Marco Ottavi
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Marco Ottavi

Dr.

 https://orcid.org/0000-0002-5064-7342
Calculated based on number of publications stored in Pure and citations from Scopus
20002024

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  • 2024

    An Enhanced Fault Injection Framework for FPGA-Based Soft-Cores

    Smit, T. T., Forlin, B. E., Chen, K.-H., Souvatzoglou, I., Psarakis, M. & Ottavi, M., 20 Nov 2024, 2024 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). IEEE, 6 p. 10753564

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Open Access
    File

  • Lightweight Instrumentation for Accurate Performance Monitoring in RTOSes

    Forlin, B., Chen, K. H., Alachiotis, N., Cassano, L. & Ottavi, M., 10 Jun 2024, 2024 Design, Automation and Test in Europe Conference and Exhibition, DATE 2024 - Proceedings. IEEE, (Proceedings -Design, Automation and Test in Europe, DATE).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Open Access
    File
    43 Downloads (Pure)

  • Neutron Beam Evaluation of Probabilistic Data Structure-based Online Checkers

    Forlin, B., Annink, E. B., Cishugi, E., Cazzaniga, C., Rech, P., Rauwerda, G., Furano, G. & Ottavi, M., 5 Aug 2024, 2024 IEEE 30th International Symposium on On-line Testing and Robust System Design, IOLTS 2024. IEEE

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Open Access
    File
    1 Citation (Scopus)
    18 Downloads (Pure)

  • Towards the Online Reconfiguration of a Dependable Distributed On-Board Computer

    te Hofsté, G., Lund, A., Ottavi, M. & Lüdtke, D., 1 Aug 2024, Architecture of Computing Systems - 37th International Conference, ARCS 2024, Proceedings. Fey, D., Stabernack, B., Lankes, S., Pacher, M. & Pionteck, T. (eds.). Springer, p. 127-141 15 p. (Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics); vol. 14842 LNCS).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Open Access
    File
    1 Citation (Scopus)
    2 Downloads (Pure)
  • 2023

    An unprotected RISC-V Soft-core processor on an SRAM FPGA: Is it as bad as it sounds?

    Forlin, B. E., van Huffelen, W., Cazzaniga, C., Rech, P., Alachiotis, N. & Ottavi, M., 2023, Proceedings - 2023 IEEE European Test Symposium, ETS 2023. Piscataway, NJ: IEEE, 6 p. (Proceedings IEEE European Test Symposium (ETS); vol. 2023).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Open Access
    File
    2 Citations (Scopus)
    109 Downloads (Pure)

  • Built-in Software Obfuscation for Protecting Microprocessors against Hardware Trojan Horses

    Palumbo, A., Ottavi, M. & Cassano, L., 14 Nov 2023, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. Cassano, L., Psarakis, M., Traiola, M. & Bosio, A. (eds.). Piscataway, NJ: IEEE, (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT; vol. 36).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    1 Citation (Scopus)

  • DEV-PIM: Dynamic Execution Validation with Processing-in-Memory

    Bolat, A., Tugrul, Y. C., Celik, S. H., Sezer, S., Ottavi, M. & Ergin, O., 2023, Proceedings - 2023 IEEE European Test Symposium, ETS 2023. Piscataway, NJ: IEEE, 6 p. (Proceedings of the European Test Workshop; vol. 2023-May).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Open Access
    File
    65 Downloads (Pure)

  • Exploring Genomic Sequence Alignment for Improving Side-Channel Analysis

    Uchoa, H., Arora, V., Vermoen, D., Ottavi, M. & Alachiotis, N., 2023, Computer Security – ESORICS 2023: 28th European Symposium on Research in Computer Security, The Hague, The Netherlands, September 25–29, 2023, Proceedings, Part III. Tsudik, G., Conti, M., Liang, K. & Smaragdakis, G. (eds.). Cham: Springer, p. 203-221 19 p. (Lecture Notes in Computer Science; vol. 14346).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Open Access
    File
    84 Downloads (Pure)

  • Improving the Detection of Hardware Trojan Horses in Microprocessors via Hamming Codes

    Palumbo, A., Cassano, L., Reviriego, P. & Ottavi, M., 14 Nov 2023, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. Cassano, L., Psarakis, M., Traiola, M. & Bosio, A. (eds.). Piscataway, NJ: IEEE, (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT; vol. 36).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    1 Citation (Scopus)

  • Neutron Radiation Tests of the NEORV32 RISC-V SoC on Flash-Based FPGAs

    Böhmer, K., Forlin, B., Cazzaniga, C., Rech, P., Furano, G., Alachiotis, N. & Ottavi, M., 14 Nov 2023, 36th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2023. Cassano, L., Psarakis, M., Traiola, M. & Bosio, A. (eds.). Piscataway, NJ: IEEE, (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT; vol. 36).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    4 Citations (Scopus)

