Marko Sturm

dr.ir.

  • 489 Citations
  • 13 h-Index
20012020

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2020

Etching processes of transferred and non-transferred multi-layer graphene in the presence of extreme UV, H2O and H2

Mund, B. K., Sturm, J. M., van den Beld, W. T. E., Lee, C. J. & Bijkerk, F., 28 Feb 2020, In : Applied surface science. 504, 144485.

Research output: Contribution to journalArticleAcademicpeer-review

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3 Downloads (Pure)
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Open Access
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5 Downloads (Pure)

W/B short period multilayer structures for soft x-rays

Medvedev, R., Zameshin, A., Sturm, J. M., Yakshin, A. & Bijkerk, F., 1 Apr 2020, In : AIP advances. 10, 4, 8 p., 045305.

Research output: Contribution to journalArticleAcademicpeer-review

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1 Downloads (Pure)
2019
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4 Downloads (Pure)

Extreme UV secondary electron yield measurements of Ru, Sn, and Hf oxide thin films

Sturm, J. M., Liu, F., Darlatt, E., Kolbe, M., Aarnink, A. A. I., Lee, C. J. & Bijkerk, F., 1 Jul 2019, In : Journal of Micro/ Nanolithography, MEMS, and MOEMS. 18, 3, 033501.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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78 Downloads (Pure)

Grazing-Incidence La/B-Based Multilayer Mirrors for 6.x nm Wavelength

Kuznetsov, D., Yakshin, A., Sturm, J. M. & Bijkerk, F., 1 Jan 2019, In : Journal of nanoscience and nanotechnology. 19, 1, p. 585-592 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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17 Downloads (Pure)

Hydrogenation dynamics of Ru capped y thin films

Soroka, O., Sturm, J. M., Van De Kruijs, R. W. E., Makhotkin, I. A., Nikolaev, K., Yakunin, S. N., Lee, C. J. & Bijkerk, F., 8 Oct 2019, In : Journal of Applied Physics. 126, 14, 145301.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access

Nanoscale Transition Metal Thin Films: Growth Characteristics and Scaling Law for Interlayer Formation

Chandrasekaran, A., van de Kruijs, R. W. E., Sturm, J. M., Zameshin, A. & Bijkerk, F., 11 Dec 2019, In : ACS applied materials & interfaces. 11, 49, p. 46311−46326 16 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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13 Downloads (Pure)
Open Access
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1 Citation (Scopus)
116 Downloads (Pure)

Oxidation of metal thin films by atomic oxygen: A low energy ion scattering study

Stilhano Vilas Boas, C. R., Sturm, J. M. & Bijkerk, F., 21 Oct 2019, In : Journal of Applied Physics. 126, 15, 7 p., 155301.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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31 Downloads (Pure)
2018

Aromatic structure degradation of single layer graphene on an amorphous silicon substrate in the presence of water, hydrogen and Extreme Ultraviolet light

Mund, B. K., Sturm, J. M., Lee, C. J. & Bijkerk, F., 1 Jan 2018, In : Applied surface science. 427, Part B, p. 1033-1040 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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2 Citations (Scopus)
15 Downloads (Pure)

Control of YH3 formation and stability via hydrogen surface adsorption and desorption

Soroka, O., Sturm, J. M., van de Kruijs, R. W. E., Lee, C. J. & Bijkerk, F., 15 Oct 2018, In : Applied surface science. 455, p. 70-74 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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2 Citations (Scopus)
15 Downloads (Pure)

Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold

Makhotkin, I. A., Milov, I., Chalupský, J., Tiedtke, K., Enkisch, H., de Vries, G., Scholze, F., Siewert, F., Sturm, J. M., Nikolaev, K. V., van de Kruijs, R. W. E., Smithers, M. A., Van Wolferen, H. A. G. M., Keim, E. G., Louis, E., Jacyna, I., Jurek, M., Klinger, D., Pelka, J. B., Juha, L. & 15 others, Hájková, V., Vozda, V., Sburian, T., Saksl, K., Faatz, B., Keitel, B., Plönjes, E., Schreiber, S., Toleikis, S., Loch, R., Hermann, M., Strobel, S., Donker, R., Mey, T. & Sobierajski, R., 1 Nov 2018, In : Journal of the Optical Society of America B: Optical Physics. 35, 11, p. 2799-2805 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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2 Citations (Scopus)
71 Downloads (Pure)

Double matrix effect in Low Energy Ion Scattering from La surfaces

Zameshin, A. A., Yakshin, A. E., Sturm, J. M., Brongerma, H. H. & Bijkerk, F., 15 May 2018, In : Applied surface science. 440, p. 570-579 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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4 Citations (Scopus)
22 Downloads (Pure)

