Marko Sturm

dr.ir.

  • 474 Citations
  • 13 h-Index
20012020
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Research Output 2001 2020

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Article
2019
2 Downloads (Pure)
Open Access
File
Graphite
Optical sensors
optical measuring instruments
Graphene
Etching
3 Downloads (Pure)

Etching processes of transferred and non-transferred multi-layer graphene in the presence of extreme UV, H2O and H2

Mund, B. K., Sturm, J. M., van den Beld, W. T. E., Lee, C. J. & Bijkerk, F., 29 Oct 2019, In : Applied surface science. 504, 144485.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Graphite
Graphene
Etching
graphene
etching
46 Downloads (Pure)

Extreme UV secondary electron yield measurements of Ru, Sn, and Hf oxide thin films

Sturm, J. M., Liu, F., Darlatt, E., Kolbe, M., Aarnink, A. A. I., Lee, C. J. & Bijkerk, F., 1 Jul 2019, In : Journal of Micro/ Nanolithography, MEMS, and MOEMS. 18, 3, 033501.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Oxide films
Thin films
oxides
Electrons
thin films
13 Downloads (Pure)

Grazing-Incidence La/B-Based Multilayer Mirrors for 6.x nm Wavelength

Kuznetsov, D., Yakshin, A., Sturm, J. M. & Bijkerk, F., 1 Jan 2019, In : Journal of nanoscience and nanotechnology. 19, 1, p. 585-592 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
grazing incidence
Multilayers
Mirrors
mirrors
Wavelength

Hydrogenation dynamics of Ru capped y thin films

Soroka, O., Sturm, J. M., Van De Kruijs, R. W. E., Makhotkin, I. A., Nikolaev, K., Yakunin, S. N., Lee, C. J. & Bijkerk, F., 8 Oct 2019, In : Journal of applied physics. 126, 14, 145301.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
hydrogenation
thin films
ellipsometry
hydrogen
surface plasmon resonance
11 Downloads (Pure)

Nanoscale Transition Metal Thin Films: Growth Characteristics and Scaling Law for Interlayer Formation

Chandrasekaran, A., van de Kruijs, R. W. E., Sturm, J. M., Zameshin, A. & Bijkerk, F., 11 Dec 2019, In : ACS applied materials & interfaces. 11, 49, p. 46311−46326 16 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Scaling laws
Film growth
Transition metals
Thin films
Interfacial energy
1 Citation (Scopus)
109 Downloads (Pure)
Open Access
File
nitrogen ions
Ion bombardment
Ruthenium
ruthenium
bombardment
16 Downloads (Pure)

Oxidation of metal thin films by atomic oxygen: A low energy ion scattering study

Stilhano Vilas Boas, C. R., Sturm, J. M. & Bijkerk, F., 21 Oct 2019, In : Journal of applied physics. 126, 15, 7 p., 155301.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
ion scattering
oxidation
oxygen
thin films
metals
1 Downloads (Pure)

Sputtering and nitridation of transition metal surfaces under low energy, steady state nitrogen ion bombardment

Phadke, P., Sturm, J. M., van de Kruijs, R. W. E. & Bijkerk, F., 26 Nov 2019, (Accepted/In press) In : Applied surface science. 505, 144529.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Nitridation
nitrogen ions
Ion bombardment
metal surfaces
Transition metals
2018
2 Citations (Scopus)
13 Downloads (Pure)

Aromatic structure degradation of single layer graphene on an amorphous silicon substrate in the presence of water, hydrogen and Extreme Ultraviolet light

Mund, B. K., Sturm, J. M., Lee, C. J. & Bijkerk, F., 1 Jan 2018, In : Applied surface science. 427, Part B, p. 1033-1040 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Graphite
Amorphous silicon
Graphene
Hydrogen
Degradation
2 Citations (Scopus)
13 Downloads (Pure)

Control of YH3 formation and stability via hydrogen surface adsorption and desorption

Soroka, O., Sturm, J. M., van de Kruijs, R. W. E., Lee, C. J. & Bijkerk, F., 15 Oct 2018, In : Applied surface science. 455, p. 70-74 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Hydrogen
Desorption
Adsorption
Yttrium
Thin films
2 Citations (Scopus)
65 Downloads (Pure)

Damage accumulation in thin ruthenium films induced by repetitive exposure to femtosecond XUV pulses below the single-shot ablation threshold

