Maurits Jelke de Jong

ir.

20172019

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2019

Recovery after hot-carrier injection: Slow versus fast traps

de Jong, M. J., Salm, C. & Schmitz, J., 23 Sep 2019, In : Microelectronics reliability. 100-101, 5 p., 113318.

Research output: Contribution to journalArticleAcademicpeer-review

2 Downloads (Pure)
2018

Towards understanding recovery of hot-carrier induced degradation

de Jong, M. J., Salm, C. & Schmitz, J., 30 Sep 2018, In : Microelectronics reliability. 88-90, p. 147-151 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

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1 Citation (Scopus)
75 Downloads (Pure)
2017

Observations on the recovery of hot carrier degradation of hydrogen/deuterium passivated nMOSFETs

de Jong, M. J., Salm, C. & Schmitz, J., Sep 2017, In : Microelectronics reliability. 76-77, p. 136-140 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)
2 Downloads (Pure)