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Fingerprint Dive into the research topics where Raymond Josephus Engelbart Hueting is active. These topic labels come from the works of this person. Together they form a unique fingerprint.

Engineering & Materials Science

Silicon
Light emitting diodes
Diodes
Ferroelectric materials
Transistors
Field effect transistors
Leakage currents
Electric breakdown
Metals
Avalanche diodes
Titanium nitride
Molybdenum oxide
Analytical models
Telegraph
Inversion layers
Gallium nitride
Substrates
Quantum efficiency
Thin films
MOSFET devices
Capacitors
Semiconductor devices
Physics
Semiconductor materials
Data communication systems
Palladium
Barium strontium titanate
Electrodes
Ionization
Electric potential
Raman spectroscopy
Chemical reactions
Electrostatics
Charge carriers
Polarization
Alumina
Piezoelectricity
Capacitance
Doping (additives)
Modulation
Temperature
Electroluminescence
Energy gap
Defects
Heterojunctions
Electric fields
Transmission electron microscopy
Light emission
Permittivity
Tuning

Physics & Astronomy

Aerospace Sciences

avalanches
Raman spectroscopy

Engineering

CMOS
light emitting diodes
avalanche diodes
diodes
photodiodes
SOI (semiconductors)
traps
resonators
reflectors
heterojunctions
charge carriers
transistors
electrical faults
electrodes
p-n junctions
communication
injectors
tuning
direct current
junction diodes
p-i-n diodes
permittivity

Chemistry and Materials

silicon
titanium nitrides
barium
aluminum oxides
strontium

General

insulators
optical spectrum
fins
light emission
capacitors
figure of merit
transmitters
isolation
metals
thin films
leakage
defects
costs
curves
failure analysis
injection

Physics

photons
electroluminescence
electric potential
physics

Mathematical and Computer Sciences

finite element method

Chemical Compounds

Silicon
Light emitting diodes
Diodes
Metals
Leakage currents
Electric breakdown
Avalanche diodes
Analytical models
Telegraph
Ferroelectric materials
Aluminum Oxide
Field effect transistors
Quantum efficiency
Transistors
Capacitors
Semiconductor devices
Physics
Data communication systems
Barium strontium titanate
Ionization
Raman spectroscopy
Chemical reactions
Electrostatics
Thin films
Charge carriers
Semiconductor materials
Piezoelectricity
Electric potential
Doping (additives)
Modulation
Electroluminescence
Energy gap
Defects
Electrodes
Heterojunctions
Electric fields
Transmission electron microscopy
Light emission
Permittivity
Substrates
Tuning
Jitter
Bit error rate
Polarization
Spatial distribution
Glass
Temperature
Impact ionization
Time domain analysis
Electron mobility