Makhotkin, I. A., Milov, I., Chalupský, J., Tiedtke, K., Enkisch, H., de Vries, G., Scholze, F., Siewert, F., Sturm, J. M., Nikolaev, K. V., van de Kruijs, R. W. E., Smithers, M. A., Van Wolferen, H. A. G. M., Keim, E. G., Louis, E., Jacyna, I., Jurek, M., Klinger, D., Pelka, J. B., Juha, L. & 15 others, Hájková, V., Vozda, V., Sburian, T., Saksl, K., Faatz, B., Keitel, B., Plönjes, E., Schreiber, S., Toleikis, S., Loch, R., Hermann, M., Strobel, S., Donker, R., Mey, T. & Sobierajski, R., 1 Nov 2018, In : Journal of the Optical Society of America B: Optical Physics. 35, 11, p. 2799-2805 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
free electron lasers
ruthenium
ablation
shot
damage
3 Citations (Scopus)
17 Downloads (Pure)

Double matrix effect in Low Energy Ion Scattering from La surfaces

Zameshin, A. A., Yakshin, A. E., Sturm, J. M., Brongerma, H. H. & Bijkerk, F., 15 May 2018, In : Applied surface science. 440, p. 570-579 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Scattering
Ions
Charge transfer
Lanthanum
Conduction bands
1 Citation (Scopus)
18 Downloads (Pure)

Formation of H2O on a CO2 dosed Ru(0 0 0 1) surface under Extreme Ultraviolet Light and H2

Mund, B. K., Sturm, J. M., Lee, C. J. & Bijkerk, F., 31 Oct 2018, In : Applied surface science. 456, p. 538-544 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Amorphous carbon
Temperature programmed desorption
Absorption spectroscopy
Reaction products
Carbon Dioxide
5 Citations (Scopus)
34 Downloads (Pure)

Mechanism of single-shot damage of Ru thin films irradiated by femtosecond extreme UV free-electron laser

Milov, I., Makhotkin, I. A., Sobierajski, R., Medvedev, N., lipp, V., Chalupsky, J., Sturm, J. M., Tiedtke, K., de Vries, G., Störmer, M., Siewert, F., van de Kruijs, R., Louis, E., Jacyna, I., Jurek, M., Juha, L., Hájková, V., Vozda, V., Burian, T., Saksl, K. & 13 others, Faatz, B., Keitel, B., Plönjes, E., Schreiber, S., Toleikis, S., Loch, R., Hermann, M., Strobel, S., Nienhuys, H. K., Gwalt, G., Mey, T., Enkisch, H. & Bijkerk, F., 23 Jul 2018, In : Optics express. 26, 15, p. 19665-19685 21 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
ultraviolet lasers
free electron lasers
shot
damage
thin films
2017
7 Citations (Scopus)
52 Downloads (Pure)

Adsorption and Dissociation of CO2 on Ru (0001)

Pachecka, M., Sturm, J. M., Lee, C. J. & Bijkerk, F., 30 Mar 2017, In : Journal of physical chemistry. p. 6729-6735 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Carbon Monoxide
Temperature programmed desorption
Infrared spectroscopy
desorption
infrared spectroscopy
4 Citations (Scopus)
36 Downloads (Pure)

Characterization of self-assembled monolayers on a ruthenium surface

Shaheen, A., Sturm, J. M., Ricciardi, R., Huskens, J., Lee, C. J. & Bijkerk, F., 6 Jun 2017, In : Langmuir. 33, 25, p. 6419-6429 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Ruthenium
Self assembled monolayers
ruthenium
Monolayers
sulfur
2 Citations (Scopus)
1 Downloads (Pure)

Coexistence of ice clusters and liquid-like water clusters on the Ru(0001) surface

Liu, F., Sturm, J. M., Lee, C. J. & Bijkerk, F., 2017, In : Physical chemistry chemical physics. 19, 12, p. 8288-8299 12 p.

Research output: Contribution to journalArticleAcademicpeer-review

Ice
ice
Water
Liquids
liquids
4 Citations (Scopus)
301 Downloads (Pure)
Open Access
File
magnetron sputtering
oxidation
thin films
oxygen
photoelectron spectroscopy
2 Citations (Scopus)
110 Downloads (Pure)

Metal diffusion properties of ultra-thin high-k Sc2O3 films

Pachecka, M., Lee, C. J., Sturm, J. M. & Bijkerk, F., 1 Oct 2017, In : AIP advances. 7, 10, 21 p., 105324.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
metals
tin
etching
ruthenium
adhesion
1 Downloads (Pure)

Thermal stability of high-reflectance La/B-based multilayers for 6.x nm wavelength

Kuznetsov, D. S., Yakshin, A. E., Sturm, J. M. & Bijkerk, F., 28 Sep 2017, In : Journal of applied physics. 122, 12, 125302.

