Marko Sturm

dr.ir.

  • 519 Citations
  • 14 h-Index
20012020

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2019

Nanoscale Transition Metal Thin Films: Growth Characteristics and Scaling Law for Interlayer Formation

Chandrasekaran, A., van de Kruijs, R. W. E., Sturm, J. M., Zameshin, A. & Bijkerk, F., 11 Dec 2019, In : ACS applied materials & interfaces. 11, 49, p. 46311−46326 16 p.

Research output: Contribution to journalArticleAcademicpeer-review

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1 Citation (Scopus)
18 Downloads (Pure)
Open Access
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2 Citations (Scopus)
131 Downloads (Pure)

Oxidation of metal thin films by atomic oxygen: A low energy ion scattering study

Stilhano Vilas Boas, C. R., Sturm, J. M. & Bijkerk, F., 21 Oct 2019, In : Journal of Applied Physics. 126, 15, 7 p., 155301.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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2 Citations (Scopus)
46 Downloads (Pure)
2020

Etching processes of transferred and non-transferred multi-layer graphene in the presence of extreme UV, H2O and H2

Mund, B. K., Sturm, J. M., van den Beld, W. T. E., Lee, C. J. & Bijkerk, F., 28 Feb 2020, In : Applied surface science. 504, 144485.

Research output: Contribution to journalArticleAcademicpeer-review

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10 Downloads (Pure)

Hydrogen diffusion through Ru thin films

Soroka, O., Sturm, J. M., Lee, C. J., Schreuders, H., Dam, B. & Bijkerk, F., 26 May 2020, In : International journal of hydrogen energy. 45, 29, p. 15003-15010 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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16 Downloads (Pure)
Open Access
File
1 Citation (Scopus)
10 Downloads (Pure)
Open Access
File

W/B short period multilayer structures for soft x-rays

Medvedev, R., Zameshin, A., Sturm, J. M., Yakshin, A. & Bijkerk, F., 1 Apr 2020, In : AIP advances. 10, 4, 8 p., 045305.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
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6 Downloads (Pure)