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Research Output 1997 2019

2019

In search of a hole inversion layer in Pd/MoOx/Si diodes through I- v characterization using dedicated ring-shaped test structures

Gupta, G., Tharnmaiah, S. D., Hueting, R. J. E. & Nanver, L. K., 6 Jun 2019, 2019 IEEE 32nd International Conference on Microelectronic Test Structures, ICMTS 2019. IEEE, p. 12-17 6 p. 8730920

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Molybdenum oxide
Inversion layers
Palladium
Diodes
Silicon
2018
1 Citation (Scopus)
104 Downloads (Pure)

Charge carrier transport and electroluminescence in atomic layer deposited poly-GaN/c-Si heterojunction diodes

Gupta, G., Banerjee, S., Dutta, S., Aarnink, A. A. I., Schmitz, J., Kovalgin, A. Y. & Hueting, R. J. E., 28 Aug 2018, In : Journal of applied physics. 124, 8, 8 p., 084503.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
electroluminescence
heterojunctions
charge carriers
diodes
traps
3 Citations (Scopus)
32 Downloads (Pure)

Data Transmission Capabilities of Silicon Avalanche Mode Light-Emitting Diodes

Agarwal, V., Annema, A-J., Hueting, R. J. E., Dutta, S., Nanver, L. K. & Nauta, B., 1 Nov 2018, In : IEEE transactions on electron devices. 65, 11, p. 4883-4890 8 p., 8472882.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Silicon
Data communication systems
Light emitting diodes
Jitter
Leakage currents
3 Citations (Scopus)
14 Downloads (Pure)

Epitaxial Stress-Free Growth of High Crystallinity Ferroelectric PbZr0.52Ti0.48O3 on GaN/AlGaN/Si(111) Substrate

Li, L., Liao, Z., Gauquelin, N., Nguyen, M. D., Hueting, R. J. E., Gravesteijn, D. J., Lobato, I., Houwman, E. P., Lazar, S., Verbeeck, J., Koster, G. & Rijnders, G., 23 Jan 2018, In : Advanced materials interfaces. 5, 2, 1700921.

Research output: Contribution to journalArticleAcademicpeer-review

Gallium nitride
Ferroelectric materials
Substrates
Epitaxial growth
Strain relaxation
1 Downloads (Pure)

Figures of merit of avalanche-mode silicon LEDS

Hueting, R. J. E., Dutta, S., Agarwal, V. & Annema, A. J., 8 Oct 2018, Fifth Conference on Sensors, MEMS, and Electro-Optic Systems, 2018, Skuluza, South Africa. SPIE International, Vol. 11043.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

figure of merit
avalanches
light emitting diodes
CMOS
silicon
2 Downloads (Pure)

Investigation of light-emission and avalanche-current mechanisms in PureB SPAD devices

Nanver, L. K., Krakers, M., Knezevic, T., Karavidas, A., Boturchuk, I., Agarwal, V., Hueting, R. J. E., Dutta, S. & Annema, A. J., 8 Oct 2018, Fifth Conference on Sensors, MEMS and Electro-Optical Systems 2018. SPIE International, Vol. 11043.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

avalanche diodes
avalanches
light emission
defects
photons
1 Citation (Scopus)
1 Downloads (Pure)

Minority Carrier Injection in High-Barrier Si-Schottky Diodes

Gupta, G., Dutta, S., Banerjee, S. & Hueting, R. J. E., 1 Apr 2018, In : IEEE transactions on electron devices. 65, 4, p. 1276-1282 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Silicon
Diodes
Thermionic emission
Schottky barrier diodes
Carrier transport
1 Citation (Scopus)
30 Downloads (Pure)

Optocoupling in CMOS

Agarwal, V., Dutta, S., Annema, A. J., Hueting, R. J. E., Schmitz, J., Lee, M-J., Charbon, E. & Nauta, B., 2 Dec 2018, 2018 IEEE International Electron Devices Meeting (IEDM). San Francisco, USA: IEEE

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
CMOS
light emitting diodes
avalanches
quantum efficiency
communication
2 Citations (Scopus)
39 Downloads (Pure)

Random telegraph signal phenomena in ultra shallow p+n silicon avalanche diodes

Agarwal, V., Annema, A. J., Dutta, S., Hueting, R. J. E., Nanver, L. K. & Nauta, B., 10 May 2018, In : Journal of the Electron Devices Society. 6, 1, p. 642-652 11 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Avalanches
Avalanche diodes
Telegraph
Silicon
Defects
1 Citation (Scopus)
10 Downloads (Pure)

The balancing act in ferroelectric transistors: how hard can it be?

