Research Output per year
Personal profile
Keywords
- QC Physics
Fingerprint Dive into the research topics where Marko Sturm is active. These topic labels come from the works of this person. Together they form a unique fingerprint.
- 5 Similar Profiles
ion scattering
Physics & Astronomy
thin films
Physics & Astronomy
graphene
Physics & Astronomy
mirrors
Physics & Astronomy
ruthenium
Physics & Astronomy
Graphene
Engineering & Materials Science
Graphite
Chemical Compounds
Thin films
Chemical Compounds
Network
Recent external collaboration on country level. Dive into details by clicking on the dots.
Research Output 2001 2020
Atomic H diffusion and C etching in multilayer graphene monitored using a y based optical sensor
Mund, B. K., Soroka, O., Sturm, J. M., Van Den Beld, W. T. E., Lee, C. J. & Bijkerk, F., 1 Sep 2019, In : Journal of Vacuum Science and Technology B: Nanotechnology and Microelectronics. 37, 5, 6 p., 051801.Research output: Contribution to journal › Article › Academic › peer-review
Open Access
Graphite
Optical sensors
optical measuring instruments
Graphene
Etching
Comparison of hydrogen transport through thin metal, Si and oxide layers
Soroka, O., Sturm, J. M. & Bijkerk, F., 21 Jan 2019.Research output: Contribution to conference › Poster
Open Access
File
oxides
hydrogen
metals
yttrium
diffusivity
Comparison of Sputtering of Transition Metals by Reactive Ion Bombardment
Phadke, P., Sturm, J. M., van de Kruijs, R. W. E. & Bijkerk, F., 21 Jan 2019.Research output: Contribution to conference › Poster
Open Access
File
bombardment
sputtering
transition metals
lithography
ions
Etching processes of transferred and non-transferred multi-layer graphene in the presence of extreme UV, H2O and H2
Mund, B. K., Sturm, J. M., van den Beld, W. T. E., Lee, C. J. & Bijkerk, F., 29 Oct 2019, In : Applied surface science. 504, 144485.Research output: Contribution to journal › Article › Academic › peer-review
Graphite
Graphene
Etching
graphene
etching
Extreme UV secondary electron yield measurements of Ru, Sn, and Hf oxide thin films
Sturm, J. M., Liu, F., Darlatt, E., Kolbe, M., Aarnink, A. A. I., Lee, C. J. & Bijkerk, F., 1 Jul 2019, In : Journal of Micro/ Nanolithography, MEMS, and MOEMS. 18, 3, 033501.Research output: Contribution to journal › Article › Academic › peer-review
Open Access
File
Oxide films
Thin films
oxides
Electrons
thin films
Activities 2005 2018
Metal-on-metal interface formation laws of nanoscale thin films
Anirudhan Chandrasekaran (Speaker), Robbert Wilhelmus Elisabeth van de Kruijs (Contributor), J.M. Sturm (Contributor), F. Bijkerk (Contributor)7 Nov 2018
Activity: Talk or presentation › Invited talk
Atomic oxygen diffusion in ultrathin transition metal oxide films at room temperature
Cristiane Regina Stilhano Vilas Boas (Speaker), J.M. Sturm (Contributor), F. Bijkerk (Contributor)7 Nov 2018 → 9 Nov 2018
Activity: Talk or presentation › Oral presentation
Matrix effects involving quasiresonant neutralization from valence band in Low Energy Ion Scattering
Andrey Zameshin (Contributor), Andrey Yakshin (Contributor), J.M. Sturm (Contributor), Cristiane Regina Stilhano Vilas Boas (Contributor), F. Bijkerk (Contributor)1 Jul 2018 → 6 Jul 2018
Activity: Talk or presentation › Oral presentation
Nanometer scale oxidation and oxygen diffusion at low temperature: Static and Isotope Exchange Depth Profile
Cristiane Regina Stilhano Vilas Boas (Speaker), J.M. Sturm (Contributor), F. Bijkerk (Contributor)31 May 2018
Activity: Talk or presentation › Oral presentation
Damage processes in thin Ru films induced by single and multiple ultra-short XUV pulses
Igor A. Makhotkin (Speaker), Igor Milov (Contributor), Ryszard Sobierajski (Contributor), Jaromir Chalupský (Contributor), Kai Tiedtke (Contributor), Nikita Medvedev (Contributor), vladimir lipp (Contributor), B. Ziaja (Contributor), Frank Scholze (Contributor), V. Zhakhovsky (Contributor), N. Inogamov (Contributor), Hartmut Enkisch (Contributor), Gosse de Vries (Contributor), Frank Scholze (Contributor), Frank Siewert (Contributor), J.M. Sturm (Contributor), Konstantin Nikolaev (Contributor), Robbert Wilhelmus Elisabeth van de Kruijs (Contributor), Eric Louis (Contributor), Iwanna Jacyna (Contributor), Marek Jurek (Contributor), Dorota Klinger (Contributor), Laurent Nittler (Contributor), Yevgen Syryanyy (Contributor), Libor Juha (Contributor), Věra Hájková (Contributor), Vojtěch Vozda (Contributor), Tomáš Burian (Contributor), Karel Saksl (Contributor), Bart Faatz (Contributor), Barbara Keitel (Contributor), Elke Plönjes (Contributor), Siegfried Schreiber (Contributor), Sven Toleikis (Contributor), R.A. Loch (Contributor), Martin Hermann (Contributor), Sebastian Strobel (Contributor), Han Kwang Nienhuys (Contributor), Rilpho Dunker (Contributor), Grzegorz Gwalt (Contributor), Tobias Mey (Contributor), Mark A. Smithers (Contributor), Hendricus A.G.M. van Wolferen (Contributor), Enrico G. Keim (Contributor), F. Bijkerk (Contributor)23 Jan 2018
Activity: Talk or presentation › Invited talk