  • Towards Dependable RISC-V Cores for Edge Computing Devices

    Nikiema, P. R., Palumbo, A., Aasma, A., Cassano, L., Kritikakou, A., Kulmala, A., Lukkarila, J., Ottavi, M., Psiakis, R. & Traiola, M., 28 Aug 2023, 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design (IOLTS). Savino, A., Maniatakos, M., di Carlo, S. & Gizopoulos, D. (eds.). IEEE, 7 p. (Proceedings - 2023 IEEE 29th International Symposium on On-Line Testing and Robust System Design, IOLTS 2023).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Open Access
    File
    8 Citations (Scopus)
    177 Downloads (Pure)
  • 2022

    ERIC: An Efficient and Practical Software Obfuscation Framework

    Bolat, A., Celik, S. H., Olgun, A., Ergin, O. & Ottavi, M., 2022, Proceedings - 52nd Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2022. Piscataway, NJ: IEEE, p. 466-474 9 p. (Proceedings - Annual IEEE/IFIP International Conference on Dependable Systems and Networks, DSN 2022; vol. 2022).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Open Access
    File
    4 Citations (Scopus)
    114 Downloads (Pure)

  • Is RISC-V ready for Space? A Security Perspective

    Cassano, L., Mascio, S. D., Palumbo, A., Menicucci, A., Furano, G., Bianchi, G. & Ottavi, M., 30 Nov 2022, Proceedings - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022. Cassano, L., Chakravarty, S. & Bosio, A. (eds.). IEEE, (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT; vol. 2022-October).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Open Access
    File
    7 Citations (Scopus)
    256 Downloads (Pure)

  • Preventing Soft Errors and Hardware Trojans in RISC-V Cores

    Annink, E. B., Rauwerda, G., Hakkennes, E., Menicucci, A., Mascio, S. D., Furano, G. & Ottavi, M., Dec 2022, Proceedings - 35th IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2022. Cassano, L., Chakravarty, S. & Bosio, A. (eds.). IEEE, 6 p. (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT; vol. 2022-October).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Open Access
    File
    5 Citations (Scopus)
    260 Downloads (Pure)

  • Yield Evaluation of Faulty Memristive Crossbar Array-based Neural Networks with Repairability

    Bala, A., Khandelwal, S., Jabir, A. & Ottavi, M., 27 Sept 2022, 2022 IEEE 28th International Symposium on On-Line Testing and Robust System Design (IOLTS). Savino, A., Rech, P., Di Carlo, S. & Gizopoulos, D. (eds.). IEEE, 5 p.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Open Access
    File
    1 Citation (Scopus)
    144 Downloads (Pure)
  • 2021

    A Lightweight Security Checking Module to Protect Microprocessors against Hardware Trojan Horses

    Palumbo, A., Cassano, L., Reviriego, P., Bianchi, G. & Ottavi, M., 8 Oct 2021, 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). Dilillo, L., Cassano, L. & Papadimitriou, A. (eds.). Piscataway, NJ: IEEE, p. 1-6 6 p. 9568291. (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT; vol. 2021-October).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    12 Citations (Scopus)

  • A memristive architecture for process variation aware gas sensing and logic operations

    Khandelwal, S., Ottavi, M., Martinelli, E. & Jabir, A., 26 Jul 2021, 2021 IEEE 27th International Symposium on On-Line Testing and Robust System Design (IOLTS). Piscataway, NJ: IEEE, 9486691

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • Reliability Assessment of Memristor based Gas Sensor Array

    Gupta, V., Panunzi, G., Khandelwal, S., Martinelli, E., Jabir, A. & Ottavi, M., 8 Oct 2021, 2021 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). Dilillo, L., Cassano, L. & Papadimitriou, A. (eds.). Piscataway, NJ: IEEE, p. 1-6 6 p. 9568304. (IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT); vol. 2021).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

  • 2020

    A Microprocessor Protection Architecture against Hardware Trojans in Memories

    Bolat, A., Cassano, L., Reviriego, P., Ergin, O. & Ottavi, M., Apr 2020, Proceedings - 2020 15th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2020. IEEE, 9080961

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    14 Citations (Scopus)

  • Characterization of a RISC-V Microcontroller Through Fault Injection

    Asciolla, D., Dilillo, L., Santos, D., Melo, D., Menicucci, A. & Ottavi, M., 21 Mar 2020, Applications in Electronics Pervading Industry, Environment and Society - APPLEPIES 2019. Saponara, S. & De Gloria, A. (eds.). Springer, p. 91-101 11 p. (Lecture Notes in Electrical Engineering; vol. 627).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    Open Access
    File
    5 Citations (Scopus)
    23 Downloads (Pure)

  • On-Board Satellite Telemetry Forecasting with RNN on RISC-V Based Multicore Processor