Research output: Contribution to journalArticleAcademicpeer-review

1 Citation (Scopus)
140 Downloads (Pure)

Tin etching from metallic and oxidized scandium thin films

Pachecka, M., Lee, C. J., Sturm, J. M. & Bijkerk, F., Aug 2017, In : AIP advances. 7, 8, 8 p., 085107.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
scandium
tin
etching
oxides
thin films
2016
7 Citations (Scopus)
45 Downloads (Pure)

Electronegativity-dependent tin etching from thin films

Pachecka, M., Sturm, J. M., van de Kruijs, R. W. E., Lee, C. J. & Bijkerk, F., 29 Jul 2016, In : AIP advances. 6, 7, 9 p., 075222.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
tin
etching
thin films
hydrogen
availability
4 Citations (Scopus)
73 Downloads (Pure)

Exploiting the P L2,3 absorption edge for optics: spectroscopic and structural characterization of cubic boron phosphide thin films

Huber, S., Medvedev, V., Meyer-Ilse, J., Gullikson, E., Padavala, B., Edgar, J. H., Sturm, J. M., van de Kruijs, R. W. E., Prendergast, D. & Bijkerk, F., 2016, In : Optical materials express. 6, 12, p. 3946-3959 12.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Boron
Optics
Thin films
X ray absorption
Spectroscopy
9 Citations (Scopus)

Extreme UV induced dissociation of amorphous solid water and crystalline water bilayers on Ru(0001)

Liu, F., Sturm, J. M., Lee, C. J. & Bijkerk, F., 2016, In : Surface science. 646, p. 101-107 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

dissociation
water
desorption
cross sections
water loss
20 Citations (Scopus)
210 Downloads (Pure)

Highly efficient blazed grating with multilayer coating for tender X-ray energies

Senf, F., Bijkerk, F., Eggenstein, F., Gwalt, G., Huang, Q., van de Kruijs, R. W. E., Kutz, O., Lemke, S., Louis, E., Mertin, M., Packe, I., Rudolph, I., Schafers, F., Siewert, F., Sokolov, A., Sturm, J. M., Waberski, C., Wang, Z., Wolf, J., Zeschke, T. & 1 others, Erko, A., 2016, In : Optics express. 24, 12, p. 13220-13230 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
gratings
coatings
x rays
retarding
energy
5 Citations (Scopus)
176 Downloads (Pure)

In vacuo growth studies of Ru thin films on Si, SiN, and SiO2 by high-sensitivity low energy ion scattering

Coloma Ribera, R., van de Kruijs, R. W. E., Sturm, J. M., Yakshin, A. & Bijkerk, F., 2016, In : Journal of applied physics. 120, 6, p. 065303- 13 p., 065303.

Research output: Contribution to journalArticleAcademicpeer-review

File
ion scattering
sensitivity
thin films
energy
oxygen
5 Citations (Scopus)
45 Downloads (Pure)

Structure of high-reflectance La/B-based multilayer mirrors with partial La nitridation

Kuznetsov, D., Yakshin, A., Sturm, J. M., van de Kruijs, R. W. E. & Bijkerk, F., 2016, In : AIP advances. 6, 9 p., 115117.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
mirrors
reflectance
laminates
passivity
thin films
13 Citations (Scopus)

Versailles Project on Advanced Materials and Standards Interlaboratory Study on Measuring the Thickness and Chemistry of Nanoparticle Coatings Using XPS and LEIS

Belsey, N. A., Cant, D. J. H., Minelli, C., Araujo, J. R., Bock, B., Brüner, P., Castner, D. G., Ceccone, C., Counsell, J. D. P., Dietrich, P. M., Engelhard, M. H., Fearn, S., Galhardo, C. E., Kalbe, H., Kim, J. W., Lartundo-Rojas, L., Luftman, H. S., Nunney, T. S., Pseiner, J., Smith, E. F. & 12 others, Spampinato, V., Sturm, J. M., Thomas, A. G., Treacy, J. P. W., Veith, L., Wagstaffe, M., Wang, H., Wang, M., Wang, Y. C., Werner, W., Yang, L. & Shard, A. G., 2016, In : Journal of physical chemistry C. 120, 42, p. 24070-24079

Research output: Contribution to journalArticleAcademicpeer-review

ion scattering
X ray photoelectron spectroscopy
photoelectron spectroscopy
Scattering
Ions
2015
14 Citations (Scopus)

Emissivity of freestanding membranes with thin metal coatings

van Zwol, P. J., Vles, D. F., Voorthuijzen, W. P., Péter, M., Vermeulen, H., Zande, W. J., Sturm, J. M., van de Kruijs, R. W. E. & Bijkerk, F., 7 Dec 2015, In : Journal of applied physics. 118, 21, p. 213107- 21.

