilli, G. C., Cazzaniga, C., Di Nunzio, L., Fazzolari, R., Re, M., Reviriego, P., Furano, G. & Senesi, R., 2018, Proceedings - 2018 13th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2018.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Neutrons 100%
  • Memory 33%
  • Events 16%
  • Avionics 16%
  • Neutron Irradiation 16%
  2 Citations (Scopus)

• Simplified Procedures for COTS TID Testing: A Comparison Between 90Sr and 60Co

  Menicucci, A., Malatesta, F., Di Capua, F., Campajola, L., Casolaro, P., Furano, G., Di Mascio, S. & Ottavi, M., 2018, 2018 IEEE Nuclear and Space Radiation Effects Conference, NSREC 2018.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Complexity 100%
  • Experimental Result 100%
  • Testing 100%
  • Procedures 100%
  • Qualifications 50%
  8 Citations (Scopus)

• Towards defining a simplified procedure for COTS system-on-chip TID testing

  Di Mascio, S., Menicucci, A., Furano, G., Szewczyk, T., Campajola, L., Di Capua, F., Lucaroni, A. & Ottavi, M., 2018, In: Nuclear Engineering and Technology. 50, 8, p. 1298-1305

  Research output: Contribution to journal › Article › Academic › peer-review

  Open Access

  File

  • Proton Beams 100%
  • Events 50%
  • Standard 50%
  • Differences 50%
  • Miniaturization 50%
  12 Citations (Scopus)

  39 Downloads (Pure)

• Two dimensional FFT architecture based on radix-43 algorithm with efficient output reordering

  Kala, S., Nalesh, S., Jose, B. R., Mathew, J. & Ottavi, M., 2018, Proceedings - 2018 13th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2018.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • radix-4 100%
  1 Citation (Scopus)
• 2017

  Dependable multicore architectures at nanoscale

  Ottavi, M. (Editor), Gizopoulos, D. (Editor) & Pontarelli, S. (Editor), 2017, Springer.

  Research output: Book/Report › Book editing › Academic

  • Application 100%
  • Multicore 100%
  11 Citations (Scopus)

• Detecting errors in instructions with bloom filters

  Atamaner, M., Ergin, O., Ottavi, M. & Reviriego, P., 2017, 2017 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review
  5 Citations (Scopus)

• Guest editorial: IEEE transactions on computers and ieee transactions on emerging topics in computing joint special section on innovation in reconfigurable computing fabrics from devices to architectures

  DeMara, R. F., Platzner, M. & Ottavi, M., 1 Apr 2017, In: IEEE Transactions on Emerging Topics in Computing. 5, 2, p. 207-209 3 p., 7938823.

  Research output: Contribution to journal › Editorial › Academic › peer-review
  1 Citation (Scopus)

• Guest Editorial: IEEE Transactions on Computers and IEEE Transactions on Emerging Topics in Computing Joint Special Section on Innovation in Reconfigurable Computing Fabrics from Devices to Architectures

  Demara, R. F., Platzner, M. & Ottavi, M., 2017, In: IEEE transactions on computers. 66, 6, p. 927-929

  Research output: Contribution to journal › Editorial › Academic

  • reconfigurable computing 100%
  • Application 100%
  • Energy Consumption 100%
  • Computing 100%
  • Innovations 100%

• High-energy neutrons characterization of a safety critical computing system

  Fedi, A., Ottavi, M., Furano, G., Bruno, A., Senesi, R., Andreani, C. & Cazzaniga, C., 2017, 2017 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Error Injection 100%
  • Neutron Beam 33%
  3 Citations (Scopus)

• Preface

  Ottavi, M., Gizopoulos, D. & Pontarelli, S., 28 Aug 2017, Dependable Multicore Architectures at Nanoscale. Ottavi, M., Gizopoulos, D. & Pontarelli, S. (eds.). Cham, Switzerland: Springer, p. xiii-xviii 6 p.

