Maurits Jelke de Jong

ir.

20172019

Research output per year

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Research Output

Recovery after hot-carrier injection: Slow versus fast traps

de Jong, M. J., Salm, C. & Schmitz, J., 23 Sep 2019, In : Microelectronics reliability. 100-101, 5 p., 113318.

Research output: Contribution to journalArticleAcademicpeer-review

  • 2 Downloads (Pure)

    Towards understanding recovery of hot-carrier induced degradation

    de Jong, M. J., Salm, C. & Schmitz, J., 30 Sep 2018, In : Microelectronics reliability. 88-90, p. 147-151 5 p.

    Research output: Contribution to journalArticleAcademicpeer-review

    Open Access
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  • 1 Citation (Scopus)
    75 Downloads (Pure)

    Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs

    de Jong, M. J., Salm, C. & Schmitz, J., Sep 2017, In : Microelectronics reliability. 76-77, p. 136-140 5 p.

    Research output: Contribution to journalArticleAcademicpeer-review

  • 4 Citations (Scopus)
    2 Downloads (Pure)