Research output: Contribution to journalArticleAcademicpeer-review

metal coatings
emissivity
membranes
heat
silicon nitrides
24 Citations (Scopus)

High-reflectance La/B-based multilayer mirror for 6.x  nm wavelength

Kuznetsov, D., Yakshin, A., Sturm, J. M., van de Kruijs, R. W. E., Louis, E. & Bijkerk, F., 2015, In : Optics letters. 40, 16, p. 3378-3781

Research output: Contribution to journalArticleAcademicpeer-review

mirrors
reflectance
laminates
wavelengths
passivity
28 Citations (Scopus)

Steam reforming of acetic acid - A major component in the volatiles formed during gasification of humin

Hoang, T. M. C., Geerdink, B., Sturm, J. M., Lefferts, L. & Seshan, K., 2015, In : Applied catalysis B: environmental. 163, p. 74-82

Research output: Contribution to journalArticleAcademicpeer-review

Steam reforming
Gasification
Acetic acid
Acetic Acid
acetic acid
2014
8 Citations (Scopus)

Defect formation in single layer graphene under extreme ultraviolet irradiation

Gao, A., Zoethout, E., Sturm, J. M., Lee, C. J. & Bijkerk, F., 2014, In : Applied surface science. 317, p. 745-751 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Graphene
Irradiation
Defects
Photons
Photoelectrons
2013
16 Citations (Scopus)

Reactions of ethanol on Ru(0001)

Sturm, J. M., Lee, C. J. & Bijkerk, F., 1 Jun 2013, In : Surface science. 612, p. 42-47 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

Ethanol
ethyl alcohol
Carbon Monoxide
Hydrogen
Dehydrogenation
51 Downloads (Pure)

UHV-opstelling voor het bestuderen van de contaminatie van EUV-spiegels

Sturm, J. M., Liu, F., Grecea, M. L., Gleeson, M. A., Lee, C. J. & Bijkerk, F., 2013, In : NEVAC blad. 51, 1, p. 12-15 4 p.

Research output: Contribution to journalArticleAcademic

File
20 Citations (Scopus)

Well-Ordered Molybdenum Oxide Layers on Au(111): Preparation and Properties

Guimond, S., Goebke, D., Sturm, J. M., Romanyshyn, Y., Kuhlenbeck, H., Cavalleri, M. & Freund, H-J., 2 May 2013, In : Journal of physical chemistry C. 117, 17, p. 8746-8757

Research output: Contribution to journalArticleAcademicpeer-review

2011
11 Citations (Scopus)

Methanol Adsorption on V2O3(0001)

Romanyshyn, Y., Guimond, S., Goebke, D., Sturm, J. M., Kuhlenbeck, H., Doebler, J., Ganduglia-Pirovano, M. V., Sauer, J. & Freund, H-J., Jul 2011, In : Topics in catalysis. 54, 10-12, p. 669-684

Research output: Contribution to journalArticleAcademicpeer-review

2009
51 Citations (Scopus)

Formaldehyde Formation on Vanadium Oxide Surfaces V2O3(0001) and V2O5(001): How does the Stable Methoxy Intermediate Form?

Goebke, D., Romanyshyn, Y., Guimond, S., Sturm, J. M., Kuhlenbeck, H., Doebler, J., Reinhardt, U., Ganduglia-Pirovano, M. V., Sauer, J. & Freund, H-J., 2009, In : Angewandte Chemie (international edition). 48, 20, p. 3695-3698

Research output: Contribution to journalArticleAcademicpeer-review

33 Citations (Scopus)

Partial oxidation of methanol on well-ordered V2O5(001)/Au(111) thin films

Sturm, J. M., Goebke, D., Kuhlenbeck, H., Doebler, J., Reinhardt, U., Ganduglia-Pirovano, M. V., Sauer, J. & Freund, H-J., 2009, In : Physical chemistry chemical physics. 11, 17, p. 3290-3299

