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Damage processes in thin Ru films induced by single and multiple ultra-short XUV pulses
Makhotkin, I. A. (Speaker), Milov, I. (Contributor), Sobierajski, R. (Contributor), Chalupský, J. (Contributor), Tiedtke, K. (Contributor), Medvedev, N. (Contributor), lipp, V. (Contributor), Ziaja, B. (Contributor), Scholze, F. (Contributor), Zhakhovsky, V. (Contributor), Inogamov, N. (Contributor), Enkisch, H. (Contributor), de Vries, G. (Contributor), Scholze, F. (Contributor), Siewert, F. (Contributor), Sturm, J. M. (Contributor), Nikolaev, K. (Contributor), van de Kruijs, R. W. E. (Contributor), Louis, E. (Contributor), Jacyna, I. (Contributor), Jurek, M. (Contributor), Klinger, D. (Contributor), Nittler, L. (Contributor), Syryanyy, Y. (Contributor), Juha, L. (Contributor), Hájková, V. (Contributor), Vozda, V. (Contributor), Burian, T. (Contributor), Saksl, K. (Contributor), Faatz, B. (Contributor), Keitel, B. (Contributor), Plönjes, E. (Contributor), Schreiber, S. (Contributor), Toleikis, S. (Contributor), Loch, R. A. (Contributor), Hermann, M. (Contributor), Strobel, S. (Contributor), Nienhuys, H. K. (Contributor), Dunker, R. (Contributor), Gwalt, G. (Contributor), Mey, T. (Contributor), Smithers, M. A. (Contributor), van Wolferen, H. A. G. M. (Contributor), Keim, E. G. (Contributor) & Bijkerk, F. (Contributor)
23 Jan 2018Activity: Talk or presentation › Invited talk