Hueting, R. J. E., 7 Nov 2018, In : Micromachines. 9, 11, 14 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Field effect transistors
Ferroelectric materials
Transistors
Capacitance
Polarization
1 Citation (Scopus)
15 Downloads (Pure)

Toward GHz Switching in SOI Light Emitting Diodes

Puliyankot, V., Piccolo, G., Hueting, R. J. E. & Schmitz, J., 10 Sep 2018, In : IEEE transactions on electron devices. 65, 10, p. 4413-4420 8 p., 8457503.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Light emitting diodes
Light emission
Silicon
Diodes
Geometry
2017
3 Citations (Scopus)
1 Downloads (Pure)

An improved analytical model for carrier multiplication near breakdown in diodes

Hueting, R. J. E., Heringa, A., Boksteen, B. K., Dutta, S., Ferrara, A., Agarwal, V. V. & Annema, A. J., 13 Jan 2017, In : IEEE transactions on electron devices. 64, 1, p. 264-270 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Ionization
Analytical models
Diodes
Charge carriers
Impact ionization
152 Downloads (Pure)

Avalanche-mode silicon LEDs for monolithic optical coupling in CMOS technology

Dutta, S., 8 Nov 2017, Enschede: University of Twente. 150 p.

Research output: ThesisPhD Thesis - Research UT, graduation UTAcademic

Open Access
File
optical coupling
avalanches
CMOS
light emitting diodes
silicon
1 Citation (Scopus)

Barrier Height Variation in Ni-Based AlGaN/GaN Schottky Diodes

Hajlasz, M., Donkers, J. J. T. M., Pandey, S., Hurkx, F., Hueting, R. J. E. & Gravesteijn, D. J., 1 Oct 2017, In : IEEE transactions on electron devices. 64, 10, p. 4050-4056 7 p., 8019820.

Research output: Contribution to journalArticleAcademicpeer-review

Chemical reactions
Diodes
Metals
Silicon
Spectroscopy
16 Citations (Scopus)
1 Downloads (Pure)

Electrostatic Doping in Semiconductor Devices

Gupta, G., Rajasekharan, B. & Hueting, R. J. E., 23 Jun 2017, In : IEEE transactions on electron devices. 64, 8, p. 3044-3055 12 p.

Research output: Contribution to journalArticleAcademicpeer-review

Semiconductor devices
Electrostatics
Doping (additives)
Energy gap
Metals
4 Citations (Scopus)
47 Downloads (Pure)

Low power wide spectrum optical transmitter using avalanche mode LEDs in SOI CMOS technology

Agarwal, V. V., Dutta, S., Annema, A. J., Hueting, R. J. E., Steeneken, P. G. & Nauta, B., 24 Jul 2017, In : Optics express. 25, 15, p. 16981-16995 14 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
SOI (semiconductors)
avalanches
transmitters
optical spectrum
CMOS
12 Citations (Scopus)
51 Downloads (Pure)

Monolithic optical link in silicon-on-insulator CMOS technology

Dutta, S., Agarwal, V. V., Hueting, R. J. E., Schmitz, J. & Annema, A. J., 6 Mar 2017, In : Optics express. 25, 5, p. 5440-5456 17 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
CMOS
light emitting diodes
insulators
avalanches
photodiodes
3 Citations (Scopus)
4 Downloads (Pure)

Optical Power Efficiency Versus Breakdown Voltage of Avalanche-Mode Silicon LEDs in CMOS

Dutta, S., Wienk, G. J. M., Hueting, R. J. E., Schmitz, J. & Annema, A. J., 23 Jun 2017, In : IEEE electron device letters. 38, 7, p. 898-901 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