Research output: Contribution to journalArticleAcademicpeer-review

2008
13 Citations (Scopus)

Growth and characterization of ultrathin V(2)O(y) (y approximate to 5) films on Au(111)

Guimond, S., Goebke, D., Romanyshyn, Y., Sturm, J. M., Naschitzki, M., Kuhlenbeck, H. & Freund, H-J., 14 Aug 2008, In : Journal of physical chemistry C. 112, 32, p. 12363-12373

Research output: Contribution to journalArticleAcademicpeer-review

52 Citations (Scopus)

Well-ordered V2O5(001) thin films on Au(111): Growth and thermal stability

Guimond, S., Sturm, J. M., Goebke, D., Romanyshyn, Y., Naschitzki, M., Kuhlenbeck, H. & Freund, H-J., 7 Aug 2008, In : Journal of physical chemistry C. 112, 31, p. 11835-11846

Research output: Contribution to journalArticleAcademicpeer-review

2007
3 Citations (Scopus)

Heterogeneous oxidation of Si(111) 7 x 7 monitored with Kelvin Probe Force Microscopy

Sturm, J. M., Wormeester, H. & Poelsema, B., 2007, In : Surface science. 601, 19, p. 4598-4602 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)

Metastable precursor for oxygen dissociation on Si(001) 2x1 resolved by high lateral resolution work function measurements

Sturm, J. M., Croes, G. O., Wormeester, H. & Poelsema, B., 2007, In : Surface science. 601, 12, p. 2498-2507 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

2006
7 Citations (Scopus)

In Situ Reflective High-Energy Electron Diffraction Analysis During the Initial Stage of a Trimethylaluminum/Water ALD Process

Bankras, R. G., Holleman, J., Schmitz, J., Sturm, J. M., Sturm, J. M., Zinine, A., Wormeester, H. & Poelsema, B., May 2006, In : Chemical vapor deposition. 12, 5, p. 275-280 6 p., 10.1002/cvde.200506433.

Research output: Contribution to journalArticleAcademicpeer-review

2005
13 Citations (Scopus)

Imaging of oxide charges and contact potential difference fluctuations in Atomic Layer Deposited Al2O3 on Si

Sturm, J. M., Zinine, A., Wormeester, H., Poelsema, B., Bankras, R. G., Holleman, J. & Schmitz, J., 14 Mar 2005, In : Journal of applied physics. 97, 063709, p. 063709 8 p., 10.1063/1.1870113.

Research output: Contribution to journalArticleAcademicpeer-review

Laterally resolved electrical characterisation of high-L oxides with non-contact Atomic Force Microscopy

Sturm, J. M., Zinine, A., Wormeester, H., Bankras, R. G., Holleman, J., Schmitz, J. & Poelsema, B., 17 Jun 2005, In : Microelectronic engineering. 80, 10.1016/j.mee.2005.04.015, p. 78-81 4 p., 10.1016/j.mee.2005.04.015.

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)

Nanoscale topography-capacitance correlation in high-K films: Interface heterogeneity related electrical properties

Sturm, J. M., Zinine, A., Wormeester, H., Poelsema, B., Bankras, R. G., Holleman, J. & Schmitz, J., 6 Oct 2005, In : Journal of applied physics. 98, 076104, p. 076104-1 10.1063/1.2077840.

Research output: Contribution to journalArticleAcademicpeer-review

2004

Analyse van hoge-k oxides. XPS-SPM opstelling gekoppeld aan depositieopstelling

Sturm, J. M., Zinine, A., Oerbekke, H. J. M., Wormeester, H. & Poelsema, B., 2004, In : NEVAC blad. 42, p. 42- 1 p.

Research output: Contribution to journalArticleAcademic

Degradation effects in polymer light emitting devices due to heat treatment

Janssen, F., Sturm, M., van IJzendoorn, L., van der Gon, A. D., Schoo, H., de Voigt, M. & Brongersma, H., Apr 2004, In : Macromolecular symposia. 212, 1, p. 225-230

Research output: Contribution to journalArticleAcademicpeer-review

2003
10 Citations (Scopus)

Interface instabilities in polymer light emitting diodes due to annealing

Janssen, F. J. J., Sturm, J. M., Denier van der Gon, A. W., van IJzendoorn, L. J., Kemerink, M., Schoo, H. F. M., de Voigt, M. J. A. & Brongersma, H. H., Dec 2003, In : Organic electronics. 4, 4, p. 209-218

Research output: Contribution to journalArticleAcademicpeer-review