    Cappellone, D., Di Mascio, S., Furano, G., Menicucci, A. & Ottavi, M., 19 Oct 2020, 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020. Dilillo, L., Psarakis, M. & Siddiqua, T. (eds.). IEEE, 9250796

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    9 Citations (Scopus)

  • Sensing with Memristive Complementary Resistive Switch: Modelling and Simulations

    Gupta, V., Pellegrini, D., Khandelwal, S., Jabir, A., Kvatinsky, S., Martinelli, E., Di Natale, C. & Ottavi, M., 19 Oct 2020, 33rd IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2020. Dilillo, L., Psarakis, M. & Siddiqua, T. (eds.). IEEE, 9250843

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    3 Citations (Scopus)

  • Yield Estimation of a Memristive Sensor Array

    Gupta, V., Khandelwal, S., Panunzi, G., Martinelli, E., Hamdioui, S., Jabir, A. & Ottavi, M., Jul 2020, Proceedings - 2020 26th IEEE International Symposium on On-Line Testing and Robust System Design, IOLTS 2020. IEEE, 9159727

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    1 Citation (Scopus)
  • 2019

    45nm Bit-Interleaving Differential 10T Low Leakage FinFET Based SRAM with Column-Wise Write Access Control

    Gupta, V., Khandelwal, S., Mathew, J. & Ottavi, M., 2019, 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    14 Citations (Scopus)

  • Complementary Resistive Switch Sensing

    Pellegrini, D., Ottavi, M., Martinelli, E. & Di Natale, C., 2019, 2018 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2018.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    3 Citations (Scopus)

  • Design and Implementation of a Flexible Interface for TID Detector

    Fara, I., Luza, L. M., Boch, J., Furano, G., Ottavi, M. & Dilillo, L., 2019, Proceedings - 2019 8th International Workshop on Advances in Sensors and Interfaces, IWASI 2019.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    1 Citation (Scopus)

  • Fault Modeling and Simulation of Memristor based Gas Sensors

    Khandelwal, S., Bala, A., Gupta, V., Ottavi, M., Martinelli, E. & Jabir, A., 2019, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    10 Citations (Scopus)

  • Fault tolerant photovoltaic array: A repair circuit based on memristor sensing

    Gnoli, L., Carnicelli, G., Parisi, A., Urbinati, L., Kabashi, B., Michieletti, F., Ibarra, S. I. P., Vacca, M., Graziano, M., Mathew, J. & Ottavi, M., 2019, 2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2019.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    1 Citation (Scopus)

  • Perovskite based low power synaptic memristor device for neuromorphic application

    Gupta, V., Lucarelli, G., Castro, S., Brown, T. & Ottavi, M., 2019, Proceedings - 2019 14th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2019.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    14 Citations (Scopus)

  • The case for RISC-V in space

    Di Mascio, S., Menicucci, A., Furano, G., Monteleone, C. & Ottavi, M., 2019, Applications in Electronics Pervading Industry, Environment and Society: APPLEPIES 2018.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    25 Citations (Scopus)

  • The Missing Applications Found: Robust Design Techniques and Novel Uses of Memristors

    Ottavi, M., Gupta, V., Khandelwal, S., Kvatinsky, S., Mathew, J., Martinelli, E. & Jabir, A., Jul 2019, 2019 IEEE 25th International Symposium on On-Line Testing and Robust System Design, IOLTS 2019. Gizopoulos, D., Alexandrescu, D., Papavramidou, P. & Maniatakos, M. (eds.). IEEE, p. 159-164 6 p. 8854427

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    10 Citations (Scopus)
  • 2018

    Memristor based adaptive impedance and frequency tuning network

    Palson, C. L., Das Krishna, D., Mathew, J., Jose, B. R., Ottavi, M. & Gupta, V., 2018, Proceedings - 2018 13th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2018.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    7 Citations (Scopus)

  • Neutron irradiation of an ARM Cortex-M0 Core

    Malatesta, F., Ottavi, M., Cardarilli, G., Furano, G., Menicucci, A., Cazzaniga, C., Andreani, C., Senesi, R. & Scatigno, C., Sept 2018, 2018 18th European Conference on Radiation and Its Effects on Components and Systems, RADECS 2018. Piscataway, NJ: IEEE, 5 p. 9328652

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    4 Citations (Scopus)

  • Setup and experimental results analysis of COTS Camera and SRAMs at the ISIS neutron facility

    Ottavi, M., Asciolla, D., Fiorucci, T., Grosso, E., Marzullo, C., Scaramella, A., Stramaccioni, S., Zibecchi, A., Andreani, C., Cardarilli, G. C., Cazzaniga, C., Di Nunzio, L., Fazzolari, R., Re, M., Reviriego, P., Furano, G. & Senesi, R., 2018, Proceedings - 2018 13th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2018.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    2 Citations (Scopus)