Formation of H2O on a CO2 dosed Ru(0 0 0 1) surface under Extreme Ultraviolet Light and H2

Mund, B. K., Sturm, J. M., Lee, C. J. & Bijkerk, F., 31 Oct 2018, In : Applied surface science. 456, p. 538-544 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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1 Citation (Scopus)
20 Downloads (Pure)

Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser

Milov, I., Makhotkin, I. A., Sobierajski, R., Medvedev, N., lipp, V., Chalupsky, J., Sturm, J. M., Tiedtke, K., de Vries, G., Störmer, M., Siewert, F., van de Kruijs, R., Louis, E., Jacyna, I., Jurek, M., Juha, L., Hájková, V., Vozda, V., Burian, T., Saksl, K. & 13 others, Faatz, B., Keitel, B., Plönjes, E., Schreiber, S., Toleikis, S., Loch, R., Hermann, M., Strobel, S., Nienhuys, H. K., Gwalt, G., Mey, T., Enkisch, H. & Bijkerk, F., 23 Jul 2018, In : Optics express. 26, 15, p. 19665-19685 21 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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5 Citations (Scopus)
39 Downloads (Pure)
2017

Adsorption and Dissociation of CO2 on Ru (0001)

Pachecka, M., Sturm, J. M., Lee, C. J. & Bijkerk, F., 30 Mar 2017, In : Journal of physical chemistry. p. 6729-6735 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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7 Citations (Scopus)
53 Downloads (Pure)

Characterization of self-assembled monolayers on a ruthenium surface

Shaheen, A., Sturm, J. M., Ricciardi, R., Huskens, J., Lee, C. J. & Bijkerk, F., 6 Jun 2017, In : Langmuir. 33, 25, p. 6419-6429 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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4 Citations (Scopus)
40 Downloads (Pure)

Coexistence of ice clusters and liquid-like water clusters on the Ru(0001) surface

Liu, F., Sturm, J. M., Lee, C. J. & Bijkerk, F., 2017, In : Physical chemistry chemical physics. 19, 12, p. 8288-8299 12 p.

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)
1 Downloads (Pure)
Open Access
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4 Citations (Scopus)
329 Downloads (Pure)

Metal diffusion properties of ultra-thin high-k Sc2O3 films

Pachecka, M., Lee, C. J., Sturm, J. M. & Bijkerk, F., 1 Oct 2017, In : AIP advances. 7, 10, 21 p., 105324.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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2 Citations (Scopus)
121 Downloads (Pure)

Thermal stability of high-reflectance La/B-based multilayers for 6.x nm wavelength

Kuznetsov, D. S., Yakshin, A. E., Sturm, J. M. & Bijkerk, F., 28 Sep 2017, In : Journal of Applied Physics. 122, 12, 125302.

Research output: Contribution to journalArticleAcademicpeer-review

1 Downloads (Pure)

Tin etching from metallic and oxidized scandium thin films

Pachecka, M., Lee, C. J., Sturm, J. M. & Bijkerk, F., Aug 2017, In : AIP advances. 7, 8, 8 p., 085107.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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1 Citation (Scopus)
149 Downloads (Pure)
2016

Electronegativity-dependent tin etching from thin films

Pachecka, M., Sturm, J. M., van de Kruijs, R. W. E., Lee, C. J. & Bijkerk, F., 29 Jul 2016, In : AIP advances. 6, 7, 9 p., 075222.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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7 Citations (Scopus)
46 Downloads (Pure)

Exploiting the P L2,3 absorption edge for optics: spectroscopic and structural characterization of cubic boron phosphide thin films

Huber, S., Medvedev, V., Meyer-Ilse, J., Gullikson, E., Padavala, B., Edgar, J. H., Sturm, J. M., van de Kruijs, R. W. E., Prendergast, D. & Bijkerk, F., 2016, In : Optical materials express. 6, 12, p. 3946-3959 12.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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5 Citations (Scopus)
76 Downloads (Pure)

Extreme UV induced dissociation of amorphous solid water and crystalline water bilayers on Ru(0001)

Liu, F., Sturm, J. M., Lee, C. J. & Bijkerk, F., 2016, In : Surface science. 646, p. 101-107 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)

Highly efficient blazed grating with multilayer coating for tender X-ray energies

Senf, F., Bijkerk, F., Eggenstein, F., Gwalt, G., Huang, Q., van de Kruijs, R. W. E., Kutz, O., Lemke, S., Louis, E., Mertin, M., Packe, I., Rudolph, I., Schafers, F., Siewert, F., Sokolov, A., Sturm, J. M., Waberski, C., Wang, Z., Wolf, J., Zeschke, T. & 1 others, Erko, A., 2016, In : Optics express. 24, 12, p. 13220-13230 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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21 Citations (Scopus)
234 Downloads (Pure)

In vacuo growth studies of Ru thin films on Si, SiN, and SiO2 by high-sensitivity low energy ion scattering

Coloma Ribera, R., van de Kruijs, R. W. E., Sturm, J. M., Yakshin, A. & Bijkerk, F., 2016, In : Journal of Applied Physics. 120, 6, p. 065303- 13 p., 065303.