  Research output: Chapter in Book/Report/Conference proceeding › Foreword/postscript › Academic
  1 Citation (Scopus)

• Racetrack logic

  Vacca, M., Graziano, M. & Ottavi, M., 2017, In: Electronics letters. 53, 22, p. 1462-1464

  Research output: Contribution to journal › Article › Academic › peer-review

  Open Access

  File

  • Simulation 100%
  • Computation 100%
  • Building-Blocks 100%
  • Data-Stores 100%
  • Memory System 100%
  3 Citations (Scopus)

  11 Downloads (Pure)

• Reliable gas sensing with memristive array

  Adeyemo, A., Jabir, A., Mathew, J., Martinelli, E., Di Natale, C. & Ottavi, M., 2017, 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design, IOLTS 2017. Piscataway, NJ: IEEE, 3 p.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Sensor 100%
  • Memristor 100%
  • Measurement Error 50%
  • Models 50%
  • Experimental Result 50%
  9 Citations (Scopus)
• 2016

  A novel method for SEE validation of complex SoCs using Low-Energy Proton beams

  Furano, G., Di Mascio, S., Szewczyk, T., Menicucci, A., Campajola, L., Di Capua, F., Fabbri, A. & Ottavi, M., 2016, 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Proving 100%
  • Event 100%
  • Proton Beams 100%
  • Proton Energy 100%
  • Validation 100%
  7 Citations (Scopus)

• Complementary resistive switch-based arithmetic logic implementations using material implication

  Yang, Y., Mathew, J., Pontarelli, S., Ottavi, M. & Pradhan, D. K., 2016, In: IEEE transactions on nanotechnology. 15, 1, p. 94-108

  Research output: Contribution to journal › Article › Academic › peer-review

  • Material Implication 100%
  • Arithmetic Circuit 33%
  • Nand Gate 33%
  44 Citations (Scopus)

• Design and characterization of a high-safety hardware/software module for the acquisition of Eurobalise telegrams

  Giuliani, F., Ottavi, M., Cardarilli, G. C., Re, M., Di Nunzio, L., Fazzolari, R., Bruno, A. & Zuliani, F., 2016, 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Software Module 100%
  • Hardware 100%
  • Design 100%
  • Fault Injection 42%
  • Standards 14%
  4 Citations (Scopus)

• Low cost memristor associative memory design for full and partial matching applications

  Yang, Y., Mathew, J., Chakraborty, R. S., Ottavi, M. & Pradhan, D. K., 2016, In: IEEE transactions on nanotechnology. 15, 3, p. 527-538

  Research output: Contribution to journal › Article › Academic › peer-review

  • Memristor 100%
  • Memory Design 100%
  • Matching Application 100%
  • Associative Memory 100%
  • Content-Addressable Memory 50%
  18 Citations (Scopus)

• Qualitative techniques for System-on-Chip test with low-energy protons

  Di Mascio, S., Ottavi, M., Furano, G., Szewczyk, T., Menicucci, A., Campajola, L. & Di Capua, F., 2016, Proceedings - 2016 11th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2016.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • System-on-Chip 100%
  • Proton Energy 100%
  • Test Setup 100%
  • Testing 100%
  • Ionising Radiation 50%
  4 Citations (Scopus)
• 2015

  2T2M memristor based TCAM cell for low power applications

  Yang, Y., Mathew, J., Ottavi, M., Pontarelli, S. & Pradhan, D. K., 2015, Proceedings - 2015 10th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2015.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • ternary content-addressable memory 100%
  • Memory Design 33%
  • Power Dissipation 33%
  • Low-Power Design 33%
  • Content-Addressable Memory 33%
  5 Citations (Scopus)

• A method to protect Bloom filters from soft errors

  Reviriego, P., Pontarelli, S., Maestro, J. A. & Ottavi, M., 2015, Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Error Correction Code 100%
  • Soft Error 100%
  • Filters 100%
  • Error Correction 57%
  • Correction Code 57%
  7 Citations (Scopus)

• A synergetic use of bloom filters for error detection and correction

  Reviriego, P., Pontarelli, S., Maestro, J. A. & Ottavi, M., 2015, In: IEEE transactions on very large scale integration (VLSI) systems. 23, 3, p. 584-587

  Research output: Contribution to journal › Article › Academic › peer-review

  • Noise Margin 100%
  • Error Detection 100%
  • Traffic Classification 100%
  • Algal Bloom 100%
  • Traffic 100%
  10 Citations (Scopus)