  • Simplified Procedures for COTS TID Testing: A Comparison Between 90Sr and 60Co

    Menicucci, A., Malatesta, F., Di Capua, F., Campajola, L., Casolaro, P., Furano, G., Di Mascio, S. & Ottavi, M., 2018, 2018 IEEE Nuclear and Space Radiation Effects Conference, NSREC 2018.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    8 Citations (Scopus)

  • Two dimensional FFT architecture based on radix-43 algorithm with efficient output reordering

    Kala, S., Nalesh, S., Jose, B. R., Mathew, J. & Ottavi, M., 2018, Proceedings - 2018 13th IEEE International Conference on Design and Technology of Integrated Systems In Nanoscale Era, DTIS 2018.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    1 Citation (Scopus)
  • 2017

    Detecting errors in instructions with bloom filters

    Atamaner, M., Ergin, O., Ottavi, M. & Reviriego, P., 2017, 2017 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    5 Citations (Scopus)

  • High-energy neutrons characterization of a safety critical computing system

    Fedi, A., Ottavi, M., Furano, G., Bruno, A., Senesi, R., Andreani, C. & Cazzaniga, C., 2017, 2017 IEEE Int. Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2017.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    5 Citations (Scopus)

  • Reliable gas sensing with memristive array

    Adeyemo, A., Jabir, A., Mathew, J., Martinelli, E., Di Natale, C. & Ottavi, M., 2017, 2017 IEEE 23rd International Symposium on On-Line Testing and Robust System Design, IOLTS 2017. Piscataway, NJ: IEEE, 3 p.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    10 Citations (Scopus)
  • 2016

    A novel method for SEE validation of complex SoCs using Low-Energy Proton beams

    Furano, G., Di Mascio, S., Szewczyk, T., Menicucci, A., Campajola, L., Di Capua, F., Fabbri, A. & Ottavi, M., 2016, 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    7 Citations (Scopus)

  • Design and characterization of a high-safety hardware/software module for the acquisition of Eurobalise telegrams

    Giuliani, F., Ottavi, M., Cardarilli, G. C., Re, M., Di Nunzio, L., Fazzolari, R., Bruno, A. & Zuliani, F., 2016, 2016 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFT 2016.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    4 Citations (Scopus)

  • Qualitative techniques for System-on-Chip test with low-energy protons

    Di Mascio, S., Ottavi, M., Furano, G., Szewczyk, T., Menicucci, A., Campajola, L. & Di Capua, F., 2016, Proceedings - 2016 11th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2016.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    4 Citations (Scopus)
  • 2015

    2T2M memristor based TCAM cell for low power applications

    Yang, Y., Mathew, J., Ottavi, M., Pontarelli, S. & Pradhan, D. K., 2015, Proceedings - 2015 10th IEEE International Conference on Design and Technology of Integrated Systems in Nanoscale Era, DTIS 2015.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    5 Citations (Scopus)

  • A method to protect Bloom filters from soft errors

    Reviriego, P., Pontarelli, S., Maestro, J. A. & Ottavi, M., 2015, Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    7 Citations (Scopus)

  • Characterization of low power radiation-hard reed-solomon code protected serializers in 65-nm for HEP experiments electronics

    Felici, D., Bonacini, S. & Ottavi, M., 2015, Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    3 Citations (Scopus)

  • Enhancing embedded SRAM security and error tolerance with hardware CRC and obfuscation

    Kan, S., Ottavi, M. & Dworak, J., 2015, Proceedings 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS). Piscataway, NJ: IEEE, 4 p. (Proceedings IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFTS); vol. 2015).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    7 Citations (Scopus)

  • Fault detection and repair of DSC arrays through memristor sensing

    Mathew, J., Yang, Y., Ottavi, M., Brown, T., Zampetti, A., Di Carlo, A., Jabir, A. M. & Pradhan, D. K., 2015, Proceedings of the 2015 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems, DFTS 2015.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    5 Citations (Scopus)
  • 2014

    Characterization of data retention faults in DRAM devices

    Bacchini, A., Rovatti, M., Furano, G. & Ottavi, M., 2014, Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    18 Citations (Scopus)

  • Complementary resistive switch based stateful logic operations using material implication

    Yang, Y., Mathew, J., Pradhan, D. K., Ottavi, M. & Pontarelli, S., 2014, Proceedings -Design, Automation and Test in Europe, DATE.

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review

    9 Citations (Scopus)

  • Foreword

    Ottavi, M., Hamdioui, S., Kundu, S. & Pontarelli, S., 18 Nov 2014, Proceedings - 2014 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT). Piscataway, NJ: IEEE, p. ii-iii 2 p. 6962058. (Proceedings - IEEE International Symposium on Defect and Fault Tolerance in VLSI Systems).

    Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › Academic › peer-review