Mike Jaimie Dikkers



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Research Output

  • 1 Conference contribution

RFID Tag Failure after Thermal Overstress

Ozturk, E., Dikkers, M. J., Batenburg, K. M., Salm, C. & Schmitz, J., 10 Feb 2020, 2019 IEEE International Integrated Reliability Workshop, IIRW 2019. IEEE, 8989885

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
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