Research output: Contribution to journalArticleAcademicpeer-review

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5 Citations (Scopus)
178 Downloads (Pure)

Structure of high-reflectance La/B-based multilayer mirrors with partial La nitridation

Kuznetsov, D., Yakshin, A., Sturm, J. M., van de Kruijs, R. W. E. & Bijkerk, F., 2016, In : AIP advances. 6, 9 p., 115117.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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5 Citations (Scopus)
47 Downloads (Pure)

Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS

Belsey, N. A., Cant, D. J. H., Minelli, C., Araujo, J. R., Bock, B., Brüner, P., Castner, D. G., Ceccone, C., Counsell, J. D. P., Dietrich, P. M., Engelhard, M. H., Fearn, S., Galhardo, C. E., Kalbe, H., Kim, J. W., Lartundo-Rojas, L., Luftman, H. S., Nunney, T. S., Pseiner, J., Smith, E. F. & 12 others, Spampinato, V., Sturm, J. M., Thomas, A. G., Treacy, J. P. W., Veith, L., Wagstaffe, M., Wang, H., Wang, M., Wang, Y. C., Werner, W., Yang, L. & Shard, A. G., 2016, In : Journal of physical chemistry C. 120, 42, p. 24070-24079

Research output: Contribution to journalArticleAcademicpeer-review

20 Citations (Scopus)
2015

Emissivity of freestanding membranes with thin metal coatings

van Zwol, P. J., Vles, D. F., Voorthuijzen, W. P., Péter, M., Vermeulen, H., Zande, W. J., Sturm, J. M., van de Kruijs, R. W. E. & Bijkerk, F., 7 Dec 2015, In : Journal of Applied Physics. 118, 21, p. 213107- 21.

Research output: Contribution to journalArticleAcademicpeer-review

14 Citations (Scopus)

High-reflectance La/B-based multilayer mirror for 6.x  nm wavelength

Kuznetsov, D., Yakshin, A., Sturm, J. M., van de Kruijs, R. W. E., Louis, E. & Bijkerk, F., 2015, In : Optics letters. 40, 16, p. 3378-3781

Research output: Contribution to journalArticleAcademicpeer-review

25 Citations (Scopus)

Steam reforming of acetic acid - A major component in the volatiles formed during gasification of humin

Hoang, T. M. C., Geerdink, B., Sturm, J. M., Lefferts, L. & Seshan, K., 2015, In : Applied catalysis B: environmental. 163, p. 74-82

Research output: Contribution to journalArticleAcademicpeer-review

29 Citations (Scopus)
2014

Defect formation in single layer graphene under extreme ultraviolet irradiation

Gao, A., Zoethout, E., Sturm, J. M., Lee, C. J. & Bijkerk, F., 2014, In : Applied surface science. 317, p. 745-751 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

8 Citations (Scopus)
2013

Reactions of ethanol on Ru(0001)

Sturm, J. M., Lee, C. J. & Bijkerk, F., 1 Jun 2013, In : Surface science. 612, p. 42-47 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

16 Citations (Scopus)

UHV-opstelling voor het bestuderen van de contaminatie van EUV-spiegels

Sturm, J. M., Liu, F., Grecea, M. L., Gleeson, M. A., Lee, C. J. & Bijkerk, F., 2013, In : NEVAC blad. 51, 1, p. 12-15 4 p.

Research output: Contribution to journalArticleAcademic

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54 Downloads (Pure)

Well-Ordered Molybdenum Oxide Layers on Au(111): Preparation and Properties

Guimond, S., Goebke, D., Sturm, J. M., Romanyshyn, Y., Kuhlenbeck, H., Cavalleri, M. & Freund, H-J., 2 May 2013, In : Journal of physical chemistry C. 117, 17, p. 8746-8757

Research output: Contribution to journalArticleAcademicpeer-review

20 Citations (Scopus)
2011

Methanol Adsorption on V2O3(0001)

Romanyshyn, Y., Guimond, S., Goebke, D., Sturm, J. M., Kuhlenbeck, H., Doebler, J., Ganduglia-Pirovano, M. V., Sauer, J. & Freund, H-J., Jul 2011, In : Topics in catalysis. 54, 10-12, p. 669-684

Research output: Contribution to journalArticleAcademicpeer-review

11 Citations (Scopus)
2009

Formaldehyde Formation on Vanadium Oxide Surfaces V2O3(0001) and V2O5(001): How does the Stable Methoxy Intermediate Form?