Silicon
Electric breakdown
Light emitting diodes
Electroluminescence
Spatial distribution
6 Citations (Scopus)
30 Downloads (Pure)

The avalanche-mode superjunction LED

Dutta, S., Steeneken, P. G., Agarwal, V. V., Schmitz, J., Annema, A. J. & Hueting, R. J. E., Apr 2017, In : IEEE transactions on electron devices. 64, 4, p. 1612-1618 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Open Access
File
Light emitting diodes
Silicon
Electric fields
Optical links
Photodiodes
2016
9 Citations (Scopus)
43 Downloads (Pure)

An integrated optical link in 140 nm SOI technology

Dutta, S., Hueting, R. J. E., Agarwal, V. V. & Annema, A. J., 5 Jun 2016, Conference on Lasers and Electro-Optics, CLEO: Science and Innovations 2016. Washington: Optical Society of America, p. JW2A.132 (Proceedings Conference on Lasers and Electro-Optics).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
1 Downloads (Pure)

Bipolar transistor with lateral emitter and collector and method of production

Hueting, R. J. E. & van den Oever, L. C. M., 5 Apr 2016, Patent No. US 9,306,017 B2, Priority date 5 Apr 2016

Research output: PatentProfessional

Open Access
File
1 Citation (Scopus)

Interface trap density estimation in FinFETs from the subthreshold current

Schmitz, J., Kaleli, B., Kuipers, P., van den Berg, N., Smits, S. M. & Hueting, R. J. E., 28 Mar 2016, 2016 International Conference on Microelectronic Test Structures (ICMTS). USA: IEEE, p. 164-167 4 p. (Proceedings Conference ICMTS).

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

traps
transconductance
wafers
electric potential
temperature
1 Citation (Scopus)

Interface trap density estimation in FinFETs using the gm/ID Method in the subthreshold regime

Boksteen, B. K., Schmitz, J. & Hueting, R. J. E., May 2016, In : IEEE transactions on electron devices. 63, 5, p. 1814-1820 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

2 Citations (Scopus)
74 Downloads (Pure)

Random telegraph signal phenomena in avalanche mode diodes: application to SPADs

Agarwal, V. V., Annema, A. J., Dutta, S., Hueting, R. J. E., Nanver, L. K. & Nauta, B., 14 Sep 2016, 2016 46th European Solid-State Device Research Conference (ESSDERC). USA: IEEE, p. 264-267 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Open Access
File
avalanche diodes
avalanches
diodes
photons
sustaining
34 Downloads (Pure)

RESURF power semiconductor devices - Performance and operating limits

Ferrara, A., 13 Jan 2016, Enschede: GildePrint. 102 p.

Research output: ThesisPhD Thesis - Research UT, graduation UTAcademic

Open Access
File
Power transmission
Power electronics
Industry
Semiconductor devices
Digital signal processing
2015
3 Citations (Scopus)

Electric field and interface charge extraction in field-plate assisted RESURF devices

Boksteen, B. K., Heringa, A., Ferrara, A., Steeneken, P. G., Schmitz, J. & Hueting, R. J. E., 1 Feb 2015, In : IEEE transactions on electron devices. 62, 2, p. 622-629 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

6 Citations (Scopus)

Electrostatic analysis of n-doped SrTiO3 metal-insulator-semiconductor systems

Kamerbeek, A. M., Banerjee, T. & Hueting, R. J. E., 15 Dec 2015, In : Journal of applied physics. 118, 225704, p. 1-5 5 p.

Research output: Contribution to journalArticleAcademicpeer-review

127 Downloads (Pure)

Field-plate assisted RESURF power devices: Gradient based optimization, degradation and analysis

Boksteen, B. K., 26 Aug 2015, Enschede: GildePrint. 138 p.