• Characterization of low power radiation-hard reed-solomon code protected serializers in 65-nm for HEP experiments electronics

  Felici, D., Bonacini, S. & Ottavi, M., 2015, Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Characterization 100%
  • Electronics 100%
  • Particle Physics 100%
  • Radiation Power 100%
  • Operating Speed 50%
  3 Citations (Scopus)

• Dependable multicore architectures at nanoscale: The view from Europe

  Ottavi, M., Pontarelli, S., Gizopoulos, D., Paschalis, A., Bolchini, C., Michael, M. K., Anghel, L., Tahoori, M., Reviriego, P., Bringmann, O., Izosimov, V., Manhaeve, H., Strydis, C. & Hamdioui, S., 2015, In: IEEE Design and Test. 32, 2, p. 17-28

  Research output: Contribution to journal › Article › Academic › peer-review

  • Multicore 100%
  • Design 100%
  • Application 33%
  • Survey 33%
  • Soft Error 33%
  21 Citations (Scopus)

• Enhancing embedded SRAM security and error tolerance with hardware CRC and obfuscation

  Kan, S., Ottavi, M. & Dworak, J., 2015, Proceedings 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS). Piscataway, NJ: IEEE, 4 p. (Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS); vol. 2015).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Obfuscation 100%
  • Data Simulation 50%
  • Malicious Agent 50%
  6 Citations (Scopus)

• Fault detection and repair of DSC arrays through memristor sensing

  Mathew, J., Yang, Y., Ottavi, M., Brown, T., Zampetti, A., Di Carlo, A., Jabir, A. M. & Pradhan, D. K., 2015, Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Fault Detection 100%
  • Faulty Component 33%
  5 Citations (Scopus)

• Lifetime reliability analysis of complementary resistive switches under threshold and doping interface speed variations

  Li, G., Mathew, J., Shafik, R. A., Pradhan, D. K., Ottavi, M. & Pontarelli, S., 2015, In: IEEE transactions on nanotechnology. p. 130-139

  Research output: Contribution to journal › Article › Academic › peer-review

  • Switching 100%
  • Speed Interface 100%
  • Memristor 40%
  • Simulation 40%
  • Threshold Voltage 40%
  4 Citations (Scopus)

• Low delay single symbol error correction codes based on reed solomon codes

  Pontarelli, S., Reviriego, P., Ottavi, M. & Maestro, J. A., 2015, In: IEEE transactions on computers. 64, 5, p. 1497-1501

  Research output: Contribution to journal › Article › Academic › peer-review

  • Correction Code 100%
  • Reed-Solomon Code 100%
  • Single Error 33%
  • Error Detection 22%
  • Memory Protection 16%
  28 Citations (Scopus)

• Novel Complementary Resistive Switch Crossbar Memory Write and Read Schemes

  Yang, Y., Mathew, J., Ottavi, M., Pontarelli, S. & Pradhan, D. K., 26 Jan 2015, In: IEEE transactions on nanotechnology. 14, 2, p. 346-357 12 p.

  Research output: Contribution to journal › Article › Academic › peer-review

  • Write Operation 100%
  • Crossbar Switch 100%
  • Power Consumption 66%
  • Memory System 33%
  • Configuration Cell 33%
  17 Citations (Scopus)

  8 Downloads (Pure)
• 2014

  A 20 mW, 4.8 Gbit/sec, SEU robust serializer in 65nm for read-out of data from LHC experiments

  Felici, D., Bertazzoni, S., Bonacini, S., Marchioro, A., Moreira, P. & Ottavi, M., 2014, In: Journal of instrumentation. C01004.