Goebke, D., Romanyshyn, Y., Guimond, S., Sturm, J. M., Kuhlenbeck, H., Doebler, J., Reinhardt, U., Ganduglia-Pirovano, M. V., Sauer, J. & Freund, H-J., 2009, In : Angewandte Chemie (international edition). 48, 20, p. 3695-3698

Research output: Contribution to journalArticleAcademicpeer-review

52 Citations (Scopus)

Partial oxidation of methanol on well-ordered V2O5(001)/Au(111) thin films

Sturm, J. M., Goebke, D., Kuhlenbeck, H., Doebler, J., Reinhardt, U., Ganduglia-Pirovano, M. V., Sauer, J. & Freund, H-J., 2009, In : Physical chemistry chemical physics. 11, 17, p. 3290-3299

Research output: Contribution to journalArticleAcademicpeer-review

34 Citations (Scopus)
2008

Growth and characterization of ultrathin V(2)O(y) (y approximate to 5) films on Au(111)

Guimond, S., Goebke, D., Romanyshyn, Y., Sturm, J. M., Naschitzki, M., Kuhlenbeck, H. & Freund, H-J., 14 Aug 2008, In : Journal of physical chemistry C. 112, 32, p. 12363-12373

Research output: Contribution to journalArticleAcademicpeer-review

13 Citations (Scopus)

Well-ordered V2O5(001) thin films on Au(111): Growth and thermal stability

Guimond, S., Sturm, J. M., Goebke, D., Romanyshyn, Y., Naschitzki, M., Kuhlenbeck, H. & Freund, H-J., 7 Aug 2008, In : Journal of physical chemistry C. 112, 31, p. 11835-11846

Research output: Contribution to journalArticleAcademicpeer-review

53 Citations (Scopus)
2007

Heterogeneous oxidation of Si(111) 7 x 7 monitored with Kelvin Probe Force Microscopy

Sturm, J. M., Wormeester, H. & Poelsema, B., 2007, In : Surface science. 601, 19, p. 4598-4602 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Scopus)

Metastable precursor for oxygen dissociation on Si(001) 2x1 resolved by high lateral resolution work function measurements

Sturm, J. M., Croes, G. O., Wormeester, H. & Poelsema, B., 2007, In : Surface science. 601, 12, p. 2498-2507 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)
2006

In Situ Reflective High-Energy Electron Diffraction Analysis During the Initial Stage of a Trimethylaluminum/Water ALD Process

Bankras, R. G., Holleman, J., Schmitz, J., Sturm, J. M., Sturm, J. M., Zinine, A., Wormeester, H. & Poelsema, B., May 2006, In : Chemical vapor deposition. 12, 5, p. 275-280 6 p., 10.1002/cvde.200506433.

Research output: Contribution to journalArticleAcademicpeer-review

7 Citations (Scopus)
2005

Imaging of oxide charges and contact potential difference fluctuations in Atomic Layer Deposited Al2O3 on Si

Sturm, J. M., Zinine, A., Wormeester, H., Poelsema, B., Bankras, R. G., Holleman, J. & Schmitz, J., 14 Mar 2005, In : Journal of Applied Physics. 97, 063709, p. 063709 8 p., 10.1063/1.1870113.

Research output: Contribution to journalArticleAcademicpeer-review

13 Citations (Scopus)

Laterally resolved electrical characterisation of high-L oxides with non-contact Atomic Force Microscopy

Sturm, J. M., Zinine, A., Wormeester, H., Bankras, R. G., Holleman, J., Schmitz, J. & Poelsema, B., 17 Jun 2005, In : Microelectronic engineering. 80, 10.1016/j.mee.2005.04.015, p. 78-81 4 p., 10.1016/j.mee.2005.04.015.

Research output: Contribution to journalArticleAcademicpeer-review

Nanoscale topography-capacitance correlation in high-K films: Interface heterogeneity related electrical properties

Sturm, J. M., Zinine, A., Wormeester, H., Poelsema, B., Bankras, R. G., Holleman, J. & Schmitz, J., 6 Oct 2005, In : Journal of Applied Physics. 98, 076104, p. 076104-1 10.1063/1.2077840.

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)
2004

Analyse van hoge-k oxides. XPS-SPM opstelling gekoppeld aan depositieopstelling

Sturm, J. M., Zinine, A., Oerbekke, H. J. M., Wormeester, H. & Poelsema, B., 2004, In : NEVAC blad. 42, p. 42- 1 p.

Research output: Contribution to journalArticleAcademic