Research output: ThesisPhD Thesis - Research UT, graduation UTAcademic

File
4 Citations (Scopus)

Ideal RESURF Geometries

Ferrara, A., Boksteen, B. K., Hueting, R. J. E., Heringa, A., Schmitz, J. & Steeneken, P. G., 1 Oct 2015, In : IEEE transactions on electron devices. 62, 10, p. 3341-3347 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

4 Citations (Scopus)

Integration of epitaxial Pb(Zr0.52Ti0.48)O3 films on GaN/AlGaN/GaN/Si(111) substrates using rutile TiO2 buffer layers

Elibol, K., Elibol, K., Nguyen, D. M., Hueting, R. J. E., Gravesteijn, D. J., Koster, G., Koster, G. & Rijnders, A. J. H. M., 30 Jul 2015, In : Thin solid films. 591, Part A, p. 66-71 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

9 Citations (Scopus)
239 Downloads (Pure)

On device architectures, subthreshold swing, and power consumption of the piezoelectric field-effect transistor (π-FET)

Hueting, R. J. E., van Hemert, T., Kaleli, B., Wolters, R. A. M. & Schmitz, J., 22 Apr 2015, In : Journal of the Electron Devices Society. 3, 3, p. 149-157 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

File
19 Citations (Scopus)

Opto-electronic modeling of light emission from avalanche-mode silicon p+n junctions

Dutta, S., Hueting, R. J. E., Annema, A. J., Qi, L., Nanver, L. K. & Schmitz, J., 18 Sep 2015, In : Journal of applied physics. 118, p. 1-10 10 p.

Research output: Contribution to journalArticleAcademicpeer-review

Physics-based stability analysis of MOS transistors

Ferrara, A., Steeneken, P. G., Boksteen, B. K., Heringa, A., Scholten, A. J., Schmitz, J. & Hueting, R. J. E., 10 Jun 2015, In : Solid-state electronics. 113, p. 28-34 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Transistors
transistors
Physics
physics
failure analysis
2 Citations (Scopus)

The boost transistor: a field plate controlled LDMOST

Ferrara, A., Schmitz, J., Boksteen, B. K., Hueting, R. J. E., Steeneken, P. G., Heringa, A., Claes, J. & van der Wel, A. P., 10 May 2015, 2015 IEEE 27th International Symposium on Power Semiconductor Devices & IC's (ISPSD). USA: IEEE, p. 165-168 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

Transistors
Electrodes
Electric breakdown
Networks (circuits)
Electric potential
2014
8 Citations (Scopus)

Analysis of thin-film PZT/LNO stacks on an encapsulated TiN electrode

Kaleli, B., Nguyen, D. M., Schmitz, J., Wolters, R. A. M. & Hueting, R. J. E., 1 May 2014, In : Microelectronic engineering. 119, p. 16-19 4 p.

Research output: Contribution to journalArticleAcademicpeer-review

Titanium nitride
titanium nitrides
Leakage currents
Ferroelectric materials
Thin films
1 Citation (Scopus)

Identifying failure mechanisms in LDMOS transistors by analytical stability analysis

Ferrara, A., Steeneken, P. G., Boksteen, B. K., Heringa, A., Scholten, A. J., Schmitz, J. & Hueting, R. J. E., 22 Sep 2014, Proceedings of the 44th European Solid State Device Research Conference, ESSDERC 2014. USA: IEEE Circuits & Systems Society, p. 321-324 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2 Citations (Scopus)

Impact of interface charge on the electrostatics of field-plate assisted RESURF devices

Boksteen, B. K., Ferrara, A., Heringa, A., Steeneken, P. G. & Hueting, R. J. E., 30 Jun 2014, In : IEEE transactions on electron devices. 61, 8, p. 2859-2866 8 p.

Research output: Contribution to journalArticleAcademicpeer-review

7 Citations (Scopus)

Integration of a Piezoelectric Layer on Si FinFETs for Tunable Strained Device Applications

Kaleli, B., Hueting, R. J. E., Nguyen, D. M. & Wolters, R. A. M., 1 Jun 2014, In : IEEE transactions on electron devices. 61, 6, p. 1929-1935 7 p.

Research output: Contribution to journalArticleAcademicpeer-review

Piezoelectricity
Silicon
Electron mobility
Oxides
FinFET

Opportunities for shear energy scaling in bulk acoustic wave resonators

Jose, S. & Hueting, R. J. E., 1 Oct 2014, In : IEEE transactions on ultrasonics, ferroelectrics and frequency control. 61, 10, p. 1720-1728 9 p.