  Research output: Contribution to journal › Article › Academic › peer-review

  Open Access

  File

  • Operating Speed 100%
  • Flip-Flop 100%
  • Power Consumption 100%
  • Design 100%
  • Paramount Importance 100%
  10 Citations (Scopus)

  11 Downloads (Pure)

• A single-bit and double-adjacent error correcting parallel decoder for multiple-bit error correcting BCH codes

  Namba, K., Pontarelli, S., Ottavi, M. & Lombardi, F., 2014, In: IEEE transactions on device and materials reliability. 14, 2, p. 664-671

  Research output: Contribution to journal › Article › Academic › peer-review

  • Error 100%
  • Time 8%
  12 Citations (Scopus)

• Characterization of data retention faults in DRAM devices

  Bacchini, A., Rovatti, M., Furano, G. & Ottavi, M., 2014, Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Data Retention 100%
  • Memory Address 16%
  15 Citations (Scopus)

• Complementary resistive switch based stateful logic operations using material implication

  Yang, Y., Mathew, J., Pradhan, D. K., Ottavi, M. & Pontarelli, S., 2014, Proceedings -Design, Automation and Test in Europe, DATE.

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Memristor 100%
  • Material Implication 100%
  • Simulation 50%
  • Logic Gate 50%
  • Building-Blocks 50%
  9 Citations (Scopus)

• Design and analysis of single-event tolerant slave latches for enhanced scan delay testing

  Lu, Y., Lombardi, F., Pontarelli, S. & Ottavi, M., 2014, In: IEEE transactions on device and materials reliability. 14, 1, p. 333-343

  Research output: Contribution to journal › Article › Academic › peer-review

  • Slave Latch 100%
  18 Citations (Scopus)

• Design of a nanometric CMOS memory cell for hardening to a single event with a multiple-node upset

  D'Alessio, M., Ottavi, M. & Lombardi, F., 2014, In: IEEE transactions on device and materials reliability. 14, 1, p. 127-132

  Research output: Contribution to journal › Article › Academic › peer-review

  • Critical Charge 100%
  • Area Power Consumption 100%
  44 Citations (Scopus)

• Efficient implementation of error correction codes in hash tables

  Reviriego, P., Pontarelli, S., Maestro, J. A. & Ottavi, M., 2014, In: Microelectronics reliability. 54, 1, p. 338-340

  Research output: Contribution to journal › Article › Academic › peer-review

  • Table Construction 100%
  3 Citations (Scopus)

• FastTag: A technique to protect cache tags against soft errors

  Reviriego, P., Pontarelli, S., Ottavi, M. & Maestro, J. A., 2014, In: IEEE transactions on device and materials reliability. 14, 3, p. 935-937

  Research output: Contribution to journal › Article › Academic › peer-review

  • Soft Error 100%
  • Error Correction Code 66%
  • Error Correction 66%
  • Modern Processor 33%
  • Protection 33%
  16 Citations (Scopus)

• Foreword

  Ottavi, M., Hamdioui, S., Kundu, S. & Pontarelli, S., 18 Nov 2014, Proceedings - 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). Piscataway, NJ: IEEE, p. ii-iii 2 p. 6962058. (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems).

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

• Total Ionizing Dose Effects on DRAM Data Retention Time

  Bacchini, A., Furano, G., Rovatti, M. & Ottavi, M., Dec 2014, In: IEEE transactions on nuclear science. 61, 6, p. 3690-3693 4 p., 6954568.

  Research output: Contribution to journal › Article › Academic › peer-review

  • Radiation Exposure 100%
  • Irradiation 100%
  • Dose Response 100%
  • Memory 100%
  • Cells 100%
  17 Citations (Scopus)

• Using memristor state change behavior to identify faults in photovoltaic arrays

  Mathew, J., Ottavi, M., Yang, Y. & Pradhan, D. K., 2014, Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems. Piscataway, NJ: IEEE

  Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Memristor 100%
  • Simulation 40%
  • Non-Volatile Memory 20%
  • Threshold Voltage 20%
  • Timing Behavior 20%
  5 Citations (Scopus)
• 2013

  A method to construct low delay single error correction codes for protecting data bits only

  Reviriego, P., Pontarelli, S., Maestro, J. A. & Ottavi, M., 2013, In: IEEE transactions on computer-aided design of integrated circuits and systems. 32, 3, p. 479-483

  Research output: Contribution to journal › Article › Academic › peer-review

  • Error Correction Code 100%
  • Error Correction 100%
  • Protecting Data 100%
  • Soft Error 28%
  • Memory Protection 14%
  45 Citations (Scopus)