Research output: Contribution to journalArticleAcademicpeer-review

10 Citations (Scopus)

Silicon LEDs in FinFET technology

Piccolo, G., Kuindersma, P. I., Ragnarsson, L-A., Hueting, R. J. E., Collaert, N. & Schmitz, J., 26 Sep 2014, Proceeding ofthe 44th European Solid State Device Research Conference (ESSDERC). USA: IEEE Circuits & Systems Society, p. 274-277 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

2013

Analysis of ferroelectric and electrical properties of sub 100 nm thick PZT/LNO stacks on an encapsulated TiN electrode

Kaleli, B., Nguyen, D. M., Schmitz, J., Wolters, R. A. M. & Hueting, R. J. E., 16 Sep 2013, p. -.

Research output: Contribution to conferencePosterOther research output

211 Downloads (Pure)

Characterization of strained silicon FinFETs and the integration of a piezoelectric layer

Kaleli, B., 20 Nov 2013, Enschede: University of Twente. 134 p.

Research output: ThesisPhD Thesis - Research UT, graduation UTAcademic

File
4 Citations (Scopus)

Comparison of electrical techniques for temperature evaluation in power MOS transistors

Ferrara, A., Steeneken, P. G., Reimann, K., Heringa, A., Yan, L., Boksteen, B. K., Swanenberg, M., Koops, G. E. J., Scholten, A. J., Surdeanu, R., Schmitz, J. & Hueting, R. J. E., 26 Mar 2013, IEEE International Conference on Microelectronic Test Structures (ICMTS 2013). USA: IEEE, p. 115-120 6 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

MOSFET devices
Temperature
Diodes
Chucks
Gates (transistor)
9 Citations (Scopus)
60 Downloads (Pure)

Design optimization of field-plate assisted RESURF devices

Boksteen, B. K., Ferrara, A., Heringa, A., Steeneken, P. G., Koops, G. E. J. & Hueting, R. J. E., 26 May 2013, 25th International Symposium on Power Semiconductor Devices and ICs, ISPSD 2013. USA: IEEE Circuits & Systems Society, p. 237-240 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

File
15 Citations (Scopus)

Piezoelectric strain modulation in FETs

van Hemert, T. & Hueting, R. J. E., 10 Oct 2013, In : IEEE transactions on electron devices. 60, 10, p. 3265-3270 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

Field effect transistors
Modulation
Threshold voltage
Leakage currents
Transistors

Role of junction depth in light emission from silicon p-i-n LEDs

Piccolo, G., Sammak, A., Hueting, R. J. E., Schmitz, J. & Nanver, L. K., 16 Sep 2013, Proceeding of European Solid State Device Research Conference (ESSDERC 2013). USA: IEEE, p. 119-122 4 p.

Research output: Chapter in Book/Report/Conference proceedingConference contributionAcademicpeer-review

3 Citations (Scopus)

Strain and conduction-band offset in narrow n-type finFETs

van Hemert, T., Kaleli, B., Hueting, R. J. E., Esseni, D., van Dal, M. J. H. & Schmitz, J., 1 Mar 2013, In : IEEE transactions on electron devices. 60, 3, p. 1005-1010 6 p.

Research output: Contribution to journalArticleAcademicpeer-review

3 Citations (Scopus)

Strain characterization of FinFETs using Raman spectroscopy

Kaleli, B., van Hemert, T., Hueting, R. J. E. & Wolters, R. A. M., 31 Aug 2013, In : Thin solid films. 541, p. 57-61 5 p.

Research output: Contribution to journalConference articleAcademicpeer-review

fins
Raman spectroscopy
finite element method
silicon
Silicon

Structural characterization of rutile TiO2 on GaN templated Si (111)

Elibol, K., Nguyen, D. M., Hueting, R. J. E., Koster, G. & Rijnders, A. J. H. M., 11 Dec 2013, p. -.

Research output: Contribution to conferencePosterOther research output

67 Downloads (Pure)

Tailoring strain in microelectronic devices

van Hemert, T., 6 Dec 2013, Enschede: University of Twente. 94 p.

Research output: ThesisPhD Thesis - Research UT, graduation UTAcademic

File